IN2012DN05264A - - Google Patents
Info
- Publication number
- IN2012DN05264A IN2012DN05264A IN5264DEN2012A IN2012DN05264A IN 2012DN05264 A IN2012DN05264 A IN 2012DN05264A IN 5264DEN2012 A IN5264DEN2012 A IN 5264DEN2012A IN 2012DN05264 A IN2012DN05264 A IN 2012DN05264A
- Authority
- IN
- India
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
- G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequences by preliminary fault modelling, e.g. analysis, simulation
- G01R31/318357—Simulation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
- G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequences by preliminary fault modelling, e.g. analysis, simulation
- G01R31/31835—Analysis of test coverage or failure detectability
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- Evolutionary Computation (AREA)
- Geometry (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102010002563 | 2010-03-04 | ||
DE102010040035A DE102010040035A1 (en) | 2010-03-04 | 2010-08-31 | Improvements to backward analysis to determine error masking factors |
PCT/EP2011/051786 WO2011107321A1 (en) | 2010-03-04 | 2011-02-08 | Improvements in backward analysis for determining fault masking factors |
Publications (1)
Publication Number | Publication Date |
---|---|
IN2012DN05264A true IN2012DN05264A (en) | 2015-08-07 |
Family
ID=44503068
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IN5264DEN2012 IN2012DN05264A (en) | 2010-03-04 | 2012-06-14 |
Country Status (8)
Country | Link |
---|---|
US (1) | US8732649B2 (en) |
EP (1) | EP2542904B1 (en) |
JP (1) | JP5681215B2 (en) |
KR (1) | KR20130008035A (en) |
CN (1) | CN102770777B (en) |
DE (1) | DE102010040035A1 (en) |
IN (1) | IN2012DN05264A (en) |
WO (1) | WO2011107321A1 (en) |
Families Citing this family (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4976412B2 (en) | 2005-12-01 | 2012-07-18 | ベー・エル・アー・ハー・エム・エス・ゲーエムベーハー | Methods for diagnosis and treatment of critically ill patients with endothelin, endothelin agonists and adrenomedullin antagonists |
PT2780371T (en) | 2011-11-16 | 2019-01-30 | Adrenomed Ag | Anti-adrenomedullin (adm) antibody or anti-adm antibody fragment or anti-adm non-ig scaffold for regulating the fluid balance in a patient having a chronic or acute disease |
PT2594587E (en) | 2011-11-16 | 2014-08-27 | Adrenomed Ag | Anti-adrenomedullin (adm) antibody or anti-adm antibody fragment or anti-adm non-ig protein scaffold for reducing the risk of mortality in a patient having a chronic or acute disease or acute condition |
NZ624873A (en) | 2011-11-16 | 2016-07-29 | Adrenomed Ag | Anti-adrenomedullin (adm) antibody or anti-adm antibody fragment or anti-adm non-ig scaffold for prevention or reduction of organ dysfunction or organ failure in a patient having a chronic or acute disease or acute condition |
JP6224608B2 (en) | 2011-11-16 | 2017-11-01 | アドレノメト アクチェンゲゼルシャフト | Anti-adrenomedullin (ADM) antibody, anti-ADM antibody fragment or anti-ADM non-Ig scaffold for use in the treatment of acute disease or condition in a patient to stabilize blood circulation |
SI2780717T1 (en) | 2011-11-16 | 2017-05-31 | Sphingotec Gmbh | Adrenomedullin assays and methods for determining mature adrenomedullin |
US8719747B2 (en) * | 2012-01-31 | 2014-05-06 | Mentor Graphics Corporation | Single event upset mitigation for electronic design synthesis |
WO2014142852A1 (en) * | 2013-03-13 | 2014-09-18 | Intel Corporation | Vulnerability estimation for cache memory |
US9317254B1 (en) * | 2013-12-04 | 2016-04-19 | Google Inc. | Fault tolerance model, methods, and apparatuses and their validation techniques |
US10013581B2 (en) * | 2014-10-07 | 2018-07-03 | Nuvoton Technology Corporation | Detection of fault injection attacks |
KR102542723B1 (en) * | 2016-10-27 | 2023-06-12 | 삼성전자주식회사 | Simulation method and system for predicting ser |
JP6863460B2 (en) | 2017-06-05 | 2021-04-21 | 富士通株式会社 | Soft error inspection method, soft error inspection device and soft error inspection system |
US10691572B2 (en) | 2017-08-30 | 2020-06-23 | Nvidia Corporation | Liveness as a factor to evaluate memory vulnerability to soft errors |
US11022649B2 (en) * | 2018-11-30 | 2021-06-01 | Arm Limited | Stabilised failure estimate in circuits |
US10747601B2 (en) * | 2018-11-30 | 2020-08-18 | Arm Limited | Failure estimation in circuits |
CN109634797A (en) * | 2018-12-18 | 2019-04-16 | 上海交通大学 | A method of with register mask window analysis register architecture sensitive factor |
US11366899B2 (en) | 2020-02-18 | 2022-06-21 | Nuvoton Technology Corporation | Digital fault injection detector |
US11176026B2 (en) | 2020-02-20 | 2021-11-16 | International Business Machines Corporation | Assignment of test case priorities based on combinatorial test design model analysis |
US11086768B1 (en) * | 2020-02-20 | 2021-08-10 | International Business Machines Corporation | Identifying false positives in test case failures using combinatorics |
US11663113B2 (en) | 2020-02-20 | 2023-05-30 | International Business Machines Corporation | Real time fault localization using combinatorial test design techniques and test case priority selection |
US11307975B2 (en) | 2020-02-20 | 2022-04-19 | International Business Machines Corporation | Machine code analysis for identifying software defects |
US11783026B2 (en) * | 2021-01-05 | 2023-10-10 | Nuvoton Technology Corporation | Processor with in-band fault-injection detection |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61187047A (en) | 1985-02-14 | 1986-08-20 | Fujitsu Ltd | Logical circuit simulation system |
JPH04245338A (en) * | 1991-01-31 | 1992-09-01 | Hitachi Ltd | Throughput reducing method for fault simulation |
US5499249A (en) * | 1994-05-31 | 1996-03-12 | At&T Corp. | Method and apparatus for test generation and fault simulation for sequential circuits with embedded random access memories (RAMs) |
CA2159036C (en) * | 1994-12-29 | 1999-01-26 | Miron Abramovici | Method for identifying untestable & redundant faults in sequential logic circuits |
JPH11142482A (en) | 1997-11-13 | 1999-05-28 | Fujitsu Ltd | Method and device for timing fault diagnosis |
US20020188904A1 (en) * | 2001-06-11 | 2002-12-12 | International Business Machines Corporation | Efficiency of fault simulation by logic backtracking |
US7007252B2 (en) * | 2003-04-09 | 2006-02-28 | Synopsys, Inc. | Method and apparatus for characterizing the propagation of noise through a cell in an integrated circuit |
US7159199B2 (en) * | 2004-04-02 | 2007-01-02 | Stmicroelectronics Limited | Method for verifying adequate synchronization of signals that cross clock environments and system |
US7246413B2 (en) | 2004-05-28 | 2007-07-24 | Charles Portelli | Magnetic safety knob for a cabinet door |
US7296201B2 (en) * | 2005-10-29 | 2007-11-13 | Dafca, Inc. | Method to locate logic errors and defects in digital circuits |
US20070226572A1 (en) | 2005-11-07 | 2007-09-27 | Ming Zhang | Soft error rate analysis system |
US8230285B2 (en) | 2006-02-17 | 2012-07-24 | Jds Uniphase Corporation | Protocol analyzer for consumer electronics |
JP5045319B2 (en) * | 2007-09-03 | 2012-10-10 | 日本電気株式会社 | Error signal pulse width calculation method and program |
JP5672038B2 (en) * | 2011-02-10 | 2015-02-18 | 富士通株式会社 | Verification support device, verification support program, and verification support method |
-
2010
- 2010-08-31 DE DE102010040035A patent/DE102010040035A1/en not_active Withdrawn
-
2011
- 2011-02-08 JP JP2012555347A patent/JP5681215B2/en not_active Expired - Fee Related
- 2011-02-08 WO PCT/EP2011/051786 patent/WO2011107321A1/en active Application Filing
- 2011-02-08 CN CN201180012050.6A patent/CN102770777B/en active Active
- 2011-02-08 US US13/582,315 patent/US8732649B2/en active Active
- 2011-02-08 EP EP11703857.0A patent/EP2542904B1/en active Active
- 2011-02-08 KR KR1020127025868A patent/KR20130008035A/en active Search and Examination
-
2012
- 2012-06-14 IN IN5264DEN2012 patent/IN2012DN05264A/en unknown
Also Published As
Publication number | Publication date |
---|---|
JP5681215B2 (en) | 2015-03-04 |
CN102770777A (en) | 2012-11-07 |
WO2011107321A1 (en) | 2011-09-09 |
EP2542904A1 (en) | 2013-01-09 |
EP2542904B1 (en) | 2014-04-16 |
CN102770777B (en) | 2015-05-20 |
JP2013521483A (en) | 2013-06-10 |
US8732649B2 (en) | 2014-05-20 |
US20130061104A1 (en) | 2013-03-07 |
KR20130008035A (en) | 2013-01-21 |
DE102010040035A1 (en) | 2011-09-08 |