GB2489262B - Testing apparatus - Google Patents
Testing apparatusInfo
- Publication number
- GB2489262B GB2489262B GB1104863.4A GB201104863A GB2489262B GB 2489262 B GB2489262 B GB 2489262B GB 201104863 A GB201104863 A GB 201104863A GB 2489262 B GB2489262 B GB 2489262B
- Authority
- GB
- United Kingdom
- Prior art keywords
- testing apparatus
- testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
- G01R31/42—AC power supplies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/263—Circuits therefor for testing thyristors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/08—Locating faults in cables, transmission lines, or networks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
- G01R31/3271—Testing of circuit interrupters, switches or circuit-breakers of high voltage or medium voltage devices
- G01R31/3272—Apparatus, systems or circuits therefor
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB1104863.4A GB2489262B (en) | 2011-03-23 | 2011-03-23 | Testing apparatus |
KR1020120029650A KR101899031B1 (en) | 2011-03-23 | 2012-03-23 | Testing apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB1104863.4A GB2489262B (en) | 2011-03-23 | 2011-03-23 | Testing apparatus |
Publications (3)
Publication Number | Publication Date |
---|---|
GB201104863D0 GB201104863D0 (en) | 2011-05-04 |
GB2489262A GB2489262A (en) | 2012-09-26 |
GB2489262B true GB2489262B (en) | 2016-07-06 |
Family
ID=44013012
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB1104863.4A Expired - Fee Related GB2489262B (en) | 2011-03-23 | 2011-03-23 | Testing apparatus |
Country Status (2)
Country | Link |
---|---|
KR (1) | KR101899031B1 (en) |
GB (1) | GB2489262B (en) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103197167A (en) * | 2013-02-20 | 2013-07-10 | 国网智能电网研究院 | Parameter design method for load electric reactor of maximum metal condition (MMC) valve steady-state operation testing device |
CN104422836A (en) * | 2013-09-09 | 2015-03-18 | 南京南瑞继保电气有限公司 | Overcurrent cut-off test circuit as well as control method thereof |
KR101442990B1 (en) * | 2013-10-16 | 2014-11-04 | 엘에스산전 주식회사 | Snthetic test circuit for hvdc thyristor valves |
CN104914340B (en) * | 2015-06-11 | 2016-11-09 | 中国西电电气股份有限公司 | Flexible direct current transmission converter valve wholly-controled device overcurrent turn-off function pilot system and method |
CN104977485B (en) * | 2015-06-11 | 2017-03-01 | 中国西电电气股份有限公司 | A kind of assay device of the soft straight power model short circuit current of MMC HVDC and method |
FR3064829B1 (en) * | 2017-04-03 | 2019-04-05 | Valeo Siemens Eautomotive France Sas | METHOD OF PROTECTING AGAINST AN OVERPOWER CURRENT IN A RESONANT CIRCUIT |
CN112710940B (en) * | 2020-12-23 | 2022-05-20 | 西安交通大学 | SiC MOSFET reverse transfer capacitance measuring method |
CN114167272B (en) * | 2021-12-03 | 2024-04-12 | 广东电网有限责任公司 | Flexible direct current converter valve steady-state operation test device and method |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6181152B1 (en) * | 1997-11-18 | 2001-01-30 | Stmicroelectronics S.A. | Method and system for testing an integrated circuit input capacitance, particularly for a contactless operating integrated circuit |
WO2002067003A1 (en) * | 2001-02-21 | 2002-08-29 | Abb Ab | Test circuit for hvdc thyristor valves |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4301550B2 (en) | 2003-07-08 | 2009-07-22 | 東芝三菱電機産業システム株式会社 | Test circuit for semiconductor power converter |
CN100568004C (en) | 2007-09-21 | 2009-12-09 | 中国电力科学研究院 | Thyristor switched capacitor high voltage valve test device and method |
-
2011
- 2011-03-23 GB GB1104863.4A patent/GB2489262B/en not_active Expired - Fee Related
-
2012
- 2012-03-23 KR KR1020120029650A patent/KR101899031B1/en active IP Right Grant
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6181152B1 (en) * | 1997-11-18 | 2001-01-30 | Stmicroelectronics S.A. | Method and system for testing an integrated circuit input capacitance, particularly for a contactless operating integrated circuit |
WO2002067003A1 (en) * | 2001-02-21 | 2002-08-29 | Abb Ab | Test circuit for hvdc thyristor valves |
Also Published As
Publication number | Publication date |
---|---|
KR20120109379A (en) | 2012-10-08 |
GB2489262A (en) | 2012-09-26 |
KR101899031B1 (en) | 2018-09-14 |
GB201104863D0 (en) | 2011-05-04 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
COOA | Change in applicant's name or ownership of the application |
Owner name: ALSTOM TECHNOLOGY LTD Free format text: FORMER OWNER: ALSTOM GRID UK LIMITED |
|
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 20180323 |