GB2247528A - Probe pin automatic changing means - Google Patents

Probe pin automatic changing means Download PDF

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Publication number
GB2247528A
GB2247528A GB9118194A GB9118194A GB2247528A GB 2247528 A GB2247528 A GB 2247528A GB 9118194 A GB9118194 A GB 9118194A GB 9118194 A GB9118194 A GB 9118194A GB 2247528 A GB2247528 A GB 2247528A
Authority
GB
United Kingdom
Prior art keywords
probe pin
changing means
stripper
probe
pin automatic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB9118194A
Other versions
GB9118194D0 (en
GB2247528B (en
Inventor
Michael Dietrich
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
IHO Holding GmbH and Co KG
Original Assignee
FAG Kugelfischer Georg Schaefer KGaA
Kugelfischer Georg Schaefer and Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by FAG Kugelfischer Georg Schaefer KGaA, Kugelfischer Georg Schaefer and Co filed Critical FAG Kugelfischer Georg Schaefer KGaA
Publication of GB9118194D0 publication Critical patent/GB9118194D0/en
Publication of GB2247528A publication Critical patent/GB2247528A/en
Application granted granted Critical
Publication of GB2247528B publication Critical patent/GB2247528B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/004Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points
    • G01B5/008Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
    • G01B5/012Contact-making feeler heads therefor
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q35/00Control systems or devices for copying directly from a pattern or a master model; Devices for use in copying manually
    • B23Q35/04Control systems or devices for copying directly from a pattern or a master model; Devices for use in copying manually using a feeler or the like travelling along the outline of the pattern, model or drawing; Feelers, patterns, or models therefor
    • B23Q35/24Feelers; Feeler units

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  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Measuring Leads Or Probes (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)

Abstract

Means for automatically changing probe pins (3) comprise a protrusion or recess on each probe pin (3) which is engaged by a corresponding recess or protrusion on a movable carrier (5). The protrusion comprises a spigot (10) which engages a double slot (11) in the carrier (5). <IMAGE>

Description

Probe Din automatic changing means The present invention relates to probe
pin automatic changing means, especially but not exclusively in shape-gauging machines.
Such probe pins adapted to be removed from a probe carrier have been previously proposed. such an arrangement is proposed in, for example, DEOS 28 41 548. The probe pins are secured with the aid of transverse spigots and retaining springs. However, the arrangement as described is so c6mplicated that it only permits a manual exchange. Such an arrangement, therefore, is no longer of any use if, as frequently called for in the recent past, the gauging devices required to be used directly for the mass production of an article and if gauging probes of different types and sizes are required in the course of these gauging operations. In practice, this has resulted in automatic testing applicances being fitted with automatic probe-changing devices. However, such devices have only been provided for use on large testing appliances and consist of complicated double-armed grippers or of pneumatically operable gripping devices. Complicated operating sequences are necessary in both instances for changing the probe if the latter is arranged vertically.
An aim of the present invention, therefore, is to provide means which render it possible to change the 1 probe without difficulty even in the case of small machines.
Accordingly the present invention is directed to a probe pin automatic changing means, especially but. not exclusively in shape-gauging machines, in which the probe pin is provided with a protrusion or a recess engageable by a reciprocally formed stripper section of a changing device of the changing means.
Advantageousl) the probe pin has a protrusion in the form of a transverse spigot which, when the pin is held by the changing device, is opposed by a part of the stripper, and in which the stripper includes a double slot which is formed by a longitudinal groove and which is open at its intended top.
Preferably a lug protrudes into a part of the double slot's opening.
In a preferred embodiment the stripper is provided with a limit switch.
Advantageously a resilient push-in member is fastened to the stripper.
Preferably the profile of the changing device is, in a side view thereof, U-shaped, and one arm of the 11U11 is formed by the stripper and the other one by a support.
In a preferred embodiment a base plate of the changing device is provided with a recess located opposite a reciprocally formed sub-base, and the two components is 1 1 i are joined to each other by a screw extending therethrough at an angle of substantially 45 thereto.
Probe pins generally have a first transverse spigot f or insertion into a slot of a probe carrier. A retaining spring is also needed so as to prevent the probe from dropping out of the carrier. The probe pins, which are arranged horizontally and side by side in a store device and which may be differently sized, may thus be provided with a second transverse spigot in one f orm, of the present invention. A reason for the provision of this second transverse spigot is that the probe requires to be axially secured in a stripper. Thus, this second transverse spigot is arranged, both prior to and after inserting the probe into the probe-changing device, in a double slot in and extending transversely to a longitudinal groove in the stripper of the device. A sufficiently precise axial attachment is achieved not only when the probe is inserted into but also when it is removed from the measuring system. This renders it possible to push the probe against the retaining spring.
The probe carrier is desirably moveable axially towards the changing device for the purpose of inserting a new probe pin into the carrier. The result of this axial movement is that the top of the f irst transverse spigot engages a transverse slot of the carrier and will be pressed, in radial direction, by the spring against the carrier. The probe pin's correct engagement will be achieved as soon as its f irst transverse spigot comes to abut on the base of the carrier's slot. This in turn will be achieved once the second transverse spigot has been secured axially in the stripper's double slot which is open at its top. The probe pin may be moved out of the double slot of the changing device's stripper by moving the probe holder upwardly. Thereafter, any desired movement towards the workpiece to be gauged is possible. Removal of the probe ii effected in reverse order. The simple operating sequences and the simple device so far described also suffice for this purpose.
A lug may be provided in the slot of the changing device's arm so as to improve the probe pin's mounting support.
A limit switch may, for the sake of safety, be arranged in the region of the double slot. Its purpose is to ensure that, if the probe carrier is moved forwards, the machine can without fail be stopped prior to the second transverse spigot being damaged or being shorn off or prior to too large a force acting on the mounting of the gauging system.
As probe pins may be quite long, it is advantageous, if the construction of the changing device is such thatf in a side view thereof, a U-shaped profile results. This leads to the provision, at a certain distance, of a second support having a probe resting section, which may be V-shaped, and this second support 51 also optimizes the securing of the probe pin.
It is occasionally necessary to exchange the changing device. To facilitate this, the bottom region of the device is provided, according to a further preferred embodiment, with a recess disposed opposite a reciprocally formed sub-base which may be fastened to a rotary table. These two components may be joined to each other by means of a screw. This results in accurate positioning and a connection which makes installation and dismantling 10 relatively easy.
An example of probe pin automatic changing means made in accordance with the present invention are shown in the accompanying drawings, in which:Figure 1 shows a partial cross-sectional side 15 view of such means, together with a probe pin carrier; Figure 2 shows an axial view of the means shown in Figure I as seen from the probe pin carrier; and Figure 3 is a top view of the means shown in Figure 1.
A gauging systems probe pin carrier 1, as illustrated in Figure 1, is of a previously proposed shape. It is fitted on one side of its radial extent with a probe holder lt which is located opposite a retaining spring 2. A probe pin 3, and end part of which is shown in broken lines in Figure 1, is held by these components 1,' and 2 and is locked in position by a f irst transverse spigot 4 of the pin 3 engaging a transverse slot 111 of the holder 1.
A holder part of the changing means comprises a stripper 5, a push-in member 6, a base plate 7, a sub-base 8 and a support 9 which together with the plate 7, create 5 a U-shaped contour.
Now, if, for example, the probe pin 3 requires to be taken out of the probe carrier 1, it will have to be transferred, by moving the gauging system along the X direction and/or the direction, as appropriate, into horizontal position in relation to the holder part of the changing means, as illustrated in Figure 1. A second transverse spigot 10, which is offset at an angle of 900 from the first transverse spigot 4, is of considerable importance, as the gauging system must be moved in such a way that this spigot 10 will be inserted into a double slot 11 of the stripper 5. This double slot 11 is open at its top, and can more readily be identified from Figure 3. The double slot 11 extends on both sides of a rectangularly shaped longitudinal groove 51 in which, as shown in Figure 2, the probe pin 3 is secured. The pin 3 becomes caught in the double groove 11 as the carrier 11 is pulled away. It is thus deposited in the holder part of the changing means, with an end portion resting in a recess in the support 9.
A lug 12 is provided to ensure that, when the pin 3 is gripped by the carrier 1, the pin 10 will not be pushed out of the double groove 11. This lug 12 forms, in the illustrated embodiment, an integral part of the pushin member 6 which defines a boundary of the double groove 11 and which, in turn, is fastened to the stripper 5. The member 6 is flexible so as to avoid any risk of damage to the components. The removal of the probe pin 3 is effected in reverse order.
In order to prevent the components 1, 5 and 6 from being damaged, the stripper 5 is fitted with a limit switch 13 serving to switch off,, if need be, any movement of the gauging system.
The base plate 7 in the lower region of the holder part of the changing means is provided with a recess located opposite a reciprocally formed sub-base 8. This facilitates a sometimes required exchange of the changing device since the recess 70 renders it possible to join the components 7 and 8 quickly and precisely to each other. They are joined by means of a screw 14 extending at an angle of 45 therethrough.
Many variations and modifications to the illustrated device will readily occur to the reader familiar with probe changing means without taking it outside the scope of the present invention. To give one example only, the probe pin 3, instead of being provided with a transverse spigot 10, could alternatively be provided with two diametrically oppositely disposed truncations or recesses which oppose a fork-like part of a stripper.
- a -

Claims (8)

Claims
1. Probe pin automatic changing means, especially but not exclusively in shape-gauging machines, in which 5 the probe pin is provided with a protrusion or a recess engageable by a reciprocally formed stripper section of a changing device of the changing means.
2. Probe pin automatic changing means according to claim 1, in which the probe pin has a protrusion in the form of a transverse spigot which, when the pin is held by the changing device, is opposed by a part of the stripper, and in which the stripper includes a double slot which is formed by a longitudinal groove and which is open at its intended top.
3. Probe pin automatic changing means according to claim 2, in which a lug protrudes into a part of the double slot's opening.
4. Probe pin automatic changing means according to any preceding claim, in which the stripper is provided with a limit switch.
5. Probe pin automatic changing means according to any preceding claim, in which a resilient push-in member is fastened to the stripper.
6. Probe pin automatic changing means according to 25 any preceding claim, in which the profile of the changing device is, in a side view thereof, U-shaped, and in which one arm of the IIUII is f ormed by the stripper and the z other one by a support.
7. Probe pin automatic changing means according to any preceding claim, in which a base plate of the changing device is provided with a recess located opposite a 5 reciprocally formed sub-base, and in which the two components are joined to each other by a screw extending therethrough at an angle of substantially 450 thereto.
8. Probe pin automatic changing means, substantially as described herein with reference to and as 10 shown in the accompanying drawings.
Published 1992 at The Patent Office- Concept House. Cardill Road. Newpori. Gwent NP9 I RH Furiher copies mai- be obtained fl Sales Branch. Unit 6. Nine Mile Point. CA7nfelinfach. Cross KeyS. Newport. NPI 7HZ. Printed by Multiplex techniques ltd- SI Man. Cra.v_ Kent
GB9118194A 1990-08-24 1991-08-23 Probe pin automatic changing means Expired - Fee Related GB2247528B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19904026794 DE4026794A1 (en) 1990-08-24 1990-08-24 DEVICE FOR AUTOMATICALLY CHANGING PEN PINS

Publications (3)

Publication Number Publication Date
GB9118194D0 GB9118194D0 (en) 1991-10-09
GB2247528A true GB2247528A (en) 1992-03-04
GB2247528B GB2247528B (en) 1994-06-29

Family

ID=6412839

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9118194A Expired - Fee Related GB2247528B (en) 1990-08-24 1991-08-23 Probe pin automatic changing means

Country Status (2)

Country Link
DE (1) DE4026794A1 (en)
GB (1) GB2247528B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1996012929A1 (en) * 1994-10-20 1996-05-02 Taylor Hobson Limited Stylus attachment for a metrological instrument
US20110083335A1 (en) * 2009-10-13 2011-04-14 Mitutoyo Corporation Detector and measuring device

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1996012929A1 (en) * 1994-10-20 1996-05-02 Taylor Hobson Limited Stylus attachment for a metrological instrument
US5847270A (en) * 1994-10-20 1998-12-08 Taylor Hobson Limited Stylus attachment for a metrological instrument
US20110083335A1 (en) * 2009-10-13 2011-04-14 Mitutoyo Corporation Detector and measuring device
EP2312260A1 (en) * 2009-10-13 2011-04-20 Mitutoyo Corporation Detector and measuring device
US8302322B2 (en) * 2009-10-13 2012-11-06 Mitutoyo Corporation Detector and measuring device

Also Published As

Publication number Publication date
DE4026794A1 (en) 1992-02-27
GB9118194D0 (en) 1991-10-09
GB2247528B (en) 1994-06-29

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 19970823