GB9000198D0 - Wiring testing apparatus - Google Patents

Wiring testing apparatus

Info

Publication number
GB9000198D0
GB9000198D0 GB909000198A GB9000198A GB9000198D0 GB 9000198 D0 GB9000198 D0 GB 9000198D0 GB 909000198 A GB909000198 A GB 909000198A GB 9000198 A GB9000198 A GB 9000198A GB 9000198 D0 GB9000198 D0 GB 9000198D0
Authority
GB
United Kingdom
Prior art keywords
testing apparatus
wiring testing
wiring
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB909000198A
Other versions
GB2240435A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BARKER COLIN G
Original Assignee
BARKER COLIN G
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by BARKER COLIN G filed Critical BARKER COLIN G
Priority to GB9000198A priority Critical patent/GB2240435A/en
Publication of GB9000198D0 publication Critical patent/GB9000198D0/en
Publication of GB2240435A publication Critical patent/GB2240435A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
GB9000198A 1990-01-05 1990-01-05 Testing test fixtures for pcb's Withdrawn GB2240435A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB9000198A GB2240435A (en) 1990-01-05 1990-01-05 Testing test fixtures for pcb's

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB9000198A GB2240435A (en) 1990-01-05 1990-01-05 Testing test fixtures for pcb's

Publications (2)

Publication Number Publication Date
GB9000198D0 true GB9000198D0 (en) 1990-03-07
GB2240435A GB2240435A (en) 1991-07-31

Family

ID=10668854

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9000198A Withdrawn GB2240435A (en) 1990-01-05 1990-01-05 Testing test fixtures for pcb's

Country Status (1)

Country Link
GB (1) GB2240435A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10039928B4 (en) 2000-08-16 2004-07-15 Infineon Technologies Ag Device for automated testing, calibration and characterization of test adapters
DE10116823C2 (en) * 2001-04-04 2003-10-30 Infineon Technologies Ag Procedure for calibrating test cards with non-resilient contact elements

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4841231A (en) * 1987-10-30 1989-06-20 Unisys Corporation Test probe accessibility method and tool

Also Published As

Publication number Publication date
GB2240435A (en) 1991-07-31

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Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)