HUE061317T2 - Eljárás és berendezés lencseanyag törésmutatójának meghatározására - Google Patents

Eljárás és berendezés lencseanyag törésmutatójának meghatározására

Info

Publication number
HUE061317T2
HUE061317T2 HUE18842649A HUE18842649A HUE061317T2 HU E061317 T2 HUE061317 T2 HU E061317T2 HU E18842649 A HUE18842649 A HU E18842649A HU E18842649 A HUE18842649 A HU E18842649A HU E061317 T2 HUE061317 T2 HU E061317T2
Authority
HU
Hungary
Prior art keywords
refraction
index
determination
lens material
lens
Prior art date
Application number
HUE18842649A
Other languages
English (en)
Inventor
Susanne Fechner
Roger Biel
Marcus Heift
Thomas Tonn
Original Assignee
Alcon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Alcon Inc filed Critical Alcon Inc
Publication of HUE061317T2 publication Critical patent/HUE061317T2/hu

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0228Testing optical properties by measuring refractive power
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/0209Low-coherence interferometers
    • G01B9/02091Tomographic interferometers, e.g. based on optical coherence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2441Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using interferometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0242Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0271Testing optical properties by measuring geometrical properties or aberrations by using interferometric methods
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958Inspecting transparent materials or objects, e.g. windscreens
    • G01N2021/9583Lenses
    • GPHYSICS
    • G02OPTICS
    • G02CSPECTACLES; SUNGLASSES OR GOGGLES INSOFAR AS THEY HAVE THE SAME FEATURES AS SPECTACLES; CONTACT LENSES
    • G02C7/00Optical parts
    • G02C7/02Lenses; Lens systems ; Methods of designing lenses
    • G02C7/04Contact lenses for the eyes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Geometry (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
HUE18842649A 2017-12-21 2018-12-18 Eljárás és berendezés lencseanyag törésmutatójának meghatározására HUE061317T2 (hu)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US201762608635P 2017-12-21 2017-12-21

Publications (1)

Publication Number Publication Date
HUE061317T2 true HUE061317T2 (hu) 2023-06-28

Family

ID=65268998

Family Applications (1)

Application Number Title Priority Date Filing Date
HUE18842649A HUE061317T2 (hu) 2017-12-21 2018-12-18 Eljárás és berendezés lencseanyag törésmutatójának meghatározására

Country Status (4)

Country Link
US (1) US10823636B2 (hu)
EP (1) EP3729039B1 (hu)
HU (1) HUE061317T2 (hu)
WO (1) WO2019123265A1 (hu)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA3090200A1 (en) 2018-02-08 2019-08-15 Amo Groningen B.V. Multi-wavelength wavefront system and method for measuring diffractive lenses
WO2019155023A1 (en) * 2018-02-08 2019-08-15 Amo Groningen B.V. Wavefront based characterization of lens surfaces based on reflections
EP4189325A1 (en) * 2020-07-30 2023-06-07 Alcon Inc. Method for determining geometrical parameters of a soft contact lens
CN113483679B (zh) * 2021-07-06 2022-07-22 东北大学秦皇岛分校 一种隐形眼镜参数测量装置及方法
CN115931778B (zh) * 2022-11-28 2023-09-01 湖北华鑫光电有限公司 镜片的折射率检测设备及其方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU2011359150A1 (en) * 2011-02-15 2013-08-29 Wavelight Gmbh Apparatus for measuring optical properties of an object
WO2014049053A1 (en) * 2012-09-28 2014-04-03 Novartis Ag Method for automated inline determination of the refractive power of an ophthalmic lens
US9019485B2 (en) 2013-03-11 2015-04-28 Lumetrics, Inc. Apparatus and method for evaluation of optical elements
US20160054195A1 (en) 2014-08-20 2016-02-25 Johnson & Johnson Vision Care, Inc. System and methods for measuring ophthalmic lens
EP3059575B1 (en) 2015-02-20 2020-11-25 Alcon Inc. Method for determining the quality of a surface of an ophthalmic lens
JP2016223982A (ja) * 2015-06-02 2016-12-28 キヤノン株式会社 計測方法、計測装置、光学素子の製造方法
JP2017003434A (ja) * 2015-06-10 2017-01-05 キヤノン株式会社 屈折率の計測方法、計測装置、光学素子の製造方法

Also Published As

Publication number Publication date
EP3729039A1 (en) 2020-10-28
US20190195730A1 (en) 2019-06-27
WO2019123265A1 (en) 2019-06-27
US10823636B2 (en) 2020-11-03
EP3729039B1 (en) 2023-01-04

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