IT201700077459A1 - Dispositivo e procedimento per la rilevazione di difetti superficiali - Google Patents

Dispositivo e procedimento per la rilevazione di difetti superficiali

Info

Publication number
IT201700077459A1
IT201700077459A1 IT102017000077459A IT201700077459A IT201700077459A1 IT 201700077459 A1 IT201700077459 A1 IT 201700077459A1 IT 102017000077459 A IT102017000077459 A IT 102017000077459A IT 201700077459 A IT201700077459 A IT 201700077459A IT 201700077459 A1 IT201700077459 A1 IT 201700077459A1
Authority
IT
Italy
Prior art keywords
procedure
detection
surface defects
defects
Prior art date
Application number
IT102017000077459A
Other languages
English (en)
Inventor
Nisco Bruno De
Girolamo Alessandro Di
Original Assignee
Tekno Idea Srl
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tekno Idea Srl filed Critical Tekno Idea Srl
Priority to IT102017000077459A priority Critical patent/IT201700077459A1/it
Priority to PCT/IB2018/055041 priority patent/WO2019012404A1/en
Priority to US16/629,530 priority patent/US11105614B2/en
Priority to BR112020000286-0A priority patent/BR112020000286A2/pt
Priority to JP2020523065A priority patent/JP2020527728A/ja
Priority to EP18749871.2A priority patent/EP3652524B1/en
Priority to MA049568A priority patent/MA49568A/fr
Publication of IT201700077459A1 publication Critical patent/IT201700077459A1/it
Priority to US17/380,285 priority patent/US11629953B2/en
Priority to JP2023084317A priority patent/JP2023106529A/ja

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8829—Shadow projection or structured background, e.g. for deflectometry

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
IT102017000077459A 2017-07-10 2017-07-10 Dispositivo e procedimento per la rilevazione di difetti superficiali IT201700077459A1 (it)

Priority Applications (9)

Application Number Priority Date Filing Date Title
IT102017000077459A IT201700077459A1 (it) 2017-07-10 2017-07-10 Dispositivo e procedimento per la rilevazione di difetti superficiali
PCT/IB2018/055041 WO2019012404A1 (en) 2017-07-10 2018-07-09 DEVICE AND METHOD FOR DETECTING SURFACE DEFECTS
US16/629,530 US11105614B2 (en) 2017-07-10 2018-07-09 Devices and processes for detecting surface defects
BR112020000286-0A BR112020000286A2 (pt) 2017-07-10 2018-07-09 dispositivo e processo para detectar defeitos de superfície
JP2020523065A JP2020527728A (ja) 2017-07-10 2018-07-09 表面欠陥を検出するためのデバイスおよび方法
EP18749871.2A EP3652524B1 (en) 2017-07-10 2018-07-09 Device and process for detecting surface defects
MA049568A MA49568A (fr) 2017-07-10 2018-07-09 Dispositif et procédé de détection de défauts de surface
US17/380,285 US11629953B2 (en) 2017-07-10 2021-07-20 Devices for detecting painting defects on at least one painted surface to be inspected
JP2023084317A JP2023106529A (ja) 2017-07-10 2023-05-23 表面欠陥を検出するためのデバイスおよび方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT102017000077459A IT201700077459A1 (it) 2017-07-10 2017-07-10 Dispositivo e procedimento per la rilevazione di difetti superficiali

Publications (1)

Publication Number Publication Date
IT201700077459A1 true IT201700077459A1 (it) 2019-01-10

Family

ID=61005905

Family Applications (1)

Application Number Title Priority Date Filing Date
IT102017000077459A IT201700077459A1 (it) 2017-07-10 2017-07-10 Dispositivo e procedimento per la rilevazione di difetti superficiali

Country Status (7)

Country Link
US (2) US11105614B2 (it)
EP (1) EP3652524B1 (it)
JP (2) JP2020527728A (it)
BR (1) BR112020000286A2 (it)
IT (1) IT201700077459A1 (it)
MA (1) MA49568A (it)
WO (1) WO2019012404A1 (it)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT201700077459A1 (it) * 2017-07-10 2019-01-10 Tekno Idea Srl Dispositivo e procedimento per la rilevazione di difetti superficiali
CN111189854B (zh) * 2020-04-13 2020-08-07 征图新视(江苏)科技股份有限公司 玻璃盖板自动检测***缺陷分层检测方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008123604A1 (ja) * 2007-03-29 2008-10-16 Toyota Jidosha Kabushiki Kaisha 表面検査装置
US20140043602A1 (en) * 2012-08-07 2014-02-13 Carl Zeiss Industrielle Messtechnik Gmbh Apparatus and method for inspecting an object
EP2799810A1 (de) * 2013-04-30 2014-11-05 Aimess Services GmbH Vorrichtung und Verfahren zum simultanen dreidimensionalen Vermessen von Oberflächen mit mehreren Wellenlängen
WO2017001897A1 (pt) * 2015-06-30 2017-01-05 Bosch Car Multimedia Portugal, S.A. Dispositivo e método para deteção de defeitos em superfícies especulares com luz difusa estruturada

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4629319A (en) 1984-02-14 1986-12-16 Diffracto Ltd. Panel surface flaw inspection
US5237404A (en) * 1990-06-28 1993-08-17 Mazda Motor Corporation Inspection apparatus with improved detection of surface defects over large and curved surfaces
JPH05322543A (ja) 1992-05-22 1993-12-07 Mazda Motor Corp 表面欠陥検査装置
WO2000014478A1 (de) * 1998-09-04 2000-03-16 Siemens Aktiengesellschaft Anordnung und verfahren zur ermittlung einer tiefen- und farbinformation eines aufzunehmenden objekts
DE10110994B4 (de) 2000-03-09 2012-11-29 Isra Vision Systems Ag Vorrichtung zur Bildabtastung eines Objektes
WO2003016819A1 (de) * 2001-08-14 2003-02-27 Metronom Gmbh Industrial Measurement Verfahren zur vermessung von oberflächenstrukturen
GB0500570D0 (en) * 2005-01-12 2005-02-16 Enfis Ltd Sensing in meat products and the like
JP5110977B2 (ja) * 2007-06-22 2012-12-26 株式会社日立ハイテクノロジーズ 欠陥観察装置及びその方法
WO2010029549A1 (en) * 2008-09-12 2010-03-18 Ceramicam Ltd. Surface scanning device
JP4719284B2 (ja) * 2008-10-10 2011-07-06 トヨタ自動車株式会社 表面検査装置
JP2011232265A (ja) * 2010-04-30 2011-11-17 Honda Motor Co Ltd 表面検査装置及び表面検査方法
US20130057678A1 (en) 2010-05-17 2013-03-07 Ford Espana S.L. Inspection system and method of defect detection on specular surfaces
IT201700077459A1 (it) * 2017-07-10 2019-01-10 Tekno Idea Srl Dispositivo e procedimento per la rilevazione di difetti superficiali
US11328380B2 (en) * 2018-10-27 2022-05-10 Gilbert Pinter Machine vision systems, illumination sources for use in machine vision systems, and components for use in the illumination sources

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008123604A1 (ja) * 2007-03-29 2008-10-16 Toyota Jidosha Kabushiki Kaisha 表面検査装置
US20140043602A1 (en) * 2012-08-07 2014-02-13 Carl Zeiss Industrielle Messtechnik Gmbh Apparatus and method for inspecting an object
EP2799810A1 (de) * 2013-04-30 2014-11-05 Aimess Services GmbH Vorrichtung und Verfahren zum simultanen dreidimensionalen Vermessen von Oberflächen mit mehreren Wellenlängen
WO2017001897A1 (pt) * 2015-06-30 2017-01-05 Bosch Car Multimedia Portugal, S.A. Dispositivo e método para deteção de defeitos em superfícies especulares com luz difusa estruturada

Also Published As

Publication number Publication date
JP2023106529A (ja) 2023-08-01
EP3652524A1 (en) 2020-05-20
JP2020527728A (ja) 2020-09-10
US11105614B2 (en) 2021-08-31
US20200173771A1 (en) 2020-06-04
MA49568A (fr) 2020-05-20
US11629953B2 (en) 2023-04-18
EP3652524C0 (en) 2024-02-14
EP3652524B1 (en) 2024-02-14
US20210348917A1 (en) 2021-11-11
BR112020000286A2 (pt) 2020-07-14
WO2019012404A1 (en) 2019-01-17

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