HK1172095A1 - System for inspection through rays - Google Patents
System for inspection through raysInfo
- Publication number
- HK1172095A1 HK1172095A1 HK12112919.9A HK12112919A HK1172095A1 HK 1172095 A1 HK1172095 A1 HK 1172095A1 HK 12112919 A HK12112919 A HK 12112919A HK 1172095 A1 HK1172095 A1 HK 1172095A1
- Authority
- HK
- Hong Kong
- Prior art keywords
- rays
- inspection
- Prior art date
Links
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201010620367.5A CN102565867B (en) | 2010-12-31 | 2010-12-31 | System for inspection through rays |
Publications (1)
Publication Number | Publication Date |
---|---|
HK1172095A1 true HK1172095A1 (en) | 2013-04-12 |
Family
ID=46411731
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK12112919.9A HK1172095A1 (en) | 2010-12-31 | 2012-12-13 | System for inspection through rays |
Country Status (2)
Country | Link |
---|---|
CN (2) | CN103712997B (en) |
HK (1) | HK1172095A1 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104316970A (en) * | 2014-11-07 | 2015-01-28 | 天津重方科技有限公司 | Single-column X-ray back scattering human body safety scanner |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR1542746A (en) * | 1967-09-07 | 1968-10-18 | Combustible Nucleaire | In situ radiographic inspection of welded parts by electron bombardment |
CN200941097Y (en) * | 2006-07-27 | 2007-08-29 | 上海英迈吉东影图像设备有限公司 | Imaging apparatus having X-ray back scatter and fault scan |
CN101644687A (en) * | 2008-08-05 | 2010-02-10 | 同方威视技术股份有限公司 | Method and device for ray bundle scanning for back scattering imaging |
KR100968217B1 (en) * | 2009-02-23 | 2010-07-06 | (주)신영포엠 | Diagnosis apparatus for medical treatment with x-ray stand capable of swaying |
CN201392320Y (en) * | 2009-03-17 | 2010-01-27 | 江苏威汇力自动化技术有限公司 | Two-DOF portable X ray imager |
CN201917669U (en) * | 2010-12-31 | 2011-08-03 | 同方威视技术股份有限公司 | System for examination through ray |
-
2010
- 2010-12-31 CN CN201310690363.8A patent/CN103712997B/en active Active
- 2010-12-31 CN CN201010620367.5A patent/CN102565867B/en active Active
-
2012
- 2012-12-13 HK HK12112919.9A patent/HK1172095A1/en unknown
Also Published As
Publication number | Publication date |
---|---|
CN102565867B (en) | 2014-03-12 |
CN102565867A (en) | 2012-07-11 |
CN103712997B (en) | 2016-05-25 |
CN103712997A (en) | 2014-04-09 |
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