JP2000010627A - Method and device for detecting abnormal value of measuring instrument - Google Patents

Method and device for detecting abnormal value of measuring instrument

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Publication number
JP2000010627A
JP2000010627A JP17108598A JP17108598A JP2000010627A JP 2000010627 A JP2000010627 A JP 2000010627A JP 17108598 A JP17108598 A JP 17108598A JP 17108598 A JP17108598 A JP 17108598A JP 2000010627 A JP2000010627 A JP 2000010627A
Authority
JP
Japan
Prior art keywords
value
measuring
difference
same type
measuring instrument
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
JP17108598A
Other languages
Japanese (ja)
Inventor
Kazuya Hirabayashi
和也 平林
Toshinori Kanetani
利憲 金谷
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yaskawa Electric Corp
Original Assignee
Yaskawa Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yaskawa Electric Corp filed Critical Yaskawa Electric Corp
Priority to JP17108598A priority Critical patent/JP2000010627A/en
Publication of JP2000010627A publication Critical patent/JP2000010627A/en
Abandoned legal-status Critical Current

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  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Testing And Monitoring For Control Systems (AREA)

Abstract

PROBLEM TO BE SOLVED: To highly accurately detect the abnormal value of a measuring instrument by correcting the delay time of values measured by the same kind of measuring instruments through a time difference arithmetic unit provided between a measured value storage device and a same-kind measuring instrument difference arithmetic unit and comparing a difference between a discrimination reference value and the newly measured values of the same kind of measuring instruments. SOLUTION: A time difference arithmetic unit 6 calculates a time difference between the same kind of measuring instruments caused by stagnation time inside a plant. A same-kind measuring instrument difference arithmetic unit 7 corrects the measured value stored in a measured value storage device 5 with the time difference provided by the time difference arithmetic unit 6 and finds a difference between the same kind of measuring instruments while considering the time difference. A discrimination reference value storage device 10 stores the discrimination reference value provided by a discrimination reference value arithmetic unit 9. An abnormal value discriminating device 11 compares the difference between the same kind of measuring instruments provided by the same-kind measuring instrument difference arithmetic unit 9 with the discrimination reference value stored in the discrimination reference value storage device 10 and discriminates whether it is abnormality or not. A display device 12 displays the result provided by an abnormality discrimination value 11 on a screen.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、上下水道処理装置
などのプラントにおいて使用される計測器の異常を検出
する異常値検出方法およびその装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an abnormal value detecting method and an abnormal value detecting method for detecting an abnormality of a measuring instrument used in a plant such as a water and sewage treatment apparatus.

【0002】[0002]

【従来の技術】上下水道処理装置などのプラントでは、
プラントに設置された多数の計測器を中央監視室で監視
しており、それぞれの計測器に異常が発生したとき、同
種の計測器の差との比較から計測器の異常値検出を行っ
ていた。従来、計測器の異常値検出装置として図5に示
すようなものがある。図5は下水処理システムにおける
ブロック図である。汚濁物質を含む下水は、管路1より
最初沈澱池2に導入し、汚濁物質の中の沈降しやすいも
のを沈降分離し、上澄水を曝気槽3に流出する。曝気槽
3では最終沈澱池4から引き抜いた返送汚泥が管路24
を介して返送されるとともに、散気管( 図示せず) より
曝気槽3内にブロワー( 図示せず) から圧送された空気
が供給され、汚濁物質は活性汚泥により吸着、分解され
最終沈澱池に導かれる。最終沈澱池では活性汚泥を沈降
分離し、清澄水は処理水として管路25から滅菌槽( 図
示せず) を経て放流され、沈澱した汚泥は曝気槽3に返
送され、その一部は汚泥処理プロセス( 図示せず) に送
られ処理するようにしている。13は流入下水流量計、
14は流入水のpH計、15は流入水の懸濁物質濃度
計、16は曝気槽流入水のUV計、17はDO計、18
はMLSS濃度計、19は水温計、20は酸化還元電位
計、21は処理水のpH計、22は処理水の懸濁物質濃
度計、23は処理水のUV計である。このように下水処
理プラントにおいては、プラントを適切に運転するため
に各種の水質データを計測、収集することが通常行われ
ている。下水処理プラントの運転において、計測値が異
常な値を示した時、運転員は同種の計測器の動きを参照
する。すなわち、ある系列のMLSS濃度が上昇した場
合に、他の処理系のMLSS濃度がどのような値を示し
ているかチェックする。その結果、一つの計測器のみが
異常な値を示していればその計測器単独の異常として調
査を行い、一方同種類の計測器も同じ動きを示していれ
ば、プラントの状態について調べる。図5において、5
は計測値蓄積装置、7は同種類計測器差演算装置、8は
四分位数演算装置、9は判定基準値演算装置、10は判
定基準値記憶装置、11は異常値判定装置、12は表示
装置である。計測値蓄積装置5は下水処理場に取り付け
られた各計測器から収集した計測値を蓄積する。同種類
計測器演算装置7は、計測値蓄積装置5に蓄積された計
測値から同種類計測器の差を求めている。異常値検出の
計算例は (1)式のようになる。 対象データ(同種類計測器の差)=MLSS1−MLSS2・・・ (1) MLSS1:処理系列1の水路1のMLSS濃度 MLSS2:処理系列1の水路2のMLSS濃度 これは、処理系列が等しく、水路の異なる計測器を対象
としている。四分位数演算装置8は、同種類計測器の差
の四分位数(25%点、50%点、75%点) を求め
る。判定基準値演算装置9は四分位数演算装置8で得ら
れた四分位数から、ヒンジ幅1(25%点〜50%点の
距離) とヒンジ幅2(50%点〜75%点の距離) を基
準に判定基準値を直近30日のデータを使用して1日1
回設定する。四分位数基準の判定基準値の考え方につい
て以下に説明する。四分位数とは、相対累積度数の25
%点、50%点、75%点のことであり、25%点〜5
0%点の距離をヒンジ幅1、50%点〜75%点の距離
をヒンジ幅2として、2つのヒンジ幅を基準に判定基準
値を設定する。それぞれのヒンジ(25%点、75%
点) からヒンジ幅1の6倍、ヒンジ幅2の6倍離れたも
のをファーアウトと呼び異常値とする。つまり四分位数
基準による判定法では、 (2)式を満足する計測値の差を
正常値と判定する。 L<D<H ・・・・・ (2) ただし、L:25%点−(6×ヒンジ幅1)、D:同種
類計測器の差、H:75%点+(6×ヒンジ幅2)であ
る。判定基準値記憶装置10は、判定基準値演算装置で
得られた判定基準値を記憶する。異常値判定装置11は
同種類計測器演算装置21で得られた同種類計測器の差
と判定基準値記憶装置に記憶している判定基準値を比較
し、異常か否かの判定を行う異常値判定装置、表示装置
12は、異常値判定装置で得られた結果を画面に表示す
るである。従って、(1) 式で演算した各計測値の差を対
象データとし、これを四分位数基準で(2) 式によって評
価し表示していた。
2. Description of the Related Art In plants such as water and sewage treatment equipment,
Many measuring instruments installed in the plant are monitored in the central monitoring room, and when an error occurs in each measuring instrument, the abnormal value of the measuring instrument was detected by comparing with the difference of the same kind of measuring instrument . Conventionally, there is an apparatus for detecting an abnormal value of a measuring instrument as shown in FIG. FIG. 5 is a block diagram of the sewage treatment system. The sewage containing pollutants is first introduced into the sedimentation basin 2 from the pipe line 1, sedimentable sediment in the pollutants is separated, and the supernatant water flows out to the aeration tank 3. In the aeration tank 3, return sludge extracted from the final sedimentation basin 4 is supplied to a pipeline 24.
The air sent from the blower (not shown) is supplied from the blower (not shown) into the aeration tank 3 through the diffuser (not shown), and the pollutants are adsorbed and decomposed by the activated sludge, and are returned to the final settling tank. Be guided. In the final sedimentation basin, activated sludge is settled and separated, and the clarified water is discharged as treated water from a pipe 25 through a sterilization tank (not shown), and the settled sludge is returned to the aeration tank 3, and a part of the sludge is treated. It is sent to a process (not shown) for processing. 13 is an inflow sewage flow meter,
14 is a pH meter of the influent, 15 is a suspended matter concentration meter of the influent, 16 is a UV meter of the influent of the aeration tank, 17 is a DO meter, 18 is
Is an MLSS concentration meter, 19 is a water temperature meter, 20 is an oxidation-reduction potentiometer, 21 is a pH meter of treated water, 22 is a suspended matter concentration meter of treated water, and 23 is a UV meter of treated water. As described above, in a sewage treatment plant, measurement and collection of various water quality data are usually performed in order to properly operate the plant. In the operation of the sewage treatment plant, when the measured value shows an abnormal value, the operator refers to the movement of the same type of measuring device. That is, when the MLSS concentration of a certain series increases, the value of the MLSS concentration of another processing system is checked. As a result, if only one measuring device shows an abnormal value, the investigation is performed as an abnormality of the measuring device alone, while if the same type of measuring device shows the same movement, the condition of the plant is examined. In FIG. 5, 5
Is a measurement value accumulating device, 7 is the same type measuring device difference calculating device, 8 is a quartile calculating device, 9 is a criterion value calculating device, 10 is a criterion value storing device, 11 is an abnormal value determining device, and 12 is an abnormal value determining device. A display device. The measurement value accumulating device 5 accumulates measurement values collected from each measuring instrument attached to the sewage treatment plant. The same-type measuring device calculation device 7 obtains a difference between the same-type measuring devices from the measured values stored in the measured value storage device 5. A calculation example of abnormal value detection is as shown in equation (1). Target data (difference between instruments of the same type) = MLSS1−MLSS2 (1) MLSS1: MLSS concentration of waterway 1 of treatment series 1 MLSS2: MLSS concentration of waterway 2 of treatment series 1 It targets instruments with different waterways. The quartile arithmetic unit 8 calculates the quartiles (25% point, 50% point, 75% point) of the difference between the same type of measuring instruments. Based on the quartile obtained by the quartile calculator 8, the criterion value calculator 9 determines the hinge width 1 (distance between 25% point and 50% point) and hinge width 2 (50% point to 75% point). Distance) based on the data of the last 30 days.
Set times. The concept of the quartile-based criterion value will be described below. The quartile is the relative cumulative frequency of 25
% Point, 50% point, 75% point, 25% point to 5%
Assuming that the distance at the 0% point is a hinge width 1 and the distance between the 50% point and the 75% point is a hinge width 2, a judgment reference value is set based on the two hinge widths. Each hinge (25% point, 75%
A point that is 6 times the hinge width 1 and 6 times the hinge width 2 from the point) is called far-out and is regarded as an abnormal value. That is, in the determination method based on the quartile, the difference between the measured values satisfying the expression (2) is determined as a normal value. L <D <H (2) where, L: 25% point− (6 × hinge width 1), D: difference between instruments of the same type, H: 75% point + (6 × hinge width 2) ). The criterion value storage device 10 stores the criterion value obtained by the criterion value calculation device. The abnormal value judging device 11 compares the difference between the same type of measuring instruments obtained by the same type measuring device computing device 21 with the judging reference value stored in the judging reference value storage device to judge whether or not there is an abnormality. The value determination device and the display device 12 display a result obtained by the abnormal value determination device on a screen. Therefore, the difference between the measured values calculated by equation (1) was used as the target data, which was evaluated and displayed by equation (2) on a quartile basis.

【0003】[0003]

【発明が解決しようとする課題】ところが、従来の計測
器の異常値検出装置では、処理系列や水路が異なっても
水理工学的に同様な位置に設置された計測器についての
み、同種類計測器による異常値検出を行っていたので、
適用できる計測器の種類が一部に限定されていた。ま
た、時間変動を考慮した計測器の異常値検出ができなか
ったため、異常値の検出の精度が悪かった。そこで、本
発明は計測器の種類が制限されずかつ、検出精度の高い
計測器の異常値検出方法およびその装置を提供する。
However, in the conventional apparatus for detecting an abnormal value of a measuring instrument, the same type of measuring instrument is used only for measuring instruments which are installed at the same position in terms of hydraulic engineering, even if the processing sequence and the water channel are different. The abnormal value was detected by the
The types of measuring instruments that can be applied were limited in part. In addition, since the abnormal value of the measuring instrument could not be detected in consideration of the time variation, the accuracy of detecting the abnormal value was poor. Therefore, the present invention provides a method and apparatus for detecting an abnormal value of a measuring instrument which is not limited in the type of the measuring instrument and has high detection accuracy.

【0004】[0004]

【課題を解決するための手段】上記問題を解決するた
め、本発明は、プラントの各処理工程に設置された各種
の計測器から出力される計測値を計測値蓄積装置に蓄積
し、前記計測値蓄積装置に蓄積された計測値から同種類
の計測器の測定値の差を同種類計測器差演算装置で演算
し、前記同種類計測器差演算装置からの同種類計測値差
データを四分位数演算装置で四分位数を演算し、前記四
分位数演算装置で得られた四分位数を基準に判定基準値
演算装置によって判定基準値を設定し、前記判定基準値
演算装置で得られた判定基準値を判定基準値記憶装置に
記憶し、前記判定基準値記憶装置の判定基準値と前記同
種類計測器演算装置で得られた計測値差データとを異常
値判定装置で異常か否かを判定する計測器の異常値検出
方法において、前記プラントの任意の処理工程の前後に
同種類の計測器を少なくとも1個設置し、前記計測値蓄
積装置と同種類計測器差演算装置との間に設けた時間差
演算装置により同種類の計測器の測定値の遅れ時間を補
正し、前記判定基準値と新しく計測された同種類計測器
の計測値との差を比較するようにしている。また、前記
判定基準値を同種類計測値の差の相対累積度数の25%
点から50点及び50%点から75%点を基準に設定し
てもよい。また、プラントの各処理工程に設置された各
種計測器から出力される計測値を蓄積する計測値蓄積装
置と、前記計測値蓄積装置に蓄積された計測値から同種
類の計測器の測定値の差を演算する同種類計測器差演算
装置と、前記同種類計測器差演算装置からの同種類計測
値差データの四分位数を演算する四分位数演算装置と、
前記四分位数演算装置で得られた四分位数を基準として
判定基準値を設定する判定基準値演算装置と、前記判定
基準値演算装置で得られた判定基準値を記憶する判定基
準値記憶装置と、前記判定基準値記憶装置の判定基準値
と前記同種類計測器演算装置で得られた計測値差データ
とを比較して、異常か否かの判定を行う異常値判定装置
と、前記異常値判定装置で得られた結果を画面に表示す
る表示装置とからなる計測器の異常値検出装置におい
て、前記プラントの任意の処理工程の前後に少なくとも
1個設置した同種類の計測器と、前記計測値蓄積装置と
同種類計測器差演算装置との間に前記同種類計測器の測
定値の遅れ時間を補正する時間差演算装置を設けた構成
にしている。上記手段により、異常値を検出できる計測
器の種類が広がり、また、計測値の時間変動を考慮した
計測器の異常値検出ができるようになるため、計測器の
異常値検出の精度が向上する。
In order to solve the above-mentioned problems, the present invention accumulates measured values output from various measuring instruments installed in each processing step of a plant in a measured value accumulating device, The difference between the measurement values of the same type of measuring device is calculated from the measurement values stored in the value storage device by the same type of measurement device difference calculation device, and the same type measurement value difference data from the same type of measurement device difference calculation device is output. A quartile is calculated by a quartile calculator, and a criterion value is set by a criterion value calculator based on the quartile obtained by the quartile calculator. The determination reference value obtained by the device is stored in a determination reference value storage device, and the determination reference value of the determination reference value storage device and the measurement value difference data obtained by the same type measurement device arithmetic device are used as an abnormal value determination device. In a method for detecting an abnormal value of a measuring instrument for determining whether or not there is an abnormality, At least one measuring device of the same type is installed before and after any runt processing step, and a measuring device of the same type is measured by a time difference calculating device provided between the measurement value accumulating device and the measuring device difference calculating device of the same type. The delay time of the measured value is corrected, and the difference between the reference value and the newly measured value of the same type of measuring device is compared. In addition, the judgment reference value is set to 25% of the relative cumulative frequency of the difference between the measurement values of the same type.
It may be set based on 50 points from the point and 75% point from the 50% point. Further, a measurement value storage device that accumulates measurement values output from various measurement devices installed in each processing step of the plant, and a measurement value of the same type of measurement device from the measurement values accumulated in the measurement value accumulation device. The same type measuring device difference calculating device for calculating the difference, the quartile calculating device for calculating the quartile of the same type measured value difference data from the same type measuring device difference calculating device,
A criterion value calculating device that sets a criterion value based on a quartile obtained by the quartile value calculating device, and a criterion value that stores a criterion value obtained by the criterion value calculating device A storage device, comparing the determination reference value of the determination reference value storage device and the measurement value difference data obtained by the same-type measuring device arithmetic device, and an abnormal value determination device that determines whether or not there is an abnormality; In the abnormal value detecting device of the measuring device comprising a display device for displaying the result obtained by the abnormal value determining device on a screen, at least one measuring device of the same type installed before and after any processing step of the plant In addition, a time difference calculating device for correcting a delay time of a measurement value of the same type measuring device is provided between the measurement value accumulating device and the same type measuring device difference calculating device. By the above means, the types of measuring instruments capable of detecting an abnormal value are expanded, and the abnormal value of the measuring instrument can be detected in consideration of the time variation of the measured value, so that the accuracy of detecting the abnormal value of the measuring instrument is improved. .

【0005】[0005]

【発明の実施の形態】以下、本発明の実施例を図を参照
して詳細に説明する。図1は、本発明の下水処理システ
ムの計測器の異常値検出装置を示すブロック図である。
従来例の図5と同一のものには同一符号を付して詳細な
説明を省略する。6は時間差演算装置で、プラント内の
滞留時間に起因する同種類計測器間の時間差を算出す
る。時間差のある同種類計測器の例としては、曝気槽流
入水UV計(UVin)と処理水UV計( UVout)があ
り、本実施例ではこのUV計を曝気槽3の入口部と出口
部に設置し、計測した。時間差Hiの算出は (3)式のよ
うに滞留時間を考慮して求められる。つまり、i時点
(時刻i)からHi時点までの流入水量の和と両計測器
間に存在する各槽の容積の和Vが等しくなるHiを求め
ている。 V=ΣQ(i−j) ・・・・・・・・・・・・・・・ (3) 但し、Vは同種類計測器の間に存在する各槽の容積の
和、Σはj=1からHiまでの和、jは時刻iから過去
にさかのぼる時間、Hiはi時点の滞留時間、Q(i)
はi時点の流入水量、jは時刻iから過去にさかのぼる
時間である。同種類計測器差演算装置7は、計測値蓄積
装置5に蓄積された計測値を時間差演算装置6で得られ
た時間差で時間補正を行い、時間差を考慮に入れた同種
類計測器の差を求めている。同種類計測器の差は(4) 式
のようになる。 UVin(i−Hi)−UV0ut (i)=UVdef (i) ・・・・(4) 但し、UVin(i)はi時点のUV( 流入水) 、UVde
f (i)はi時点の同種類計測器差U、Vout (i)は
i時点のUV( 処理水) である。四分位数演算装置8
は、同種類計測器の差の四分位数(25%点、50%
点、75%点) を求める。判定基準値演算装置9は四分
位数演算装置8で得られた四分位数から、ヒンジ幅1
(25%〜50%点の距離) とヒンジ幅2(50%点〜
75%点の距離) を基準に判定基準値を直近30日のデ
ータを使用して1日1回設定するである。判定基準値記
憶装置10は、判定基準値演算装置9で得られた判定基
準値を記憶する。異常値判定装置11は同種類計測器演
算装置9で得られた同種類計測器の差と判定基準値記憶
装置10に記憶している判定基準値を比較し、異常か否
かの判定を行う。表示装置12は異常値判定装置11で
得られた結果を画面に表示する。つぎに動作について説
明する。まず、計測データは図2のように経時変化す
る。曝気槽3の入口部に設けた曝気槽流入水のUV計2
3のピークは、一定時間経過した後、曝気槽3の出口部
に設けた処理水のUV計23に遅れてピークが現れる。
図のピーク点を見ると、曝気槽流入水のUV16と処理
水のUV計23には、数時間の時間差が生じていること
が分かる。つぎに、時間差演算装置6により2つのUV
計の時間補正を行った。その補正後のデータを図3に示
す。この図から分かるように、曝気槽流入水のUV計1
6の計測値のピークと処理水のUV計23の計測値のピ
ークは、ほぼ同時刻を示しており、時間補正は妥当であ
ったと言える。最後に時間補正後、同種類計測器差演算
装置7によってこの両者の差を対象データとして求め、
判定基準値記憶装置10と異常値判定装置11によって
同種類計測器の異常値チェックを行った。その結果を図
4に示す。この図から、2つの計測値の差は判定基準値
の中に入っており、正常に動作していると推定される。
このように従来の方法では時間差のある同種類計測器の
異常値チェックはできなかったが、この方法を使用する
ことにより時間差を考慮した同種類計測器の異常値検出
を行うことができる。本実施例では、UV計を用いた
が、これに限られるものではなく、どのような種類の計
測器でも適用できる。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiments of the present invention will be described below in detail with reference to the drawings. FIG. 1 is a block diagram showing an abnormal value detecting device of a measuring instrument of a sewage treatment system of the present invention.
The same components as those in FIG. 5 of the conventional example are denoted by the same reference numerals, and detailed description is omitted. Reference numeral 6 denotes a time difference calculating device which calculates a time difference between the same type of measuring instruments due to the residence time in the plant. Examples of the same type of measuring instrument having a time difference include an aeration tank inflow water UV meter (UVin) and a treated water UV meter (UVout). In this embodiment, these UV meters are provided at the inlet and outlet of the aeration tank 3. Installed and measured. The calculation of the time difference Hi is determined in consideration of the residence time as in the equation (3). That is, Hi at which the sum of the inflow water amount from the time point i (time i) to the time point Hi and the sum V of the volume of each tank existing between the two measuring instruments are obtained. V = ΣQ (ij) (3) where V is the sum of the volumes of the tanks existing between instruments of the same type, and Σ is j = The sum from 1 to Hi, j is the time going back from time i to the past, Hi is the residence time at time i, Q (i)
Is the amount of inflow water at time i, and j is the time going back from time i to the past. The same-type measuring device difference calculating device 7 performs time correction of the measured value stored in the measured value storing device 5 with the time difference obtained by the time difference calculating device 6, and calculates the difference between the same-type measuring devices taking the time difference into account. I'm asking. The difference between instruments of the same type is as shown in equation (4). UV in (i−Hi) −UV 0ut (i) = UV def (i) (4) where UV in (i) is the UV (inflow water) and UV de at time i
f (i) is the difference U of the same type of measuring instrument at the time point i, and Vout (i) is the UV (treated water) at the time point i. Quartile calculator 8
Is the quartile of the difference between instruments of the same type (25% point, 50%
Point, 75% point). The criterion value calculating device 9 calculates the hinge width 1
(25% to 50% point distance) and hinge width 2 (50% point to
The reference value is set once a day using the data of the last 30 days, based on the distance of 75% point). The criterion value storage device 10 stores the criterion value obtained by the criterion value calculation device 9. The abnormal value determination device 11 compares the difference between the same type of measuring instruments obtained by the same type measuring device arithmetic device 9 with the determination reference value stored in the determination reference value storage device 10 and determines whether or not there is an abnormality. . The display device 12 displays the result obtained by the abnormal value determination device 11 on a screen. Next, the operation will be described. First, the measurement data changes over time as shown in FIG. UV meter 2 for aeration tank inflow water provided at the entrance of aeration tank 3
After a certain period of time, the peak of No. 3 appears with a delay in the UV meter 23 of the treated water provided at the outlet of the aeration tank 3.
Looking at the peak point in the figure, it can be seen that there is a time difference of several hours between the UV 16 of the aeration tank inflow water and the UV meter 23 of the treated water. Next, two UVs are calculated by the time difference calculating device 6.
A total time correction was made. FIG. 3 shows the data after the correction. As can be seen from this figure, the UV meter 1
The peak of the measurement value of No. 6 and the peak of the measurement value of the UV meter 23 of the treated water show almost the same time, and it can be said that the time correction was appropriate. Finally, after the time correction, the difference between the two is obtained as target data by the same type measuring instrument difference calculation device 7,
An abnormal value check of the same type of measuring device was performed by the judgment reference value storage device 10 and the abnormal value judgment device 11. FIG. 4 shows the results. From this figure, the difference between the two measured values is within the determination reference value, and it is estimated that the operation is normal.
As described above, the abnormal value of the same type of measuring instrument having a time difference cannot be checked by the conventional method. However, by using this method, the abnormal value of the same type of measuring instrument can be detected in consideration of the time difference. In this embodiment, a UV meter is used, but the present invention is not limited to this, and any type of measuring instrument can be applied.

【0006】[0006]

【発明の効果】以上述べたように本発明によれば、プラ
ントの任意の処理工程の前後に同種類の計測器を少なく
とも1個設置し、さらに、計測値蓄積装置と同種類計測
器差演算装置との間に時間差演算装置を設けて同種類の
計測器の測定値の遅れ時間を補正し、同種類計測器間の
計測値の差を比較するようにしたので、異常値を検出す
る計測器の種類に制限がなく、かつ計測器の異常値を高
精度に検出できる方法および装置を提供できる効果があ
る。
As described above, according to the present invention, at least one measuring instrument of the same type is installed before and after an arbitrary processing step of the plant, and furthermore, a difference measuring instrument of the same type as the measured value accumulating device is used. A time difference calculation device is installed between the devices to correct the delay time of the measurement value of the same type of measurement device, and the difference between the measurement values of the same type of measurement device is compared. There is an effect that there is no limitation on the type of instrument and that a method and apparatus capable of detecting an abnormal value of a measuring instrument with high accuracy can be provided.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の下水処理システムの計測器の異常値検
出装置を示すブロック図である。
FIG. 1 is a block diagram showing an abnormal value detection device of a measuring instrument of a sewage treatment system of the present invention.

【図2】本発明の時間補正前の曝気槽流入水UV値およ
び処理水UV値の時間変化を示す特性図である。
FIG. 2 is a characteristic diagram showing a temporal change of an aeration tank inflow water UV value and a treated water UV value before time correction according to the present invention.

【図3】本発明の時間補正後の曝気槽流入水UV値およ
び処理水UV値の時間変化を示す特性図である。
FIG. 3 is a characteristic diagram showing a time change of an aeration tank inflow water UV value and a treated water UV value after time correction according to the present invention.

【図4】本発明の時間補正後の曝気槽流入水UV値およ
び処理水UV値の時間変化差および判定基準値を示す特
性図である。
FIG. 4 is a characteristic diagram showing a time change difference and a determination reference value of an aeration tank inflow water UV value and a treated water UV value after time correction according to the present invention.

【図5】従来の下水処理システムの計測器の異常値検出
装置を示すブロック図である。
FIG. 5 is a block diagram showing a device for detecting an abnormal value of a measuring instrument of a conventional sewage treatment system.

【符号の説明】[Explanation of symbols]

1、24、25:管路 13:流入下水流量
計 2:最初沈澱池 14:流入水のpH計 3:曝気槽 15:流入水の懸濁
物質 4:最終沈澱池 16:曝気槽流入水
のUV計 5:計測値蓄積装置 17:溶存酸素濃度
計 6:時間差演算装置 18:MLSS濃度計 7:同種類計測器演算装置 19:水温計 8:四分位数演算装置 20:酸化還元電位
計 9:判定基準値演算装置 21:処理水のpH計 10:判定基準値記憶装置 22:処理水の懸
濁物質濃度計 11:異常値判定装置 23:処理水のU
V計 12:表示装置
1, 24, 25: Pipe line 13: Inflow sewage flow meter 2: First sedimentation basin 14: pH meter of inflow water 3: Aeration tank 15: Suspended substance of inflow water 4: Final sedimentation tank 16: Inflow of aeration tank UV meter 5: Measured value accumulating device 17: Dissolved oxygen concentration meter 6: Time difference calculating device 18: MLSS concentration meter 7: Same type measuring device calculating device 19: Water temperature meter 8: Quartile number calculating device 20: Oxidation reduction potentiometer 9: Determination reference value calculation device 21: pH meter of treated water 10: Determination reference value storage device 22: Suspended substance concentration meter of treated water 11: Abnormal value determination device 23: U of treated water
V meter 12: Display device

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】プラントの各処理工程に設置された各種の
計測器から出力される計測値を計測値蓄積装置に蓄積
し、前記計測値蓄積装置に蓄積された計測値から同種類
の計測器の測定値の差を同種類計測器差演算装置で演算
し、前記同種類計測器差演算装置からの同種類計測値差
データを四分位数演算装置で四分位数を演算し、前記四
分位数演算装置で得られた四分位数を基準に判定基準値
演算装置によって判定基準値を設定し、前記判定基準値
演算装置で得られた判定基準値を判定基準値記憶装置に
記憶し、前記判定基準値記憶装置の判定基準値と前記同
種類計測器演算装置で得られた計測値差データとを異常
値判定装置で異常か否かを判定する計測器の異常値検出
方法において、 前記プラントの任意の処理工程の前後に同種類の計測器
を少なくとも1個設置し、前記計測値蓄積装置と同種類
計測器差演算装置との間に設けた時間差演算装置により
同種類の計測器の測定値の遅れ時間を補正し、前記判定
基準値と新しく計測された同種類計測器の計測値との差
を比較することを特徴とする計測器の異常値検出方法。
1. A measurement value output from various measuring instruments installed in each processing step of a plant is accumulated in a measurement value accumulating device, and the same type of measuring device is measured from the measurement values accumulated in the measurement value accumulating device. The difference between the measured values is calculated by the same-type measuring instrument difference calculating device, and the same-type measured value difference data from the same-type measuring device difference calculating device is calculated as a quartile by a quartile calculating device. A criterion value is set by a criterion value calculator based on the quartile obtained by the quartile calculator, and the criterion value obtained by the criterion value calculator is stored in a criterion value storage device. An abnormal value detecting method of a measuring instrument for storing and judging whether or not an abnormal value is judged by an abnormal value judging device based on a judging reference value of the judging value storage device and the measurement value difference data obtained by the same type measuring device computing device. In the above, before and after any processing steps of the plant, few measuring instruments of the same type At least one is installed, and the delay time of the measurement value of the same type of measuring device is corrected by the time difference calculating device provided between the measured value accumulating device and the same type measuring device difference calculating device, and the determination reference value and A method for detecting an abnormal value of a measuring instrument, comprising comparing a difference between a newly measured value of a measuring instrument of the same type and a measuring value of the measuring instrument.
【請求項2】前記判定基準値を同種類計測値の差の相対
累積度数の25%点から50%点及び50%点から75
%点を基準に設定した請求項1記載の計測器の異常値検
出方法。
2. The method according to claim 1, wherein the determination reference value is set to a value from 25% to 50% of the relative cumulative frequency of the difference between the measurement values of the same type and to 75 from the 50% point.
The method for detecting an abnormal value of a measuring instrument according to claim 1, wherein the setting is based on a percentage point.
【請求項3】プラントの各処理工程に設置された各種計
測器から出力される計測値を蓄積する計測値蓄積装置
と、前記計測値蓄積装置に蓄積された計測値から同種類
の計測器の測定値の差を演算する同種類計測器差演算装
置と、前記同種類計測器差演算装置からの同種類計測値
差データの四分位数を演算する四分位数演算装置と、前
記四分位数演算装置で得られた四分位数を基準として判
定基準値を設定する判定基準値演算装置と、前記判定基
準値演算装置で得られた判定基準値を記憶する判定基準
値記憶装置と、前記判定基準値記憶装置の判定基準値と
前記同種類計測器演算装置で得られた計測値差データと
を比較して、異常か否かの判定を行う異常値判定装置
と、前記異常値判定装置で得られた結果を画面に表示す
る表示装置とからなる計測器の異常値検出装置におい
て、 前記プラントの任意の処理工程の前後に少なくとも1個
設置した同種類の計測器と、前記計測値蓄積装置と同種
類計測器差演算装置との間に前記同種類計測器の測定値
の遅れ時間を補正する時間差演算装置を設けたことを特
徴とする異常値検出装置。
3. A measurement value accumulating device for accumulating measured values output from various measuring devices installed in each processing step of a plant, and a measuring device of the same type based on the measured values accumulated in the measured value accumulating device. A measuring instrument difference calculating device for calculating a difference between measured values, a quartile calculating device for calculating a quartile of the same type measuring value difference data from the measuring device difference calculating device, A criterion value calculation device for setting a criterion value based on a quartile obtained by a quantile calculation device, and a criterion value storage device for storing a criterion value obtained by the criterion value calculation device An abnormal value determination device that compares a determination reference value of the determination reference value storage device with measurement value difference data obtained by the same type of measurement device arithmetic device to determine whether or not there is an abnormality; And a display device for displaying the result obtained by the value judgment device on a screen. An abnormal value detecting device for measuring equipment, wherein at least one measuring instrument of the same type installed before and after an arbitrary processing step of the plant, and the measured value accumulating device and the measuring instrument difference calculating device of the same type, An abnormal value detection device provided with a time difference calculation device for correcting a delay time of a measurement value of a type measuring device.
【請求項4】前記プラントが下水処理場である請求項3
に記載の計測器の異常値検出装置。
4. The plant according to claim 3, wherein said plant is a sewage treatment plant.
An abnormal value detection device for a measuring instrument according to claim 1.
JP17108598A 1998-06-18 1998-06-18 Method and device for detecting abnormal value of measuring instrument Abandoned JP2000010627A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17108598A JP2000010627A (en) 1998-06-18 1998-06-18 Method and device for detecting abnormal value of measuring instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17108598A JP2000010627A (en) 1998-06-18 1998-06-18 Method and device for detecting abnormal value of measuring instrument

Publications (1)

Publication Number Publication Date
JP2000010627A true JP2000010627A (en) 2000-01-14

Family

ID=15916733

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17108598A Abandoned JP2000010627A (en) 1998-06-18 1998-06-18 Method and device for detecting abnormal value of measuring instrument

Country Status (1)

Country Link
JP (1) JP2000010627A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005149510A (en) * 2003-11-19 2005-06-09 Siemens Ag Supervision method of technical apparatus
CN103109163A (en) * 2010-10-01 2013-05-15 欧姆龙株式会社 Sensor device, sensor management system, method for controlling sensor device, program, and computer-readable recording medium
JP2018180666A (en) * 2017-04-05 2018-11-15 オムロン株式会社 Control device, control program, control system, and control method

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005149510A (en) * 2003-11-19 2005-06-09 Siemens Ag Supervision method of technical apparatus
JP4643232B2 (en) * 2003-11-19 2011-03-02 シーメンス アクチエンゲゼルシヤフト Technical device monitoring method
CN103109163A (en) * 2010-10-01 2013-05-15 欧姆龙株式会社 Sensor device, sensor management system, method for controlling sensor device, program, and computer-readable recording medium
JP2018180666A (en) * 2017-04-05 2018-11-15 オムロン株式会社 Control device, control program, control system, and control method
US10890888B2 (en) 2017-04-05 2021-01-12 Omron Corporation Control apparatus, control program, control system, and control method

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