IN170226B - - Google Patents
Info
- Publication number
- IN170226B IN170226B IN669/DEL/86A IN669DE1986A IN170226B IN 170226 B IN170226 B IN 170226B IN 669DE1986 A IN669DE1986 A IN 669DE1986A IN 170226 B IN170226 B IN 170226B
- Authority
- IN
- India
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Machines For Laying And Maintaining Railways (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB858519473A GB8519473D0 (en) | 1985-08-02 | 1985-08-02 | Measuring movements of railway rails |
| GB868616298A GB8616298D0 (en) | 1986-07-03 | 1986-07-03 | Measuring displacement |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| IN170226B true IN170226B (de) | 1992-02-29 |
Family
ID=26289596
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IN669/DEL/86A IN170226B (de) | 1985-08-02 | 1986-07-23 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US4694690A (de) |
| EP (1) | EP0211627A3 (de) |
| AU (1) | AU581145B2 (de) |
| IN (1) | IN170226B (de) |
| NZ (1) | NZ217058A (de) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB8706317D0 (en) * | 1987-03-17 | 1987-04-23 | Bicc Plc | Optical sensor |
| US4914290A (en) * | 1988-04-06 | 1990-04-03 | Dukane Corporation | Method and apparatus for measuring of microdistances |
| IT1216609B (it) * | 1988-04-21 | 1990-03-08 | Pirelli Cavi Spa | Sensore ottico di posizione. |
| US5161891A (en) * | 1991-02-12 | 1992-11-10 | Practical Transportation, Inc. | Process for determining and controlling railroad rail's neutral temperature to prevent track buckling and rail fractures |
| WO2001018487A1 (de) * | 1999-09-06 | 2001-03-15 | Franz Rottner | Verformungsaufnehmer |
| DE10152380A1 (de) * | 2001-10-28 | 2003-06-26 | Pieper Siegfried | Vorrichtung zur Erfassung von Kräften und Veränderungen an Rädern von Schienenfahrzeugen |
| KR100520467B1 (ko) * | 2003-10-15 | 2005-10-11 | 한국철도기술연구원 | 궤도차량의 속도측정장치 및 그 방법 |
| US7584646B2 (en) | 2006-09-08 | 2009-09-08 | Ford Global Technologies, Llc | Device for measuring coefficient of friction |
| DE102011018684B4 (de) | 2011-04-26 | 2019-05-16 | Manfred A. Gregor | Mikroamplitudenmeter |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE1165632B (de) * | 1959-05-13 | 1964-03-19 | Plasser Bahnbaumasch Franz | Einrichtung zum in Gleislaengsrichtung fortschreitenden Ausrichten eines Gleises der Hoehe oder der Seite nach |
| US4103547A (en) * | 1977-02-07 | 1978-08-01 | The United States Of America As Represented By The Secretary Of The Department Of Transportation | Locomotive track curvature indicator |
| DE2721215C3 (de) * | 1977-05-11 | 1981-02-05 | Opto-Produkte Ag, Zuerich (Schweiz) | Reifenprüfgerät zur zerstörungsfreien holographischen Werkstoffprüfung von Fahr- und Flugzeugreifen auf Fehlstellen |
| US4173073A (en) * | 1977-05-25 | 1979-11-06 | Hitachi, Ltd. | Track displacement detecting and measuring system |
| FR2417753A1 (fr) * | 1978-02-15 | 1979-09-14 | Hitachi Ltd | Systeme de mesure optique a distance et de controle d'un objet subissant une transformation physique |
| SE415397B (sv) * | 1978-06-02 | 1980-09-29 | Asea Ab | Fiberoptiskt metdon |
| AT368221B (de) * | 1980-02-27 | 1982-09-27 | Plasser Bahnbaumasch Franz | Schienenkopfoberflaechen-messeinrichtung |
| JPS60230016A (ja) * | 1984-04-27 | 1985-11-15 | Mitsubishi Electric Corp | 光学的変位測定装置 |
-
1986
- 1986-07-23 IN IN669/DEL/86A patent/IN170226B/en unknown
- 1986-07-29 AU AU60670/86A patent/AU581145B2/en not_active Ceased
- 1986-07-30 US US06/891,652 patent/US4694690A/en not_active Expired - Fee Related
- 1986-08-01 EP EP86305922A patent/EP0211627A3/de not_active Withdrawn
- 1986-08-01 NZ NZ217058A patent/NZ217058A/xx unknown
Also Published As
| Publication number | Publication date |
|---|---|
| NZ217058A (en) | 1989-10-27 |
| AU6067086A (en) | 1987-02-05 |
| AU581145B2 (en) | 1989-02-09 |
| US4694690A (en) | 1987-09-22 |
| EP0211627A3 (de) | 1988-05-04 |
| EP0211627A2 (de) | 1987-02-25 |