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Priority to HUP0402087priorityCriticalpatent/HU0402087D0/en
Publication of HU0402087D0publicationCriticalpatent/HU0402087D0/en
Priority to PCT/HU2005/000115prioritypatent/WO2006040605A1/en
Priority to EP05798498Aprioritypatent/EP1834186A1/en
Priority to JP2007536272Aprioritypatent/JP5134369B2/en
Priority to US11/783,960prioritypatent/US7827010B2/en
HUP04020872004-10-152004-10-15Equipment and method for measuring noise of asystem during planning processes, quality checks, and wear-tests
HU0402087D0
(en)