JP2000258397A - Nondestructive inspection device of pipe - Google Patents
Nondestructive inspection device of pipeInfo
- Publication number
- JP2000258397A JP2000258397A JP6284399A JP6284399A JP2000258397A JP 2000258397 A JP2000258397 A JP 2000258397A JP 6284399 A JP6284399 A JP 6284399A JP 6284399 A JP6284399 A JP 6284399A JP 2000258397 A JP2000258397 A JP 2000258397A
- Authority
- JP
- Japan
- Prior art keywords
- pipe
- probes
- pitch
- pipe axis
- probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Abstract
Description
【０００１】[0001]
【発明の属する技術分野】本発明は、管の非破壊検査装
置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a non-destructive pipe inspection apparatus.
【０００２】[0002]
【従来の技術】シームレス鋼管等の欠陥を非破壊検査す
る装置は、管の外周に０．３ｍｍ程度の隙間をあけて外
嵌する回転リング状体に、管軸方向に多数本連設した細
径のプローブをプローブの長手方向が管軸に直角になる
ように配設して取付けている。この回転リング状体を毎
分１０００回転程度の回転数で回転させ、その中を管を
軸方向に通過させて管の表面の傷の有無を検査する。こ
の細径のプローブは直径２ｍｍφ程度のフェライトコア
に高周波巻線を巻いたプローブであって、被覆を含めて
直径約４ｍｍφとなり、４ｍｍのピッチで管軸に平行に
密に並べられている。従来このようなプローブはピッチ
が約１０ｍｍであったが、小さい傷を検出することがで
きるように、プローブのピッチをできるだけ小さくする
ために、細径のプローブの開発と改善が続けられてき
た。しかしこのプローブの配設ピッチをさらに小さくす
ることは困難な限界に達している。そして直径４ｍｍφ
のプローブでは、軸方向長さ約８ｍｍまでの傷を検出す
ることが限度であり、これより短い傷を確実に検出する
ことはできなかった。2. Description of the Related Art An apparatus for non-destructively inspecting a defect of a seamless steel pipe or the like is provided with a plurality of thin ring-shaped bodies continuously fitted in a pipe axis direction on a rotating ring-shaped body which is externally fitted with a gap of about 0.3 mm on the outer circumference of the pipe. A probe having a diameter is arranged and attached such that the longitudinal direction of the probe is perpendicular to the tube axis. The rotating ring-shaped body is rotated at a rotation speed of about 1000 rotations per minute, and the tube is passed through the tube in the axial direction to inspect the surface of the tube for flaws. This small-diameter probe is a probe in which a high-frequency winding is wound around a ferrite core having a diameter of about 2 mmφ, and has a diameter of about 4 mmφ including the coating, and is densely arranged parallel to the tube axis at a pitch of 4 mm. Conventionally, such a probe has a pitch of about 10 mm. However, in order to detect a small flaw, a probe with a small diameter has been developed and improved in order to make the pitch of the probe as small as possible. However, it has reached a difficult limit to further reduce the arrangement pitch of the probes. And diameter 4mmφ
With the probe of the above, the limit of detecting a flaw up to an axial length of about 8 mm was a limit, and a flaw shorter than this could not be reliably detected.
【０００３】[0003]
【発明が解決しようとする課題】しかし、近年さらに小
さい傷が問題となるケースが生じ、非破壊検査装置でさ
らに小さい表面傷を精度よく検出することが要請されて
いる。However, in recent years, there have been cases where even smaller flaws become a problem, and there is a demand for non-destructive inspection equipment to detect smaller surface flaws with higher accuracy.
【０００４】本発明は上記問題点を解決し、軸方向長さ
３ｍｍ以下の傷を確実に検出することができる管の非破
壊検査装置を開発し、これを提供することを目的とする
ものである。An object of the present invention is to solve the above-mentioned problems and to develop and provide a non-destructive pipe inspection apparatus capable of reliably detecting a flaw having an axial length of 3 mm or less. is there.
【０００５】[0005]
【課題を解決するための手段】本発明は、上記問題点を
解決するためになされたもので、その技術手段は、管の
非破壊検査装置において、管軸方向に連設したプローブ
を円周方向にＮ列設け、該Ｎ列のそれぞれの連設プロー
ブの管軸方向位置をプローブの連設ピッチのＮ分の１ず
つ相互に管軸方向にずらして配設したことを特徴とする
管の非破壊検査装置である。但し、Ｎは２以上の整数と
する。SUMMARY OF THE INVENTION The present invention has been made to solve the above-mentioned problems, and its technical means is to provide a non-destructive inspection apparatus for a pipe in which a probe connected in the axial direction of the pipe is provided. N rows are provided in the direction, and the positions in the pipe axis direction of the respective consecutively arranged probes in the N rows are displaced from each other in the pipe axis direction by 1 / N of the continuous pitch of the probes. It is a non-destructive inspection device. Here, N is an integer of 2 or more.
【０００６】[0006]
【発明の実施の形態】以下図面を参照して本発明の実施
の形態を説明する。Embodiments of the present invention will be described below with reference to the drawings.
【０００７】図１に示すように、管の非破壊検査装置１
は、管１０の外周にハードメタル又はセラミックシュー
２を介して、管外周との間に０．３ｍｍ程度の隙間をあ
けて外嵌する回転リング状体に、管軸方向に連設した細
径の多数のプローブ３を配設したものである。As shown in FIG. 1, a non-destructive pipe inspection apparatus 1
Is a small diameter continuously provided in the pipe axis direction on a rotating ring-shaped body which is fitted around the outer circumference of the pipe 10 with a gap of about 0.3 mm between the outer circumference of the pipe and a hard metal or ceramic shoe 2. Are provided with a large number of probes 3.
【０００８】この細径のプローブ３は直径２ｍｍφ程度
のフェライトコアに８ｋＨｚの高周波電流を流す高周波
巻線を巻いたプローブであって、被覆を含めて管軸方向
に約４ｍｍのピッチで連設されている。従来このプロー
ブ３は回転リング状体の円周方向１ヶ所に設けられてい
たが、本発明の管の非破壊検査装置１では、図２に示す
ように円周方向にＮ列（図２の例では４列のプローブ３
ａ，３ｂ，３ｃ，３ｄ）を配設している。そしてこの各
プローブ３ａ，３ｂ，３ｃ，３ｄはＮ分の１ピッチず
つ、すなわち図２では４分の１ピッチずつ管軸方向にず
らして取付ける。この結果全体ではプローブ３をピッチ
１ｍｍで連設したのと同様になり、この装置で検出でき
る傷の長さは従来８ｍｍ程度であったが、長さ１．５ｍ
ｍ程度まで検出可能となった。The small-diameter probe 3 is a probe in which a high-frequency winding for passing a high-frequency current of 8 kHz is wound around a ferrite core having a diameter of about 2 mmφ, and is continuously provided at a pitch of about 4 mm in the tube axis direction including the coating. ing. Conventionally, this probe 3 is provided at one location in the circumferential direction of the rotating ring-shaped body. However, in the pipe nondestructive inspection apparatus 1 of the present invention, as shown in FIG. In the example, four rows of probes 3
a, 3b, 3c, 3d). The probes 3a, 3b, 3c, 3d are mounted at a pitch of 1 / N, that is, shifted by a quarter pitch in FIG. 2 in the tube axis direction. As a result, it is the same as when the probes 3 are continuously connected at a pitch of 1 mm. The length of a flaw that can be detected by this device was about 8 mm in the past, but was 1.5 m in length.
m can be detected.
【０００９】[0009]
【実施例】図４は従来のプローブ３の配列を示すもので
プローブのピッチ４ｍｍである。図３は、これを２列と
し、２分の１ピッチずつ管軸方向にずらして配設したも
のである。その結果プローブ３の管軸方向配設ピッチは
２ｍｍとなった。図３の例では２列のプローブ３ａ，３
ｂは近接して設けられているが図２に示すように円周上
の離れた位置に設けてもよい。FIG. 4 shows an arrangement of a conventional probe 3 having a probe pitch of 4 mm. FIG. 3 shows two rows of these, which are arranged so as to be shifted in the tube axis direction by a half pitch. As a result, the arrangement pitch of the probe 3 in the tube axis direction was 2 mm. In the example of FIG. 3, two rows of probes 3a, 3
Although b is provided in the vicinity, it may be provided at a distant position on the circumference as shown in FIG.
【００１０】図３のプローブ配置とした非破壊検査装置
は図４に示すプローブ配置の装置に対して探傷速度は２
分の１となるが傷検出長さは８ｍｍ（１００％）から３
ｍｍ（１００％／−３ｄＢ）となった。The nondestructive inspection apparatus having the probe arrangement shown in FIG. 3 has a flaw detection speed of 2 compared to the apparatus having the probe arrangement shown in FIG.
The length of flaw detection is reduced from 8 mm (100%) to 3
mm (100% /-3 dB).
【００１１】図５は図３、図４に示すプローブ配列の差
異をテストした直径２５．４ｍｍφの試験パイプ１１で
ある。深さ０．１５ｍｍ、長さがそれぞれＬ＝３，５，
８，１０，２５ｍｍの傷を人工的に表面に設けた。これ
を図３、図４に示すプローブ配列の非破壊検査装置１で
測定した。１０回のテストの結果、傷検出の度数を調べ
図６に示した。検出回数は図４に示す従来型ではＬ＝３
ｍｍのとき５回（５０％）、Ｌ＝５ｍｍのとき６回（６
０％）、Ｌ＝８ｍｍのとき９回（９０％）、Ｌ＝１０ｍ
ｍ、Ｌ＝２５ｍｍのとき１０回（１００％）であった。
これに比し図３のプローブ配列とした短傷用の非破壊検
査装置では、Ｌ＝３ｍｍの傷で１０回（１００％）、こ
れより長い傷は問題なく１００％検出した。FIG. 5 shows a test pipe 11 having a diameter of 25.4 mmφ for testing the difference between the probe arrangements shown in FIGS. 0.15mm depth and L = 3,5 respectively
8, 10, 25 mm flaws were artificially provided on the surface. This was measured by the probe array nondestructive inspection device 1 shown in FIGS. As a result of the ten tests, the frequency of flaw detection was determined and shown in FIG. The number of detections is L = 3 in the conventional type shown in FIG.
5 times (50%) at 6 mm, and 6 times (6%) at L = 5 mm
0%), 9 times (90%) when L = 8 mm, L = 10 m
It was 10 times (100%) when m and L = 25 mm.
On the other hand, in the non-destructive inspection device for short scratches having the probe array shown in FIG. 3, a scratch of L = 3 mm was detected 10 times (100%), and a scratch longer than this was detected 100% without any problem.
【００１２】図７、図８は計算モデルによる欠陥検出確
率を示すもので漏洩磁束が正規分布すると仮定し検出確
率を計算した結果を示すもので、欠陥長さｍｍと検出レ
ベル％と確率％を示した図である。図８に示すように、
図４のプローブ配置では欠陥長さ８ｍｍ以上は１００％
検出するが８ｍｍ未満では確率が小さい。図３に示すプ
ローブ配列の例では図７に示すように長さＬ＝１ｍｍで
検出確率約５０％、Ｌ＝３ｍｍ以上では確率１００％で
あることを示している。FIGS. 7 and 8 show the defect detection probability by the calculation model, and show the result of calculation of the detection probability assuming that the leakage magnetic flux has a normal distribution. The defect length mm, the detection level% and the probability% are shown in FIG. FIG. As shown in FIG.
In the probe arrangement shown in FIG. 4, 100% is used when the defect length is 8 mm or more.
Although it is detected, if it is less than 8 mm, the probability is small. In the example of the probe array shown in FIG. 3, as shown in FIG. 7, the detection probability is about 50% when the length L is 1 mm, and the probability is 100% when the length L is 3 mm or more.
【００１３】[0013]
【発明の効果】本発明の管の非破壊検査装置は以上のよ
うに構成されているので、管の表面傷が従来より小さい
ものを確実に検出することが可能となるという優れた効
果を奏する。The pipe non-destructive inspection apparatus of the present invention is configured as described above, and has an excellent effect that it is possible to reliably detect a pipe having a smaller surface flaw than the conventional one. .
【図１】実施例の管の非破壊検査装置を示す模式断面図
である。FIG. 1 is a schematic sectional view showing a non-destructive pipe inspection apparatus according to an embodiment.
【図２】実施例の管の非破壊検査装置を示す模式正面図
である。FIG. 2 is a schematic front view showing a non-destructive pipe inspection apparatus according to an embodiment.
【図３】実施例のプローブ配列を示す説明図である。FIG. 3 is an explanatory diagram showing a probe sequence of an example.
【図４】従来例のプローブ配列を示す説明図である。FIG. 4 is an explanatory view showing a conventional probe arrangement.
【図５】試験パイプの側面図である。FIG. 5 is a side view of a test pipe.
【図６】試験結果を示す比較グラフである。FIG. 6 is a comparative graph showing test results.
【図７】実施例の検出レベルと確率を示す図である。FIG. 7 is a diagram showing detection levels and probabilities in the embodiment.
【図８】従来例の検出レベルと確率を示す図である。FIG. 8 is a diagram showing a detection level and a probability in a conventional example.
１ 非破壊検査装置 ２ シュー ３ プローブ １０ 管 １１ テストパイプ DESCRIPTION OF SYMBOLS 1 Non-destructive inspection apparatus 2 Shoe 3 Probe 10 Tube 11 Test pipe
Claims (1)
連設したプローブを円周方向にＮ列設け、該Ｎ列のそれ
ぞれの連設プローブの管軸方向位置をプローブの連設ピ
ッチのＮ分の１ずつ相互に管軸方向にずらして配設した
ことを特徴とする管の非破壊検査装置。但し、Ｎは２以
上の整数とする。In a non-destructive inspection apparatus for a pipe, N rows of probes connected in the pipe axis direction are provided in the circumferential direction, and the position of each of the N rows of connected probes in the pipe axis direction is determined by the pitch of the connected probes. A non-destructive inspection apparatus for pipes, wherein the pipes are mutually displaced in the pipe axis direction by 1 / N. Here, N is an integer of 2 or more.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6284399A JP2000258397A (en) | 1999-03-10 | 1999-03-10 | Nondestructive inspection device of pipe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6284399A JP2000258397A (en) | 1999-03-10 | 1999-03-10 | Nondestructive inspection device of pipe |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JP2000258397A true JP2000258397A (en) | 2000-09-22 |
Family
ID=13212005
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6284399A Pending JP2000258397A (en) | 1999-03-10 | 1999-03-10 | Nondestructive inspection device of pipe |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2000258397A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007205826A (en) * | 2006-02-01 | 2007-08-16 | Hitachi Building Systems Co Ltd | Wire rope flaw detector |
| JP2013064668A (en) * | 2011-09-20 | 2013-04-11 | Ihi Inspection & Instrumentation Co Ltd | Method for analyzing defect detection probability by ultrasonic test |
| JP2016500812A (en) * | 2012-10-15 | 2016-01-14 | マグカム ナムローゼ フェンノートシャップＭａｇＣａｍ ＮＶ | Apparatus and method for determining magnetic field distribution of magnet along main surface of magnet |
-
1999
- 1999-03-10 JP JP6284399A patent/JP2000258397A/en active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007205826A (en) * | 2006-02-01 | 2007-08-16 | Hitachi Building Systems Co Ltd | Wire rope flaw detector |
| JP2013064668A (en) * | 2011-09-20 | 2013-04-11 | Ihi Inspection & Instrumentation Co Ltd | Method for analyzing defect detection probability by ultrasonic test |
| JP2016500812A (en) * | 2012-10-15 | 2016-01-14 | マグカム ナムローゼ フェンノートシャップＭａｇＣａｍ ＮＶ | Apparatus and method for determining magnetic field distribution of magnet along main surface of magnet |
| US9797964B2 (en) | 2012-10-15 | 2017-10-24 | Magcam Nv | Devices and methods for determining a magnetic field distribution of a magnet along a main surface of said magnet |
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| Date | Code | Title | Description |
|---|---|---|---|
| A02 | Decision of refusal |
Effective date: 20031224 Free format text: JAPANESE INTERMEDIATE CODE: A02 |