HK1052220A1 - Method and arrangement for depth resolving optical detection of a probe - Google Patents

Method and arrangement for depth resolving optical detection of a probe

Info

Publication number
HK1052220A1
HK1052220A1 HK03102529.3A HK03102529A HK1052220A1 HK 1052220 A1 HK1052220 A1 HK 1052220A1 HK 03102529 A HK03102529 A HK 03102529A HK 1052220 A1 HK1052220 A1 HK 1052220A1
Authority
HK
Hong Kong
Prior art keywords
sample
arrangement
probe
light
optical detection
Prior art date
Application number
HK03102529.3A
Other languages
English (en)
Inventor
Ralf Wolleschensky
Michael Kempe
Original Assignee
Zeiss Carl Jena Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE2001118463 external-priority patent/DE10118463A1/de
Priority claimed from DE2001155002 external-priority patent/DE10155002A1/de
Application filed by Zeiss Carl Jena Gmbh filed Critical Zeiss Carl Jena Gmbh
Publication of HK1052220A1 publication Critical patent/HK1052220A1/xx

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N2021/6463—Optics

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Microscoopes, Condenser (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
HK03102529.3A 2001-04-07 2003-04-09 Method and arrangement for depth resolving optical detection of a probe HK1052220A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE2001118463 DE10118463A1 (de) 2001-04-07 2001-04-07 Verfahren und Anordnung zur tiefenaufgelösten optischen Erfassung einer Probe
DE2001155002 DE10155002A1 (de) 2001-11-08 2001-11-08 Verfahren und Anordnung zur tiefenaufgelösten optischen Erfassung einer Probe

Publications (1)

Publication Number Publication Date
HK1052220A1 true HK1052220A1 (en) 2003-09-05

Family

ID=26009086

Family Applications (1)

Application Number Title Priority Date Filing Date
HK03102529.3A HK1052220A1 (en) 2001-04-07 2003-04-09 Method and arrangement for depth resolving optical detection of a probe

Country Status (5)

Country Link
EP (1) EP1248132B1 (ja)
JP (1) JP4747243B2 (ja)
AT (1) ATE493683T1 (ja)
DE (1) DE50214827D1 (ja)
HK (1) HK1052220A1 (ja)

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* Cited by examiner, † Cited by third party
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DE10221564A1 (de) * 2002-05-15 2003-11-27 Evotec Ag Vorrichtung und Verfahren zur Untersuchung chemischer und/oder biologischer Proben
DE10254139A1 (de) * 2002-11-15 2004-05-27 Carl Zeiss Jena Gmbh Verfahren und Anordnung zur tiefenaufgelösten optischen Erfassung einer Probe
JP4495083B2 (ja) * 2003-02-13 2010-06-30 浜松ホトニクス株式会社 蛍光相関分光解析装置
DE102004034962A1 (de) * 2004-07-16 2006-02-16 Carl Zeiss Jena Gmbh Mikroskop mit erhöhter Auflösung
DE102004034993A1 (de) * 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Lichtrastermikroskop mit linienförmiger Abtastung und Verwendung
DE102004034996A1 (de) * 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Lichtrastermikroskop mit linienförmiger Abtastung
US7729750B2 (en) * 2005-01-20 2010-06-01 The Regents Of The University Of California Method and apparatus for high resolution spatially modulated fluorescence imaging and tomography
DE102005022880B4 (de) * 2005-05-18 2010-12-30 Olympus Soft Imaging Solutions Gmbh Trennung spektral oder farblich überlagerter Bildbeiträge in einem Mehrfarbbild, insbesondere in transmissionsmikroskopischen Mehrfarbbildern
DE102005046755A1 (de) * 2005-09-29 2007-04-19 Carl Zeiss Jena Gmbh Vorrichtung und Verfahren zum Erzeugen eines Bildes eines Objektes
JP4978470B2 (ja) * 2005-10-11 2012-07-18 株式会社ニコン 顕微鏡装置及び観察方法
JP4831072B2 (ja) 2005-10-13 2011-12-07 株式会社ニコン 顕微鏡装置
JP5551069B2 (ja) * 2007-07-06 2014-07-16 ナショナル ユニヴァーシティー オブ シンガポール 蛍光焦点変調顕微鏡システムおよびその方法
DE102007047468A1 (de) * 2007-09-28 2009-04-02 Carl Zeiss Microimaging Gmbh Verfahren und Anordnung zur optischen Erfassung einer beleuchteten Probe
DE102007047460A1 (de) 2007-09-28 2009-04-09 Carl Zeiss Meditec Ag Vorrichtung und Verfahren zur Untersuchung des Augenhintergrundes, inbesondere der Photorezeptoren
DE102007047465A1 (de) * 2007-09-28 2009-04-02 Carl Zeiss Microimaging Gmbh Verfahren und Anordnung zur optischen Erfassung einer beleuchteten Probe
DE102008024954A1 (de) * 2008-05-23 2009-11-26 Carl Zeiss Microlmaging Gmbh Mikroskop mit einer optischen Anordnung zur Strukturierung des Beleuchtungslichtes
JP5699421B2 (ja) * 2008-09-16 2015-04-08 横河電機株式会社 顕微鏡装置
DE102008049878A1 (de) * 2008-09-30 2010-04-01 Carl Zeiss Microlmaging Gmbh Verbesserte Verfahren und Vorrichtungen für die Mikroskopie mit strukturierter Beleuchtung
EP2312367A1 (en) * 2009-10-16 2011-04-20 Olympus Corporation Laser scanning microscope
JP2012008260A (ja) * 2010-06-23 2012-01-12 Hamamatsu Photonics Kk 画像生成装置
JP5563405B2 (ja) * 2010-08-24 2014-07-30 荏原実業株式会社 分光画像取得装置及び方法
JP5412394B2 (ja) 2010-09-30 2014-02-12 オリンパス株式会社 標本観察装置
DE102011077236A1 (de) * 2011-06-08 2012-12-13 Carl Zeiss Microlmaging Gmbh Autofokusverfahren für Mikroskop und Mikroskop mit Autofokuseinrichtung
JP5892410B2 (ja) * 2011-10-03 2016-03-23 株式会社ニコン 走査型顕微鏡
US20130250088A1 (en) * 2012-03-22 2013-09-26 Molecular Devices, Llc Multi-color confocal microscope and imaging methods
DE102012223128B4 (de) 2012-12-13 2022-09-01 Carl Zeiss Microscopy Gmbh Autofokusverfahren für Mikroskop und Mikroskop mit Autofokuseinrichtung
US10088657B2 (en) * 2014-06-11 2018-10-02 Hans-Ulrich Dodt Light sheet microscopy using meso-optical elements
WO2016027453A1 (ja) * 2014-08-18 2016-02-25 国立大学法人大阪大学 ラマン分光顕微鏡及びラマン散乱光観察方法
JP7290907B2 (ja) 2016-03-10 2023-06-14 シスメックス株式会社 光学機器および像の形成方法
JP6266851B1 (ja) * 2016-03-17 2018-01-24 国立研究開発法人科学技術振興機構 イメージング装置及びイメージング方法
CN108333151B (zh) * 2017-01-19 2021-01-26 北京大学 一种基于飞秒脉冲整形的超分辨显微成像***及成像方法
DE102019116626B4 (de) * 2019-06-19 2021-03-18 Abberior Instruments Gmbh Verfahren und Vorrichtungen zur Überprüfung der Konfokalität einer scannenden und entscannenden Mikroskopbaugruppe

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US5867604A (en) * 1995-08-03 1999-02-02 Ben-Levy; Meir Imaging measurement system
GB2338858B (en) * 1997-04-04 2000-12-27 Isis Innovation Microscopy imaging apparatus and method
EP0981733B1 (en) * 1997-05-16 2004-02-11 Massachusetts Institute Of Technology Grating based phase control optical delay line
JPH11242189A (ja) * 1997-12-25 1999-09-07 Olympus Optical Co Ltd 像形成法、像形成装置
WO1999042884A1 (de) * 1998-02-19 1999-08-26 Leica Microsystems Heidelberg Gmbh Optische anordnung mit spektral selektivem element
JPH11271020A (ja) * 1998-03-25 1999-10-05 Olympus Optical Co Ltd 干渉顕微鏡装置
DE19930816A1 (de) * 1999-07-01 2001-01-04 Zeiss Carl Jena Gmbh Verfahren und Vorrichtung zur Tiefenselektion von Mikroskopbildern
JP4481397B2 (ja) * 1999-09-07 2010-06-16 オリンパス株式会社 光学装置及び顕微鏡

Also Published As

Publication number Publication date
EP1248132B1 (de) 2010-12-29
JP2002323660A (ja) 2002-11-08
ATE493683T1 (de) 2011-01-15
EP1248132A2 (de) 2002-10-09
JP4747243B2 (ja) 2011-08-17
DE50214827D1 (de) 2011-02-10
EP1248132A3 (de) 2004-06-16

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Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20160328