GB2407578A - Conductive polymer compositions - Google Patents

Conductive polymer compositions Download PDF

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Publication number
GB2407578A
GB2407578A GB0425236A GB0425236A GB2407578A GB 2407578 A GB2407578 A GB 2407578A GB 0425236 A GB0425236 A GB 0425236A GB 0425236 A GB0425236 A GB 0425236A GB 2407578 A GB2407578 A GB 2407578A
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United Kingdom
Prior art keywords
weight percent
amount
present
composition according
curing agent
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Granted
Application number
GB0425236A
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GB0425236D0 (en
GB2407578B (en
Inventor
Chih-Min Cheng
Gerald Fredrickson
Girish Hanchinamani
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National Starch and Chemical Investment Holding Corp
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National Starch and Chemical Investment Holding Corp
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Priority claimed from US09/841,980 external-priority patent/US6583201B2/en
Application filed by National Starch and Chemical Investment Holding Corp filed Critical National Starch and Chemical Investment Holding Corp
Publication of GB0425236D0 publication Critical patent/GB0425236D0/en
Publication of GB2407578A publication Critical patent/GB2407578A/en
Application granted granted Critical
Publication of GB2407578B publication Critical patent/GB2407578B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01BCABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
    • H01B1/00Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
    • H01B1/20Conductive material dispersed in non-conductive organic material
    • H01B1/22Conductive material dispersed in non-conductive organic material the conductive material comprising metals or alloys
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/498Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
    • H01L23/49866Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers characterised by the materials
    • H01L23/49883Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers characterised by the materials the conductive materials containing organic materials or pastes, e.g. for thick films
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/321Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by conductive adhesives
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/12Using specific substances
    • H05K2203/122Organic non-polymeric compounds, e.g. oil, wax, thiol
    • H05K2203/124Heterocyclic organic compounds, e.g. azole, furan

Abstract

A composition comprises a polymeric resin, a conductive filler, a corrosion inhibitor selected from N-hydroxysuccinimide and/or piperidine, a curing agent or catalyst, an adhesion promoter, and 8-hydroxyquinoline. The resin may be a vinyl, acrylic, phenolic, epoxy, maleimide, polyimide, or silicon-containing resin but bisphenol A and bisphenol F epoxy resins are preferred. The conductive filler is typically silver. Meanwhile, the adhesion promoter may be a silane or polyvinyl butyrol and the curing agent/catalyst may be liquid imidazole or a solid tertiary amine. The composition may further contain a reactive or non-reactive diluent. The composition may be suitable for use as a conductive adhesive in microelectronic devices or semiconductor packages to provide electrically stable interconnections.

Description

1 2407578 Title: Conductive Materials with Electrical Stability for Use in
Electronics Devices
Field of the Invention
This invention relates to compositions that are suitable for use as conductive materials in microelectronic devices or semiconductor packages to provide electrically stable interconnections.
Background of the Invention
Conductive compositions are used for a variety of purposes in the fabrication and assembly of semiconductor packages and microelectronic devices. For example, conductive adhesives are used to bond integrated circuit chips to substrates (die attach adhesives) or circuit assemblies to printed wire boards (surface mount conductive adhesives).
Two conductors with dissimilar electrochemical potentials will form an electrochemical cell in the presence of water. The conductors act as cathode and anode, and environmental humidity provides the necessary aqueous medium to bridge the anode and cathode. The metal with the lower electrochemical potential acts as the anode resulting in the loss of electrons {M - ne Mn+} and the corrosion of the metal. The metal with the higher electrochemical potential acts as the cathode {2H2O + O2 + 4e 40H-} . Oxygen is involved in this mechanism but does not directly react with the anode metal. The metal is ion Mn+ will combine with OH- and form a metal hydroxide that stabilises by developing into a metal oxide, which over time forms on the anode surface. Metal oxides in general are nonconductive, the result being a decrease in conductivity of the metal circuitry.
The problem is less acute when the filler in the composition is the same metal as the contiguous circuitry or the substrate. Thus, a semiconductor package using a conductive composition, one comprising an epoxy resin and silver filler, for example, will not be as susceptible to electrochemical failure when a silver-filled composition is used on a silver substrate. However, if the composition is used on a nickel plated substrate, electrochemical corrosion will result under high humidity conditions.
These compositions, however, are vulnerable to environmental conditions, and high temperature and high humidity can cause the electrical resistance of the assembly fabricated with these compositions to increase substantially over time. The suspected mode of failure is electrochemical corrosion of the circuitry at the interface of the conductive filler in the composition with another contiguous metal surface, for example, a metal lead frame or other circuitry.
It would be an advantage, therefore, to provide conductive materials that form electrically stable assemblies for use in semiconductor packaging operations. It would also be advantageous to provide a conductive adhesive which would combine a corrosion inhibitor in a manner that would provide improved contact resistance when exposed to harsh environmental conditions.
Summary of the Invention
This invention is a composition that comprises a polymeric resin, a conductive filler, one or more corrosion inhibitors, a curing agent/catalyst, an adhesion promoter and optionally other additives such as reactive or nonreactive diluents. The compositions exhibit improved electrical stability over those compositions that do not contain a corrosion inhibitor.
The invention provides a composition for use in microelectronic devices comprising: (a) a polymeric resin, (b) a conductive filler, (c) a corrosion inhibitor selected from the group consisting of NHydroxysuccinimide, piperidine and mixtures thereof, (d) a curing agent or catalyst, (e) an adhesion promoter, (f) 8-hydroxyquinoline and (g) optionally a reactive or non-reactive diluent.
Suitably the corrosion inhibitors will be present in an amount of no more than 10 weight percent (but not 0%); the resin will be present in an amount of 10 to 90 weight percent; the filler in an amount of 1 to 90 weight percent, suitably 10 to 90 weight percent; the curing agent will be present in a ratio of curing agent to resin in amount of no more than 1:1; the adhesion promoters in an amount of no more than 10 weight percent, for a total 100 weight percent.
In a further embodiment, the composition includes N-Hydroxysuccinimide in combination with one or more corrosion inhibitors.
Detailed Description of the Invention
Chemical compositions that may be used in the fabrication of semiconductor packages can be given improved electrical stability by the addition of an oxygen scavenger or corrosion inhibitor or both to the formulation. Although oxygen scavengers and corrosion inhibitors have been used in aqueous medium to inhibit corrosion, it was unexpected that these materials could be added to compositions for use in the electronics industry without any loss in initial conductivity or adhesion properties of these compositions.
A conductive composition achieves its conductivity through metal particles dispersed throughout the composition. When these metal particles are in contact with another contiguous metal, as is required to form the circuitry for the ultimate electronic device, and water is present, an electrochemical cell is formed. The reaction at the cathode utilises oxygen, and the reaction at the anode eventually produces a metal oxide.
To counteract the formation of metal oxide, corrosion inhibitors are commonly utilised. A corrosion inhibitor is defined herein to be any chemical compound that has a lone pair of electrons, such as nitrogen-, sulfur-, and oxygen-containing compounds, that will bind with metal and impede the reactivity of the metal at the electrochemical anode.
Exemplary resins for use in these formulations are any of the resins currently used throughout the industry, such as, vinyl, acrylic, phenolic, epoxy such as Bisphenol A, Bisphenol F. maleimide, polyimide, or siliconcontaining resins. The formulations and physical properties are known to those skilled in the art.
Exemplary curing agents or catalysts are liquid imidazole and solid tertiary amines.
Exemplary reactive diluents are glycidyl ethers, for example, 1,4butanediol diglycidyl ether; vinyl ethers, for example, ethylene vinyl ether, and vinyl esters, for example, ethylene vinyl ester, and acrylates, for example, methyl methacrylate.
An exemplary nonreactive diluent is butyl carbitol.
Exemplary adhesion promoters are silanes and polyvinyl butyrol.
Chemical compositions are used in the fabrication of electronic packages, for example, as adhesives, encapsulants, or to form integral passives, such as resistors or capacitors. By the judicious choice of filler, these compositions can be formulated to give a broad range of resistivity, conductivity, capacitance, or dielectric properties as needed for the specific circuit component. Providing the precise type and amount of filler for obtaining the electrical properties desired for a specific end use application is within the expertise of one skilled in the art. It will be understood that all resistors necessarily exhibit some conductance, and all conductors exhibit some resistance, and that resistors and conductors form a continuum of resistance and conductance depending on the specific property of the individual material. This continuum is also the case for dielectrics and capacitors.
Exemplary conductive fillers are silver, copper, gold, palladium, platinum, carbon black, carbon fiber, graphite, aluminum, indium tin oxide, silver coated copper, silver coated aluminum, metallic coated glass spheres, silver coated fiber, silver coated spheres and antimony doped tin oxide.
In another embodiment, this invention is a method of enhancing the electrical stability of a conductive composition comprising adding to the composition a corrosion inhibitor.
Applicants have discovered that an adhesive comprising 8-hydroxyquinoline, as a corrosion inhibitor compound to chelate or react with the metal anode or cathode, will reduce or prevent the electrochemical process and prevent significant increases in resistivity.
The adhesive composition of this embodiment of the invention contains up to 10 weight percent (but not 0%) of 8-hydroxyquinoline; a further corrosion inhibitor in an amount of up to 10 weight percent (but not 0%); about 10 to 90 weight percent of a resin; 10 to 90 weight percent of a conductive filler; about O to 10 weight percent of adhesion promoters (but not 0%); curing agent in a ratio of curing agent to resin of up to about 1:1 (but not 0); and optionally O to 50 weight percent of a diluent for a total of 100 weight percent.
Preferably, the 8-hydroxyquinoline and/or the corrosion inhibitor is/are present in the range of 0.9 to 2 weight percent, the resin is present in the range of 18 to 22 weight percent, the curing agent is present in the range of about 3 to 4 weight percent, the conductive filler is present in the range of 70 to 80 weight percent, for example 75% by weight, and the adhesion promoter is present in an amount of up to 1 weight percent (but not 0%). Suitably N-Hydroxysuccinimide is present at about 0.5% by weight. Suitably piperidine, if present, is in an amount less than 2 weight percent. In a further preferred embodiment, up to 2 weight percent 8hydroxyquinoline is utilized as the corrosion inhibitor in combination with less than 1 weight percent of N-Hydroxysuccinimide. In a still further preferred embodiment, up to 1 weight percent 8-hydroxyquinoline is utilized as the corrosion inhibitor in combination with up to 1 weight percent of piperidine and up to 1 weight percent of N-Hydroxysuccinimide.
The invention can be further described by the following Example 2. (Example 1 and Formulae A, E, F. D and I of Example 2 are for comparision purposes).
EXAMPLES
Example 1
Nine compositions were prepared using between 18 to 22 weight percent epoxy resin, 3 to 4 weight percent solid and liquid curing agents, about 75% silver, about 0.9 to 2 weight percent corrosion inhibitor and less than 1 weight percent of an adhesion promoter. The compositions were prepared by mixing the resin, solid curing agent and corrosion inhibitor or mixture of corrosion inhibitors (except for composition A) with a three roll mill. Next, the liquid curing agent or catalyst and the adhesion promoter were added to the mixture in a double pranatory mixer. Once the composition reached a homogeneous state the conductive filler was added. Finally, the entire composition was mixed and de-aired. The resulting composition is a pasty material that may be either syringe dispensed or screen printed.
The compositions were measured for the effects of temperature and humidity on resistivity when contacted with a contiguous metal, denominated contact resistivity. The contact resistivity test vehicle consisted of a FR-4 board substrate on which was printed a pattern of an open circuit with metal segments 3 mm long separated by 1 mm gaps in a horseshoe shape. Horseshoe circuits are breached with ten zero ohm resistors. The number of connections between the composition and the metal segments is ten. The compositions were cured for 10 minutes at 150 C.
By using multiple metal-adhesive connections in the contact resistance device, the conductivity change can be magnified and the experimental error minimised. Contact resistance was measured across the circuit using a Keithley 580 Microohm meter and was deemed to be the combination of the resistance as determined by resistivity plus interracial resistance between the end of each metal segment and the test composition.
Contact resistance values were determined directly after cooling to room temperature after curing, and monitored over the course up to 1800 hours while being subjected to 85 C and % relative humidity. The samples were returned to room temperature and measurements were recorded at that time.
The percent increase in contact resistivity for compositions A, B. C and D are reported in Table 1 and show a significant improvement in the electrical stability of the compositions in the presence of 2hydroxyquinoline (2HQL), 6-hydroxyquinoline (6HQL) or piperidine (PPD) as a corrosion inhibitor. ("Keithley" as used above is a Registered Trade Mark).
Table 1: Contact resistance stability of conductive adhesives with 6HQL, 2HQL and piperidine inhibitors Formula Inhibitor % 6HQL 2HQL PPD Resistvty change in 85C/85%RH Time, hrs 0 90 420 852 A 0 0 0 Ohm 11 13.6 32.8 331.4 % Change 0 24 198 2913 Time, hrs 0 120 576 912 1080 B 0.91 0 0 Ohm 23. 6 22.6 24.4 23.3 23.7 _ % Change 0 4 3 -1 04 Time, hrs 0 120 576 912 1080 C 0 0.91 0 Ohm 11. 8 12.5 14.5 16.3 17.3 % Change 0 6 23 38 47 Time, hrs 0 120 457 624 D 0 0 1.8 Ohm 14.1 14. 7 20 23.4 % Change 0 4 42 66
Example 2
This example demonstrates the effect of one or more corrosion inhibitors in combination with 8-hydroxyquinoline. The samples were prepared in the same manner as those of Example 1 and were subjected to 85 C and 85% relative humidity for a period up to 1900 hours. The results, shown in Table 2, indicate that compositions containing 8- hydroxyquinoline or a mixture of 8-hydroxyquinoline (8HQL) and piperidine as a corrosion inhibitor, and N-Hydroxysuccinimide (NHSI) provided superior electrical stability.
Table 2: Contact resistance stability of conductive adhesives with 8hydroxyquinoline and various corrosion inhibitors Corrosion inhibitors % Resistivity change in 85C/85%RH Formula 8HQL 6HQL NHSI PPS Time, hrs 0 90 420 852 A 0 0 0 0 Ohm 11 13.6 32.8 331.4 % Change 0 24 198 2913 Time, hrs 0 100 500 1000 E 1.8 0 0 0 Ohm 15. 6 17 16.4 24.3 % Change 0 9 5 56 Time, hrs 0 168 1872 F 0 0 1.8 0 Ohm 13.6 21.7 143.7 % Change 0 60 957 Time, hrs 0 120 456 624 D 0 0 0 1.8 Ohm 14.1 14.7 20 23. 4 % Change 0 4 42 66 Time, hrs 0 120 460 624 G 1 6 0 0.4 0 Ohm 8.9 9.4 9. 9 10.1 % Change 0 6 11 13
_
Time, hrs 0 168 1872 H 0.8 0 0.4 0.6 Ohm 10.5 11.5 16.2 _ % Change 0 10 54 Time, hrs 0 168 1872 I 0 0.8 0.4 0.6 Ohm 20.2 23.2 51. 6 % Change 0 15 155

Claims (13)

  1. Claims 1. A composition for use in microelectronic devices comprising (a)
    a polymeric resin, (b) a conductive filler, (c) corrosion inhibitor selected from the group consisting of N- hydroxysuccinimide, piperidine and mixtures thereof, (d) a curing agent or catalyst, (e) an adhesion promoter, (f) 8-hydroxyquinoline, and (g) optionally, a reactive or a nonreactive diluent.
  2. 2. The composition according to claim 1, wherein (a) the polymeric resin is present in an amount of 10 to about 90 weight percent, (b) the conductive filler is present in an amount of 10 to 90 weight percent, (c) the corrosion inhibitor is present in an amount up to 10 weight percent (but not 0%), (d) the curing agent or catalyst is present in an amount of a ratio of curing agent to resin of no greater than 1:1 (but not 0%), (e) the adhesion promoters are present in an amount of about O to 10 weight percent (but not 0%), (I) the 8-hydroxyquinoline is present in an amount of about O to about 10 weight percent (but not 0%), (g) the diluent is present in an amount of O to 50 weight percent, for a total of 100 weight percent.
  3. 3. The composition according to claim 2, wherein the resin is present in an amount of from about 18 to about 22 weight percent.
  4. 4. The composition according to claim 2 or 3, wherein the curing agent or catalyst is present in an amount of from about 3 to about 4 weight percent.
  5. 5. The composition according to claim 2, 3 or 4, wherein the adhesion promoter is present in an amount of less than 1 weight percent.
  6. 6. The composition according to any one of claims 2 to 5, wherein the corrosion inhibitor is present in an amount of from about 0.9 to about 2 weight percent.
  7. 7. The composition according to any one of claims 2 to 6, wherein the conductive filler is present in an amount of about 75 weight percent.
  8. 8. The composition according to any one of claims 2 to 7, wherein NHydroxysuccinimide is present in an amount of about 0.5 weight percent.
  9. 9. The composition according to any one of claims 2 to 8, wherein piperidine is present in an amount of less than 2 weight percent.
  10. 10. The composition according to any one of the preceding claims, wherein the conductive fillers are selected from the group consisting of silver, copper, gold, palladium, platinum, carbon black, carbon fibre, graphite, aluminium, indium tin oxide, silver coated copper, silver coated aluminium, metallic coated glass spheres, silver coated fibres, silver coated spheres, antimony doped tin oxide and mixtures thereof.
  11. 11. The composition according to claim 10, wherein the conductive filler is silver.
  12. 12. The composition according to any one of the preceding claims, wherein the resins are selected from the group consisting of Bisphenol A epoxy, Bisphenol F epoxy, vinyl-, acrylic-, phenol-, epoxy-, maleimide-, polyimide-, and silicon-containing resins.
  13. 13. The composition according to claim 12, wherein the resins are selected from the group of Bisphenol A and Bisphenol F epoxy resins.
GB0425236A 2001-04-25 2002-03-22 Conductive materials with electrical stability for use in electronics devices Expired - Fee Related GB2407578B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/841,980 US6583201B2 (en) 2001-04-25 2001-04-25 Conductive materials with electrical stability for use in electronics devices
GB0329810A GB2393442B (en) 2001-04-25 2002-03-22 Conductive materials with electrical stability for use in electronics devices

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GB0425236D0 GB0425236D0 (en) 2004-12-15
GB2407578A true GB2407578A (en) 2005-05-04
GB2407578B GB2407578B (en) 2005-06-15

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10240074B2 (en) * 2014-12-19 2019-03-26 Shengyi Technology Co., Ltd. Degradable and recyclable epoxy conductive adhesive as well as preparing, degrading and recycling methods therefor

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1032038A2 (en) * 1999-02-12 2000-08-30 National Starch and Chemical Investment Holding Corporation Conductive and resitive material with electrical stability for use in electronics devices
EP1231248A1 (en) * 2001-02-13 2002-08-14 National Starch and Chemical Investment Holding Corporation Conductive and resistive materials with electrical stability for use in electronics devices

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1032038A2 (en) * 1999-02-12 2000-08-30 National Starch and Chemical Investment Holding Corporation Conductive and resitive material with electrical stability for use in electronics devices
EP1231248A1 (en) * 2001-02-13 2002-08-14 National Starch and Chemical Investment Holding Corporation Conductive and resistive materials with electrical stability for use in electronics devices

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10240074B2 (en) * 2014-12-19 2019-03-26 Shengyi Technology Co., Ltd. Degradable and recyclable epoxy conductive adhesive as well as preparing, degrading and recycling methods therefor

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Publication number Publication date
GB0425236D0 (en) 2004-12-15
GB2407578B (en) 2005-06-15

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Effective date: 20090322