GB2508889B - Conductive atomic force microscope tips coated with graphene - Google Patents

Conductive atomic force microscope tips coated with graphene

Info

Publication number
GB2508889B
GB2508889B GB1222559.5A GB201222559A GB2508889B GB 2508889 B GB2508889 B GB 2508889B GB 201222559 A GB201222559 A GB 201222559A GB 2508889 B GB2508889 B GB 2508889B
Authority
GB
United Kingdom
Prior art keywords
graphene
atomic force
force microscope
microscope tips
conductive atomic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB1222559.5A
Other versions
GB2508889A (en
GB201222559D0 (en
Inventor
Huiling Duan
Marc Porti Pujal
Mario Lanza Martinez
Albin Bayerl
Montserrat Nafria Maqueda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Peking University
Universitat Autonoma de Barcelona UAB
Original Assignee
Peking University
Universitat Autonoma de Barcelona UAB
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Peking University, Universitat Autonoma de Barcelona UAB filed Critical Peking University
Priority to GB1222559.5A priority Critical patent/GB2508889B/en
Publication of GB201222559D0 publication Critical patent/GB201222559D0/en
Publication of GB2508889A publication Critical patent/GB2508889A/en
Application granted granted Critical
Publication of GB2508889B publication Critical patent/GB2508889B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
    • G01Q60/40—Conductive probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/16—Probe manufacture
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y40/00—Manufacture or treatment of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/08—Probe characteristics
    • G01Q70/14—Particular materials
GB1222559.5A 2012-12-14 2012-12-14 Conductive atomic force microscope tips coated with graphene Expired - Fee Related GB2508889B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB1222559.5A GB2508889B (en) 2012-12-14 2012-12-14 Conductive atomic force microscope tips coated with graphene

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB1222559.5A GB2508889B (en) 2012-12-14 2012-12-14 Conductive atomic force microscope tips coated with graphene

Publications (3)

Publication Number Publication Date
GB201222559D0 GB201222559D0 (en) 2013-01-30
GB2508889A GB2508889A (en) 2014-06-18
GB2508889B true GB2508889B (en) 2015-06-10

Family

ID=47630729

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1222559.5A Expired - Fee Related GB2508889B (en) 2012-12-14 2012-12-14 Conductive atomic force microscope tips coated with graphene

Country Status (1)

Country Link
GB (1) GB2508889B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108658037A (en) * 2018-04-27 2018-10-16 国家纳米科学中心 A kind of graphene functionalized nanometer pinpoint and preparation method thereof

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114217097B (en) * 2021-11-19 2024-03-05 国家纳米科学中心 Preparation method of graphene functionalized silicon-based probe
CN115616016A (en) * 2022-12-14 2023-01-17 矿冶科技集团有限公司 Electronic probe sample surface conductivity treatment method

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070154354A1 (en) * 2001-09-12 2007-07-05 Faris Sadeg M Probes and methods of making probes using folding techniques
US20090243637A1 (en) * 2008-03-31 2009-10-01 Hitachi High-Technologies Corporation Measuring apparatus having nanotube probe
US20110048625A1 (en) * 2009-08-27 2011-03-03 Caldwell Joshua D METHOD FOR THE REDUCTION OF GRAPHENE FILM THICKNESS AND THE REMOVAL AND TRANSFER OF EPITAXIAL GRAPHENE FILMS FROM SiC SUBSTRATES
JP2012218967A (en) * 2011-04-07 2012-11-12 Panasonic Corp Method for forming graphene film

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070154354A1 (en) * 2001-09-12 2007-07-05 Faris Sadeg M Probes and methods of making probes using folding techniques
US20090243637A1 (en) * 2008-03-31 2009-10-01 Hitachi High-Technologies Corporation Measuring apparatus having nanotube probe
US20110048625A1 (en) * 2009-08-27 2011-03-03 Caldwell Joshua D METHOD FOR THE REDUCTION OF GRAPHENE FILM THICKNESS AND THE REMOVAL AND TRANSFER OF EPITAXIAL GRAPHENE FILMS FROM SiC SUBSTRATES
JP2012218967A (en) * 2011-04-07 2012-11-12 Panasonic Corp Method for forming graphene film

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108658037A (en) * 2018-04-27 2018-10-16 国家纳米科学中心 A kind of graphene functionalized nanometer pinpoint and preparation method thereof

Also Published As

Publication number Publication date
GB2508889A (en) 2014-06-18
GB201222559D0 (en) 2013-01-30

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20161214