GB898872A - Improvements in the manufacture of crystalline silicon - Google Patents
Improvements in the manufacture of crystalline siliconInfo
- Publication number
- GB898872A GB898872A GB2783159A GB2783159A GB898872A GB 898872 A GB898872 A GB 898872A GB 2783159 A GB2783159 A GB 2783159A GB 2783159 A GB2783159 A GB 2783159A GB 898872 A GB898872 A GB 898872A
- Authority
- GB
- United Kingdom
- Prior art keywords
- silicon
- tube
- carrier member
- rod
- zone
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/06—Silicon
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B33/00—Silicon; Compounds thereof
- C01B33/02—Silicon
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B13/00—Single-crystal growth by zone-melting; Refining by zone-melting
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Inorganic Chemistry (AREA)
- Silicon Compounds (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
<PICT:0898872/III/1> <PICT:0898872/III/2> <PICT:0898872/III/3> A molten zone is passed downwards in an inert or reducing atmosphere through a mass of silicon pieces or granules contained in a silica tube, the upper surface of the mass being in contact with a carrier member so as to form a rod of reduced diameter attached to the carrier member. The carrier member may be of metal, graphite, a ceramic material, or silicon. The silica tube may be externally air- or water-cooled. The molten zone may be produced by radiant or induction heating. In the latter case, the mass of silicon may be preheated by conduction from the carrier member or by radiation. Relative movement may be effected between the carrier member and the tube so as to control the diameter of the rod. A molten zone may be passed at a rate of 6-12 inches/hr. through silicon particles of up to 1/4 inch mesh size in a 1 inch diameter tube. As shown in Figs. 1 and 2, a molten zone is formed in a rod of silicon 3 by means of a resistance heating element 4 and induction heating coil 5, and this molten zone is caused to pass down through a mass of silicon 2 in a silica tube 1 by relative movement of coil 5. The resulting elongated rod may be removed from the tube and zone-melted in known manner or may be further zone-melted in situ in the same or the reverse direction provided that a layer of unmelted silicon is retained at the bottom of the tube. As shown in Fig. 3, a second carrier member 10 is held in a chuck 9 of a closure member 8 at the lower end of an open-ended tube to enable repeated zone-refining to take place in situ without distortion. After initial formation of a single rod using a mono-crystalline silicon seed 10, a molten zone may be passed upwards to produce a mono-crystalline rod.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB2783159A GB898872A (en) | 1959-08-14 | 1959-08-14 | Improvements in the manufacture of crystalline silicon |
DEJ18555A DE1170913B (en) | 1959-08-14 | 1960-08-11 | Process for the production of crystalline silicon in rod form |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB2783159A GB898872A (en) | 1959-08-14 | 1959-08-14 | Improvements in the manufacture of crystalline silicon |
Publications (1)
Publication Number | Publication Date |
---|---|
GB898872A true GB898872A (en) | 1962-06-14 |
Family
ID=10266014
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB2783159A Expired GB898872A (en) | 1959-08-14 | 1959-08-14 | Improvements in the manufacture of crystalline silicon |
Country Status (2)
Country | Link |
---|---|
DE (1) | DE1170913B (en) |
GB (1) | GB898872A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0349117A2 (en) * | 1988-07-01 | 1990-01-03 | Hemlock Semiconductor Corporation | Trace metals analysis in semiconductor material |
EP0450494A1 (en) * | 1990-03-30 | 1991-10-09 | Sumitomo Sitix Corporation | Manufacturing method for single-crystal silicon |
US5499598A (en) * | 1993-03-17 | 1996-03-19 | Tokuyama Corporation | Method for producing a silicon rod |
WO2014019789A1 (en) * | 2012-07-31 | 2014-02-06 | Siltronic Ag | Method for producing a monocrystal from silicon |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE973271C (en) * | 1951-10-26 | 1960-01-07 | Karlheinz Belzer | Method and device for hardening toothed scissors |
US2904642A (en) * | 1955-11-08 | 1959-09-15 | Du Mont Allen B Lab Inc | Gamma correction circuit |
NL98843C (en) * | 1956-07-02 |
-
1959
- 1959-08-14 GB GB2783159A patent/GB898872A/en not_active Expired
-
1960
- 1960-08-11 DE DEJ18555A patent/DE1170913B/en active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0349117A2 (en) * | 1988-07-01 | 1990-01-03 | Hemlock Semiconductor Corporation | Trace metals analysis in semiconductor material |
EP0349117A3 (en) * | 1988-07-01 | 1990-10-31 | Hemlock Semiconductor Corporation | Trace metals analysis in semiconductor material |
EP0450494A1 (en) * | 1990-03-30 | 1991-10-09 | Sumitomo Sitix Corporation | Manufacturing method for single-crystal silicon |
US5499598A (en) * | 1993-03-17 | 1996-03-19 | Tokuyama Corporation | Method for producing a silicon rod |
WO2014019789A1 (en) * | 2012-07-31 | 2014-02-06 | Siltronic Ag | Method for producing a monocrystal from silicon |
Also Published As
Publication number | Publication date |
---|---|
DE1170913B (en) | 1964-05-27 |
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