IT1281546B1 - Apparecchio di misura optoelettronico per il controllo di dimensioni lineari - Google Patents

Apparecchio di misura optoelettronico per il controllo di dimensioni lineari

Info

Publication number
IT1281546B1
IT1281546B1 IT95BO000162A ITBO950162A IT1281546B1 IT 1281546 B1 IT1281546 B1 IT 1281546B1 IT 95BO000162 A IT95BO000162 A IT 95BO000162A IT BO950162 A ITBO950162 A IT BO950162A IT 1281546 B1 IT1281546 B1 IT 1281546B1
Authority
IT
Italy
Prior art keywords
control
measuring device
linear dimensions
optoelectronic measuring
optoelectronic
Prior art date
Application number
IT95BO000162A
Other languages
English (en)
Inventor
Emilio Milana
Giovanni Graziani
Original Assignee
Marposs Spa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Marposs Spa filed Critical Marposs Spa
Priority to IT95BO000162A priority Critical patent/IT1281546B1/it
Publication of ITBO950162A0 publication Critical patent/ITBO950162A0/it
Priority to DE69610200T priority patent/DE69610200T2/de
Priority to JP53068996A priority patent/JP3786697B2/ja
Priority to US08/930,761 priority patent/US5841542A/en
Priority to EP96909166A priority patent/EP0820579B1/en
Priority to PCT/EP1996/001444 priority patent/WO1996032624A1/en
Publication of ITBO950162A1 publication Critical patent/ITBO950162A1/it
Application granted granted Critical
Publication of IT1281546B1 publication Critical patent/IT1281546B1/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
IT95BO000162A 1995-04-13 1995-04-13 Apparecchio di misura optoelettronico per il controllo di dimensioni lineari IT1281546B1 (it)

Priority Applications (6)

Application Number Priority Date Filing Date Title
IT95BO000162A IT1281546B1 (it) 1995-04-13 1995-04-13 Apparecchio di misura optoelettronico per il controllo di dimensioni lineari
DE69610200T DE69610200T2 (de) 1995-04-13 1996-04-02 Opto-elektronischer messapparat für die verifikation von lineardimensionen
JP53068996A JP3786697B2 (ja) 1995-04-13 1996-04-02 直線的寸法を検査するためのオプトエレクトロニック計測装置
US08/930,761 US5841542A (en) 1995-04-13 1996-04-02 Opto-electronic measuring apparatus for checking linear dimensions
EP96909166A EP0820579B1 (en) 1995-04-13 1996-04-02 Opto-electronic measuring apparatus for checking linear dimensions
PCT/EP1996/001444 WO1996032624A1 (en) 1995-04-13 1996-04-02 Opto-electronic measuring apparatus for checking linear dimensions

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT95BO000162A IT1281546B1 (it) 1995-04-13 1995-04-13 Apparecchio di misura optoelettronico per il controllo di dimensioni lineari

Publications (3)

Publication Number Publication Date
ITBO950162A0 ITBO950162A0 (it) 1995-04-13
ITBO950162A1 ITBO950162A1 (it) 1996-10-13
IT1281546B1 true IT1281546B1 (it) 1998-02-18

Family

ID=11340508

Family Applications (1)

Application Number Title Priority Date Filing Date
IT95BO000162A IT1281546B1 (it) 1995-04-13 1995-04-13 Apparecchio di misura optoelettronico per il controllo di dimensioni lineari

Country Status (6)

Country Link
US (1) US5841542A (it)
EP (1) EP0820579B1 (it)
JP (1) JP3786697B2 (it)
DE (1) DE69610200T2 (it)
IT (1) IT1281546B1 (it)
WO (1) WO1996032624A1 (it)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19738977A1 (de) * 1997-09-05 1999-03-18 Blum Novotest Gmbh Meßgerät zum Scannen von Maßen, insbesondere Durchmessern
US6678891B1 (en) 1998-11-19 2004-01-13 Prasara Technologies, Inc. Navigational user interface for interactive television
FR2826443B1 (fr) * 2001-06-21 2003-10-10 Gilles Cavallucci Procede et dispositif de detection optique de la position d'un objet
US8035094B2 (en) 2002-06-17 2011-10-11 Quest Metrology, LLC Methods for measuring at least one physical characteristic of a component
US8410466B2 (en) * 2002-06-17 2013-04-02 Quest Metrology Group, Llc Non-contact component inspection system
US7227163B2 (en) * 2002-06-17 2007-06-05 Johnson Stanley P Product inspection system and a method for implementing same
US7745805B2 (en) 2002-06-17 2010-06-29 Johnson Thread-View Systems Product inspection system and a method for implementing same that incorporates a correction factor
US20100259764A1 (en) * 2003-06-13 2010-10-14 Johnson Stanley P Product inspection system and a method for implementing same
EP1531317A1 (de) * 2003-11-14 2005-05-18 Dr. Schleuniger Pharmatron AG Verfahren zur Durchführung von Dicke- und Härtemessungen an Prüfkörpern und Drehteller und Wischereinheit hierfür
ITBO20050146A1 (it) * 2005-03-14 2006-09-15 Marposs Spa Apparecchiatura e metodo per il controllo di pezzi meccanici
US7633635B2 (en) * 2006-08-07 2009-12-15 GII Acquisitions, LLC Method and system for automatically identifying non-labeled, manufactured parts
US7461463B1 (en) * 2007-05-16 2008-12-09 Beta Lasermike, Inc. Eccentricity gauge for wire and cable and method for measuring concentricity
US8170698B1 (en) * 2008-02-20 2012-05-01 Mark David Gusack Virtual robotic controller system with special application to robotic microscopy structure and methodology
JP5372598B2 (ja) * 2009-05-15 2013-12-18 株式会社森精機製作所 加工方法及び加工システム
JP5465922B2 (ja) * 2009-05-15 2014-04-09 Ｄｍｇ森精機株式会社 加工方法及び加工システム
EP2539669A1 (en) * 2010-02-25 2013-01-02 Tesa Sa Optical measurement system
CN105698704B (zh) * 2014-11-26 2018-03-30 北京智朗芯光科技有限公司 检测晶片基底二维形貌和温度的装置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5248031B2 (it) * 1974-05-13 1977-12-07
JPS5537919A (en) * 1978-09-11 1980-03-17 Ngk Insulators Ltd Automatic outer configuration measurement device
US4576482A (en) * 1979-09-07 1986-03-18 Diffracto Ltd. Electro-optical inspection
US5114230A (en) * 1979-09-07 1992-05-19 Diffracto Ltd. Electro-optical inspection
BE883832A (fr) * 1980-06-13 1980-10-01 Centre Rech Metallurgique Procede et dispositif pour controler la planeite des toles metalliques.
DE3510644A1 (de) * 1985-03-23 1986-10-02 Rheinmetall GmbH, 4000 Düsseldorf Verfahren zur vermessung von insbesondere rotationssymmetrischen werkstuecken
DE3521260A1 (de) * 1985-06-13 1986-12-18 OEM Meßtechnik GmbH, 8000 München Verfahren und vorrichtung zum ermitteln der abmessungen eines laenglichen pruefobjektes
GB2180337A (en) * 1985-09-13 1987-03-25 Tesa Metrology Ltd Optical measurement apparatus
US5291272A (en) * 1991-09-27 1994-03-01 Criterion Resources, Inc. Method and apparatus for measuring dimensional variables of threaded pipe

Also Published As

Publication number Publication date
JP3786697B2 (ja) 2006-06-14
EP0820579A1 (en) 1998-01-28
ITBO950162A0 (it) 1995-04-13
US5841542A (en) 1998-11-24
DE69610200T2 (de) 2001-04-26
ITBO950162A1 (it) 1996-10-13
DE69610200D1 (de) 2000-10-12
JPH11503827A (ja) 1999-03-30
WO1996032624A1 (en) 1996-10-17
EP0820579B1 (en) 2000-09-06

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Legal Events

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0001 Granted