GB2573542A - System and apparatus for evaluating a PDC element - Google Patents
System and apparatus for evaluating a PDC element Download PDFInfo
- Publication number
- GB2573542A GB2573542A GB1807554.9A GB201807554A GB2573542A GB 2573542 A GB2573542 A GB 2573542A GB 201807554 A GB201807554 A GB 201807554A GB 2573542 A GB2573542 A GB 2573542A
- Authority
- GB
- United Kingdom
- Prior art keywords
- pdc
- pdc element
- radiation
- radiation pattern
- laser
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 238000000034 method Methods 0.000 claims abstract description 38
- 230000005855 radiation Effects 0.000 claims abstract description 27
- 238000010438 heat treatment Methods 0.000 claims abstract description 12
- 238000000862 absorption spectrum Methods 0.000 claims abstract description 3
- 238000011156 evaluation Methods 0.000 claims description 10
- 238000011835 investigation Methods 0.000 claims description 6
- 238000001914 filtration Methods 0.000 claims description 2
- 230000035876 healing Effects 0.000 claims 1
- 229910003460 diamond Inorganic materials 0.000 abstract description 23
- 239000010432 diamond Substances 0.000 abstract description 23
- 239000000758 substrate Substances 0.000 abstract description 6
- 229910052582 BN Inorganic materials 0.000 abstract description 3
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 abstract description 3
- GJNGXPDXRVXSEH-UHFFFAOYSA-N 4-chlorobenzonitrile Chemical compound ClC1=CC=C(C#N)C=C1 GJNGXPDXRVXSEH-UHFFFAOYSA-N 0.000 description 6
- 238000004458 analytical method Methods 0.000 description 6
- 238000005553 drilling Methods 0.000 description 4
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 2
- CWYNVVGOOAEACU-UHFFFAOYSA-N Fe2+ Chemical compound [Fe+2] CWYNVVGOOAEACU-UHFFFAOYSA-N 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000003801 milling Methods 0.000 description 2
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- 238000010009 beating Methods 0.000 description 1
- 239000011230 binding agent Substances 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- 230000003197 catalytic effect Effects 0.000 description 1
- 238000006555 catalytic reaction Methods 0.000 description 1
- -1 ceramets Substances 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000010191 image analysis Methods 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000005065 mining Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000003786 synthesis reaction Methods 0.000 description 1
- 238000001931 thermography Methods 0.000 description 1
- 238000003325 tomography Methods 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- UONOETXJSWQNOL-UHFFFAOYSA-N tungsten carbide Chemical compound [W+]#[C-] UONOETXJSWQNOL-UHFFFAOYSA-N 0.000 description 1
- 238000004876 x-ray fluorescence Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/18—Investigating or analyzing materials by the use of thermal means by investigating thermal conductivity
-
- E—FIXED CONSTRUCTIONS
- E21—EARTH OR ROCK DRILLING; MINING
- E21B—EARTH OR ROCK DRILLING; OBTAINING OIL, GAS, WATER, SOLUBLE OR MELTABLE MATERIALS OR A SLURRY OF MINERALS FROM WELLS
- E21B10/00—Drill bits
- E21B10/46—Drill bits characterised by wear resisting parts, e.g. diamond inserts
- E21B10/56—Button-type inserts
- E21B10/567—Button-type inserts with preformed cutting elements mounted on a distinct support, e.g. polycrystalline inserts
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/20—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/39—Crystals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J2005/0077—Imaging
Landscapes
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Geology (AREA)
- Mining & Mineral Resources (AREA)
- Mechanical Engineering (AREA)
- Environmental & Geological Engineering (AREA)
- Fluid Mechanics (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Geochemistry & Mineralogy (AREA)
- Food Science & Technology (AREA)
- Medicinal Chemistry (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Abstract
The thermal conductivity of a polycrystalline diamond compact (PDC) element 4 is measured to evaluate the diamond intergrowth and quality of the element 4. A portion of the element 4 is heated, for example by a laser 1, and the emitted infrared radiation 8 is measured as a radiation pattern indicative of the thermal conductivity. The PDC element may be formed of a cylindrical substrate 5 and a diamond table 6. A hot mirror or polarising wedge 9 may direct the emitted light 8 from the surface 7 of the PDC element 4 through a collimator or filter 10 before being measured by an IR camera 14. The radiation pattern may be evaluated by a computer 15 and areas of best expected performance of the PDC 4 may be marked. The heating means may be a laser 1 tuned to the optimum absorption spectrum of the PDC element 4. The method is also applied to polycrystalline cubic boron nitride compact (PCBN) elements.
Description
This invention relates to the evaluation of a polycrystalline diamond compact (PDC) and poiycrystailine cubic boron nitride compacts (PC8N). PDC and PCBN blanks or catting elements car: be used |rs single point cutting and milling and ether variants can be used in drilling applications.
IQ The invention is particularly concerned with a PDC element for use in oil and gas drilling, thermal drilling, mining drilling/boring tools and: the like, but can equality be applied to PDC and PCBN used in the cutting and milling of ferrous, non-ferrous· metals, ceramets, composites and other engineering materials.
PDC Or PCBN cutting elements or blanks are well known and typically comprise a cylindrical substrate to which a diamond or cubic boron nitride table is bonded at one end. The exception to this Is solid PCBN where: the PCBN layer is not supported by a substrate. The substrate may, for example, be of sintered tungsten carbide particles or any other suitable composition.
For simplification further references to PDC in this patent specification will include PCBN where cubic, boron nitnde is substituted for diamond. The evaluation of PDC elements is inherently complex due to the multifarious nature of the product. One parameter that serves as an indicator of the quality and performance of the PDC 25 element is the degree of homogeneity of the diamond/catalysi matrix as well as the degree of diamond intergrowth achieved following high pressure high temperature (HPH;) synthesis, in order to evaluate the degree of diamond intergrowth, several methods have been proposed previously. The most common method is scanning electron microscope (SEM) X-ray fluorescence or backscatter electron imaging 30 evaluation of a sample. Us-ng SE.M analysis, a polished PDC element can be evaluated and several automated image analysis systems and equations have been derived to attempt a quantitative measure of the diamond intergrowth. See, for example, US 7,616734. US 8,014.492 and US 20050139397. Alternative evaluation methods proposed involve electrical conductivity (US 9,239,307). .35 magnetic susceptibility (US 9,459.236), CT tomography (US 9.443.042), and X-ray (US 7,558,369) evaluation.
Ail of the known evaluation methods rely on the metallic content in the PDC element structure, or at least the contrast between elements. In addition anv of the 5 techniques used are limited due to being applied typically only to a small area of the
PCD surface and/or only to a small sample from a batch of PDC elements due to the: time and cost .associated with the techniques. The known methods, in most cases, are labour intensive, require significant sample preparation and cars be subject to operator variances or depend on the interpretation of the operator, 10 Leached PDC elements, where the catalytic material is leached from the Sintered polycrystall'ne diamond, significantly hinder traditional methods of evaluation.
The present invention is directed towards overcoming these problems
Summary of the Invention
According to the invention, there is provided a method for evaluating a PDC element comprising measuring the thermal conductivity of the PDC element.
In one embodiment of the invention the method includes heating a portion of the PDC element and measuring the thermal conductivity of the PDC element.
In another embodiment of the invention the method includes beating a central portion of the PDC element
In another embodiment of the invention the method includes collecting infrared radiation emanating from the PDC element during and/or after heating the PDC element and generating a radiation pattern corresponding to the thermal conductivity of the PDC element.
In another embodiment of the Invention the method Includes measuring the· radiation pattern by means of an infrared camera.
In another embodiment of ths invention the method includes Identification and marking 35 of a PDC element indicating areas of best expected performance based on the
-3radiation pattern.
In another embodiment of the invention the method includes collimating andfor filtering the collected infrared radiation prior to delivering the ooBimated infrared radiation to the 5 infrared camera.
In another embodiment of the invention the method includes heating the PDC element by means of a laser.
In another· embodiment of the invention the laser is tuned to the optimum absorption spectrum of the PDC element under investigation.
In another embodiment of the invention the thermal load Is: applied by means, of conduction to the PDC element under investigation.
In another embodiment of the invention the thermal load is applied by means of radiation other than a laser to the PDC element under investigation.
In another aspect the invention provides apparatus comprising a heater for heating a 20 portion of the PDC element and means fof collecting infrared radiation emitted from a surface or the PDC element and generating a radiation pattern corresponding to the collected IR cutting radiation.
In one embodiment of the Invention the heater comprises a laser.
In another embodiment of the invention the collecting means comprises a hot mirror or polarising wedge for directing infrared radiation emitted from th® surface of the PDC element to an infrared camera for generating the radiation pattern.
In another embodiment of the invention a collimator and/or filter is mounted between the hot mirror end the Infrared camera.
In another embodiment of the invention the infrared camera is connected- to a .computer having means for evaluation of the radlatfon pattern.
In another embodiment of the invention the laser -s operable to direct a light beam:at a centre of the PDC element.
The invention will be more ofeariy understood' by the following description of some embodiments thereof.: given by way of example only; with reference to. the accompanying drawing which is a schematic illustration of a system according to the TO invention for evaluating a PDC element.
Referring to the drawing., a laser 1 delivers a beam of light 2 through a fiter/pola riser 3 to the centre of a PDC element 4 which is to be tested. The PDC element comprises a cylindrical substrate 5 with ri diamond table 6 bonded to the substrate 5. The laser beam 2 is directed to the centre of a cutting face 7 of the diamond table 6t heating the centre of the cutting face 7. the beat then conducting radiaiiy outwardly across the cuffing face 7. infrared (iR) light 8 ©mined from a surface 7 of the PDC element 4, due to the heating thereof by the laser 1, is reflected and focussed by an infrared hot mirror/polarised wedge 9 through a ooliimatorffifter 10 to an infrared camera 14. The infrared hot mirror 9 may have an opening 11 to allow through-passage of the laser beam 2 from the laser 1 to the PDC element 4. The transmittance can also be due to the reflective path through a polarised wedge instead of a hot mirror 9. The infrared camera 14 is connected to a computer 15 with analysis software.
Advantageously, the invention provides a system and method for the evaluation of polycrystaihne diamond compact elements by simultaneous heating and thermal imaging. By utilising the thermal properties of diamond, the degree of intergrowth can 30 be evaluated if the diamond compact is viewed as a three dimensional thermal circuit.
The higher the degree of diamond intergrowth, the higher the thermal bridging and the lower the overall thermal resistance. By controlling the amount of thermal energy delivered to the PDC element 4 and simultaneously evaluating the thermal resistanoe/conduction, a qualitative measure can be- made of the degree of diamond 35 intergrowth in the PDC element 4.
Ths thermal properties of the PDC element 4 are typically strongly influenced by the polycrystalline diamond structure. In particular, the thermal conductivity of the diamond: the size, shape and quantity of the diamond grains; arid the extent atnd 5 nature of the diamond-to-diamond bonding strongly affect the overall thermal conductivity and other thermal properties of the PDC element. When the binder component is leached, the thermal properties of the PDC element are not significantly affected and therefore the analysis method proposed by the present invention is valid for both leached and un-leached PDC elements.
It will further be appreciated that the system of the invention has the capability to evaluate the complete surface of the PDC cutting element 4 or it can be adjusted to focus on a particular region; In addition, the analysis method is also sens! We to subsurface anomalies that will reduce the overall thermal conduction
The technique can also measure time responses and determine specific response variables characteristic of the PDC element. 8y analysing these characteristics of PDC elements, various standard analytical techniques can be used to determine a 20 fingerprint' for an individual PDC element, or for PDC elements of the same design etc. such that the technique can be used io determine changes in the quality and therefore performance of PDC elements using standard statistical date analysis: techniques. In its simplest form an image can be recorded that can act as a unique signature of the PDC element 4.
If the application of thermal energy is made using a laser 1 as described above, this can simultaneously apply a mark to the surface of the PDC element 4 to indicate that the PDC element 4 has been evaluated. With a feedback system, this mark can be as Simple as a dot nr as detailed as a serial number.
The system descnbed above in particular uses a laser 1 as the method of applying a very precise amount of thermal energy to the surface of the PDC element 4. This can be achieved by either a set number of puises or a set time for a continuous laser beam. The hot mirror or polarising wedge S jS usec§ fo focus th® reflected IR light to a receiving thermalcamera 14. The thermal camera 14 can take several images that
-Qcan be processed on a computer 15 to calculate the total thermal transfer of enemy from the centre of the PDC element 4 to the edge of the area of interest. By knowing the amount of energy supplied, the distance and time, the thermal conduction/resistance can be calculated. The thermal resistance is indirectly S proportional io the degree of diamond intergrowth. Advantageously, this allows rapid analysis of PDC elements· 4 with significant opportunity to automate inspection to enable 100% I aspection.
The terms 'comprise'' and include’, and any variations thereof reared for 10 grammatical reasons, are to fee considered as interchangeable and accorded the widest possible interpretation.
The invention is not limited ip the embodiments: heretobefere described which may:fee varied in both construction arid detail within the scope pf the appended claims.
Claims (15)
1. A method for evaluating a PDC element comprising measuring the thermal uor-ductivity of the PDC element
2i The method of claim 1, wherein the method includes heating a portion of the PDC element and measuring the thermal conductivity of the PDC element.
3. The method as claimed in claim 1 or claim 2, wherein the method includes 10 healing a oentrai portion of the PDC element
4. The method as claimed in any preceding claim, where-η the method includes collecting infrared radiation emanating from the PDC element during and/or after heating the PDC element and generating a radiation pattern corresponding to
15 the thermal conductivity of the PDC element.
5. The method as claimed in claim 4, wherein the method includes measuring the radiation pattern by means of an infrared camera.
20
6. The method as claimed in claim 5, wherein the method: includes identification arrd marking of a PDC element indicating areas of best expected performance based on the radiation pattern.
7. The method as claimed in claim 5, wherein the method includes collimating 25 and/or filtering the collected infrared radiation prior io delivering the collimated infrared radiation to the infrared camera,
S, The method aS claimed in any one of the preceding claims.: wherein the method includes heating the PDC element by means of a laser.
0. The method as claimed in claim 8 where the taser is tuned to trie optimum absorption spectrum of the PDC element: under investigation.
10. The method as claimed in any one of claims 1 to S Wherein ths thermal load is
35 applied by means of conduction to the PDC element under investigation.
11. The method as claimed in any one of claims 1 to 8 wherein the thermal load is: applied by means of radiation other than a laser to the PDC -element under investigation.
12. Apparatus for -evaluating a PDC element, the apparatus comprising a. heater for heating a portion of the PDC element, and means for collecting: infrared radiation emitted from: a surface- of the PDC etemeht and measuring the radiation pattern corresponding to the collected IR radiation.
13. The apparatus as claimed in claim 12. wherein the heater comprises a laser.
14. The apparatus as claimed in claim 12 or claim 13. wherein the collecting means comprises a hot m-rro· or polarising -wedge for directing infrared radiation
15 emitted from the surface of the PDC element to an infrared camera for generating the radiation pattern.
15. The apparatus as claimed in claim 14, wherein a collimator and/or filter is mounted between ths hot mirror and the infrared camera..
16. The apparatus as claimed: h claim 14 or claim 15, wherein the infrared camera is connected to a computer having means for evaluation of the radiation pattern.
17. The apparatus as claimed in any one of claim 13 to 16, whorefn the taser is
25 operable to direct a light beam at a centre of (he PDC element
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB1807554.9A GB2573542A (en) | 2018-05-09 | 2018-05-09 | System and apparatus for evaluating a PDC element |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB1807554.9A GB2573542A (en) | 2018-05-09 | 2018-05-09 | System and apparatus for evaluating a PDC element |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| GB201807554D0 GB201807554D0 (en) | 2018-06-20 |
| GB2573542A true GB2573542A (en) | 2019-11-13 |
Family
ID=62598334
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB1807554.9A Withdrawn GB2573542A (en) | 2018-05-09 | 2018-05-09 | System and apparatus for evaluating a PDC element |
Country Status (1)
| Country | Link |
|---|---|
| GB (1) | GB2573542A (en) |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5273790A (en) * | 1987-03-30 | 1993-12-28 | Crystallume | Method for consolidating diamond particles to form high thermal conductivity article |
| WO2010111578A1 (en) * | 2009-03-27 | 2010-09-30 | Varel International, Ind., L.P. | Backfilled polycrystalline diamond cutter with high thermal conductivity |
| EP2738139A1 (en) * | 2011-07-28 | 2014-06-04 | Sumitomo Electric Industries, Ltd. | Polycrystalline diamond and manufacturing method therefor |
| EP3061738A1 (en) * | 2013-10-22 | 2016-08-31 | Tungaloy Corporation | Cubic boron nitride sintered body, and coated cubic boron nitride sintered body |
| US20160340259A1 (en) * | 2014-02-04 | 2016-11-24 | Iljin Diamond Co., Ltd. | Polycrystalline diamond compact with improved thermal stability |
| EP3219694A1 (en) * | 2016-03-17 | 2017-09-20 | Iljin Diamond Co., Ltd. | Composite sintered body for cutting tool and cutting tool using the same |
| CN107389728A (en) * | 2017-07-28 | 2017-11-24 | 西安交通大学 | A kind of thermal conductivity of thin diamond films measurement apparatus and measuring method |
-
2018
- 2018-05-09 GB GB1807554.9A patent/GB2573542A/en not_active Withdrawn
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5273790A (en) * | 1987-03-30 | 1993-12-28 | Crystallume | Method for consolidating diamond particles to form high thermal conductivity article |
| WO2010111578A1 (en) * | 2009-03-27 | 2010-09-30 | Varel International, Ind., L.P. | Backfilled polycrystalline diamond cutter with high thermal conductivity |
| EP2738139A1 (en) * | 2011-07-28 | 2014-06-04 | Sumitomo Electric Industries, Ltd. | Polycrystalline diamond and manufacturing method therefor |
| EP3061738A1 (en) * | 2013-10-22 | 2016-08-31 | Tungaloy Corporation | Cubic boron nitride sintered body, and coated cubic boron nitride sintered body |
| US20160340259A1 (en) * | 2014-02-04 | 2016-11-24 | Iljin Diamond Co., Ltd. | Polycrystalline diamond compact with improved thermal stability |
| EP3219694A1 (en) * | 2016-03-17 | 2017-09-20 | Iljin Diamond Co., Ltd. | Composite sintered body for cutting tool and cutting tool using the same |
| CN107389728A (en) * | 2017-07-28 | 2017-11-24 | 西安交通大学 | A kind of thermal conductivity of thin diamond films measurement apparatus and measuring method |
Also Published As
| Publication number | Publication date |
|---|---|
| GB201807554D0 (en) | 2018-06-20 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| WAP | Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1) |