GB2609588A - Systems and methods for controlling image contrast in an X-ray system - Google Patents
Systems and methods for controlling image contrast in an X-ray system Download PDFInfo
- Publication number
- GB2609588A GB2609588A GB2216885.0A GB202216885A GB2609588A GB 2609588 A GB2609588 A GB 2609588A GB 202216885 A GB202216885 A GB 202216885A GB 2609588 A GB2609588 A GB 2609588A
- Authority
- GB
- United Kingdom
- Prior art keywords
- beam filter
- inspection system
- contrast
- ray
- ray inspection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title claims 2
- 238000007689 inspection Methods 0.000 claims abstract 19
- 230000001678 irradiating effect Effects 0.000 claims abstract 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims 6
- 239000010949 copper Substances 0.000 claims 6
- 229910052802 copper Inorganic materials 0.000 claims 6
- 239000000463 material Substances 0.000 claims 3
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims 3
- 239000010937 tungsten Substances 0.000 claims 3
- 229910052721 tungsten Inorganic materials 0.000 claims 3
- 230000005855 radiation Effects 0.000 claims 2
- 229910000906 Bronze Inorganic materials 0.000 claims 1
- 229910000831 Steel Inorganic materials 0.000 claims 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims 1
- 239000010974 bronze Substances 0.000 claims 1
- KUNSUQLRTQLHQQ-UHFFFAOYSA-N copper tin Chemical compound [Cu].[Sn] KUNSUQLRTQLHQQ-UHFFFAOYSA-N 0.000 claims 1
- 230000003247 decreasing effect Effects 0.000 claims 1
- 239000011159 matrix material Substances 0.000 claims 1
- 239000007769 metal material Substances 0.000 claims 1
- 239000002245 particle Substances 0.000 claims 1
- 239000010959 steel Substances 0.000 claims 1
- 229910052718 tin Inorganic materials 0.000 claims 1
- 239000011135 tin Substances 0.000 claims 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/10—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being confined in a container, e.g. in a luggage X-ray scanners
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/203—Measuring back scattering
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/313—Accessories, mechanical or electrical features filters, rotating filter disc
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Immunology (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Pathology (AREA)
- Crystallography & Structural Chemistry (AREA)
- High Energy & Nuclear Physics (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Geophysics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Abstract
An X-ray inspection system for scanning objects and providing corresponding contrast controlled scan images is provided. The system includes an X-ray source configured to generate an X-ray beam for irradiating the object where the X-ray source is coupled with at least a first beam filter having a first thickness and a second beam filter having a second thickness greater than the first thickness, a detector array, a processing unit, a user interface configured to receive a user input indicative of a desired level of contrast in an image, and a controller configured to adjust a position of at least one of the first or second beam filters based on the user input indicative of the desired level of contrast in the at least one image.
Claims (18)
1. An X-ray inspection system for scanning an object, the system comprising: an X-ray source configured to generate an X-ray beam for irradiating the object, wherein the X-ray beam irradiating the object defines a field of view and wherein the X-ray source is coupled with at least a first beam filter having a first thickness and a second beam filter having a second thickness greater than the first thickness; a detector array adapted to receive radiation, originating from the X-ray beam, that is transmitted through, or scattered from, the object and to generate data representative of at least one image; a processing unit configured to receive the data representative of at least one image and to generate the at least one image for display based on the data representative of at least one image; a user interface configured to receive a user input indicative of a desired level of contrast in the at least one image; and a controller configured to adjust a position of at least one of the first beam filter or the second beam filter based on the user input indicative of the desired level of contrast in the at least one image.
2. The X-ray inspection system of claim 1 , wherein the desired level of contrast comprises at least one of a first contrast level, a second contrast level, a third contrast level, or a fourth contrast level and wherein the first contrast level is less than the second contrast level, the second contrast level is less than the third contrast level, and the third contrast level is less than the fourth contrast level.
3. The X-ray inspection system of claim 2, wherein, upon the user interface receiving the user input of the first contrast level, the controller is configured to cause the first beam filter and the second beam filter to not be in the field of view of the X-ray source.
4. The X-ray inspection system of claim 2, wherein, upon the user interface receiving the user input of the second contrast level, the controller is configured to cause the first beam filter to be in the field of view of the X-ray source and the second beam filter to not be in the field of view of the X-ray source.
5. The X-ray inspection system of claim 2, wherein, upon the user interface receiving the user input of the third contrast level, the controller is configured to cause the first beam filter to not be in the field of view of the X-ray source and the second beam filter to be in the field of view of the X-ray source.
6. The X-ray inspection system of claim 2, wherein, upon the user interface receiving the user input of the fourth contrast level, the controller is configured to cause the first beam filter to be in the field of view of the X-ray source and the second beam filter to be in the field of view of the X-ray source.
7. The X-ray inspection system of claim 1, wherein the first beam filter and the second beam filter comprise a metallic material having a high atomic number.
8. The X-ray inspection system of claim 1, wherein the first beam filter and the second beam filter comprise at least one of bronze, tin, tungsten, copper or a copper matrix embedded with tungsten particles.
9. The X-ray inspection system of claim 1, wherein the first beam filter and the second beam filter comprise a first layer made of tungsten or lead and a second layer made of steel or copper configured to absorb fluorescence emitted by the first layer.
10. The X-ray inspection system of claim 1, further comprising a shielding coupled with the first beam filter and the second beam filter configured to reduce radiation leakage.
11. The X-ray inspection system of claim 1, further comprising a pencil beam forming aperture placed in front of the X-ray source wherein the first beam filter is positioned between the X- ray source and the pencil beam forming aperture, and wherein image contrast increases by: increasing the distance between the pencil beam forming aperture and the first beam filter, and decreasing the distance between the first beam filter and the X-ray source.
12. The X-ray inspection system of claim 1, further comprising a third beam filter.
13. The X-ray inspection system of claim 12, wherein the first beam filter, second beam filter, and third beam filter comprise a 0.5mm thick copper material, a 1.0mm thick copper material, and a 2.0mm thick copper material, respectively.
14. The X-ray inspection system of claim 1, wherein the processing unit is further configured to modify one or more nonlinear transfer functions adapted to process the data representative of at least one image based on the desired level of contrast.
15. The X-ray inspection system of claim 14, wherein the nonlinear transfer functions comprise at least one of a gamma function or a S-curve function.
16. The X-ray inspection system of claim 2, wherein the processing unit is further configured to implement at least one of a first set of programmatic instructions or a second set of programmatic instructions based on the desired level of contrast.
17. The X-ray inspection system of claim 16, wherein the processing unit is further configured to implement the first set of programmatic instructions based on at least one of the first contrast level or second contrast level and wherein the first set of programmatic instructions comprise one or more contrast enhancement functions.
18. The X-ray inspection system of claim 16, wherein the processing unit is further configured to implement the second set of programmatic instructions based on at least one of the third contrast level or fourth contrast level and wherein the second set of programmatic instructions comprise one or more edge enhancement functions.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/US2020/035508 WO2021246998A1 (en) | 2020-06-01 | 2020-06-01 | Systems and methods for controlling image contrast in an x-ray system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| GB202216885D0 GB202216885D0 (en) | 2022-12-28 |
| GB2609588A true GB2609588A (en) | 2023-02-08 |
Family
ID=78831358
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB2216885.0A Pending GB2609588A (en) | 2020-06-01 | 2020-06-01 | Systems and methods for controlling image contrast in an X-ray system |
Country Status (4)
| Country | Link |
|---|---|
| EP (1) | EP4157093A4 (en) |
| CN (1) | CN115697202A (en) |
| GB (1) | GB2609588A (en) |
| WO (1) | WO2021246998A1 (en) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3417243A (en) * | 1965-10-28 | 1968-12-17 | Minnesota Mining & Mfg | Method and apparatus for x-ray fluorescence gauging of a higher atomic number selected element in a coating on a base |
| US5394454A (en) * | 1992-05-09 | 1995-02-28 | U.S. Philips Corporation | Filter method for an x-ray system, and device for carrying out such a filter method |
| US20030095626A1 (en) * | 2001-11-21 | 2003-05-22 | Anderton R. Larry | Method and apparatus for enhancing the contrast of a medical diagnostic image that includes foreign objects |
| US20130156151A1 (en) * | 2010-09-07 | 2013-06-20 | Yoshiaki Sugaya | X-ray ct apparatus and tube current determination method |
| US20170071559A1 (en) * | 2015-09-11 | 2017-03-16 | Siemens Healthcare Gmbh | Spectral filtration of x-rays for energy-selective x-ray imaging |
| US20180333109A1 (en) * | 2017-05-18 | 2018-11-22 | Robert Zamenhof | Contrast enhanced energy subtraction mammography |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2543753B (en) * | 2015-10-21 | 2020-07-29 | Smiths Heimann Sas | Vehicle cabin inspection system and method |
-
2020
- 2020-06-01 CN CN202080101575.6A patent/CN115697202A/en active Pending
- 2020-06-01 EP EP20938600.2A patent/EP4157093A4/en active Pending
- 2020-06-01 WO PCT/US2020/035508 patent/WO2021246998A1/en unknown
- 2020-06-01 GB GB2216885.0A patent/GB2609588A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3417243A (en) * | 1965-10-28 | 1968-12-17 | Minnesota Mining & Mfg | Method and apparatus for x-ray fluorescence gauging of a higher atomic number selected element in a coating on a base |
| US5394454A (en) * | 1992-05-09 | 1995-02-28 | U.S. Philips Corporation | Filter method for an x-ray system, and device for carrying out such a filter method |
| US20030095626A1 (en) * | 2001-11-21 | 2003-05-22 | Anderton R. Larry | Method and apparatus for enhancing the contrast of a medical diagnostic image that includes foreign objects |
| US20130156151A1 (en) * | 2010-09-07 | 2013-06-20 | Yoshiaki Sugaya | X-ray ct apparatus and tube current determination method |
| US20170071559A1 (en) * | 2015-09-11 | 2017-03-16 | Siemens Healthcare Gmbh | Spectral filtration of x-rays for energy-selective x-ray imaging |
| US20180333109A1 (en) * | 2017-05-18 | 2018-11-22 | Robert Zamenhof | Contrast enhanced energy subtraction mammography |
Also Published As
| Publication number | Publication date |
|---|---|
| CN115697202A (en) | 2023-02-03 |
| GB202216885D0 (en) | 2022-12-28 |
| EP4157093A1 (en) | 2023-04-05 |
| EP4157093A4 (en) | 2024-01-24 |
| WO2021246998A1 (en) | 2021-12-09 |
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| REG | Reference to a national code |
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