IT7829239A0 - ELECTRICAL. PROCEDURE AND DEVICE FOR THE TEST OF CONDUCTIVE ELEMENTS - Google Patents

ELECTRICAL. PROCEDURE AND DEVICE FOR THE TEST OF CONDUCTIVE ELEMENTS

Info

Publication number: IT7829239A0
Authority: IT; Italy
Prior art keywords: procedure; test; electrical; conductive elements; conductive
Prior art date: 1977-10-31

Application number

IT7829239A

Other languages

Italian (it)

Other versions

IT1099851B (en

Original Assignee

Western Electric Co

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1977-10-31

Filing date

1978-10-30

Publication date

1978-10-30

1978-10-10 Priority claimed from US05/949,578 external-priority patent/US4213087A/en

1978-10-30 Application filed by Western Electric Co filed Critical Western Electric Co

1978-10-30 Publication of IT7829239A0 publication Critical patent/IT7829239A0/en

1985-09-28 Application granted granted Critical

1985-09-28 Publication of IT1099851B publication Critical patent/IT1099851B/en

Links

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2853—Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections

Landscapes

Engineering & Computer Science (AREA)
Computer Hardware Design (AREA)
Microelectronics & Electronic Packaging (AREA)
General Engineering & Computer Science (AREA)
Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Measurement Of Resistance Or Impedance (AREA)
Testing Or Measuring Of Semiconductors Or The Like (AREA)
Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Testing Of Individual Semiconductor Devices (AREA)

IT29239/78A 1977-10-31 1978-10-30 PROCEDURE AND DEVICE FOR TESTING ELECTRICAL CONDUCTING ELEMENTS IT1099851B (en)

Applications Claiming Priority (2)

Application Number	Priority Date	Filing Date	Title
US84721377A	1977-10-31	1977-10-31
US05/949,578 US4213087A (en)	1978-10-10	1978-10-10	Method and device for testing electrical conductor elements

Publications (2)

Publication Number	Publication Date
IT7829239A0 true IT7829239A0 (en)	1978-10-30
IT1099851B IT1099851B (en)	1985-09-28

Family

ID=27126694

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
IT29239/78A IT1099851B (en)	1977-10-31	1978-10-30	PROCEDURE AND DEVICE FOR TESTING ELECTRICAL CONDUCTING ELEMENTS

Country Status (12)

Country	Link
JP (1)	JPS5488777A (en)
CA (1)	CA1120545A (en)
CH (1)	CH635686A5 (en)
DE (1)	DE2847074A1 (en)
DK (1)	DK483278A (en)
FR (1)	FR2407483A1 (en)
GB (1)	GB2007850B (en)
HK (1)	HK25584A (en)
IT (1)	IT1099851B (en)
NL (1)	NL7810608A (en)
SE (1)	SE433782B (en)
SG (1)	SG56382G (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US4547724A (en) *	1983-02-07	1985-10-15	Tektronix, Inc.	Method and apparatus for detection of non-linear electrical devices
JPH0630444B2 (en) *	1985-05-02	1994-04-20	株式会社日立製作所	A / D converter test method

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US3500188A (en) *	1966-06-02	1970-03-10	Amp Inc	Method and means for measuring constriction resistance based on nonlinearity
GB1221704A (en) *	1968-09-16	1971-02-10	Dale Electronics	Method for testing the resistance characteristics of self-heated electric resistors
US3692987A (en) *	1970-07-06	1972-09-19	Western Electric Co	Methods and apparatus for allocating the measured noise and resistance of a thin-film resistor between the resistor proper and the contact pads therefor
US3746973A (en) *	1972-05-05	1973-07-17	Ibm	Testing of metallization networks on insulative substrates supporting semiconductor chips
US3803483A (en) *	1972-05-05	1974-04-09	Ibm	Semiconductor structure for testing of metallization networks on insulative substrates supporting semiconductor chips
US3974443A (en) *	1975-01-02	1976-08-10	International Business Machines Corporation	Conductive line width and resistivity measuring system

1978
- 1978-10-23 SE SE7811012A patent/SE433782B/en unknown
- 1978-10-24 NL NL7810608A patent/NL7810608A/en not_active Application Discontinuation
- 1978-10-27 FR FR7830633A patent/FR2407483A1/en active Granted
- 1978-10-28 DE DE19782847074 patent/DE2847074A1/en not_active Withdrawn
- 1978-10-30 IT IT29239/78A patent/IT1099851B/en active
- 1978-10-30 DK DK483278A patent/DK483278A/en not_active Application Discontinuation
- 1978-10-31 CA CA000315697A patent/CA1120545A/en not_active Expired
- 1978-10-31 JP JP13337178A patent/JPS5488777A/en active Pending
- 1978-10-31 GB GB7842658A patent/GB2007850B/en not_active Expired
- 1978-10-31 CH CH1121678A patent/CH635686A5/en not_active IP Right Cessation
1982
- 1982-11-04 SG SG563/82A patent/SG56382G/en unknown
1984
- 1984-03-22 HK HK255/84A patent/HK25584A/en unknown

Also Published As

Publication number	Publication date
SE7811012L (en)	1979-05-01
GB2007850A (en)	1979-05-23
DK483278A (en)	1979-05-01
FR2407483B1 (en)	1983-09-16
SE433782B (en)	1984-06-12
CA1120545A (en)	1982-03-23
GB2007850B (en)	1982-05-12
SG56382G (en)	1983-09-02
JPS5488777A (en)	1979-07-14
DE2847074A1 (en)	1979-05-03
NL7810608A (en)	1979-05-02
IT1099851B (en)	1985-09-28
FR2407483A1 (en)	1979-05-25
HK25584A (en)	1984-03-30
CH635686A5 (en)	1983-04-15

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