IN2014MN01506A - - Google Patents

Info

Publication number
IN2014MN01506A
IN2014MN01506A IN1506MUN2014A IN2014MN01506A IN 2014MN01506 A IN2014MN01506 A IN 2014MN01506A IN 1506MUN2014 A IN1506MUN2014 A IN 1506MUN2014A IN 2014MN01506 A IN2014MN01506 A IN 2014MN01506A
Authority
IN
India
Prior art keywords
sample
molecular
gaseous
species
aerosol
Prior art date
Application number
Inventor
Daniel Szalay
Lajos Godorhazy
Zoltan Takats
Original Assignee
Medimass Kft
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Medimass Kft filed Critical Medimass Kft
Publication of IN2014MN01506A publication Critical patent/IN2014MN01506A/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/14Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/142Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using a solid target which is not previously vapourised
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/0027Methods for using particle spectrometers
    • H01J49/0031Step by step routines describing the use of the apparatus
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/0445Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for introducing as a spray, a jet or an aerosol
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/0454Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for vaporising using mechanical energy, e.g. by ultrasonic vibrations
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/14Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/16Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Dispersion Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

According to some embodiments systems and methods for surface impact ionization of liquid phase and aerosol samples are provided. The method includes accelerating a liquid or aerosol sample colliding the sample with a solid collision surface thereby disintegrating the sample into both molecular ionic species (e.g. gaseous molecular ions) and molecular neutral species (e.g. gaseous sample) and transporting the disintegrated sample to an ion analyzer. Some embodiments of the method further comprise discarding the molecular neutral species. Such embodiments transport substantially only the molecular ionic species to the ion analyzer.
IN1506MUN2014 2011-12-28 2012-12-28 IN2014MN01506A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201161580715P 2011-12-28 2011-12-28
PCT/IB2012/002995 WO2013098642A2 (en) 2011-12-28 2012-12-28 Collision ion generator and separator

Publications (1)

Publication Number Publication Date
IN2014MN01506A true IN2014MN01506A (en) 2015-05-01

Family

ID=47780098

Family Applications (1)

Application Number Title Priority Date Filing Date
IN1506MUN2014 IN2014MN01506A (en) 2011-12-28 2012-12-28

Country Status (7)

Country Link
US (2) US9287100B2 (en)
EP (2) EP3699950A1 (en)
JP (1) JP6320933B2 (en)
CN (2) CN108511315B (en)
IL (1) IL233401A0 (en)
IN (1) IN2014MN01506A (en)
WO (1) WO2013098642A2 (en)

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Also Published As

Publication number Publication date
EP2798657B1 (en) 2020-05-06
WO2013098642A3 (en) 2014-01-03
CN104254901A (en) 2014-12-31
EP2798657A2 (en) 2014-11-05
IL233401A0 (en) 2014-08-31
US9287100B2 (en) 2016-03-15
CN104254901B (en) 2018-05-04
US20160247668A1 (en) 2016-08-25
CN108511315A (en) 2018-09-07
EP3699950A1 (en) 2020-08-26
CN108511315B (en) 2021-01-08
WO2013098642A2 (en) 2013-07-04
US20140353489A1 (en) 2014-12-04
JP2015504160A (en) 2015-02-05
JP6320933B2 (en) 2018-05-09
US10242858B2 (en) 2019-03-26

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