IE891576L - Electronic test system - Google Patents

Electronic test system

Info

Publication number
IE891576L
IE891576L IE157689A IE157689A IE891576L IE 891576 L IE891576 L IE 891576L IE 157689 A IE157689 A IE 157689A IE 157689 A IE157689 A IE 157689A IE 891576 L IE891576 L IE 891576L
Authority
IE
Ireland
Prior art keywords
test system
electronic test
electronic
test
Prior art date
Application number
IE157689A
Other versions
IE891576A1 (en
IE80813B1 (en
Original Assignee
Revolventon Invest Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Revolventon Invest Ltd filed Critical Revolventon Invest Ltd
Priority to IE157689A priority Critical patent/IE80813B1/en
Priority to GB9010928A priority patent/GB2233130A/en
Publication of IE891576L publication Critical patent/IE891576L/en
Publication of IE891576A1 publication Critical patent/IE891576A1/en
Publication of IE80813B1 publication Critical patent/IE80813B1/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2215—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test error correction or detection circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
IE157689A 1989-05-16 1989-05-16 Electronic test systems IE80813B1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
IE157689A IE80813B1 (en) 1989-05-16 1989-05-16 Electronic test systems
GB9010928A GB2233130A (en) 1989-05-16 1990-05-16 Testing microprocessor-based apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IE157689A IE80813B1 (en) 1989-05-16 1989-05-16 Electronic test systems

Publications (3)

Publication Number Publication Date
IE891576L true IE891576L (en) 1990-11-16
IE891576A1 IE891576A1 (en) 1991-02-13
IE80813B1 IE80813B1 (en) 1999-03-10

Family

ID=11029251

Family Applications (1)

Application Number Title Priority Date Filing Date
IE157689A IE80813B1 (en) 1989-05-16 1989-05-16 Electronic test systems

Country Status (2)

Country Link
GB (1) GB2233130A (en)
IE (1) IE80813B1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6094624A (en) * 1997-08-19 2000-07-25 Chao; Nathan Electronic test facility
DE10014709A1 (en) * 2000-03-24 2001-09-27 Mannesmann Vdo Ag Device for testing computer supported function units in motor vehicles, e.g. testing of a vehicle separation controller using an engine control unit, so that connections to external testing devices are not required

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4402055A (en) * 1981-01-27 1983-08-30 Westinghouse Electric Corp. Automatic test system utilizing interchangeable test devices
US4455654B1 (en) * 1981-06-05 1991-04-30 Test apparatus for electronic assemblies employing a microprocessor
FR2531230A1 (en) * 1982-07-27 1984-02-03 Rank Xerox Sa ASSEMBLY FOR CENTRALIZED AUTOMATIC TEST OF PRINTED CIRCUITS AND METHOD FOR TESTING MICROPROCESSOR CIRCUITS USING THE SAME
US4691316A (en) * 1985-02-14 1987-09-01 Support Technologies, Inc. ROM emulator for diagnostic tester
US4868822A (en) * 1988-02-19 1989-09-19 John Fluke Mfg. Co., Inc. Memory emulation method and system for testing and troubleshooting microprocessor-based electronic systems

Also Published As

Publication number Publication date
GB2233130A (en) 1991-01-02
IE891576A1 (en) 1991-02-13
IE80813B1 (en) 1999-03-10
GB9010928D0 (en) 1990-07-04

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Legal Events

Date Code Title Description
MK9A Patent expired