GB8321502D0 - Polymeric films - Google Patents

Polymeric films

Info

Publication number
GB8321502D0
GB8321502D0 GB838321502A GB8321502A GB8321502D0 GB 8321502 D0 GB8321502 D0 GB 8321502D0 GB 838321502 A GB838321502 A GB 838321502A GB 8321502 A GB8321502 A GB 8321502A GB 8321502 D0 GB8321502 D0 GB 8321502D0
Authority
GB
United Kingdom
Prior art keywords
polymeric films
polymeric
films
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB838321502A
Other versions
GB2125423A (en
GB2125423B (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AT&T Corp
Original Assignee
Western Electric Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Western Electric Co Inc filed Critical Western Electric Co Inc
Publication of GB8321502D0 publication Critical patent/GB8321502D0/en
Publication of GB2125423A publication Critical patent/GB2125423A/en
Application granted granted Critical
Publication of GB2125423B publication Critical patent/GB2125423B/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02107Forming insulating materials on a substrate
    • H01L21/02109Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
    • H01L21/02112Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
    • H01L21/02123Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon
    • H01L21/02126Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material containing Si, O, and at least one of H, N, C, F, or other non-metal elements, e.g. SiOC, SiOC:H or SiONC
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02107Forming insulating materials on a substrate
    • H01L21/02109Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
    • H01L21/02205Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition
    • H01L21/02208Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si
    • H01L21/02214Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si the compound comprising silicon and oxygen
    • H01L21/02216Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si the compound comprising silicon and oxygen the compound being a molecule comprising at least one silicon-oxygen bond and the compound having hydrogen or an organic group attached to the silicon or oxygen, e.g. a siloxane
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02107Forming insulating materials on a substrate
    • H01L21/02225Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
    • H01L21/0226Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
    • H01L21/02263Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase
    • H01L21/02271Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase deposition by decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
    • H01L21/02274Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase deposition by decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition in the presence of a plasma [PECVD]
GB08321502A 1982-08-13 1983-08-10 Polymeric films for electronic circuits Expired GB2125423B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US40800582A 1982-08-13 1982-08-13

Publications (3)

Publication Number Publication Date
GB8321502D0 true GB8321502D0 (en) 1983-09-14
GB2125423A GB2125423A (en) 1984-03-07
GB2125423B GB2125423B (en) 1985-09-04

Family

ID=23614453

Family Applications (1)

Application Number Title Priority Date Filing Date
GB08321502A Expired GB2125423B (en) 1982-08-13 1983-08-10 Polymeric films for electronic circuits

Country Status (8)

Country Link
JP (1) JPS5948929A (en)
BE (1) BE897503A (en)
CA (1) CA1204527A (en)
DE (1) DE3329065A1 (en)
FR (1) FR2531811B1 (en)
GB (1) GB2125423B (en)
IT (1) IT1203708B (en)
NL (1) NL8302845A (en)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60225447A (en) * 1984-04-23 1985-11-09 Mitsubishi Electric Corp Manufacture of semiconductor device
EP0204631A3 (en) * 1985-06-04 1987-05-20 Fairchild Semiconductor Corporation Semiconductor structures having polysiloxane leveling film
US4723978A (en) * 1985-10-31 1988-02-09 International Business Machines Corporation Method for a plasma-treated polysiloxane coating
US4732841A (en) * 1986-03-24 1988-03-22 Fairchild Semiconductor Corporation Tri-level resist process for fine resolution photolithography
US4756977A (en) * 1986-12-03 1988-07-12 Dow Corning Corporation Multilayer ceramics from hydrogen silsesquioxane
US4753855A (en) * 1986-12-04 1988-06-28 Dow Corning Corporation Multilayer ceramic coatings from metal oxides for protection of electronic devices
US4749631B1 (en) * 1986-12-04 1993-03-23 Multilayer ceramics from silicate esters
US4911992A (en) * 1986-12-04 1990-03-27 Dow Corning Corporation Platinum or rhodium catalyzed multilayer ceramic coatings from hydrogen silsesquioxane resin and metal oxides
JPS63213347A (en) * 1987-02-27 1988-09-06 Mitsubishi Electric Corp Semiconductor device
US4847162A (en) * 1987-12-28 1989-07-11 Dow Corning Corporation Multilayer ceramics coatings from the ceramification of hydrogen silsequioxane resin in the presence of ammonia
IT1226701B (en) * 1988-07-29 1991-02-05 Eniricerche Spa PROCEDURE FOR THE DEPOSITION OF ORGANOSILANS ON SILICON OR SILICON OXIDE SUBSTRATES FOR DEVICES OF THE EOS OR CHEMFET TYPE.
JPH02291129A (en) * 1989-04-28 1990-11-30 Nec Corp Semiconductor device
DE9206834U1 (en) * 1992-02-21 1993-06-17 Robert Bosch Gmbh, 7000 Stuttgart, De
JP2934353B2 (en) * 1992-06-24 1999-08-16 三菱電機株式会社 Semiconductor device and manufacturing method thereof
JP3262334B2 (en) 1992-07-04 2002-03-04 トリコン ホルディングズ リミテッド Method for processing semiconductor wafers
EP0642167A3 (en) * 1993-08-05 1995-06-28 Matsushita Electronics Corp Semiconductor device having capacitor and manufacturing method thereof.
US5858880A (en) * 1994-05-14 1999-01-12 Trikon Equipment Limited Method of treating a semi-conductor wafer
KR100440233B1 (en) 1996-08-24 2004-07-15 트리콘 이큅먼츠 리미티드 Method and apparatus for depositing a planarized dielectric layer on a semiconductor substrate
TW437017B (en) * 1998-02-05 2001-05-28 Asm Japan Kk Silicone polymer insulation film on semiconductor substrate and method for formation thereof
US6503633B2 (en) * 2000-05-22 2003-01-07 Jsr Corporation Composition for film formation, process for producing composition for film formation, method of film formation, and silica-based film
WO2003104305A1 (en) * 2002-04-18 2003-12-18 Lg Chem, Ltd. Organic silicate polymer and insulation film comprising the same
CN103030832B (en) 2005-11-30 2015-07-08 Lg化学株式会社 Method for preparing microcellular foam of thermoplastic resin prepared with die having improved cooling property

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1347948A (en) * 1961-12-15 1964-01-04 Pacific Semiconductors Process for esterification of silicon dioxide at atmospheric pressure
JPS5850417B2 (en) * 1979-07-31 1983-11-10 富士通株式会社 Manufacturing method of semiconductor device
JPS5760330A (en) * 1980-09-27 1982-04-12 Fujitsu Ltd Resin composition

Also Published As

Publication number Publication date
GB2125423A (en) 1984-03-07
DE3329065A1 (en) 1984-02-16
BE897503A (en) 1983-12-01
FR2531811B1 (en) 1986-10-31
CA1204527A (en) 1986-05-13
FR2531811A1 (en) 1984-02-17
GB2125423B (en) 1985-09-04
IT8322560A0 (en) 1983-08-12
NL8302845A (en) 1984-03-01
JPS5948929A (en) 1984-03-21
IT1203708B (en) 1989-02-15

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee