JP1583356S - - Google Patents

Info

Publication number
JP1583356S
JP1583356S JPD2017-1201F JP2017001201F JP1583356S JP 1583356 S JP1583356 S JP 1583356S JP 2017001201 F JP2017001201 F JP 2017001201F JP 1583356 S JP1583356 S JP 1583356S
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JPD2017-1201F
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JPD2017-1201F priority Critical patent/JP1583356S/ja
Priority to US35/355,042 priority patent/USD855209S1/en
Application granted granted Critical
Publication of JP1583356S publication Critical patent/JP1583356S/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JPD2017-1201F 2017-01-25 2017-01-25 Active JP1583356S (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JPD2017-1201F JP1583356S (en) 2017-01-25 2017-01-25
US35/355,042 USD855209S1 (en) 2017-01-25 2017-07-05 Substrate for spectroscopic analysis

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JPD2017-1201F JP1583356S (en) 2017-01-25 2017-01-25

Publications (1)

Publication Number Publication Date
JP1583356S true JP1583356S (en) 2017-08-07

Family

ID=59505837

Family Applications (1)

Application Number Title Priority Date Filing Date
JPD2017-1201F Active JP1583356S (en) 2017-01-25 2017-01-25

Country Status (2)

Country Link
US (1) USD855209S1 (en)
JP (1) JP1583356S (en)

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JP1614535S (en) 2018-01-19 2018-09-25
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JP1614365S (en) 2018-01-19 2018-09-25
JP1614536S (en) 2018-01-19 2018-09-25
USD898940S1 (en) 2018-01-19 2020-10-13 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD895142S1 (en) 2018-01-19 2020-09-01 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
JP1619171S (en) 2018-01-19 2018-11-26
USD895832S1 (en) 2018-01-19 2020-09-08 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD895835S1 (en) 2018-01-19 2020-09-08 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD891635S1 (en) 2018-01-19 2020-07-28 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
JP1614364S (en) 2018-01-19 2018-09-25
USD894421S1 (en) * 2018-01-19 2020-08-25 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD901715S1 (en) 2018-01-19 2020-11-10 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
JP1614542S (en) 2018-01-19 2018-09-25
JP1614538S (en) 2018-01-19 2018-09-25
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USD904640S1 (en) * 2019-01-21 2020-12-08 Applied Materials, Inc. Substrate carrier

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Also Published As

Publication number Publication date
USD855209S1 (en) 2019-07-30

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