GB2239744B - Tester head - Google Patents
Tester headInfo
- Publication number
- GB2239744B GB2239744B GB9024225A GB9024225A GB2239744B GB 2239744 B GB2239744 B GB 2239744B GB 9024225 A GB9024225 A GB 9024225A GB 9024225 A GB9024225 A GB 9024225A GB 2239744 B GB2239744 B GB 2239744B
- Authority
- GB
- United Kingdom
- Prior art keywords
- tester head
- tester
- head
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/0735—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card arranged on a flexible frame or film
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP28979389 | 1989-11-07 | ||
JP29063689 | 1989-11-08 | ||
JP30003389 | 1989-11-17 |
Publications (3)
Publication Number | Publication Date |
---|---|
GB9024225D0 GB9024225D0 (en) | 1990-12-19 |
GB2239744A GB2239744A (en) | 1991-07-10 |
GB2239744B true GB2239744B (en) | 1994-03-16 |
Family
ID=27337533
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB9024225A Expired - Fee Related GB2239744B (en) | 1989-11-07 | 1990-11-07 | Tester head |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB2239744B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7967621B2 (en) | 1999-08-17 | 2011-06-28 | Formfactor, Inc. | Electrical contactor, especially wafer level contactor, using fluid pressure |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3253069B2 (en) * | 1990-07-25 | 2002-02-04 | キヤノン株式会社 | Inspection method of part to be measured using electrical connection member |
US5378982A (en) * | 1993-02-25 | 1995-01-03 | Hughes Aircraft Company | Test probe for panel having an overlying protective member adjacent panel contacts |
JP3001182B2 (en) * | 1995-08-29 | 2000-01-24 | 信越ポリマー株式会社 | Liquid crystal panel inspection apparatus and method of manufacturing the same |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0226995A2 (en) * | 1985-12-23 | 1987-07-01 | Tektronix, Inc. | Multiple lead probe for integrated circuits |
WO1988005544A1 (en) * | 1987-01-20 | 1988-07-28 | Hughes Aircraft Company | Test connector for electrical devices |
EP0294936A1 (en) * | 1987-05-06 | 1988-12-14 | Reflex Promotion A/S | A method and a transfer for decorating textiles |
EP0304868A2 (en) * | 1987-08-28 | 1989-03-01 | Tektronix Inc. | Multiple lead probe for integrated circuits in wafer form |
EP0331282A1 (en) * | 1988-03-01 | 1989-09-06 | Hewlett-Packard Company | Membrane-based IC test probe with precisely positioned contacts |
EP0361779A1 (en) * | 1988-09-26 | 1990-04-04 | Hewlett-Packard Company | Micro-strip architecture for membrane test probe |
-
1990
- 1990-11-07 GB GB9024225A patent/GB2239744B/en not_active Expired - Fee Related
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0226995A2 (en) * | 1985-12-23 | 1987-07-01 | Tektronix, Inc. | Multiple lead probe for integrated circuits |
WO1988005544A1 (en) * | 1987-01-20 | 1988-07-28 | Hughes Aircraft Company | Test connector for electrical devices |
EP0294936A1 (en) * | 1987-05-06 | 1988-12-14 | Reflex Promotion A/S | A method and a transfer for decorating textiles |
EP0304868A2 (en) * | 1987-08-28 | 1989-03-01 | Tektronix Inc. | Multiple lead probe for integrated circuits in wafer form |
EP0331282A1 (en) * | 1988-03-01 | 1989-09-06 | Hewlett-Packard Company | Membrane-based IC test probe with precisely positioned contacts |
EP0361779A1 (en) * | 1988-09-26 | 1990-04-04 | Hewlett-Packard Company | Micro-strip architecture for membrane test probe |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7967621B2 (en) | 1999-08-17 | 2011-06-28 | Formfactor, Inc. | Electrical contactor, especially wafer level contactor, using fluid pressure |
Also Published As
Publication number | Publication date |
---|---|
GB2239744A (en) | 1991-07-10 |
GB9024225D0 (en) | 1990-12-19 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 20051107 |