GB2456583B - Eddy current inspection system and method of eddy current flaw detection - Google Patents

Eddy current inspection system and method of eddy current flaw detection

Info

Publication number
GB2456583B
GB2456583B GB0801102A GB0801102A GB2456583B GB 2456583 B GB2456583 B GB 2456583B GB 0801102 A GB0801102 A GB 0801102A GB 0801102 A GB0801102 A GB 0801102A GB 2456583 B GB2456583 B GB 2456583B
Authority
GB
United Kingdom
Prior art keywords
eddy current
inspection system
flaw detection
current flaw
current inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB0801102A
Other versions
GB2456583A (en
GB0801102D0 (en
Inventor
John Peter Hansen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
GE Inspection Technologies Ltd
Original Assignee
GE Inspection Technologies Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by GE Inspection Technologies Ltd filed Critical GE Inspection Technologies Ltd
Priority to GB0801102A priority Critical patent/GB2456583B/en
Publication of GB0801102D0 publication Critical patent/GB0801102D0/en
Priority to PCT/GB2009/050048 priority patent/WO2009093070A1/en
Publication of GB2456583A publication Critical patent/GB2456583A/en
Application granted granted Critical
Publication of GB2456583B publication Critical patent/GB2456583B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/04—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9013—Arrangements for scanning
    • G01N27/902—Arrangements for scanning by moving the sensors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Electrochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
GB0801102A 2008-01-21 2008-01-21 Eddy current inspection system and method of eddy current flaw detection Expired - Fee Related GB2456583B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
GB0801102A GB2456583B (en) 2008-01-21 2008-01-21 Eddy current inspection system and method of eddy current flaw detection
PCT/GB2009/050048 WO2009093070A1 (en) 2008-01-21 2009-01-21 Eddy current inspection system and method of eddy current flaw detection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB0801102A GB2456583B (en) 2008-01-21 2008-01-21 Eddy current inspection system and method of eddy current flaw detection

Publications (3)

Publication Number Publication Date
GB0801102D0 GB0801102D0 (en) 2008-02-27
GB2456583A GB2456583A (en) 2009-07-22
GB2456583B true GB2456583B (en) 2012-09-05

Family

ID=39166128

Family Applications (1)

Application Number Title Priority Date Filing Date
GB0801102A Expired - Fee Related GB2456583B (en) 2008-01-21 2008-01-21 Eddy current inspection system and method of eddy current flaw detection

Country Status (2)

Country Link
GB (1) GB2456583B (en)
WO (1) WO2009093070A1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8212553B2 (en) 2009-12-21 2012-07-03 Westinghouse Electric Company Llc Inspection mode switching circuit
US8519702B2 (en) * 2010-07-30 2013-08-27 Olympus Ndt Inc. Orthogonal eddy current probe for multi-directional inspection
EP2843400A1 (en) 2013-09-03 2015-03-04 Siemens Aktiengesellschaft Sensor assembly and method for determining mechanical surface tensions and/or microstructure

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1198288A (en) * 1967-04-10 1970-07-08 Magnaflux Corp Improvements in or relating to Eddy Current Crack Detector System
WO1984004596A1 (en) * 1983-05-16 1984-11-22 Toernbloms Kvalitetskontroll Method and apparatus for testing using a plurality of frequencies
EP0282930A2 (en) * 1987-03-17 1988-09-21 Törnbloms Kvalitetskontroll Ab Method and device for phase-selective testing and/or measuring of test objects with eddy current techniques.
US4799010A (en) * 1984-09-20 1989-01-17 Institut De Recherches De La Siderurgie Francaise Process for detecting defects on a surface by eddy currents and device for carrying out said process
GB2292222A (en) * 1994-08-11 1996-02-14 Kaisei Engineer Co Ltd Electromagnetic induction type inspection device
US6018242A (en) * 1996-09-13 2000-01-25 Intercontrole Eddy current probe having four active elements arranged in a quadrilateral
US6636037B1 (en) * 2000-03-31 2003-10-21 Innovative Materials Testing Technologies Super sensitive eddy-current electromagnetic probe system and method for inspecting anomalies in conducting plates
US20040075429A1 (en) * 2002-01-17 2004-04-22 Marktec Corporation Eddy current testing probe

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4303885A (en) * 1979-06-18 1981-12-01 Electric Power Research Institute, Inc. Digitally controlled multifrequency eddy current test apparatus and method
US4480225A (en) * 1982-02-11 1984-10-30 The United States Of America As Represented By The United States Department Of Energy Improved multi-directional eddy current inspection test apparatus for detecting flaws in metal articles
GB2233763B (en) * 1989-07-07 1994-06-15 Univ Essex Non-destructive testing of metals
US5237271A (en) * 1991-05-06 1993-08-17 General Electric Company Apparatus and method for non-destructive testing using multi-frequency eddy currents
GB2389909A (en) * 2002-06-22 2003-12-24 Hocking Ndt Ltd Inductively coupled eddy current probe
US20040257072A1 (en) * 2003-06-19 2004-12-23 Rock Samson Dual-sensitivity eddy current test probe
US7256577B2 (en) * 2005-04-07 2007-08-14 The Boeing Company High frequency rotary eddy current probe device

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1198288A (en) * 1967-04-10 1970-07-08 Magnaflux Corp Improvements in or relating to Eddy Current Crack Detector System
WO1984004596A1 (en) * 1983-05-16 1984-11-22 Toernbloms Kvalitetskontroll Method and apparatus for testing using a plurality of frequencies
US4799010A (en) * 1984-09-20 1989-01-17 Institut De Recherches De La Siderurgie Francaise Process for detecting defects on a surface by eddy currents and device for carrying out said process
EP0282930A2 (en) * 1987-03-17 1988-09-21 Törnbloms Kvalitetskontroll Ab Method and device for phase-selective testing and/or measuring of test objects with eddy current techniques.
GB2292222A (en) * 1994-08-11 1996-02-14 Kaisei Engineer Co Ltd Electromagnetic induction type inspection device
US6018242A (en) * 1996-09-13 2000-01-25 Intercontrole Eddy current probe having four active elements arranged in a quadrilateral
US6636037B1 (en) * 2000-03-31 2003-10-21 Innovative Materials Testing Technologies Super sensitive eddy-current electromagnetic probe system and method for inspecting anomalies in conducting plates
US20040075429A1 (en) * 2002-01-17 2004-04-22 Marktec Corporation Eddy current testing probe

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
SHU et al: "Study of pulse eddy current probes detecting cracks extending in all directions", Sensors and Actuators A, 2007, Vol 141, No 1, pp13-19 *

Also Published As

Publication number Publication date
WO2009093070A1 (en) 2009-07-30
GB2456583A (en) 2009-07-22
GB0801102D0 (en) 2008-02-27

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20150121