HK1139199A1 - Three-dimensional image measurement apparatus, three-dimensional image measurement method, and three-dimensional image measurement program of non- static object - Google Patents

Three-dimensional image measurement apparatus, three-dimensional image measurement method, and three-dimensional image measurement program of non- static object

Info

Publication number
HK1139199A1
HK1139199A1 HK10105102.2A HK10105102A HK1139199A1 HK 1139199 A1 HK1139199 A1 HK 1139199A1 HK 10105102 A HK10105102 A HK 10105102A HK 1139199 A1 HK1139199 A1 HK 1139199A1
Authority
HK
Hong Kong
Prior art keywords
dimensional image
image measurement
static object
program
measurement method
Prior art date
Application number
HK10105102.2A
Other languages
English (en)
Inventor
Cunwei Lu
Cho Genki
Original Assignee
School Juridical Person Of Fukuoka Kogyo Daigaku
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by School Juridical Person Of Fukuoka Kogyo Daigaku filed Critical School Juridical Person Of Fukuoka Kogyo Daigaku
Publication of HK1139199A1 publication Critical patent/HK1139199A1/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2545—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with one projection direction and several detection directions, e.g. stereo
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C3/00—Measuring distances in line of sight; Optical rangefinders
    • G01C3/02—Details
    • G01C3/06—Use of electric means to obtain final indication

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
HK10105102.2A 2007-03-29 2010-05-24 Three-dimensional image measurement apparatus, three-dimensional image measurement method, and three-dimensional image measurement program of non- static object HK1139199A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007089764A JP4986679B2 (ja) 2007-03-29 2007-03-29 非静止物体の三次元画像計測装置、三次元画像計測方法および三次元画像計測プログラム
PCT/JP2008/000619 WO2008120457A1 (ja) 2007-03-29 2008-03-17 非静止物体の三次元画像計測装置、三次元画像計測方法および三次元画像計測プログラム

Publications (1)

Publication Number Publication Date
HK1139199A1 true HK1139199A1 (en) 2010-09-10

Family

ID=39808043

Family Applications (1)

Application Number Title Priority Date Filing Date
HK10105102.2A HK1139199A1 (en) 2007-03-29 2010-05-24 Three-dimensional image measurement apparatus, three-dimensional image measurement method, and three-dimensional image measurement program of non- static object

Country Status (4)

Country Link
JP (1) JP4986679B2 (xx)
CN (1) CN101646919B (xx)
HK (1) HK1139199A1 (xx)
WO (1) WO2008120457A1 (xx)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5224288B2 (ja) * 2009-02-13 2013-07-03 学校法人福岡工業大学 表面検査装置および表面検査方法
JP5633719B2 (ja) * 2009-09-18 2014-12-03 学校法人福岡工業大学 三次元情報計測装置および三次元情報計測方法
JP5728699B2 (ja) * 2010-03-01 2015-06-03 学校法人福岡工業大学 表面検査装置、表面検査方法および表面検査プログラム
DE102010015689B4 (de) * 2010-04-21 2019-05-23 Aktiebolaget Skf Verfahren und Vorrichtung zur Vermessung eines Lagerbauteils
EP2568253B1 (en) * 2010-05-07 2021-03-10 Shenzhen Taishan Online Technology Co., Ltd. Structured-light measuring method and system
WO2012050107A1 (ja) * 2010-10-12 2012-04-19 グローリー株式会社 硬貨処理装置及び硬貨処理方法
CN102175172B (zh) * 2010-12-30 2012-07-04 南京理工大学 一种基于图像识别的机动车辆外形尺寸检测***
TW201315962A (zh) * 2011-10-05 2013-04-16 Au Optronics Corp 投影式影像辨識裝置及其影像辨識方法
JP6079333B2 (ja) 2013-03-15 2017-02-15 株式会社リコー 校正装置、方法及びプログラム
KR20230142635A (ko) * 2013-04-08 2023-10-11 스냅 아이엔씨 멀티-카메라 장치를 사용하는 거리 추정
CN103246141B (zh) * 2013-05-03 2015-03-04 苏州佳世达光电有限公司 光源校正***
CN103241527B (zh) * 2013-05-20 2016-04-20 无锡集聚智能纺织机械有限公司 自动理管装置
CN104183010A (zh) * 2013-05-22 2014-12-03 上海迪谱工业检测技术有限公司 多视角三维在线重建的方法
FR3008522B1 (fr) * 2013-07-15 2016-11-11 European Aeronautic Defence & Space Co Eads France Procede de mesure multi-echelles de forme, de deplacement et/ou de deformation d’une piece de structure soumise a des sollicitations par creation d’une pluralite de mouchetis colorimetriques
JP6217227B2 (ja) 2013-08-12 2017-10-25 株式会社リコー 校正装置、方法及びプログラム
JP7005175B2 (ja) * 2017-05-30 2022-01-21 キヤノン株式会社 距離測定装置、距離測定方法及び撮像装置
GB201710705D0 (en) * 2017-07-04 2017-08-16 Optoscale As Structured-Light Illumination
JP6970376B2 (ja) 2017-12-01 2021-11-24 オムロン株式会社 画像処理システム、及び画像処理方法
JP7121622B2 (ja) * 2018-09-28 2022-08-18 芝浦メカトロニクス株式会社 錠剤印刷装置及び錠剤印刷方法
CN110553584A (zh) * 2019-08-30 2019-12-10 长春理工大学 一种小型复杂零件的测量工装、自动测量***及测量方法
CN112955844A (zh) * 2020-06-30 2021-06-11 深圳市大疆创新科技有限公司 目标跟踪方法、设备、***及存储介质
CN112697258A (zh) * 2020-12-17 2021-04-23 天津大学 一种基于单帧编码照明的视觉振动测量方法
TWI795111B (zh) * 2021-12-06 2023-03-01 財團法人金屬工業研究發展中心 交錯光源取像系統

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Publication number Priority date Publication date Assignee Title
JPH03289505A (ja) * 1990-04-06 1991-12-19 Nippondenso Co Ltd ３次元形状測定装置
EP1067362A1 (en) * 1999-07-09 2001-01-10 Hewlett-Packard Company Document imaging system
JP3884321B2 (ja) * 2001-06-26 2007-02-21 オリンパス株式会社 ３次元情報取得装置、３次元情報取得における投影パターン、及び、３次元情報取得方法
JP2004077290A (ja) * 2002-08-19 2004-03-11 Fuji Xerox Co Ltd ３次元形状計測装置および方法
CN1176351C (zh) * 2002-10-09 2004-11-17 天津大学 动态多分辨率的三维数字成像的方法及装置
JP4883517B2 (ja) * 2004-11-19 2012-02-22 学校法人福岡工業大学 三次元計測装置および三次元計測方法並びに三次元計測プログラム

Also Published As

Publication number Publication date
JP4986679B2 (ja) 2012-07-25
CN101646919B (zh) 2011-04-20
JP2008249432A (ja) 2008-10-16
WO2008120457A1 (ja) 2008-10-09
CN101646919A (zh) 2010-02-10

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