HK1118120A1 - System and method for optically imaging objects on a detection device by means of a pinhole aperture - Google Patents

System and method for optically imaging objects on a detection device by means of a pinhole aperture

Info

Publication number
HK1118120A1
HK1118120A1 HK08107496.6A HK08107496A HK1118120A1 HK 1118120 A1 HK1118120 A1 HK 1118120A1 HK 08107496 A HK08107496 A HK 08107496A HK 1118120 A1 HK1118120 A1 HK 1118120A1
Authority
HK
Hong Kong
Prior art keywords
detection device
pinhole aperture
imaging
inherent
areas
Prior art date
Application number
HK08107496.6A
Other languages
English (en)
Inventor
Joerg Dreibholz
Manfred Augstein
Heinz Macho
Uwe Kass
Dieter Falk
Original Assignee
Hoffmann La Roche
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hoffmann La Roche filed Critical Hoffmann La Roche
Publication of HK1118120A1 publication Critical patent/HK1118120A1/xx

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/10—Image acquisition
    • G06V10/12—Details of acquisition arrangements; Constructional details thereof
    • G06V10/14—Optical characteristics of the device performing the acquisition or on the illumination arrangements
    • G06V10/145—Illumination specially adapted for pattern recognition, e.g. using gratings

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Multimedia (AREA)
  • Artificial Intelligence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Image Input (AREA)
  • Holo Graphy (AREA)
  • Wire Bonding (AREA)
HK08107496.6A 2005-01-21 2008-07-08 System and method for optically imaging objects on a detection device by means of a pinhole aperture HK1118120A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102005002934A DE102005002934A1 (de) 2005-01-21 2005-01-21 System und Verfahren zur optischen Abbildung von Objekten auf eine Detektionsvorrichtung mittels einer Lochblende
PCT/EP2006/000424 WO2006077105A2 (fr) 2005-01-21 2006-01-19 Systeme et procede pour la formation optique d'images d'objets sur un dispositif de detection au moyen d'une ouverture de stenope

Publications (1)

Publication Number Publication Date
HK1118120A1 true HK1118120A1 (en) 2009-01-30

Family

ID=36607420

Family Applications (1)

Application Number Title Priority Date Filing Date
HK08107496.6A HK1118120A1 (en) 2005-01-21 2008-07-08 System and method for optically imaging objects on a detection device by means of a pinhole aperture

Country Status (10)

Country Link
US (1) US7635834B2 (fr)
EP (1) EP1851680B1 (fr)
JP (1) JP4547428B2 (fr)
CN (1) CN100565558C (fr)
AT (1) ATE492003T1 (fr)
CA (1) CA2595354C (fr)
DE (2) DE102005002934A1 (fr)
ES (1) ES2355419T3 (fr)
HK (1) HK1118120A1 (fr)
WO (1) WO2006077105A2 (fr)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8789756B2 (en) * 2006-02-25 2014-07-29 Roche Diagnostics Operations, Inc. Test element coding apparatuses, systems and methods
JP2008170378A (ja) * 2007-01-15 2008-07-24 Seiko Epson Corp シンチレーション評価方法およびシンチレーション評価装置
HU229699B1 (en) * 2007-05-23 2014-05-28 Mta Termeszettudomanyi Kutatokoezpont Mta Ttk Imaging optical checking device with pinhole camera (reflectometer, polarimeter, ellipsicmeter)
US7835634B2 (en) * 2007-06-28 2010-11-16 Microscan Systems, Inc. Camera enclosure sealing system and method
CH702723B1 (de) * 2008-12-17 2015-01-15 Bjoern Christensen Bildaufnahmevorrichtung und Verfahren zur Bildaufnahme.
CN105989325A (zh) * 2015-01-29 2016-10-05 深圳印象认知技术有限公司 蜂窝结构的指纹掌纹图像采集器及终端设备
EP3217322B1 (fr) 2016-03-08 2019-01-30 Roche Diagniostics GmbH Système d'analyse d'élément de test pour l'examen analytique d'un échantillon
US10365370B2 (en) * 2016-10-31 2019-07-30 Timothy Webster Wear tolerant hydraulic / pneumatic piston position sensing using optical sensors
CN107655565A (zh) * 2017-09-19 2018-02-02 京东方科技集团股份有限公司 确定光照强度的方法、装置及设备
FR3092421B1 (fr) * 2019-01-31 2022-07-22 Saint Gobain Procédé de lecture manuelle d’un code, et dispositif de lecture pour la mise en œuvre dudit procédé
CN112135117B (zh) * 2019-06-25 2023-11-07 北京小米移动软件有限公司 摄像模组的测试箱体、***、方法、装置和存储介质
CN113014909A (zh) * 2019-12-19 2021-06-22 格科微电子（上海）有限公司 Cmos图像传感器的校对办法及装置、cmos图像传感器模组

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US4506152A (en) * 1982-07-12 1985-03-19 Ncr Canada Ltd. - Ncr Canada Ltee Illumination system
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JPS6238133A (ja) * 1985-08-12 1987-02-19 株式会社トプコン 眼底カメラ
US5621203A (en) * 1992-09-25 1997-04-15 Symbol Technologies Method and apparatus for reading two-dimensional bar code symbols with an elongated laser line
US5280161A (en) * 1988-11-18 1994-01-18 West Electric Company, Ltd. Apparatus for optically reading a bar code
FR2640399B1 (fr) * 1988-12-09 1991-09-27 Alcatel Business Systems Dispositif de correction d'eclairement pour analyseur de document
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Also Published As

Publication number Publication date
DE102005002934A1 (de) 2006-07-27
WO2006077105A3 (fr) 2006-09-21
CA2595354A1 (fr) 2006-07-27
JP4547428B2 (ja) 2010-09-22
CN101107616A (zh) 2008-01-16
US20080121789A1 (en) 2008-05-29
JP2008529110A (ja) 2008-07-31
CN100565558C (zh) 2009-12-02
ES2355419T3 (es) 2011-03-25
EP1851680A2 (fr) 2007-11-07
CA2595354C (fr) 2012-05-15
US7635834B2 (en) 2009-12-22
DE602006018869D1 (de) 2011-01-27
EP1851680B1 (fr) 2010-12-15
WO2006077105A2 (fr) 2006-07-27
ATE492003T1 (de) 2011-01-15

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Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20180119