ITMI20082274A1 - Wafer a semiconduttori con una pluralita' di elementi sensori e procedimento per misurare elementi sensori su un wafer a semiconduttori - Google Patents
Wafer a semiconduttori con una pluralita' di elementi sensori e procedimento per misurare elementi sensori su un wafer a semiconduttoriInfo
- Publication number
- ITMI20082274A1 ITMI20082274A1 IT002274A ITMI20082274A ITMI20082274A1 IT MI20082274 A1 ITMI20082274 A1 IT MI20082274A1 IT 002274 A IT002274 A IT 002274A IT MI20082274 A ITMI20082274 A IT MI20082274A IT MI20082274 A1 ITMI20082274 A1 IT MI20082274A1
- Authority
- IT
- Italy
- Prior art keywords
- semiconductors
- wafer
- elements
- procedure
- measuring sensor
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
- H01L22/32—Additional lead-in metallisation on a device or substrate, e.g. additional pads or pad portions, lines in the scribe line, sacrificed conductors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Measuring Fluid Pressure (AREA)
- Semiconductor Integrated Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102007062711A DE102007062711A1 (de) | 2007-12-27 | 2007-12-27 | Halbleiterwafer mit einer Vielzahl von Sensorelementen und Verfahren zum Vermessen von Sensorelementen auf einem Halbleiterwafer |
Publications (2)
Publication Number | Publication Date |
---|---|
ITMI20082274A1 true ITMI20082274A1 (it) | 2009-06-28 |
IT1392482B1 IT1392482B1 (it) | 2012-03-09 |
Family
ID=40690746
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ITMI2008A002274A IT1392482B1 (it) | 2007-12-27 | 2008-12-19 | Wafer a semiconduttori con una pluralita' di elementi sensori e procedimento per misurare elementi sensori su un wafer a semiconduttori |
Country Status (3)
Country | Link |
---|---|
US (1) | US7872487B2 (it) |
DE (1) | DE102007062711A1 (it) |
IT (1) | IT1392482B1 (it) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102013102155B4 (de) * | 2013-03-05 | 2015-04-09 | Friedrich-Alexander-Universität Erlangen-Nürnberg | Verfahren zum testen von bauelementen und messanordnung |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4140965A (en) * | 1976-02-25 | 1979-02-20 | Optron, Inc. | Isolation voltage test apparatus |
EP0786667B1 (en) | 1995-10-31 | 2004-10-27 | Texas Instruments Incorporated | Method and apparatus for testing integrated circuits |
US6142021A (en) * | 1998-08-21 | 2000-11-07 | Motorola, Inc. | Selectable pressure sensor |
US20030043015A1 (en) * | 2001-08-28 | 2003-03-06 | Jack Gershfeld | Matrix switcher with three-dimensional orientation of printed circuit boards |
EP1466365A2 (en) * | 2001-09-28 | 2004-10-13 | Koninklijke Philips Electronics N.V. | Method of manufacturing an integrated circuit, integrated circuit obtained in accordance with said method, wafer provided with an integrated circuit obtained in accordance with the method, and system comprising an integrated circuit obtained by means of the method |
US6771089B1 (en) * | 2002-05-29 | 2004-08-03 | Advanced Micro Devices, Inc. | Test fixture having an adjustable capacitance and method for testing a semiconductor component |
-
2007
- 2007-12-27 DE DE102007062711A patent/DE102007062711A1/de not_active Withdrawn
-
2008
- 2008-11-24 US US12/276,572 patent/US7872487B2/en not_active Expired - Fee Related
- 2008-12-19 IT ITMI2008A002274A patent/IT1392482B1/it active
Also Published As
Publication number | Publication date |
---|---|
US7872487B2 (en) | 2011-01-18 |
IT1392482B1 (it) | 2012-03-09 |
DE102007062711A1 (de) | 2009-07-02 |
US20090189629A1 (en) | 2009-07-30 |
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