JP2001218106A - Imaging device - Google Patents
Imaging deviceInfo
- Publication number
- JP2001218106A JP2001218106A JP2000022759A JP2000022759A JP2001218106A JP 2001218106 A JP2001218106 A JP 2001218106A JP 2000022759 A JP2000022759 A JP 2000022759A JP 2000022759 A JP2000022759 A JP 2000022759A JP 2001218106 A JP2001218106 A JP 2001218106A
- Authority
- JP
- Japan
- Prior art keywords
- image pickup
- imaging
- infrared cut
- reflection type
- cut filter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Links
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- Optical Filters (AREA)
- Studio Devices (AREA)
Abstract
Description
【０００１】[0001]
【発明の属する技術分野】本発明は、ＣＣＤ等の撮像素
子を用いた撮像装置に係わり、特に撮像素子に入射する
光の分光特性を調節するための反射型赤外カットフィル
タを備えた撮像装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an image pickup apparatus using an image pickup device such as a CCD, and more particularly to an image pickup device provided with a reflection type infrared cut filter for adjusting a spectral characteristic of light incident on the image pickup device. About.
【０００２】[0002]
【従来の技術】ＣＣＤ等の撮像素子には、一般にＲＧＢ
のうちのＲ領域の感度が高いという分光感度特性があ
る。そこで、撮像素子を用いた撮像装置においては、撮
像素子の前段に赤外カットフィルタを配置している。2. Description of the Related Art In general, an image pickup device such as a CCD generally has RGB components.
Among them, there is a spectral sensitivity characteristic that the sensitivity in the R region is high. Therefore, in an image pickup apparatus using an image pickup device, an infrared cut filter is arranged in a stage preceding the image pickup device.
【０００３】赤外カットフィルタとしては、色素を混入
した色ガラスのように吸収型のものとコーディングによ
る分光反射を利用した反射型のものがある。吸収型のも
のは、吸湿性による特性劣化が生じやすく、厚さも大き
くコストも高いことから、反射型のものが有望視されて
いる。図１に、撮像素子１１と集光レンズ１２との間に
反射型赤外カットフィルタ１３を挿入した例を示す。な
お、図中の１４は撮像素子１１の受光面（撮像面）、１
５は赤外カットフィルタ１３のフィルタ面である。[0003] As the infrared cut filter, there are an absorptive type such as a colored glass mixed with a pigment and a reflective type using spectral reflection by coding. The absorption type is promising because the absorption type is easily deteriorated in characteristics due to the hygroscopic property, and the thickness is large and the cost is high. FIG. 1 shows an example in which a reflection type infrared cut filter 13 is inserted between the imaging element 11 and the condenser lens 12. In the drawing, reference numeral 14 denotes a light receiving surface (imaging surface) of the imaging device 11;
Reference numeral 5 denotes a filter surface of the infrared cut filter 13.
【０００４】ところで、この種の反射型赤外カットフィ
ルタを用いた撮像装置においては、例えば信号機等を撮
像すると赤のゴーストが強く現れる現象がある。本発明
者らは、赤のゴーストが現れる現象について考察したと
ころ、次のような事実を見出した。即ち、反射型赤外カ
ットフィルタの特性の一例は図２に示すように、４００
〜６２０ｎｍ付近の波長を透過するが、６４０ｎｍを越
える波長に対しては透過率が急峻に低くなっている。こ
こで、過度領域即ち６３０ｎｍ付近における透過特性
（反射特性）は、急峻ではあるもののある程度の傾斜を
持つ。つまり、この傾斜領域は極めて限られた領域であ
るが、ここでは赤外領域の光がかなり透過することにな
る。By the way, in an image pickup apparatus using such a reflection type infrared cut filter, there is a phenomenon that a red ghost appears strongly when an image of a traffic signal or the like is picked up. The present inventors have studied the phenomenon that a red ghost appears, and found the following fact. That is, an example of the characteristic of the reflection type infrared cut filter is 400 as shown in FIG.
It transmits wavelengths around ６620 nm, but has a sharply lower transmittance for wavelengths above 640 nm. Here, the transmission characteristics (reflection characteristics) in the transient region, that is, around 630 nm, have a certain degree of slope, though steep. In other words, although this inclined region is a very limited region, light in the infrared region is considerably transmitted here.
【０００５】このように、赤外領域の光は大部分は反射
型赤外カットフィルタ１３でカットされるものの、一部
は透過して撮像素子１１の受光面１４に入る。そして、
撮像素子１１の受光面１４で反射した赤外領域の光は、
反射型赤外カットフィルタ１３のフィルタ面１５により
反射され再び受光面１４に入ることになり、これがゴー
スト像を発生する要因となる。この様子を図３に示す。
ゴースト像を形成する被写体の各点像の散乱円の大きさ
δは、受光面１４とフィルタ面１５との距離をｄ、レン
ズ１２の開口値をＦとすると、 δ＝２ｄ／Ｆ となる。As described above, most of the light in the infrared region is cut by the reflection type infrared cut filter 13, but a part of the light passes through the light receiving surface 14 of the image pickup device 11. And
The light in the infrared region reflected by the light receiving surface 14 of the image sensor 11 is
The light is reflected by the filter surface 15 of the reflection type infrared cut filter 13 and enters the light receiving surface 14 again, which causes a ghost image. This is shown in FIG.
When the distance between the light receiving surface 14 and the filter surface 15 is d and the aperture value of the lens 12 is F, the size δ of the scattering circle of each point image of the subject forming the ghost image is δ = 2d / F.
【０００６】上記のゴーストの強度は、受光面１４の分
光反射率を別にすれば、 Ｔ（λ）Ｒ（λ）＝Ｔ（λ）｛１−Ｔ（λ）｝ に比例するから、ｔ≒０．５で最大となる。言い換えれ
ば、過度領域ではＴ（λ）とＲ（λ）の何れか一方がほ
ぼ０となるのでゴーストは生じることがないが、過度領
域即ちカットオフ周波数近傍では特に強いゴーストを生
じる、という特徴的な現象が存在している。そして、赤
外カットの目的が色調整（撮像分光感度特性の最適化）
にある場合には、これに対応するカットオフ波長λc0が
例えば６３０ｎｍ等、感度領域に入らざるを得ない。The intensity of the ghost is proportional to T (λ) R (λ) = T (λ) {1−T (λ)}, excluding the spectral reflectance of the light receiving surface 14, so that t ≒ 0.5 is maximum. In other words, one of T (λ) and R (λ) is almost zero in the transient region, so that no ghost occurs, but a particularly strong ghost occurs in the transient region, that is, near the cutoff frequency. Phenomena exist. The purpose of infrared cut is color adjustment (optimization of imaging spectral sensitivity characteristics)
, The cutoff wavelength λ c0 corresponding to this must be in the sensitivity region, for example, 630 nm.
【０００７】なお、光の周波数（振動数）νと波長λ
は、当該媒質中の高速度Ｃを仲立ちにしてＣ＝λ・νの
関係で１対１に対応するところから、本明細書記載にお
いては慣用に基づき、文脈によりこれらを同一視して使
用する。The frequency (frequency) ν of light and the wavelength λ
Is a one-to-one correspondence with the relation of C = λ · ν by intermediating the high speed C in the medium. Therefore, in the present description, these are used with the same context and in accordance with the context. .
【０００８】[0008]
【発明が解決しようとする課題】このように従来、反射
型赤外カットフィルタを用いた撮像装置においては、フ
ィルタの目的から必然的にカットオフ周波数が撮像素子
の有効感度領域にあるため、カットオフ周波数近傍の波
長の光源に対して特徴的なゴースト像を生じる問題があ
った。As described above, in a conventional imaging apparatus using a reflection-type infrared cut filter, the cutoff frequency is inevitably in the effective sensitivity region of the imaging element for the purpose of the filter. There is a problem that a characteristic ghost image is generated for a light source having a wavelength near the off-frequency.
【０００９】本発明は、上記事情を考慮して成されたも
ので、その目的とするところは、反射型赤外カットフィ
ルタを用いてもカットオフ光によるゴースト発生を防止
できる撮像装置を提供することにある。The present invention has been made in view of the above circumstances, and an object of the present invention is to provide an imaging apparatus capable of preventing ghost from being generated by cutoff light even when a reflection type infrared cut filter is used. It is in.
【００１０】[0010]
【課題を解決するための手段】（構成）上記課題を解決
するために本発明は次のような構成を採用している。(Structure) In order to solve the above problem, the present invention employs the following structure.
【００１１】即ち本発明は、撮像素子と、被写体像を前
記撮像素子の撮像面に結像する撮像光学系と、前記撮像
光学系と撮像素子との間に介挿された前記撮像面に入射
する光の分光特性を調節するための反射型赤外カットフ
ィルタとを備えた撮像装置において、前記反射型赤外カ
ットフィルタは、そのカットオフ周波数が前記撮像素子
の有効感度領域にあり、且つ前記撮像面に対して傾けて
配置されたものであることを特徴とする。That is, according to the present invention, there is provided an image pickup device, an image pickup optical system for forming a subject image on the image pickup surface of the image pickup device, and light incident on the image pickup surface interposed between the image pickup optical system and the image pickup device. A reflection type infrared cut filter for adjusting the spectral characteristic of light to be reflected, wherein the reflection type infrared cut filter has a cutoff frequency in an effective sensitivity region of the image sensor, and It is characterized by being arranged to be inclined with respect to the imaging surface.
【００１２】ここで、本発明の望ましい実施態様として
は次のものがあげられる。Here, preferred embodiments of the present invention include the following.
【００１３】(1) 反射型赤外カットフィルタと撮像素子
との傾け角θは、傾け方向に対する撮像面長さをｈ、フ
ィルタ反射面と撮像面との距離をｄとしたとき、ｔａｎ
２θ≧ｈ／ｄを満たすものであること。(1) The inclination angle θ between the reflection type infrared cut filter and the image sensor is tan, where h is the length of the imaging surface with respect to the inclination direction and d is the distance between the filter reflection surface and the imaging surface.
2θ ≧ h / d.
【００１４】(2) 反射型赤外カットフィルタと撮像素子
との傾け角θは、４５度であること。(2) The inclination angle θ between the reflection type infrared cut filter and the image sensor is 45 degrees.
【００１５】(3) 反射型赤外カットフィルタを、ファイ
ンダ用分岐可視ハーフミラーと兼用したこと。(3) The reflection type infrared cut filter is also used as a finder branch visible half mirror.
【００１６】(4) 反射型赤外カットフィルタを、一眼レ
フファインダでクイックリターンミラーの下の空きスペ
ースに配置したこと。(4) The reflection type infrared cut filter is disposed in an empty space below the quick return mirror by a single-lens reflex finder.
【００１７】（作用）本発明によれば、反射型赤外カッ
トフィルタを撮像面に対して傾けて配置することによ
り、撮像面で反射されフィルタで反射した光が再び撮像
面に戻るのを防止することができ、これによりカットオ
フ光によるゴースト発生を防止することが可能となる。(Function) According to the present invention, the reflection type infrared cut filter is disposed at an angle to the imaging surface, so that light reflected by the imaging surface and reflected by the filter is prevented from returning to the imaging surface again. This makes it possible to prevent the occurrence of ghost due to the cutoff light.
【００１８】ここで、反射型赤外カットフィルタと撮像
素子との傾け角θを、ｔａｎ２θ≧ｈ／ｄ（ｈは傾け方
向に対する撮像面長さ、ｄはフィルタ反射面と撮像面と
の距離を）を満たすように設定することにより、カット
オフ光の撮像面への再入射をより確実に防止することが
できる。また、反射型赤外カットフィルタを、ファイン
ダ用分岐可視ハーフミラーと兼用することにより、構成
の簡略化をはかることが可能となる。Here, the inclination angle θ between the reflection type infrared cut filter and the imaging device is defined as tan2θ ≧ h / d (h is the imaging surface length with respect to the inclination direction, and d is the distance between the filter reflection surface and the imaging surface. By setting so as to satisfy the above condition, it is possible to more reliably prevent the cutoff light from re-entering the imaging surface. In addition, by using the reflection type infrared cut filter also as the branch visible half mirror for the finder, the configuration can be simplified.
【００１９】[0019]
【発明の実施の形態】以下、本発明の詳細を図示の実施
形態によって説明する。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The details of the present invention will be described below with reference to the illustrated embodiments.
【００２０】（第１の実施形態）図４は、本発明の第１
の実施形態に係わる撮像装置の光学系構成を示す図であ
る。図中の１１はＣＣＤ撮像素子、１２は撮像素子１１
の受光面（撮像面）に被写体像を結像するためのレン
ズ、１３は撮像素子１１とレンズ１２との間に挿入され
た反射型赤外カットフィルタ（カットオフ波長６３０ｎ
ｍ）を示している。また、１４は撮像素子の受光面（撮
像面）、１５は反射型赤外カットフィルタ１３のフィル
タ面を示している。(First Embodiment) FIG. 4 shows a first embodiment of the present invention.
FIG. 2 is a diagram illustrating an optical system configuration of an imaging apparatus according to the embodiment. In the figure, 11 is a CCD image sensor, 12 is an image sensor 11
A lens 13 for forming a subject image on a light receiving surface (imaging surface) of the image pickup device 13 is a reflection type infrared cut filter (cutoff wavelength 630n) inserted between the imaging device 11 and the lens 12.
m). Reference numeral 14 denotes a light receiving surface (imaging surface) of the image sensor, and reference numeral 15 denotes a filter surface of the reflection type infrared cut filter 13.
【００２１】ここで、反射型赤外カットフィルタ１３は
光軸に対して垂直（撮像面と平行）から僅かに傾けて配
置されている。この傾きにより、反射型赤外カットフィ
ルタ１３を透過し撮像素子１１の受光面で反射し、さら
にフィルタ１３で反射した赤外光が撮像素子１１に再び
入射するのを防止している。Here, the reflection type infrared cut filter 13 is arranged to be slightly inclined from a direction perpendicular to the optical axis (parallel to the imaging surface). This inclination prevents the infrared light transmitted through the reflection type infrared cut filter 13, reflected on the light receiving surface of the image sensor 11, and further reflected by the filter 13 from entering the image sensor 11 again.
【００２２】図５は、反射型赤外カットフィルタ１３の
傾きを如何にして設定するかを説明するための図であ
る。ここでは、計算を簡単にするために、テレセントリ
ック光学系を仮定し、また主光線について解析する。FIG. 5 is a diagram for explaining how the inclination of the reflection type infrared cut filter 13 is set. Here, in order to simplify the calculation, a telecentric optical system is assumed and the principal ray is analyzed.
【００２３】反射型赤外カットフィルタ１３を透過し撮
像素子１１の受光面１４で反射し、さらに反射型赤外カ
ットフィルタ１３のフィルタ面１５で反射した光が再度
受光面１４に入らないためには、受光面１４の最上部で
反射しフィルタ面１５で再反射した光が受光面１４の最
下部よりも下に進行すればよいことから、フィルタ面１
５の傾きをθ、受光面１４の高さをｈ、フィルタ面１５
から受光面１４までの距離をｄとしたとき、 ｄ・ｔａｎ２θ≧ｈ を満たすようにθを定めればよい。θ＝４５度であれば
ｄ及びｈの値に拘わらずこの条件を満たすことができる
から、この場合を第１の実施形態の一つの好適実施例と
して挙げることができる。これに対して、この式が許す
範囲でθをなるべく小さな値、例えばθ＝｛ｔａｎ
-1（ｈ／ｄ）｝／２とすれば、フィルタを傾けるために
必要な光軸方向のスペースをより小さくすることができ
るから、これはまた第１の実施形態の他の一つの好適実
施例である。The light transmitted through the reflection type infrared cut filter 13 and reflected by the light receiving surface 14 of the image sensor 11 and further reflected by the filter surface 15 of the reflection type infrared cut filter 13 does not enter the light receiving surface 14 again. Since the light reflected at the uppermost portion of the light receiving surface 14 and re-reflected by the filter surface 15 only needs to travel below the lowermost portion of the light receiving surface 14, the filter surface 1
5 is θ, the height of the light receiving surface 14 is h, and the filter surface 15 is
When the distance from to the light receiving surface 14 is d, θ may be determined so as to satisfy d · tan2θ ≧ h. If θ = 45 degrees, this condition can be satisfied irrespective of the values of d and h, and this case can be cited as one preferred example of the first embodiment. On the other hand, θ is as small as possible within the range permitted by this equation, for example, θ = ｛tan
-1 (h / d)｝ / 2, so that the space in the direction of the optical axis required for tilting the filter can be made smaller, which is also another preferred embodiment of the first embodiment. It is an example.
【００２４】このように本実施形態によれば、撮像素子
１１とレンズ１２との間に挿入された反射型赤外カット
フィルタ１３を撮像素子１１の撮像面１４に対して傾け
て配置することにより、撮像面１４で反射されフィルタ
面１５で再反射した光が再び撮像面１４に戻るのを防止
することができる。このため、反射型赤外カットフィル
タ１３を用いてもカットオフ光によるゴースト発生を防
止することができる。また、格別の構成を付加する必要
はなく、反射型カットフィルタ１３を傾けるのみの簡易
な構成で実現し得る利点がある。As described above, according to the present embodiment, the reflection type infrared cut filter 13 inserted between the image pickup device 11 and the lens 12 is arranged to be inclined with respect to the image pickup surface 14 of the image pickup device 11. In addition, it is possible to prevent the light reflected on the imaging surface 14 and re-reflected on the filter surface 15 from returning to the imaging surface 14 again. For this reason, even if the reflection type infrared cut filter 13 is used, it is possible to prevent the ghost from occurring due to the cutoff light. Further, there is an advantage that it is not necessary to add a special configuration, and the configuration can be realized by a simple configuration in which the reflection type cut filter 13 is only tilted.
【００２５】（第２の実施形態）図６は、本発明の第２
の実施形態に係わる撮像装置の光学系構成を示す図であ
る。なお、図１と同一部分には同一符号を付して、その
詳しい説明は省略する。(Second Embodiment) FIG. 6 shows a second embodiment of the present invention.
FIG. 2 is a diagram illustrating an optical system configuration of an imaging apparatus according to the embodiment. The same parts as those in FIG. 1 are denoted by the same reference numerals, and detailed description thereof will be omitted.
【００２６】本実施形態では、反射型赤外カットフィル
タ１３を４５度傾け、被写体側から来た光の一部をこの
フィルタ１３で反射し光学ファインダに導いている。つ
まり、反射型赤外カットフィルタ１３を光学ファインダ
のためのハーフミラーとして用いている。In the present embodiment, the reflection type infrared cut filter 13 is inclined by 45 degrees, and a part of the light coming from the subject side is reflected by the filter 13 and guided to the optical finder. That is, the reflection type infrared cut filter 13 is used as a half mirror for an optical finder.
【００２７】ここで、反射型赤外カットフィルタ１３の
透過率特性を、図７に示すように、６２０ｎｍまでは７
０％とし、それを越えると急激に小さくなるようにすれ
ば、約７割の光は撮像素子１１の受光面１４側に入り、
通常通りの撮像が可能であり、約３割の光はファインダ
側に入り、被写体像を確認することができる。なおこの
場合、ファインダから見た像は若干赤くなるが、被写体
像の確認のためには殆ど問題とならない。Here, as shown in FIG. 7, the transmittance characteristic of the reflection type infrared cut filter 13 is 7 to 620 nm.
If it is set to 0%, and if it exceeds this value, about 70% of the light enters the light receiving surface 14 side of the image sensor 11,
Normal imaging is possible, and about 30% of the light enters the finder side, so that the subject image can be confirmed. In this case, although the image viewed from the viewfinder becomes slightly red, there is almost no problem in confirming the subject image.
【００２８】このように本実施形態によれば、先に説明
した第１の実施形態と同様の効果が得られるのは勿論の
こと、反射型赤外カットフィルタ１３を光学ファインダ
のためのハーフミラーとして用いることができ、これに
より構成の簡略化をはかることができる。As described above, according to this embodiment, the same effects as those of the first embodiment can be obtained, and the reflection type infrared cut filter 13 can be replaced with a half mirror for an optical finder. , Which can simplify the configuration.
【００２９】なお、本発明は上述した各実施形態に限定
されるものではない。反射型赤外カットフィルタのカッ
トオフ波長は６３０ｎｍに限定されるものではなく、使
用する撮像素子の特性に応じて適宜変更可能である。ま
た、撮像素子はＣＣＤに限るものではなく、仕様に応じ
て適宜変更可能である。The present invention is not limited to the above embodiments. The cut-off wavelength of the reflection type infrared cut filter is not limited to 630 nm, but can be appropriately changed according to the characteristics of the imaging device to be used. Further, the image pickup device is not limited to the CCD, but can be appropriately changed according to specifications.
【００３０】また、図８に示すように、一眼レフファイ
ンダにおいてクイックリターンミラー３１を用いる場
合、ミラー３１の下の空きスペースに、例えば４５度の
板状部材の形で反射型赤外カットフィルタ１３を挿入す
れば、フィルタを傾けるために光軸方向のスペースを新
たに必要としないため極めて好適である。その他、本発
明の要旨を逸脱しない範囲で、種々変形して実施するこ
とができる。As shown in FIG. 8, when the quick return mirror 31 is used in the single-lens reflex finder, the reflection type infrared cut filter 13 is formed in an empty space below the mirror 31 in the form of, for example, a 45-degree plate member. Is very preferable because no additional space in the optical axis direction is required to tilt the filter. In addition, various modifications can be made without departing from the scope of the present invention.
【００３１】[0031]
【発明の効果】以上詳述したように本発明によれば、撮
像素子の受光面に入射する光の分光特性を調節するため
の反射型赤外カットフィルタを撮像面に対して傾けて配
置することにより、受光面における反射光がフィルタで
反射して再度受光面に入るのを防止でき、反射型赤外カ
ットフィルタを用いてもカットオフ光によるゴースト発
生を無くすことができる。As described above in detail, according to the present invention, a reflection type infrared cut filter for adjusting a spectral characteristic of light incident on a light receiving surface of an image pickup device is arranged to be inclined with respect to the image pickup surface. Thereby, it is possible to prevent the reflected light on the light receiving surface from being reflected by the filter and entering the light receiving surface again, and it is possible to eliminate the occurrence of ghost due to the cut-off light even if a reflection type infrared cut filter is used.
【図１】撮像素子と集光レンズとの間に反射型赤外カッ
トフィルタを挿入した従来例を示す図。FIG. 1 is a diagram showing a conventional example in which a reflection type infrared cut filter is inserted between an image sensor and a condenser lens.
【図２】反射型赤外カットフィルタの光学特性を示す
図。FIG. 2 is a diagram showing optical characteristics of a reflection type infrared cut filter.
【図３】図１の構成においてゴースト像を発生する様子
を示す図。FIG. 3 is a diagram showing how a ghost image is generated in the configuration of FIG. 1;
【図４】第１の実施形態に係わる撮像装置の光学系構成
を示す図。FIG. 4 is a diagram showing an optical system configuration of the imaging apparatus according to the first embodiment.
【図５】第１の実施形態において反射型赤外カットフィ
ルタの傾きを如何にして設定するかを説明するための
図。FIG. 5 is a view for explaining how to set the inclination of the reflection type infrared cut filter in the first embodiment.
【図６】第２の実施形態に係わる撮像装置の光学系構成
を示す図。FIG. 6 is a diagram showing an optical system configuration of an imaging device according to a second embodiment.
【図７】第２の実施形態に用いた反射型赤外カットフィ
ルタの光学特性を示す図。FIG. 7 is a diagram showing optical characteristics of a reflection type infrared cut filter used in the second embodiment.
【図８】本発明の変形例を示す図。FIG. 8 is a diagram showing a modification of the present invention.
１１…ＣＣＤ撮像素子 １２…集光レンズ １３，２３…反射型赤外カットフィルタ １４…受光面（撮像面） １５…フィルタ面 ３１…クイックリターンミラー DESCRIPTION OF SYMBOLS 11 ... CCD imaging device 12 ... Condensing lens 13, 23 ... Reflection type infrared cut filter 14 ... Light receiving surface (imaging surface) 15 ... Filter surface 31 ... Quick return mirror
───────────────────────────────────────────────────── フロントページの続き (72)発明者 吉田 英明 東京都渋谷区幡ヶ谷２丁目43番２号 オリ ンパス光学工業株式会社内 Ｆターム(参考） 2H048 FA01 FA13 FA22 2H054 AA01 BB00 5C022 AB13 AC02 AC09 AC42 AC51 AC54 AC55 ────────────────────────────────────────────────── ─── Continuing on the front page (72) Inventor Hideaki Yoshida 2-43-2 Hatagaya, Shibuya-ku, Tokyo Olympus Optical Industrial Co., Ltd. F-term (reference) 2H048 FA01 FA13 FA22 2H054 AA01 BB00 5C022 AB13 AC02 AC09 AC42 AC51 AC54 AC55
Claims (4)
像面に結像する撮像光学系と、前記撮像光学系と撮像素
子との間に介挿された前記撮像面に入射する光の分光特
性を調節するための反射型赤外カットフィルタとを具備
してなり、 前記反射型赤外カットフィルタは、そのカットオフ周波
数が前記撮像素子の有効感度領域にあり、且つ前記撮像
面に対して傾けて配置されたものであることを特徴とす
る撮像装置。An image pickup device, an image pickup optical system for forming a subject image on an image pickup surface of the image pickup device, and a light incident on the image pickup surface interposed between the image pickup optical system and the image pickup device. A reflective infrared cut filter for adjusting spectral characteristics, wherein the reflective infrared cut filter has a cutoff frequency in an effective sensitivity region of the image sensor, and An imaging apparatus characterized in that the imaging apparatus is arranged to be inclined.
素子との傾け角θは、傾け方向に対する撮像面長さを
ｈ、フィルタ反射面と撮像面との距離をｄとしたとき、 ｔａｎ２θ≧ｈ／ｄ を満たすものであることを特徴とする請求項１記載の撮
像装置。2. An inclination angle θ between the reflection type infrared cut filter and the image pickup device is as follows: tan2θ ≧ tan, where h is the length of the imaging surface with respect to the inclination direction, and d is the distance between the filter reflection surface and the imaging surface. The imaging device according to claim 1, wherein h / d is satisfied.
素子との傾け角θは、４５度であることを特徴とする請
求項１記載の撮像装置。3. The image pickup apparatus according to claim 1, wherein an inclination angle θ between the reflection type infrared cut filter and the image pickup device is 45 degrees.
ンダ用分岐可視ハーフミラーと兼用したことを特徴とす
る請求項１〜３の何れかに記載の撮像装置。4. The imaging apparatus according to claim 1, wherein said reflection type infrared cut filter is also used as a finder branch visible half mirror.
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|---|---|---|---|
| JP2000022759A JP4323048B2 (en) | 2000-01-31 | 2000-01-31 | Imaging device |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000022759A JP4323048B2 (en) | 2000-01-31 | 2000-01-31 | Imaging device |
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|---|---|---|---|
| JP2000022759A Expired - Fee Related JP4323048B2 (en) | 2000-01-31 | 2000-01-31 | Imaging device |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2913112A1 (en) * | 2007-02-28 | 2008-08-29 | Horiba Jobin Yvon Soc Par | Inclined detector window spectrograph, has detector detecting diffracted light beam, and inclination unit provided with inclined detector window, where inclination unit inclines slot to avoid parasite spectrum |
| JP2013172304A (en) * | 2012-02-21 | 2013-09-02 | Canon Inc | Imaging device |
| WO2015087594A1 (en) * | 2013-12-13 | 2015-06-18 | コニカミノルタ株式会社 | Spectroscopic unit and spectroscopic device using same |
| JPWO2015012120A1 (en) * | 2013-07-23 | 2017-03-02 | ソニー株式会社 | Imaging device |
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2000
- 2000-01-31 JP JP2000022759A patent/JP4323048B2/en not_active Expired - Fee Related
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2913112A1 (en) * | 2007-02-28 | 2008-08-29 | Horiba Jobin Yvon Soc Par | Inclined detector window spectrograph, has detector detecting diffracted light beam, and inclination unit provided with inclined detector window, where inclination unit inclines slot to avoid parasite spectrum |
| EP1965183A1 (en) * | 2007-02-28 | 2008-09-03 | Horiba Jobin Yvon S.A.S. | Spectrograph with tilted detector window |
| JP2013172304A (en) * | 2012-02-21 | 2013-09-02 | Canon Inc | Imaging device |
| JPWO2015012120A1 (en) * | 2013-07-23 | 2017-03-02 | ソニー株式会社 | Imaging device |
| US10368009B2 (en) | 2013-07-23 | 2019-07-30 | Sony Corporation | Imaging apparatus |
| WO2015087594A1 (en) * | 2013-12-13 | 2015-06-18 | コニカミノルタ株式会社 | Spectroscopic unit and spectroscopic device using same |
| EP3067672A4 (en) * | 2013-12-13 | 2017-08-09 | Konica Minolta, Inc. | Spectroscopic unit and spectroscopic device using same |
| US9841323B2 (en) | 2013-12-13 | 2017-12-12 | Konica Minolta, Inc. | Spectroscopic unit and spectroscopic device using same |
Also Published As
| Publication number | Publication date |
|---|---|
| JP4323048B2 (en) | 2009-09-02 |
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