IL193447A0 - Method and apparatus for data analysis - Google Patents

Method and apparatus for data analysis

Info

Publication number
IL193447A0
IL193447A0 IL193447A IL19344708A IL193447A0 IL 193447 A0 IL193447 A0 IL 193447A0 IL 193447 A IL193447 A IL 193447A IL 19344708 A IL19344708 A IL 19344708A IL 193447 A0 IL193447 A0 IL 193447A0
Authority
IL
Israel
Prior art keywords
data analysis
analysis
data
Prior art date
Application number
IL193447A
Other versions
IL193447A (en
Original Assignee
Test Advantage Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Test Advantage Inc filed Critical Test Advantage Inc
Publication of IL193447A0 publication Critical patent/IL193447A0/en
Publication of IL193447A publication Critical patent/IL193447A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2894—Aspects of quality control [QC]

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Complex Calculations (AREA)
IL193447A 2006-02-17 2008-08-14 Method and apparatus for data analysis IL193447A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US77468206P 2006-02-17 2006-02-17
PCT/US2007/062366 WO2007098426A2 (en) 2006-02-17 2007-02-17 Methods and apparatus for data analysis

Publications (2)

Publication Number Publication Date
IL193447A0 true IL193447A0 (en) 2009-05-04
IL193447A IL193447A (en) 2015-05-31

Family

ID=38438077

Family Applications (1)

Application Number Title Priority Date Filing Date
IL193447A IL193447A (en) 2006-02-17 2008-08-14 Method and apparatus for data analysis

Country Status (4)

Country Link
EP (1) EP1989561A2 (en)
JP (3) JP2009527903A (en)
IL (1) IL193447A (en)
WO (1) WO2007098426A2 (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5537346B2 (en) * 2010-09-06 2014-07-02 株式会社日立メディコ Image diagnosis support apparatus and image diagnosis support method
JP5767963B2 (en) * 2011-12-28 2015-08-26 株式会社キーエンス Appearance inspection apparatus, appearance inspection method, and computer program
JP6532373B2 (en) * 2015-10-16 2019-06-19 株式会社Ｎｔｔファシリティーズ Storage battery deterioration estimation system, storage battery deterioration estimation method and storage battery deterioration estimation program
JP6752661B2 (en) * 2016-09-05 2020-09-09 日置電機株式会社 Processing equipment, inspection systems and processing programs
EP3451219A1 (en) * 2017-08-31 2019-03-06 KBC Groep NV Improved anomaly detection
US20200004619A1 (en) * 2018-06-28 2020-01-02 Honeywell International Inc. System and method for detecting a shift in real data trend using the configurable adaptive threshold
US11157346B2 (en) * 2018-09-26 2021-10-26 Palo Alto Rsearch Center Incorporated System and method for binned inter-quartile range analysis in anomaly detection of a data series
CN113486003B (en) * 2021-06-02 2024-03-19 广州数说故事信息科技有限公司 Enterprise data set processing method and system considering abnormal values in data visualization
US11907088B2 (en) * 2021-12-15 2024-02-20 Synopsys, Inc. Testing of hardware queue systems using on device test generation

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0352247A (en) * 1989-07-20 1991-03-06 Seiko Instr Inc Semiconductor testing apparatus
JPH04283046A (en) * 1991-03-12 1992-10-08 Nec Corp Working sequence control system
JP2002016118A (en) * 2000-06-29 2002-01-18 Agilent Technologies Japan Ltd Semiconductor parametric test device
US8417477B2 (en) * 2001-05-24 2013-04-09 Test Acuity Solutions, Inc. Methods and apparatus for local outlier detection
EP1479025B1 (en) * 2001-05-24 2010-09-29 Test Advantage, Inc. Methods and apparatus for semiconductor testing
EP1723571A4 (en) * 2004-02-06 2007-05-09 Test Advantage Inc Methods and apparatus for data analysis
JP2006146459A (en) * 2004-11-18 2006-06-08 Renesas Technology Corp Method and system for manufacturing semiconductor device
JP5116307B2 (en) * 2007-01-04 2013-01-09 ルネサスエレクトロニクス株式会社 Integrated circuit device abnormality detection device, method and program

Also Published As

Publication number Publication date
EP1989561A2 (en) 2008-11-12
JP2009188418A (en) 2009-08-20
JP5080526B2 (en) 2012-11-21
JP2009527903A (en) 2009-07-30
JP2010197385A (en) 2010-09-09
WO2007098426A2 (en) 2007-08-30
JP5907649B2 (en) 2016-04-26
IL193447A (en) 2015-05-31
WO2007098426A3 (en) 2008-11-13

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