IE52515B1 - Arbiter circuit - Google Patents
Arbiter circuitInfo
- Publication number
- IE52515B1 IE52515B1 IE103/82A IE10382A IE52515B1 IE 52515 B1 IE52515 B1 IE 52515B1 IE 103/82 A IE103/82 A IE 103/82A IE 10382 A IE10382 A IE 10382A IE 52515 B1 IE52515 B1 IE 52515B1
- Authority
- IE
- Ireland
- Prior art keywords
- output
- gate
- gates
- input
- low
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
- H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
- H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
- H03K3/037—Bistable circuits
- H03K3/0375—Bistable circuits provided with means for increasing reliability; for protection; for ensuring a predetermined initial state when the supply voltage has been applied; for storing the actual state when the supply voltage fails
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/22—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral
- H03K5/26—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being duration, interval, position, frequency, or sequence
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Manipulation Of Pulses (AREA)
- Logic Circuits (AREA)
- Electronic Switches (AREA)
- Bus Control (AREA)
- Lock And Its Accessories (AREA)
Abstract
An arbiter circuit includes a latch made of two crosscoupled NAND gates, one of which is a Schmitt NAND gate, a difference detector, and two output NOR gates. The output of the latch is coupled to the difference detector and to one input of the NOR gates. The NOR gates receive another input from the difference detector. The difference detector is responsive to a voltage difference that exceeds one VBE, thereby blocking signals that originate in the latch during oscillating or metastable states of the latch, which may include rut pulses.
Description
This invention relates to digital logic circuits and more particularly to an arbiter circuit of the kind employing cross-coupled NAND gates that 5 overcomes the susceptibility of the NAND gates to become metastable, and effectively blocks the transmission of this condition until such time as the outputs are in one of two stable states.
An arbiter circuit is used in digital logic ,D to a) respond to a first one of two signals that may arrive at a slight difference in time, so as to give priority to such asynchronous signals on a first come first serve basis, and b) in the case of signals that arrive at the same instant in time, make an arbitrary decision as to which of the two signals it will respond to first.
Arbiter circuits commonly employ a latch made up of two cross-coupled NAND gates. One of the problems frequently encountered in such arbiter circuits arises from a metastable condition of the cross-coupled NAND gates where the latch output is neither HIGH nor LOW but is in an intermediate state (metastable state).
This condition is usually preceded by the production in the output of the latch of what is called a rut pulse.
A rut pulse is characterized as a narrow, zero-going or positive-going pulse which is too narrow to effectively con trol the arbiter circuit, but wide enough to· be detectedln the output bus. While the probability of a metastable state 30 existing can be reduced or the duration of the metastable state can be reduced, it is extremely unlikely that this condition can be completely eliminated. Thus it becomes
82515 necessary to provide some means whereby the rut pulses, and/or the metastable levels, when they occur, can be blocked from reaching the succeeding logic devices.
Summary of the invention
According to the present invention there is provided an abriter circuit, comprising:
a) first and second input terminals and first and second output terminals;
b) first and second cross-coupled NAND gates to which first and second input terminals, respectively, are coupled;
c) a difference detector gate to first and second inputs of which the outputs of said first and second cross-coupled NAND gates respectively are coupled, which detector circuit is responsive to a voltage difference exceeding a specific amount;
d) first and second further gates having their outputs coupled to said first and second output terminals, respectively;
e) a coupling from the output of said first NAND gate to a first input of said first further gate and a coupling from the output of said second NAND gate to a first input of said second further gate; and
f) a coupling from the output of said difference detector gate to a second input of each of said further gates, for blocking said further gates when the voltage difference between the first and second inputs of said difference detector gate does not exceed said specific amount.
An arbiter circuit includes a latch made up of first and second crosscoupled NAND gates, with the first NAND gate coupled to a first input terminal and the second NAND gate coupled to a second input terminal.
One of the NAND gates is preferably a Schmitt NAND gate. The outputs of the NAND gates are coupled to a difference detector which is responsive to a specified voltage difference, preferably about one νθΕ· The output of the difference detector is fed to a first input of each of two output NOR gates which also receive a second input from the two NAND gates, respectively.
Since the difference detector responds only to input signals whose voltage difference exceeds a specified value, any signals that are produced during an oscillating or metastable state of the latch, which may include rut pulses, are blocked by the difference detector from reaching the output NOR gates.
Brief description of the drawings
Figure 1 is a block diagram of an arbiter circuit according to the invention.
Figures 2-4 are graphs of waveforms useful in explaining the operation of the arbiter circuit.
Figures 5a-5c comprise a detailed schematic diagram of the arbiter circuit.
Description of the preferred embodiment
Referring now to Figure 1, there is shown an embodiment of the arbiter circuit according to the invention which is furnished with a pair of input terminals A and B and a pair of output terminals J and K. The first input terminal A is coupled to a first input of a first NAND gate 10, preferably shown as a Schmitt NAND gate. The second input terminal B is coupled to a first input of a second NAND gate 12. The two NAND gates 10 and 12 are cross-coupled to form a latch, with the cross-coupled inputs referred to as second inputs of the latch.
The output C of the first NAND gate 10 is coupled to one input of a difference detector gate 14 and also to one input of a first NOR 'gate 16. The output D of the second NAND gate 12 is coupled to the other input of the difference detector gate 14 and also to one input of a second NOR gate 18. The output E of the difference detector gate 1U is coupled to the second inputs of the two NOR gates 16 and 18.
The output E of the first NOR gate 16 is coupled to the first output terminal J and the output G of the second NOR gate 18 is coupled to the second output terminal K. The output E of the first NOR gate 16 is also coupled through a first inverter 20 to a third input of the second NAND gate 12. Similarly, the output G of the second NOR gate 18 is coupled through a second inverter 22 to a third input of the first, or Schmitt,
NAND gate 10. The inverted outputs, or third inputs of the NAND gates 12 and 10, are labeled H and I, respectively.
The difference detector gate 14 is designed so that its output is HIGH at all times unless its inputs differ by greater than a fixed amount, in this case greater than one V^. Like a conventional exclusive NOR gate, the output will be HIGH if both inputs are HIGH, or if both inputs are LOW. However, for the output to be LOW the two inputs must differ by more than one V__.
The operation of the arbiter circuit will now be described. In the starting condition, both inputs A and B are LOW. The output of a NAND gate is LOW only if all inputs are HIGH. Therefore, since one input of each NAND gate 10 and 12 is LOW, the outputs C and D will be HIGH and so will the cross-coupled second inputs to gates 10 and 12 be HIGH. Both inputs to the difference detector gate 14 being HIGH, the output E of the gate 14 will be HIGH. Since both inputs to the NOR gate 16 are HIGH, the output F will be LOW. Similarly, since both inputs to the NOR gate 18 are HIGH, the output G will be LOW. This is true because the output of a NOR gate will be LOW if any input is HIGH.
Since outputs F and G are LOW, the inverted inputs which go to the third inputs of NAND gates 12 and 10, respectively, are HIGH but do not affect the condition of those gates because one of their inputs is LOW.
The initial condition of the circuit and the waveforms that apply are those existing at the extreme left-hand portion of the waveform diagram shown in FIG. 2.
Now assume that input A goes HIGH prior to input
B, as shown in FIG. 2. If A goes HIGH and B stays LOW, then C goes LOW because A and D and I, all three inputs to NAND gate 10, are HIGH. The output F of gate 16 stays LOW because C is LOW but E is HIGH. However, since C is LOW and D is HIGH the output E of gate 14 will now go LOW. Since both inputs C and E to gate 16 are LOW, F will go HIGH and the feedback inverted signal H will go LOW but will not affect the condition of input gate 12. The input E to gate 18 is LOW but input D is
HIGH so output G of gate 18 will stay LOW, the output I of inverter 22 will stay HIGH and input gate 10 will not he affected. At the output terminals now, J is HIGH and K is LOW.
If B goes HIGH while A stays HIGH, the latch 30 comprising gates 10 and 12 is not affected because the output C of gate 10 which forms the input to gate 12 remains LOW.
A similar operation will occur if input B goes HIGH and input A goes LOW because of the symmetry of 35 the circuit, but under these conditions output terminal J will be LOW and output terminal K will be HIGH, which is just the reverse of the previously described input signal condition of A being HIGH and B being LOW.
With the aid of the waveforms shown in FIG. 3, the condition will now be described where both A and B go HIGH at the same time, and this is the condition where the arbiter circuit has to make an arbitrary decision as to which one of the two inputs A or B will be given priority,· that is the circuit must perform an arbitration function. Referring back to the initial state where both inputs A and B are LOW, shown at Time Τθ, it will be recalled that C and D are HIGH, E is HIGH, and F and G are LOW. As A and B go HIGH one of the following two series of events can occur.
The first series of events that can occur is the following. At some time after A aidB go HIGH, 0 and D go LOW. When C andD go LOW, they cause D and C, respectively, to go back to HIGH, because of the crosscoupled LOW inputs to the gates 12 and 10. When D and C go HIGH their cross-coupled HIGH inputs to gates 10 and 12 will cause C and D, respectively, to go LOW again.
This oscillating condition will continue until the output of one of the gates 10 or 12 remains LOW and the other gate remains HIGH.
The second series of events that can occur is the following. At some time after A and B go HIGH, shown at time , C and D go LOW. When C and D go LOW, their cross-coupled LOW inputs to gates 12 and 10, respectively, will cause outputs D and C to go back to HIGH again, thereby producing a rut pulse on each of the outputs C and D, respectively, as shown at time T1 . The rut pulse that is produced on each input to gates 10 and 12 may cause the outputs C and D to go to the third state, at time T^, which is metastable. This is an unstable state, and after some period of time one of the two outputs C or D will go LOW while the other output will go HIGH.
During either of the above series of events, so long as C and D do not differ by more than one V__, point E will remain HIGH and F and G will remain LOW.
The output NOR gates l6and 18 cannot respond to the outputs C and D, while E remains HIGH. It will be seen s that during the production of the rut pulse at time T^ the outputs C and D are in phase and approximately equal in amplitude. Therefore, the difference detector output E will remain HIGH, and the rut pulses will not pass through to the NOR gates 16 and 18. However, after the latch comprising gates 10 and 12 has left the metastable state and as soon as the voltage difference between C and D becomes greater than one V„_, shown at time T^, the gate 14 will respond to this difference, ]5 causing E to go LOW and thereby allowing the output NOR gates 16 and 18 to respond to the outputs C and D of the NAND gates 10 and 12.
If input A goes HIGH much less than a gate delay before B, then a probability exists that a rut pulse may be produced on the output D of gate 12. This will not propagate to the output of gate 18. This is so for two reasons; 1) The delay of the difference detector 14 is about 1.5-2 times greater than for the NAND gates 10 and 12, thus holding its output, point E, HIGH during this time; 2) By the nature of the design the difference detector 14 is insensitive to rut pulses and tends to reduce them, through integration, to a level that subsequent gates are unable to respond to. This sequence of events is illustrated in FIG. 4.
The purpose of the inverters 20 and 22 is to keep the output of the R-S latch, constituted by the gates 20 and 12, from going from a HIGH state to a LOW state before the difference detector gate 14 returns to its initial HIGH level. Thus, if input A went HIGH before input B, output F would be HIGH and output G would be LOW. Then, if A goes LOW, C would go
HIGH. C going HIGH would allow D to go LOW, in the absence of the inverters. At the same time, E goes HIGH because both of it? inputs were HIGH. D goes LOW at about the same time that E goes HIGH, following which output G may go HIGH due to input D and then LOW due to HIGH input E and then HIGH again as input E goes LOW. The inverter 20, in this instance, would not let this series of events occur because the LOW fed from inverter 20 to input gate 12 would keep the output D of gate 12 HIGH, until the output of gate 16 went LOW, thus allowing the output of gate 14 at this time to return to its initial HIGH level.
The operation of the difference detector gate
14 will be more fully described with reference to
FIG. 5, which is a more detailed schematic diagram of the arbiter circuit of the invention. It will be noted that a buffer 24 is shown coupled between the output E of the difference detector gate 14 and the output NOR gates 16 and 18. The output of the buffer 24 is at node point L. First, however, it should be pointed out that the string of four diodes 26 shown connected between ground and connection point are V^E clamps. They serve to limit the HIGH level on the outputs C and D of the Schmitt NAND gate 10 and NAND gate 12 to a value no greater than 3VgE- This has the effect of forcing a predictable voltage level into the difference detector gate 14. The diode clamps 26 also limit the HIGH level from the difference detector gate 14 into the buffer 24.
This results in greater speed and also inbetter current level control in that it allows for a smaller value of resistor R2, which thus may be of the same material as the resistors R1 in the emitters of Q11 and Q12.
Now with the operation in the initial or normal 35 state when both inputs A and B are LOW, the inputs C and D to the difference detector gate 14 are both HIGH.
Point C is about 3V__ and the emitter of transistor Q11 Uh is about 2V-,_. Point D is about 3V__ and the emitter of ΰϋ, Ijr, transistor Q12 is about 2V„_. Since the emitter of transistor Q11 is connected to the base of Q13 and to the emitter of transistor Q14, and the emitter of Q12 is connected to the base of transistor Q14 and to the emitter of transistor Q13, the base emitter voltage of each of transistors Q13 and Q14 will be zero and the transistors Q13 and Q14 will thus be turned OFF. Point E will rise to 2VBE to turn on Q15 of the buffer 24.
Q16 will turn OFF and Q18 will turn ON, thereby causing point C to go HIGH.
Assume now that signal input A goes HIGH and input B stays LOW. Output C will be LOW and output D will be HIGH and the following will occur. Q11 is turned OFF, Q13 is turned OFF and Q12 is turned ON. The emitter of Q14 is point D - (2VBE) or about IVgg· Point E will be about 2VBE - YgQjj or about 1 volt, which is LOW, where is the forward voltage drop across the
Schottky diode clamp of the transistor.
Assume· now that input A is LOW and input B is HIGH, in which case output C is HIGH and output D is LOW. Q11 and Q13 will be turned ON and Q12 and Q14 will be turned OFF. The emitter of Q13 is point C - (2VBE) or about 1VBE< Point E will be about 2VBE - Vggjj or about 1 volt, which is LOW.
In both of the above cases where the output E of the difference detector gate 14 is LOW, it will feed a LOW signal to the buffer 24. As a result Q15 is OFF, Q16 is ON and Q17 is ON. Point L is then LOW and is about .25 volts.
Assume now that point C is HIGH, or about 3Vbe and point D is 1vbE poi»* C or / 2VBE‘
The emitter of Q11 is equal to 2V__ and the emitter
JSJlz of Q12 is equal to 1V„„. Q13 is ON because its base is i>£>
1V__ above the emitter, but 014 is OFF because its base -fcJ-H» is 1V__ below the emitter. Point Ε will be LOW. ΰ -b
The input latch consisting of gates 10 and 12 may be either two standard NAND gates or one standard NAND gate and one Schmitt NAND gate. It was found by experiment that the combination of one standard NAND and one Schmitt NAND had a lower probability of going into the metastable state than did the combination of two standard NAND gates. It was also found by experimentation that the use of two Schmitt NAND gates tended to oscillate easily. For the above reasons it is preferred to form the latch with one standard NAND gate and one standard Schmitt NAND gate as shown and described.
Instead of NOR-gates 16 and 18 it is possible to use OR-gates of course. In that case inverters 20 and 22 can he left out. Output signals K and G are of course inverted with respect to input signals A and B.
Claims (5)
1. An arbiter circuit, comprising: a) first and second input terminals and first and second output terminals; 5 b) first and second cross-coupled NAND gates to which said first and second input terminals, respectively, are coupled; c) a difference detector gate to first and second inputs of which the outputs of said first and second cross-coupled NAND gates respectively are coupled, which detector circuit is responsive 10 to a voltage difference exceeding a specific amount; d) first and second further gates having their outputs coupled to said first and second output terminals, respectively; e) a coupling from the output of said first NAND gate to a first input of said first further gate and a coupling from the output 15 of said second NAND gate to a first input of said second further gate; and f) a coupling from the output of said difference detector gate to a second input of each of said further gates, for blocking said further gates when the voltage difference between the first and 20 second inputs of said difference detector gate does not exceed said specific amount.
2. A circuit according to claim 1, wherein the output/input characteristic one of said NAND gates exhibits hysteresis.
3. A circuit according to claim 1 or claim 2, wherein said first and second further gates are first and second NOR gates respectively, said circuit further including: g) a first inverter coupling the output of said first NOR gate to 5 a third input of said second NAND gate, and h) a second inverter coupling the output of said second NOR gate to a third input of said first NAND gate.
4. A circuit according to any preceding Claim, wherein said specific amount is about IVg£. 10
5. An arbiter circuit substantially as described herein with reference to Figure 1 or Figure 5 of the drawings.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/227,514 US4398105A (en) | 1981-01-22 | 1981-01-22 | Arbiter circuit |
Publications (2)
Publication Number | Publication Date |
---|---|
IE820103L IE820103L (en) | 1982-07-22 |
IE52515B1 true IE52515B1 (en) | 1987-11-25 |
Family
ID=22853402
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IE103/82A IE52515B1 (en) | 1981-01-22 | 1982-01-19 | Arbiter circuit |
Country Status (8)
Country | Link |
---|---|
US (1) | US4398105A (en) |
JP (1) | JPS57140028A (en) |
KR (1) | KR900005229B1 (en) |
CA (1) | CA1176715A (en) |
DE (1) | DE3200894A1 (en) |
FR (1) | FR2498396B1 (en) |
GB (1) | GB2091965B (en) |
IE (1) | IE52515B1 (en) |
Families Citing this family (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4620118A (en) * | 1982-10-01 | 1986-10-28 | At&T Bell Laboratories | Dual port access circuit with automatic asynchronous contention resolving capability |
US4502014A (en) * | 1982-11-24 | 1985-02-26 | Rca Corporation | Coincident pulse cancelling circuit |
US5144158A (en) * | 1984-11-19 | 1992-09-01 | Fujitsu Limited | ECL latch circuit having a noise resistance circuit in only one feedback path |
DE3788360T2 (en) * | 1986-09-03 | 1994-03-17 | Renishaw Plc | Signal processing for touch probe. |
US4800296A (en) * | 1987-05-05 | 1989-01-24 | Texas Instruments Incorporated | Metastable defeating fli-flop |
EP0308294A3 (en) * | 1987-09-18 | 1991-04-03 | STMicroelectronics, Inc. | Noise-resistant arbiter circuit |
US4820939A (en) * | 1987-11-24 | 1989-04-11 | National Semiconductor Corporation | Finite metastable time synchronizer |
US4841178A (en) * | 1988-02-23 | 1989-06-20 | Northern Telecom Limited | Asynchronous processor arbitration circuit |
US4894565A (en) * | 1988-08-11 | 1990-01-16 | American Microsystems, Inc. | Asynchronous digital arbiter |
US4963772A (en) * | 1989-02-07 | 1990-10-16 | North American Philips Corp., Signetics Div. | Metastable-immune flip-flop arrangement |
US5038059A (en) * | 1990-02-20 | 1991-08-06 | Vlsi Technology, Inc. | Status register with asynchronous set and reset signals |
EP0464237A1 (en) * | 1990-07-03 | 1992-01-08 | International Business Machines Corporation | Bus arbitration scheme |
US5081377A (en) * | 1990-09-21 | 1992-01-14 | At&T Bell Laboratories | Latch circuit with reduced metastability |
US5138189A (en) * | 1990-09-27 | 1992-08-11 | National Semiconductor | Asynchronous state machine synchronization circuit and method |
US5266844A (en) * | 1991-07-15 | 1993-11-30 | Hewlett-Packard Company | Timing discriminator circuit and method for determining the arrival order of input signals |
US5289060A (en) * | 1992-09-16 | 1994-02-22 | Texas Instruments Incorporated | Programmable glitch filter |
US5789945A (en) * | 1996-02-27 | 1998-08-04 | Philips Electronics North America Corporation | Method and circuit for improving metastable resolving time in low-power multi-state devices |
US6188249B1 (en) * | 1998-06-30 | 2001-02-13 | Sun Microsystems, Inc. | Asymmetric arbiter with fast signal path |
US6512397B1 (en) * | 2001-08-20 | 2003-01-28 | International Business Machines Corporation | Circuit structures and methods for high-speed low-power select arbitration |
US6781418B1 (en) | 2001-09-21 | 2004-08-24 | Cypress Semiconductor Corp. | Arbiter/pulse discriminator circuits with improved metastable failure rate by delayed balance point adjustment |
US6744151B2 (en) * | 2002-09-13 | 2004-06-01 | Analog Devices, Inc. | Multi-channel power supply selector |
US7225283B1 (en) * | 2003-12-23 | 2007-05-29 | Cypress Semiconductor Corporation | Asynchronous arbiter with bounded resolution time and predictable output state |
US7383370B1 (en) | 2005-03-31 | 2008-06-03 | Cypress Semiconductor Corporation | Arbiter circuit and signal arbitration method |
FR2888017B1 (en) * | 2005-07-01 | 2007-08-31 | Atmel Nantes Sa Sa | ASYNCHRONOUS ARBITRATION DEVICE AND MICROCONTROLLER COMPRISING SUCH AN ARBITRATION DEVICE |
US7839179B2 (en) * | 2007-06-13 | 2010-11-23 | Micron Technology, Inc. | Balanced phase detector |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3219845A (en) * | 1964-12-07 | 1965-11-23 | Rca Corp | Bistable electrical circuit utilizing nor circuits without a.c. coupling |
US3646455A (en) * | 1970-10-08 | 1972-02-29 | Mohawk Data Sciences Corp | Phase-detecting circuit |
US3764902A (en) * | 1972-04-24 | 1973-10-09 | Hewlett Packard Co | Phasemeter employing means for preventing errors in the phase reading produced by noise |
US3824409A (en) * | 1972-06-12 | 1974-07-16 | Massachusetts Inst Technology | Arbiter circuits |
US3761739A (en) * | 1972-06-23 | 1973-09-25 | Ibm | Non-metastable asynchronous latch |
GB1461330A (en) * | 1974-04-16 | 1977-01-13 | Ferranti Ltd | Pulse circuits |
US4093878A (en) * | 1976-11-29 | 1978-06-06 | Ncr Corporation | De-glitchablenon-metastable flip-flop circuit |
CS203304B1 (en) * | 1978-02-02 | 1981-02-27 | Miroslav Pechoucek | Tilting circuit edge lowered and treated against the metastabil condition |
US4339731A (en) * | 1980-06-05 | 1982-07-13 | Rockwell International Corporation | Stable, fast slew, phase locked loop |
DE3036170A1 (en) * | 1980-09-25 | 1982-04-29 | Siemens AG, 1000 Berlin und 8000 München | Digitally-controlled semiconductor circuit - has flip=flop with both outputs connected to one input of logic gate, whose output is coupled to extra input of flip=flop |
-
1981
- 1981-01-22 US US06/227,514 patent/US4398105A/en not_active Expired - Lifetime
-
1982
- 1982-01-14 DE DE19823200894 patent/DE3200894A1/en active Granted
- 1982-01-18 GB GB8201252A patent/GB2091965B/en not_active Expired
- 1982-01-18 FR FR8200685A patent/FR2498396B1/en not_active Expired
- 1982-01-19 IE IE103/82A patent/IE52515B1/en not_active IP Right Cessation
- 1982-01-19 KR KR8200209A patent/KR900005229B1/en active
- 1982-01-19 JP JP57005501A patent/JPS57140028A/en active Granted
- 1982-01-21 CA CA000394622A patent/CA1176715A/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
DE3200894A1 (en) | 1982-09-02 |
GB2091965B (en) | 1984-08-01 |
JPH033964B2 (en) | 1991-01-21 |
DE3200894C2 (en) | 1987-05-21 |
US4398105A (en) | 1983-08-09 |
JPS57140028A (en) | 1982-08-30 |
FR2498396A1 (en) | 1982-07-23 |
KR830009695A (en) | 1983-12-22 |
CA1176715A (en) | 1984-10-23 |
IE820103L (en) | 1982-07-22 |
KR900005229B1 (en) | 1990-07-21 |
FR2498396B1 (en) | 1988-10-14 |
GB2091965A (en) | 1982-08-04 |
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Legal Events
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MM4A | Patent lapsed |