IN2012DN01896A - - Google Patents

Download PDF

Info

Publication number
IN2012DN01896A
IN2012DN01896A IN1896DEN2012A IN2012DN01896A IN 2012DN01896 A IN2012DN01896 A IN 2012DN01896A IN 1896DEN2012 A IN1896DEN2012 A IN 1896DEN2012A IN 2012DN01896 A IN2012DN01896 A IN 2012DN01896A
Authority
IN
India
Prior art keywords
image
phase
optical
topography
projected
Prior art date
Application number
Inventor
John Weston Nicholas
Ruth Huddart Yvonne
Original Assignee
Renishaw Plc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Renishaw Plc filed Critical Renishaw Plc
Publication of IN2012DN01896A publication Critical patent/IN2012DN01896A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G01B11/005—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines
    • G01B11/007—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines feeler heads therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

A non-contact method of inspecting the topography of an area of an object via analysis of the phase of a pattern projected on the object. The method comprises taking a first image of the object, obtained from a first perspective, on which an optical pattern is projected, and taking a second image of the object, obtained from a second perspective, on which an optical pat¬tern is projected but in which the optical pattern, as it falls on the object, in the second image differs to that in the first image. The method farther comprises determining data describing the topography of at least a region of the object based on phase data relat¬ing to the phase of at least a region of the optical partem as imaged in the first image. Phase data obtained from a corresponding region of the object as imaged in the second image is used to resolve any ambiguity in the phase or topography data obtained from the first image.
IN1896DEN2012 2009-09-11 2010-09-06 IN2012DN01896A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB0915904.7A GB0915904D0 (en) 2009-09-11 2009-09-11 Non-contact object inspection
PCT/GB2010/001675 WO2011030090A1 (en) 2009-09-11 2010-09-06 Non-contact object inspection

Publications (1)

Publication Number Publication Date
IN2012DN01896A true IN2012DN01896A (en) 2015-07-24

Family

ID=41228144

Family Applications (1)

Application Number Title Priority Date Filing Date
IN1896DEN2012 IN2012DN01896A (en) 2009-09-11 2010-09-06

Country Status (7)

Country Link
US (1) US9329030B2 (en)
EP (1) EP2475954B1 (en)
JP (1) JP5757950B2 (en)
CN (1) CN102483319B (en)
GB (1) GB0915904D0 (en)
IN (1) IN2012DN01896A (en)
WO (1) WO2011030090A1 (en)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10010268B2 (en) * 2010-09-15 2018-07-03 Olympus Corporation Endoscope apparatus
BR112014002063A2 (en) * 2011-07-29 2017-02-21 Hexagon Metrology Inc coordinate measurement system data reduction
US8922647B2 (en) * 2011-08-03 2014-12-30 The Boeing Company Projection aided feature measurement using uncalibrated camera
JP6023415B2 (en) * 2011-10-17 2016-11-09 キヤノン株式会社 Three-dimensional measuring apparatus, control method and program for three-dimensional measuring apparatus
US9188433B2 (en) 2012-05-24 2015-11-17 Qualcomm Incorporated Code in affine-invariant spatial mask
PL2918967T3 (en) * 2012-11-07 2018-10-31 Artec Europe S.A.R.L. Method for monitoring linear dimensions of three-dimensional objects
GB201222361D0 (en) * 2012-12-12 2013-01-23 Univ Birmingham Surface geometry imaging
CN103344651B (en) * 2013-05-08 2015-04-29 中北大学 Method of detecting glass defects based on phase image processing
DE102013211802A1 (en) * 2013-06-21 2014-12-24 Siemens Aktiengesellschaft Dynamikerhöhung in the color-coded triangulation
JP6266244B2 (en) * 2013-07-16 2018-01-24 株式会社キーエンス 3D image processing apparatus, 3D image processing method, 3D image processing program, computer-readable recording medium, and recorded apparatus
JP6266243B2 (en) * 2013-07-16 2018-01-24 株式会社キーエンス 3D image processing apparatus, 3D image processing method, 3D image processing program, computer-readable recording medium, and recorded apparatus
JP6334861B2 (en) * 2013-07-16 2018-05-30 株式会社キーエンス Appearance inspection apparatus, appearance inspection method, appearance inspection program, and computer-readable recording medium
JP6270361B2 (en) * 2013-07-16 2018-01-31 株式会社キーエンス 3D image processing apparatus, 3D image processing method, 3D image processing program, computer-readable recording medium, and recorded apparatus
JP6184289B2 (en) * 2013-10-17 2017-08-23 株式会社キーエンス 3D image processing apparatus, 3D image processing method, 3D image processing program, computer-readable recording medium, and recorded apparatus
US20160094830A1 (en) * 2014-09-26 2016-03-31 Brown University System and Methods for Shape Measurement Using Dual Frequency Fringe Patterns
US9792487B2 (en) * 2014-12-29 2017-10-17 Dell Products, Lp System and method for determining dimensions of an object in an image
US9569859B2 (en) 2014-12-29 2017-02-14 Dell Products, Lp System and method for redefining depth-based edge snapping for three-dimensional point selection
JP2016186674A (en) * 2015-03-27 2016-10-27 セイコーエプソン株式会社 Interactive projector and interactive projection system
WO2016183339A1 (en) * 2015-05-12 2016-11-17 Hexagon Metrology, Inc. Apparatus and method of controlling a coordinate measuring machine using environmental information or coordinate measuring machine information
EP3441715A4 (en) * 2016-04-06 2019-11-13 4d Sensor Inc. Measurement method, measurement device, measurement program, and computer-readable recording medium having measurement program recorded thereon
US11105607B2 (en) 2016-07-28 2021-08-31 Renishaw Plc Non-contact probe and method of operation
US10589860B2 (en) * 2017-05-23 2020-03-17 Gopro, Inc. Spherical infrared emitter
US10401872B2 (en) 2017-05-23 2019-09-03 Gopro, Inc. Method and system for collision avoidance
JP6557319B2 (en) * 2017-12-25 2019-08-07 株式会社キーエンス 3D image processing apparatus, 3D image processing apparatus head unit, 3D image processing method, 3D image processing program, computer-readable recording medium, and recorded apparatus
CN111637850B (en) * 2020-05-29 2021-10-26 南京航空航天大学 Self-splicing surface point cloud measuring method without active visual marker
ES2890302B2 (en) * 2020-07-02 2023-03-07 Ideko S Coop SYSTEM AND PROCESS FOR THE CONTROL OF THE UNCERTAINTY OF A PHOTOGRAMMETRIC MEASURER
CN113029042B (en) * 2021-05-25 2021-08-03 四川大学 Dynamic measuring device and method for surface morphology of high-temperature molten metal

Family Cites Families (109)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4468695A (en) 1980-11-20 1984-08-28 Tokico Ltd. Robot
JPS61114109A (en) 1984-11-09 1986-05-31 Ishida Scales Mfg Co Ltd Weight receiving method
DE3580647D1 (en) 1984-09-19 1991-01-03 Ishida Scale Mfg Co Ltd METHOD FOR DETERMINING A VOLUME.
US5372502A (en) 1988-09-02 1994-12-13 Kaltenbach & Voight Gmbh & Co. Optical probe and method for the three-dimensional surveying of teeth
DE3829925C2 (en) 1988-09-02 1994-03-03 Kaltenbach & Voigt Device for the optical measurement of teeth in the oral cavity
GB8908854D0 (en) 1989-04-19 1989-06-07 Renishaw Plc Method of and apparatus for scanning the surface of a workpiece
DE3938714A1 (en) 1989-11-23 1991-05-29 Bernd Dr Breuckmann Optical determination of object shapes, shape variations - using structured coloured light projected onto objects for high resolution, dynamic measurement
DE4007500A1 (en) 1990-03-09 1991-09-12 Zeiss Carl Fa METHOD AND DEVICE FOR CONTACTLESS MEASUREMENT OF OBJECT SURFACES
US5589942A (en) 1990-04-05 1996-12-31 Intelligent Automation Systems Real time three dimensional sensing system
JP2926365B2 (en) 1990-11-30 1999-07-28 マツダ株式会社 Surface defect inspection equipment
DE4121464A1 (en) 1990-06-28 1992-01-09 Mazda Motor DEVICE FOR DETECTING SURFACE DEFECTS
FR2664377A1 (en) * 1990-07-03 1992-01-10 Bertin & Cie APPARATUS FOR DETERMINING THE THREE DIMENSIONAL FORM OF AN OBJECT WITHOUT CONTACT.
US5251156A (en) 1990-08-25 1993-10-05 Carl-Zeiss-Stiftung, Heidenheim/Brenz Method and apparatus for non-contact measurement of object surfaces
DE4134546A1 (en) 1991-09-26 1993-04-08 Steinbichler Hans METHOD AND DEVICE FOR DETERMINING THE ABSOLUTE COORDINATES OF AN OBJECT
US5175601A (en) 1991-10-15 1992-12-29 Electro-Optical Information Systems High-speed 3-D surface measurement surface inspection and reverse-CAD system
DE4301538A1 (en) 1992-03-17 1994-07-28 Peter Dr Ing Brueckner Method and arrangement for contactless three-dimensional measurement, in particular for measuring denture models
US5319445A (en) 1992-09-08 1994-06-07 Fitts John M Hidden change distribution grating and use in 3D moire measurement sensors and CMM applications
JPH06138055A (en) * 1992-10-28 1994-05-20 Sumitomo Metal Ind Ltd Method for inspecting surface defect
US5488477A (en) 1993-11-15 1996-01-30 Zygo Corporation Methods and apparatus for profiling surfaces of transparent objects
JP3370418B2 (en) 1994-03-18 2003-01-27 株式会社資生堂 3D shape measurement system
US6028672A (en) 1996-09-30 2000-02-22 Zheng J. Geng High speed three dimensional imaging method
GB9515311D0 (en) 1995-07-26 1995-09-20 3D Scanners Ltd Stripe scanners and methods of scanning
DE19634254B4 (en) 1995-09-04 2009-06-10 Volkswagen Ag Optical-numerical method for determining the entire surface of a three-dimensional object
US5646733A (en) 1996-01-29 1997-07-08 Medar, Inc. Scanning phase measuring method and system for an object at a vision station
US5953448A (en) * 1996-03-01 1999-09-14 Textile/Clothing Technology Corporation Contour measurement of an object having a discontinuous surface using block point identification techniques
PT888522E (en) 1996-03-22 2001-10-30 Univ Loughborough PROCESS AND APPARATUS FOR THE MEDICATION OF THE OBJECT FORM
DE19618140A1 (en) 1996-05-06 1997-11-13 Fraunhofer Ges Forschung 3D measuring arrangement for whole body detection and measurement of a corresponding measuring arrangement
DE69726025T2 (en) * 1996-06-13 2004-09-16 K.U. Leuven Research & Development METHOD AND DEVICE FOR OBTAINING A THREE-DIMENSIONAL SHAPE
US6600511B1 (en) 1997-01-08 2003-07-29 Pentax Corporation Camera for use in photogrammetric analytical measurement
DE69829091T2 (en) 1997-05-22 2006-02-09 Kabushiki Kaisha Topcon measuring device
US6438272B1 (en) * 1997-12-31 2002-08-20 The Research Foundation Of State University Of Ny Method and apparatus for three dimensional surface contouring using a digital video projection system
JPH11211442A (en) 1998-01-27 1999-08-06 Matsushita Electric Works Ltd Method and device for detecting defect of object surface
JP3922784B2 (en) 1998-01-27 2007-05-30 松下電工株式会社 3D shape measuring device
US6291817B1 (en) 1998-06-23 2001-09-18 Fuji Photo Optical Co., Ltd. Moire apparatus having projection optical system and observation optical system which have optical axes parallel to each other
US6262803B1 (en) 1998-09-10 2001-07-17 Acuity Imaging, Llc System and method for three-dimensional inspection using patterned light projection
JP2000097672A (en) 1998-09-18 2000-04-07 Sanyo Electric Co Ltd Control information generating method and assisting system in three-dimensional measuring system
DE19846145A1 (en) 1998-10-01 2000-04-20 Klaus Koerner Three-dimensional imaging device for shape measurement has transmitter array whose elements move in straight, parallel lines
HU220729B1 (en) 1998-10-06 2002-05-28 EasyScan Műszaki Fejlesztő, Kereskedelmi és Szolgáltató Kft. Method and apparatus for scanning a three-dimensional object and producing a model of it by computer
US6084712A (en) * 1998-11-03 2000-07-04 Dynamic Measurement And Inspection,Llc Three dimensional imaging using a refractive optic design
CA2253085A1 (en) 1998-11-06 2000-05-06 Industrial Metrics Inc. Methods and system for measuring three dimensional spatial coordinates and for external camera calibration necessary for that measurement
US6744932B1 (en) * 2000-04-28 2004-06-01 Orametrix, Inc. System and method for mapping a surface
US6738508B1 (en) * 2000-04-28 2004-05-18 Orametrix, Inc. Method and system for registering data
US6728423B1 (en) * 2000-04-28 2004-04-27 Orametrix, Inc. System and method for mapping a surface
US7068836B1 (en) * 2000-04-28 2006-06-27 Orametrix, Inc. System and method for mapping a surface
US6771809B1 (en) * 2000-04-28 2004-08-03 Orametrix, Inc. Method and system for registering data
US6532299B1 (en) * 2000-04-28 2003-03-11 Orametrix, Inc. System and method for mapping a surface
US6744914B1 (en) * 2000-04-28 2004-06-01 Orametrix, Inc. Method and system for generating a three-dimensional object
JP3417377B2 (en) 1999-04-30 2003-06-16 日本電気株式会社 Three-dimensional shape measuring method and apparatus, and recording medium
US6100984A (en) 1999-06-11 2000-08-08 Chen; Fang Surface measurement system with a laser light generator
JP3281918B2 (en) 1999-10-12 2002-05-13 和歌山大学長 Shape measurement method and device
JP3714063B2 (en) 1999-10-19 2005-11-09 富士ゼロックス株式会社 3D shape measuring device
WO2001051887A1 (en) 2000-01-07 2001-07-19 Cyberoptics Corporation Phase profilometry system with telecentric projector
JP4010753B2 (en) 2000-08-08 2007-11-21 株式会社リコー Shape measuring system, imaging device, shape measuring method, and recording medium
JP3554816B2 (en) 2000-09-14 2004-08-18 和歌山大学長 Real-time shape deformation measurement method by rectangular wave grid projection
JP3687531B2 (en) 2000-11-27 2005-08-24 松下電工株式会社 Three-dimensional shape measurement method and system
JP4390779B2 (en) 2001-02-14 2009-12-24 株式会社リコー Image input device
JP4012710B2 (en) 2001-02-14 2007-11-21 株式会社リコー Image input device
JP4123331B2 (en) 2001-03-16 2008-07-23 日本電気株式会社 Portable wireless communication terminal capable of multimedia communication with multimedia communication system and message transmission / reception method
US7061628B2 (en) 2001-06-27 2006-06-13 Southwest Research Institute Non-contact apparatus and method for measuring surface profile
US7103211B1 (en) 2001-09-04 2006-09-05 Geometrix, Inc. Method and apparatus for generating 3D face models from one camera
US20030123707A1 (en) 2001-12-31 2003-07-03 Park Seujeung P. Imaging-based distance measurement and three-dimensional profiling system
TW550521B (en) 2002-02-07 2003-09-01 Univ Nat Central Method for re-building 3D model of house in a semi-automatic manner using edge segments of buildings
JP2003269928A (en) * 2002-03-12 2003-09-25 Nec Corp Method and instrument for measuring three-dimensional shape, and program
DE10219054B4 (en) 2002-04-24 2004-08-26 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Method and device for determining the spatial coordinates of an object
WO2004083778A1 (en) 2003-03-18 2004-09-30 Hermary Alexander Thomas Coded-light dual-view profile scanner
JP4255865B2 (en) 2003-03-31 2009-04-15 株式会社ミツトヨ Non-contact three-dimensional shape measuring method and apparatus
US7286246B2 (en) 2003-03-31 2007-10-23 Mitutoyo Corporation Method and apparatus for non-contact three-dimensional surface measurement
CA2522097C (en) 2003-04-28 2012-09-25 Stephen James Crampton Cmm arm with exoskeleton
CA2435935A1 (en) 2003-07-24 2005-01-24 Guylain Lemelin Optical 3d digitizer with enlarged non-ambiguity zone
ES2313036T3 (en) 2003-07-24 2009-03-01 Cognitens Ltd. PROCEDURE AND SYSTEM FOR THE RECONSTRUCTION OF THE THREE-DIMENSIONAL SURFACE OF AN OBJECT.
DE10359104B3 (en) 2003-12-17 2005-10-13 Universität Karlsruhe Method for dynamic, three-dimensional acquisition and display of a surface
WO2005073669A1 (en) 2004-01-29 2005-08-11 Siemens Corporate Research, Inc. Semi and fully-automatic camera calibration tools using laser-based measurement devices
US7327857B2 (en) 2004-03-09 2008-02-05 General Electric Company Non-contact measurement method and apparatus
JP2005308553A (en) 2004-04-21 2005-11-04 Topcon Corp Three-dimensional image measuring device and method
JP4645068B2 (en) 2004-06-04 2011-03-09 旭硝子株式会社 Surface shape inspection method and inspection apparatus
US7171328B1 (en) 2004-08-30 2007-01-30 Sandia Corporation Method for measuring thermal properties using a long-wavelength infrared thermal image
JP2008537190A (en) * 2005-01-07 2008-09-11 ジェスチャー テック，インコーポレイテッド Generation of three-dimensional image of object by irradiating with infrared pattern
EP1877726B1 (en) 2005-03-11 2011-07-27 Creaform Inc. Auto-referenced system and apparatus for three-dimensional scanning
EP1875161B1 (en) * 2005-04-06 2014-06-11 Dimensional Photonics International, Inc. Multiple channel interferometric surface contour measurement system
US8044996B2 (en) 2005-05-11 2011-10-25 Xenogen Corporation Surface construction using combined photographic and structured light information
JP2007024764A (en) 2005-07-20 2007-02-01 Daihatsu Motor Co Ltd Noncontact three-dimensional measuring method and system
JP2007093412A (en) 2005-09-29 2007-04-12 Fujinon Corp Three-dimensional shape measuring device
US7538891B1 (en) 2005-09-30 2009-05-26 California Institute Of Technology Surface characterization based on lateral shearing of diffracted wave fronts to measure in-plane and out-of-plane displacement gradient fields
JP2007114071A (en) 2005-10-20 2007-05-10 Omron Corp Three-dimensional shape measuring apparatus, program, computer-readable storage medium, and three-dimensional shape measuring method
US7898651B2 (en) 2005-10-24 2011-03-01 General Electric Company Methods and apparatus for inspecting an object
WO2007061632A2 (en) * 2005-11-09 2007-05-31 Geometric Informatics, Inc. Method and apparatus for absolute-coordinate three-dimensional surface imaging
CA2528791A1 (en) 2005-12-01 2007-06-01 Peirong Jia Full-field three-dimensional measurement method
GB2455926B (en) 2006-01-30 2010-09-01 Axellis Ltd Method of preparing a medical restraint
US7773797B2 (en) 2006-02-06 2010-08-10 Beijing University Of Aeronautics And Astronautics Methods and apparatus for measuring the flapping deformation of insect wings
KR100708352B1 (en) * 2006-03-07 2007-04-18 한국과학기술원 APPARATUS AND METHOD FOR 3DIMENSION CONFIGURATION MEASUREMENT WITHOUT PHASE SHIFT PROCESS AND 2pi; AMBIGUITY OF MOIRE PRINCIPLE
DE102006018558B4 (en) 2006-04-21 2022-10-06 QUISS Qualitäts-Inspektionssysteme und Service GmbH Method for automatically applying or creating and monitoring a structure applied to a substrate with determination of geometric dimensions
ATE441087T1 (en) 2006-04-27 2009-09-15 3D Scanners Ltd OPTICAL SCANNING PROBE
JP2007315882A (en) * 2006-05-25 2007-12-06 Dainippon Printing Co Ltd Apparatus and method for positioning substrate, and device and method for manufacturing color filter
US20090268214A1 (en) 2006-05-26 2009-10-29 Miljenko Lucic Photogrammetric system and techniques for 3d acquisition
CN100520285C (en) * 2006-07-13 2009-07-29 黑龙江科技学院 Vision measuring method for projecting multiple frequency grating object surface tri-dimensional profile
WO2008033329A2 (en) 2006-09-15 2008-03-20 Sciammarella Cesar A System and method for analyzing displacements and contouring of surfaces
JP4905013B2 (en) * 2006-09-19 2012-03-28 株式会社デンソー Appearance inspection apparatus, appearance inspection method, height measurement method, and circuit board manufacturing method
US7256899B1 (en) 2006-10-04 2007-08-14 Ivan Faul Wireless methods and systems for three-dimensional non-contact shape sensing
DE102006049695A1 (en) 2006-10-16 2008-04-24 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Device and method for contactless detection of a three-dimensional contour
KR100919166B1 (en) * 2007-04-02 2009-09-28 한국과학기술원 Stereo Moire Measurement Apparatus and Method
US8111907B2 (en) 2007-07-31 2012-02-07 United Technologies Corporation Method for repeatable optical determination of object geometry dimensions and deviations
JP5485889B2 (en) 2007-08-17 2014-05-07 レニショウ パブリック リミテッド カンパニー Apparatus and method for performing phase analysis measurement
US8064068B2 (en) 2008-01-25 2011-11-22 Cyberoptics Corporation Multi-source sensor for three-dimensional imaging using phased structured light
US8059280B2 (en) 2008-01-31 2011-11-15 Cyberoptics Corporation Method for three-dimensional imaging using multi-phase structured light
US9170097B2 (en) 2008-04-01 2015-10-27 Perceptron, Inc. Hybrid system
DE112009001652T5 (en) * 2008-07-08 2012-01-12 Chiaro Technologies, Inc. Multichannel recording
KR20110133477A (en) 2009-02-17 2011-12-12 앱솔루트 로보틱스 리미티드 Measurement of positional information for a robot arm
US8045181B2 (en) * 2009-05-21 2011-10-25 General Electric Company Inspection system and method with multi-image phase shift analysis
US8582824B2 (en) * 2009-06-25 2013-11-12 Twin Coast Metrology Cell feature extraction and labeling thereof

Also Published As

Publication number Publication date
CN102483319A (en) 2012-05-30
US20120154576A1 (en) 2012-06-21
JP2013504752A (en) 2013-02-07
WO2011030090A1 (en) 2011-03-17
US9329030B2 (en) 2016-05-03
GB0915904D0 (en) 2009-10-14
JP5757950B2 (en) 2015-08-05
CN102483319B (en) 2015-04-22
EP2475954A1 (en) 2012-07-18
EP2475954B1 (en) 2016-12-28

Similar Documents

Publication Publication Date Title
IN2012DN01896A (en)
GB201309572D0 (en) Skurface data acquisition, storage, and assessment system
WO2012018568A3 (en) Method and apparatus for imaging
WO2009063087A3 (en) Method for optical measurement of the three dimensional geometry of objects
ATE556397T1 (en) SENSOR FOR PRESENCE DETECTION
ATE421716T1 (en) SURFACE TRIANGULATION AND PROFILING
EP2937815A3 (en) Methods and systems for object detection using laser point clouds
DE60326881D1 (en) DIGITIZATION SYSTEM WITH A LASER FOR DENTAL APPLICATIONS
GB201305955D0 (en) A laser scanner or laser tracker having a projector
EP2161537A3 (en) Optical position measuring apparatus based on projection of grid patterns
EA201201577A1 (en) METHOD OF USING IMAGE DATA FOR CONSTRUCTING AN IMAGE OF A SPECIFIED OBJECT
IN2014MN02441A (en)
WO2008033909A3 (en) Apparatus, probe and method for providing depth assessment in an anatomical structure
PT1899678E (en) A system and method for measuring and mapping a surface relative to a reference
WO2008100248A3 (en) Feature matching method
GB2507013A (en) Scale Independent tracking pattern
WO2011029740A3 (en) Devices and methods for determining positions and measuring surfaces
MY156072A (en) Apparatus and method for inspecting an object with increased depth of field
WO2010093824A3 (en) Registration and comparison of three dimensional objects
WO2015100403A3 (en) Method and apparatus for precise determination of a position of a target on a surface
WO2012110898A9 (en) System and method for multi-scanner x-ray inspection
JP2013185832A5 (en)
WO2016039915A3 (en) Systems and methods using spatial sensor data in full-field three-dimensional surface measurment
GB2450260A (en) Techniques for interior coordinates
WO2011096695A3 (en) Process for creating an inspection program