GB2405945B - Printed circuit board assembly test apparatus - Google Patents

Printed circuit board assembly test apparatus

Info

Publication number
GB2405945B
GB2405945B GB0321268A GB0321268A GB2405945B GB 2405945 B GB2405945 B GB 2405945B GB 0321268 A GB0321268 A GB 0321268A GB 0321268 A GB0321268 A GB 0321268A GB 2405945 B GB2405945 B GB 2405945B
Authority
GB
United Kingdom
Prior art keywords
circuit board
printed circuit
test apparatus
board assembly
assembly test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB0321268A
Other versions
GB2405945A (en
GB0321268D0 (en
Inventor
John Edward Nigel Kirby
Alan Hutchison
John Laird
William Swanston
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Priority to GB0321268A priority Critical patent/GB2405945B/en
Publication of GB0321268D0 publication Critical patent/GB0321268D0/en
Publication of GB2405945A publication Critical patent/GB2405945A/en
Application granted granted Critical
Publication of GB2405945B publication Critical patent/GB2405945B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2815—Functional tests, e.g. boundary scans, using the normal I/O contacts

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
GB0321268A 2003-09-11 2003-09-11 Printed circuit board assembly test apparatus Expired - Fee Related GB2405945B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB0321268A GB2405945B (en) 2003-09-11 2003-09-11 Printed circuit board assembly test apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB0321268A GB2405945B (en) 2003-09-11 2003-09-11 Printed circuit board assembly test apparatus

Publications (3)

Publication Number Publication Date
GB0321268D0 GB0321268D0 (en) 2003-10-08
GB2405945A GB2405945A (en) 2005-03-16
GB2405945B true GB2405945B (en) 2006-10-25

Family

ID=29226887

Family Applications (1)

Application Number Title Priority Date Filing Date
GB0321268A Expired - Fee Related GB2405945B (en) 2003-09-11 2003-09-11 Printed circuit board assembly test apparatus

Country Status (1)

Country Link
GB (1) GB2405945B (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101349985B (en) * 2007-07-17 2011-06-22 鸿富锦精密工业（深圳）有限公司 Mainboard testing machine
CN103091624B (en) * 2013-01-18 2015-09-30 宁波三星智能电气有限公司 Based on the method for testing of FCT multistation proving installation
CN104776878B (en) * 2015-04-22 2017-05-24 青岛歌尔声学科技有限公司 Testing method for sensor testing tool
CN107526027B (en) * 2017-09-04 2019-08-20 中国航空工业集团公司洛阳电光设备研究所 A kind of PCBA board bga chip solder joint problem fast diagnosis method
CN116601503A (en) * 2021-01-26 2023-08-15 华为技术有限公司 Chip testing device and chip testing method
EP4375677A1 (en) * 2022-11-23 2024-05-29 Mikrodust AB Compact test fixture

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0560500A1 (en) * 1992-03-02 1993-09-15 AT&T Corp. Method and apparatus for testing edge connector I/O connections for circuit boards using boundary scan
GB2367369A (en) * 2000-06-06 2002-04-03 Ate Services Ltd A test fixture for testing a printed circuit board

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0560500A1 (en) * 1992-03-02 1993-09-15 AT&T Corp. Method and apparatus for testing edge connector I/O connections for circuit boards using boundary scan
GB2367369A (en) * 2000-06-06 2002-04-03 Ate Services Ltd A test fixture for testing a printed circuit board

Also Published As

Publication number Publication date
GB2405945A (en) 2005-03-16
GB0321268D0 (en) 2003-10-08

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20070911