GB395649A - Improvements in methods and apparatus for microscopically examining the profiles of surfaces - Google Patents

Improvements in methods and apparatus for microscopically examining the profiles of surfaces

Info

Publication number
GB395649A
GB395649A GB6701/33A GB670133A GB395649A GB 395649 A GB395649 A GB 395649A GB 6701/33 A GB6701/33 A GB 6701/33A GB 670133 A GB670133 A GB 670133A GB 395649 A GB395649 A GB 395649A
Authority
GB
United Kingdom
Prior art keywords
microscope
illuminating
examined
axis
plane
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB6701/33A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of GB395649A publication Critical patent/GB395649A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/06Means for illuminating specimens
    • G02B21/08Condensers
    • G02B21/082Condensers for incident illumination only

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
  • Eye Examination Apparatus (AREA)

Abstract

395,649. Gauging-apparatus. SCHMALTZ, G., 79, Frankfurterstrasse, Offenbach-on-Main, Germany. March 6, 1933, No. 6701. Convention date, March 10, 1932. [Class 106 (ii).] A surface is examined or tested by imaging a knife edge or a slit on the surface and examining the luminous boundary line thus produced by a microscope the axis of which is inclined to that of the light pencil incident on the surface. If the part of the surface under examination is truly plane the boundary line is straight, and any deviation from a plane surface is indicated by waviness of the line. In the form of apparatus shown, the means for illuminating the surface is carried by a bracket a secured to the microscope tube b so that the axis of the illuminating device is at right-angles to that of the microscope. The illuminating means comprises a light source d, a converging lens e, a slit diaphragm f, and an imaging system g which forms on the surface h to be examined an image at the focus of the microscope objective. The surface h is slightly inclined to the axis of the microscope. Different parts of the surface may be examined by moving the microscope tube and illuminating means up and down. A number of slits may be used so that several luminous lines are obtained for successive examination. There may also be projected on the surface a number of plane pencils crossing each other at right-angles so that two intersecting series of lines are obtained. The examination may be effected microphotographically instead of by viewing. In a modified form of apparatus the axis of the illuminating-device is parallel to that of the microscope tube, the surface to be examined being placed below the illuminating-device and a mirror being arranged below the microscope objective to receive light from the surface and direct it into the objective.
GB6701/33A 1932-03-10 1933-03-06 Improvements in methods and apparatus for microscopically examining the profiles of surfaces Expired GB395649A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE395649X 1932-03-10

Publications (1)

Publication Number Publication Date
GB395649A true GB395649A (en) 1933-07-20

Family

ID=6396881

Family Applications (1)

Application Number Title Priority Date Filing Date
GB6701/33A Expired GB395649A (en) 1932-03-10 1933-03-06 Improvements in methods and apparatus for microscopically examining the profiles of surfaces

Country Status (1)

Country Link
GB (1) GB395649A (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2667103A (en) * 1949-07-05 1954-01-26 Silge Martin Illuminating means for microscopes
US2816474A (en) * 1953-06-30 1957-12-17 Owens Illinois Glass Co Inspecting interior of television tube face
US2867149A (en) * 1953-10-05 1959-01-06 Bell Telephone Labor Inc Method of determining surface flatness
US2923197A (en) * 1955-08-11 1960-02-02 Sylvania Electric Prod Grid sorting by shadow contours
US3022578A (en) * 1958-02-26 1962-02-27 Boeing Co Discontinuity depth gauge
US3023663A (en) * 1958-11-28 1962-03-06 Bausch & Lomb Die wear microscope
US3269264A (en) * 1964-05-28 1966-08-30 United States Steel Corp Apparatus for exhibiting couplingthread contour
WO2004017016A2 (en) * 2003-06-24 2004-02-26 Pixargus Gmbh Device and method for measuring the dimensions of a body

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2667103A (en) * 1949-07-05 1954-01-26 Silge Martin Illuminating means for microscopes
US2816474A (en) * 1953-06-30 1957-12-17 Owens Illinois Glass Co Inspecting interior of television tube face
US2867149A (en) * 1953-10-05 1959-01-06 Bell Telephone Labor Inc Method of determining surface flatness
US2923197A (en) * 1955-08-11 1960-02-02 Sylvania Electric Prod Grid sorting by shadow contours
US3022578A (en) * 1958-02-26 1962-02-27 Boeing Co Discontinuity depth gauge
US3023663A (en) * 1958-11-28 1962-03-06 Bausch & Lomb Die wear microscope
US3269264A (en) * 1964-05-28 1966-08-30 United States Steel Corp Apparatus for exhibiting couplingthread contour
WO2004017016A2 (en) * 2003-06-24 2004-02-26 Pixargus Gmbh Device and method for measuring the dimensions of a body
WO2004017016A3 (en) * 2003-06-24 2004-09-30 Pixargus Gmbh Device and method for measuring the dimensions of a body
US7245386B2 (en) 2003-06-24 2007-07-17 Pixargus Gmbh Object measuring device and associated methods

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