GB693726A - High current gain semi-conductor devices - Google Patents

High current gain semi-conductor devices

Info

Publication number
GB693726A
GB693726A GB9046/51A GB904651A GB693726A GB 693726 A GB693726 A GB 693726A GB 9046/51 A GB9046/51 A GB 9046/51A GB 904651 A GB904651 A GB 904651A GB 693726 A GB693726 A GB 693726A
Authority
GB
United Kingdom
Prior art keywords
emitter
collector
electrode
semi
inches
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB9046/51A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
RCA Corp
Original Assignee
RCA Corp
Radio Corporation of America
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by RCA Corp, Radio Corporation of America filed Critical RCA Corp
Publication of GB693726A publication Critical patent/GB693726A/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/31Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/19Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
    • H01L2924/1901Structure
    • H01L2924/1904Component type
    • H01L2924/19041Component type being a capacitor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30Technical effects
    • H01L2924/301Electrical effects
    • H01L2924/3011Impedance

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Ceramic Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Bipolar Transistors (AREA)

Abstract

693,726. Semi-conductor amplifiers. RADIO CORPORATION OF AMERICA. April 18, 1951 [April 21, 1950], No. 9046/51. Class 40 (iv). [Also in Group XL (c)] The current gain characteristic of a transistor is increased by a forming treatment in which a condenser is suddenly discharged between the base and collector electrodes, while biasing voltages are applied to the electrodes, and the collector is spaced at least 0.01 inches from the emitter electrode. Fig. 2 shows a circuit arrangement in which a pulse from charged condenser 31 is applied by means of switch 32 in the reverse current direction between the point contact collector electrode 14 and base electrode 11. The emitter electrode is biased in the forward direction by means of a battery in series with a resistance, and the collector electrode is similarly biased in the reverse direction. The spacing between the emitter and collector electrodes at the time of the pulse is adjusted to about 0.015 inches. Experimental data is furnished to show that the process results in increased current gain, reduced base resistance and reduced output resistance when the treated device is subsequently operated as a normal transistor amplifier, but with the same spacing of about 0.015 inches between the emitter and collector electrodes. The resistivity of the semi-conductor material in this case is assumed to be high, i.e. between 10 and 20 ohm-centimetres. If the resistivity of the semi-conductor material is low, i.e. between 2 and 8 ohmcentimetres, the collector and emitter electrodes may be placed the normal distance apart (i.e. not more than 5 mils.) after the pulsing treatment has been applied at the increased spacing of about 0.015 inches. Alternatively, an auxiliary electrode, spaced at this distance and biased as the emitter, the normal emitter being disconnected, may be used during the pulsing treatment, and then removed or disconnected. Fig. 1 shows a suitable construction for the device. The semi-conductor material may consist of germanium, silicon, boron, selenium or tellurium.
GB9046/51A 1950-04-21 1951-04-18 High current gain semi-conductor devices Expired GB693726A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US301198XA 1950-04-21 1950-04-21

Publications (1)

Publication Number Publication Date
GB693726A true GB693726A (en) 1953-07-08

Family

ID=21852611

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9046/51A Expired GB693726A (en) 1950-04-21 1951-04-18 High current gain semi-conductor devices

Country Status (5)

Country Link
BE (1) BE502674A (en)
CH (1) CH301198A (en)
FR (1) FR1040717A (en)
GB (1) GB693726A (en)
NL (2) NL89628C (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2913704A (en) * 1954-07-06 1959-11-17 Sylvania Electric Prod Multiple emitter matrices

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL187425A (en) * 1953-05-14

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2913704A (en) * 1954-07-06 1959-11-17 Sylvania Electric Prod Multiple emitter matrices

Also Published As

Publication number Publication date
NL89628C (en) 1900-01-01
BE502674A (en) 1900-01-01
NL160604B (en) 1900-01-01
CH301198A (en) 1954-08-31
FR1040717A (en) 1953-10-19

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