GB2582065B - On-chip resonance detection and transfer function mapping of resistive-inductive-capacitive sensors - Google Patents

On-chip resonance detection and transfer function mapping of resistive-inductive-capacitive sensors Download PDF

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Publication number
GB2582065B
GB2582065B GB2001341.3A GB202001341A GB2582065B GB 2582065 B GB2582065 B GB 2582065B GB 202001341 A GB202001341 A GB 202001341A GB 2582065 B GB2582065 B GB 2582065B
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United Kingdom
Prior art keywords
inductive
resistive
transfer function
capacitive sensors
resonance detection
Prior art date
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Active
Application number
GB2001341.3A
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GB2582065A (en
GB202001341D0 (en
Inventor
Das Tejasvi
Maru Siddharth
Beardsworth Matthew
E Duewer Bruce
Allan Kost Michael
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Cirrus Logic International Semiconductor Ltd
Original Assignee
Cirrus Logic International Semiconductor Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Priority claimed from US16/455,437 external-priority patent/US10935620B2/en
Application filed by Cirrus Logic International Semiconductor Ltd filed Critical Cirrus Logic International Semiconductor Ltd
Publication of GB202001341D0 publication Critical patent/GB202001341D0/en
Publication of GB2582065A publication Critical patent/GB2582065A/en
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
    • G01D18/002—Automatic recalibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2829—Testing of circuits in sensor or actuator systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2688—Measuring quality factor or dielectric loss, e.g. loss angle, or power factor
GB2001341.3A 2019-02-26 2020-01-31 On-chip resonance detection and transfer function mapping of resistive-inductive-capacitive sensors Active GB2582065B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201962810696P 2019-02-26 2019-02-26
US16/455,437 US10935620B2 (en) 2019-02-26 2019-06-27 On-chip resonance detection and transfer function mapping of resistive-inductive-capacitive sensors

Publications (3)

Publication Number Publication Date
GB202001341D0 GB202001341D0 (en) 2020-03-18
GB2582065A GB2582065A (en) 2020-09-09
GB2582065B true GB2582065B (en) 2021-09-08

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GB2001341.3A Active GB2582065B (en) 2019-02-26 2020-01-31 On-chip resonance detection and transfer function mapping of resistive-inductive-capacitive sensors

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GB (1) GB2582065B (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10948313B2 (en) 2019-02-26 2021-03-16 Cirrus Logic, Inc. Spread spectrum sensor scanning using resistive-inductive-capacitive sensors
US11579030B2 (en) 2020-06-18 2023-02-14 Cirrus Logic, Inc. Baseline estimation for sensor system
US11835410B2 (en) 2020-06-25 2023-12-05 Cirrus Logic Inc. Determination of resonant frequency and quality factor for a sensor system
US11868540B2 (en) 2020-06-25 2024-01-09 Cirrus Logic Inc. Determination of resonant frequency and quality factor for a sensor system
US11619519B2 (en) 2021-02-08 2023-04-04 Cirrus Logic, Inc. Predictive sensor tracking optimization in multi-sensor sensing applications
US11808669B2 (en) 2021-03-29 2023-11-07 Cirrus Logic Inc. Gain and mismatch calibration for a phase detector used in an inductive sensor
US11821761B2 (en) 2021-03-29 2023-11-21 Cirrus Logic Inc. Maximizing dynamic range in resonant sensing
US11979115B2 (en) 2021-11-30 2024-05-07 Cirrus Logic Inc. Modulator feedforward compensation
US11854738B2 (en) 2021-12-02 2023-12-26 Cirrus Logic Inc. Slew control for variable load pulse-width modulation driver and load sensing

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090278685A1 (en) * 2008-05-12 2009-11-12 General Electric Company Methods and systems for calibration of rfid sensors
WO2016032704A1 (en) * 2014-08-25 2016-03-03 3M Innovative Properties Company Capacitive-based touch apparatus and method with reduced interference
GB2573644A (en) * 2018-03-29 2019-11-13 Cirrus Logic Int Semiconductor Ltd Resonant phase sensing of resistive-inductive-capacitive sensors

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090278685A1 (en) * 2008-05-12 2009-11-12 General Electric Company Methods and systems for calibration of rfid sensors
WO2016032704A1 (en) * 2014-08-25 2016-03-03 3M Innovative Properties Company Capacitive-based touch apparatus and method with reduced interference
GB2573644A (en) * 2018-03-29 2019-11-13 Cirrus Logic Int Semiconductor Ltd Resonant phase sensing of resistive-inductive-capacitive sensors

Also Published As

Publication number Publication date
GB2582065A (en) 2020-09-09
GB202001341D0 (en) 2020-03-18

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