HK1175912A1 - 產生圖像傳感器的列偏移校正 - Google Patents

產生圖像傳感器的列偏移校正

Info

Publication number
HK1175912A1
HK1175912A1 HK13103046.3A HK13103046A HK1175912A1 HK 1175912 A1 HK1175912 A1 HK 1175912A1 HK 13103046 A HK13103046 A HK 13103046A HK 1175912 A1 HK1175912 A1 HK 1175912A1
Authority
HK
Hong Kong
Prior art keywords
image sensors
column offset
generating column
offset corrections
corrections
Prior art date
Application number
HK13103046.3A
Other languages
English (en)
Inventor
杰夫里.
.格斯滕伯格
拉維.姆魯斯尤恩賈亞
約翰.托馬斯.康普頓
Original Assignee
全視科技有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 全視科技有限公司 filed Critical 全視科技有限公司
Publication of HK1175912A1 publication Critical patent/HK1175912A1/zh

Links

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • H04N25/677Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction for reducing the column or line fixed pattern noise

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Image Input (AREA)
  • Solid State Image Pick-Up Elements (AREA)
HK13103046.3A 2009-12-31 2013-03-12 產生圖像傳感器的列偏移校正 HK1175912A1 (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12/655,539 US8199225B2 (en) 2009-12-31 2009-12-31 Generating column offset corrections for image sensors
PCT/US2010/060430 WO2011081959A1 (en) 2009-12-31 2010-12-15 Generating column offset corrections for image sensors

Publications (1)

Publication Number Publication Date
HK1175912A1 true HK1175912A1 (zh) 2013-07-12

Family

ID=43598449

Family Applications (1)

Application Number Title Priority Date Filing Date
HK13103046.3A HK1175912A1 (zh) 2009-12-31 2013-03-12 產生圖像傳感器的列偏移校正

Country Status (7)

Country Link
US (1) US8199225B2 (zh)
EP (1) EP2520081A1 (zh)
JP (1) JP5624630B2 (zh)
CN (1) CN102714703B (zh)
HK (1) HK1175912A1 (zh)
TW (1) TWI493970B (zh)
WO (1) WO2011081959A1 (zh)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8269864B2 (en) * 2009-12-31 2012-09-18 Omnivision Technologies, Inc. Generating column offset corrections for image sensors
US8228403B2 (en) * 2009-12-31 2012-07-24 Omnivision Technologies, Inc. Generating column offset corrections for image sensors
US9135680B2 (en) * 2011-09-08 2015-09-15 Bae Systems Information And Electronic Systems Integration Inc. Method for reducing row and column noise in imaging systems
US9774804B2 (en) 2013-12-13 2017-09-26 Bio-Rad Laboratories, Inc. Digital imaging with masked pixels
US9736388B2 (en) * 2013-12-13 2017-08-15 Bio-Rad Laboratories, Inc. Non-destructive read operations with dynamically growing images
JP2015198273A (ja) * 2014-03-31 2015-11-09 ソニー株式会社 イメージセンサ、およびイメージセンサの動作方法、撮像装置および撮像方法、並びに電子機器
CN106321085A (zh) * 2015-07-02 2017-01-11 中石化石油工程技术服务有限公司 激发极化电位测井仪归一化方法
CN106161981B (zh) * 2016-07-29 2017-08-29 广东欧珀移动通信有限公司 图像暗角补偿方法、装置和终端设备
WO2020165908A2 (en) * 2019-02-17 2020-08-20 Guardian Optical Technologies Ltd System, device, and methods for detecting and obtaining information on objects in a vehicle
US10819927B1 (en) * 2019-07-02 2020-10-27 Omnivision Technologies, Inc. Image sensor with self-testing black level correction
CN113766878B (zh) * 2020-03-27 2023-07-25 京东方科技集团股份有限公司 X射线平板探测器及其图像校正方法

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5969758A (en) 1997-06-02 1999-10-19 Sarnoff Corporation DC offset and gain correction for CMOS image sensor
US20030202111A1 (en) * 2002-04-30 2003-10-30 Jaejin Park Apparatus and methods for dark level compensation in image sensors using dark pixel sensor metrics
JP2004015712A (ja) * 2002-06-11 2004-01-15 Sony Corp 固体撮像装置及びその固定パターン雑音除去方法
US6903670B1 (en) 2002-10-04 2005-06-07 Smal Camera Technologies Circuit and method for cancellation of column pattern noise in CMOS imagers
DE60334777D1 (de) * 2003-05-08 2010-12-16 St Microelectronics Res & Dev Verfahren und Vorrichtung zur Entfernung von Spaltenfestmusterrauschen in Festkörperbildsensoren
JP4331553B2 (ja) 2003-09-17 2009-09-16 オリンパス株式会社 撮像装置
JP2006025148A (ja) 2004-07-07 2006-01-26 Sony Corp 信号処理装置及び方法
JP4725052B2 (ja) * 2004-08-17 2011-07-13 コニカミノルタホールディングス株式会社 撮像装置
US7602438B2 (en) * 2004-10-19 2009-10-13 Eastman Kodak Company Method and apparatus for capturing high quality long exposure images with a digital camera
US7564489B1 (en) 2005-02-18 2009-07-21 Crosstek Capital, LLC Method for reducing row noise with dark pixel data
US7554066B2 (en) * 2005-04-13 2009-06-30 Aptina Imaging Corporation Method and apparatus employing dynamic element matching for reduction of column-wise fixed pattern noise in a solid state imaging sensor
KR100530257B1 (ko) 2005-04-26 2005-11-22 엠텍비젼 주식회사 이미지 센서에서의 암 전류에 의한 노이즈 제거 방법 및장치
JP4351658B2 (ja) * 2005-07-21 2009-10-28 マイクロン テクノロジー, インク. メモリ容量低減化方法、メモリ容量低減化雑音低減化回路及びメモリ容量低減化装置
JP2007053691A (ja) 2005-08-19 2007-03-01 Micron Technol Inc サブlsbを用いた拡張デジタルデータ路構造
US7427735B2 (en) * 2005-12-14 2008-09-23 Micron Technology, Inc. Method and apparatus for setting black level in an imager using both optically black and tied pixels
JP4976832B2 (ja) * 2006-12-04 2012-07-18 キヤノン株式会社 撮像システム
JP4424753B2 (ja) 2007-12-28 2010-03-03 キヤノン株式会社 固体撮像装置及びその駆動方法
US8665350B2 (en) 2008-05-08 2014-03-04 Altasens, Inc. Method for fixed pattern noise (FPN) correction
JP5335327B2 (ja) * 2008-08-29 2013-11-06 キヤノン株式会社 欠陥検出補正装置及び欠陥検出補正方法
US8094215B2 (en) * 2008-10-02 2012-01-10 Altasens, Inc. Digital column gain mismatch correction for 4T CMOS imaging systems-on-chip
US8269864B2 (en) 2009-12-31 2012-09-18 Omnivision Technologies, Inc. Generating column offset corrections for image sensors
US8228403B2 (en) 2009-12-31 2012-07-24 Omnivision Technologies, Inc. Generating column offset corrections for image sensors

Also Published As

Publication number Publication date
JP5624630B2 (ja) 2014-11-12
JP2013517641A (ja) 2013-05-16
TWI493970B (zh) 2015-07-21
CN102714703B (zh) 2015-02-18
CN102714703A (zh) 2012-10-03
TW201143409A (en) 2011-12-01
EP2520081A1 (en) 2012-11-07
US8199225B2 (en) 2012-06-12
US20110157433A1 (en) 2011-06-30
WO2011081959A1 (en) 2011-07-07

Similar Documents

Publication Publication Date Title
HK1176447A1 (zh) 產生圖像傳感器的列偏移校正
HK1175912A1 (zh) 產生圖像傳感器的列偏移校正
GB0900867D0 (en) Image compensation apparatus
EP2417632A4 (en) BLLDSENSOR
EP2489073A4 (en) DOCUMENT SENSOR
HK1171597A1 (zh) 用於圖像傳感器的列輸出電路
GB0905037D0 (en) Sensor
EP2405734A4 (en) ANGLE SENSOR
GB201200089D0 (en) Color-optimized image sensor
GB201021144D0 (en) Improved image sensor arrangement
EP2190188A4 (en) BlLDSENSOR
EP2418860A4 (en) IMAGE SENSOR FOR PRODUCING STEREOSCOPIC IMAGES
EP2397205A4 (en) PARTITION-DISTILLATION COLUMN
GB0920434D0 (en) Image sensor arrays
EP2433104A4 (en) SENSOR
GB2476317B (en) Quality sensor apparatus
GB0922589D0 (en) Pharmaceutical compounds
IL198045A0 (en) Image sensor system
PL2320191T3 (pl) Głowica czujnikowa do pomiaru grubości folii
GB0920129D0 (en) Correct scaling for superimposed images
GB201013783D0 (en) Image sensor
EP2398052A4 (en) LINEAR BLIND SENSOR
EP2398053A4 (en) BlLDSENSOR
GB0809337D0 (en) Image sensor
EP2419695A4 (en) MOTION SENSOR