GB2228567A - Intelligent inspection system - Google Patents

Intelligent inspection system Download PDF

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Publication number
GB2228567A
GB2228567A GB8904588A GB8904588A GB2228567A GB 2228567 A GB2228567 A GB 2228567A GB 8904588 A GB8904588 A GB 8904588A GB 8904588 A GB8904588 A GB 8904588A GB 2228567 A GB2228567 A GB 2228567A
Authority
GB
United Kingdom
Prior art keywords
assembly
inspection system
intelligent inspection
intelligent
rework
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB8904588A
Other versions
GB8904588D0 (en
Inventor
David Thomas Walters
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to GB8904588A priority Critical patent/GB2228567A/en
Publication of GB8904588D0 publication Critical patent/GB8904588D0/en
Publication of GB2228567A publication Critical patent/GB2228567A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8803—Visual inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N21/95607—Inspecting patterns on the surface of objects using a comparative method
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/98—Detection or correction of errors, e.g. by rescanning the pattern or by human intervention; Evaluation of the quality of the acquired patterns
    • G06V10/987—Detection or correction of errors, e.g. by rescanning the pattern or by human intervention; Evaluation of the quality of the acquired patterns with the intervention of an operator
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N2021/0181—Memory or computer-assisted visual determination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G01N2021/889—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques providing a bare video image, i.e. without visual measurement aids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N21/95607—Inspecting patterns on the surface of objects using a comparative method
    • G01N2021/95615—Inspecting patterns on the surface of objects using a comparative method with stored comparision signal
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30164—Workpiece; Machine component

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  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Quality & Reliability (AREA)
  • Theoretical Computer Science (AREA)
  • Multimedia (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

An inspection system which stores and processes image signals from a television camera in a computer, so that the operator is assisted in distinguishing any differences between a "known good assembly" previously viewed and stored and the assembly being inspected. Data regarding the component parts of the assembly and their positions is also provided so that the operator can establish the correct component that should be present at any location and its alignment. A record can be made of the faults found and any necessary corrective action, and analysis can be undertaken on sets of records. The data regarding the component parts of the assembly and their positions can be gained from an intelligent assembly/ rework system and once faults have been established, data on faults can be sent back to that system, to speed rework.

Description

INTELLIGENT INSPECTION SYSTEM This invention relates to an intelligent inspection system.
Systems which assist the inspection of an assembly by employing mirrors and lenses to optically compare it with a "known good assembly" are well known, especially in the electronics industry. They alternately present the 2 images to an operator, and any differences appear to flash. These areas can then be more closely inspected to ascertain why the assembly deviates from the original.
The systems are generally tiring on the eyes, and dependent on operator skill. Once a difference is found, it is not readily apparent just what the correct item should be at that point.
There are no inbuilt facilities to produce records or to collect data for analysis.
According to the present invention, the images of both the "known good assembly" and the assembly being inspected are captured by a television camera, and stored digitally in a computer system. This avoids the expense and inconvenience of the physical presence of the "known good assembly". Data regarding the component parts of the assembly and their positions is also fed in to the computer. This data could come directly from another computer, possibly employed in a fully automatic or semi-automatic intelligent assembly/rework system, which employs this data to guide the machine or operator through a sequence to select the right component and to locate it at the correct point, with the correct orientation.
The images can either be presented in turn to the operator, or can be chosen manually. Analysis of differences in the 2 images can be undertaken by the computer, and presented, full size or with a scale change, to the operator. Information from the data file can also be presented, regarding the correct component that should be present at that location, for example its part number, description, and orientation. A decision can then be taken regarding the necessary corrective action for that item, and a record can be made to assist this work. Analysis can be undertaken on sets of records, aiding decisions on improvements in the control of the process prior to inspection, for example staff training and methods.
An added advantage is that inspection can take place after component insertion, and prior to further processes. For example, in electronic assembly, inspection could take place prior to soldering, considerably easing any rework action.

Claims (8)

1 An intelligent inspection system comprising a television camera, suitable lens, video digitiser, and computer system with a means to compare a stored digitised image of a correct assembly with a digitised image of the assembly being inspected.
2 An intelligent inspection system as claimed in Claim 1 wherein a means is provided to give information regarding an item located at any point, from stored information regarding component parts and their positions.
3 An intelligent inspection system as claimed in Claim 1 or Claim 2 wherein a means is provided to record and to analyse information regarding any faults on the current assembly being inspected.
4 An intelligent inspection system as claimed in Claim 1 or Claim 2 or Claim 3 wherein a means is provided to record and to analyse information regarding faults on the any number of assemblies that have previously been inspected.
5 An intelligent inspection system as claimed in any preceding claim wherein a means is provided to permit images to be presented or stored to any scale, in order to facilitate inspection of any part of the assembly.
6 An intelligent inspection system as claimed in any preceding claim wherein a means is provided to mark all the parts of one type on the image,.
7 An intelligent inspection system as claimed in any preceding claim wherein a means is provided to derive information from or send information to an intelligent assembly/rework system.
8 An intelligent inspection system as claimed in Claim 7, wherein a means is provided to mark the records of those items requiring rework, so that they may be presented in turn on the intelligent assembly/rework system.
GB8904588A 1989-02-28 1989-02-28 Intelligent inspection system Withdrawn GB2228567A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB8904588A GB2228567A (en) 1989-02-28 1989-02-28 Intelligent inspection system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB8904588A GB2228567A (en) 1989-02-28 1989-02-28 Intelligent inspection system

Publications (2)

Publication Number Publication Date
GB8904588D0 GB8904588D0 (en) 1989-04-12
GB2228567A true GB2228567A (en) 1990-08-29

Family

ID=10652482

Family Applications (1)

Application Number Title Priority Date Filing Date
GB8904588A Withdrawn GB2228567A (en) 1989-02-28 1989-02-28 Intelligent inspection system

Country Status (1)

Country Link
GB (1) GB2228567A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4215948A1 (en) * 1992-05-14 1993-11-18 Fraunhofer Ges Forschung Measuring quality of crystalline products, esp. sugar - by measuring head above prod. conveyor directs light beam onto prods., reflected light is sensed by probe and numerical quality value fed to computer
DE4309939A1 (en) * 1993-03-26 1994-09-29 Guenter Dr Ing Dau Method and device for fully automatic analysis of the materials to be mixed in solids mixers
DE4343058A1 (en) * 1993-12-19 1995-06-22 Robert Prof Dr Ing Massen Multiple sensor camera for quality control
WO2000031519A1 (en) * 1998-11-25 2000-06-02 Koninklijke Philips Electronics N.V. Method of manufacturing a cathode ray tube, in which a display screen is inspected

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2106280A (en) * 1981-09-22 1983-04-07 Polygraph Leipzig Method of and apparatus for measuring and correcting registration on a printed sheet
EP0195161A2 (en) * 1985-03-14 1986-09-24 Nikon Corporation Apparatus for automatically inspecting objects and identifying or recognizing known and unknown portions thereof, including defects and the like and method
US4644172A (en) * 1984-02-22 1987-02-17 Kla Instruments Corporation Electronic control of an automatic wafer inspection system
GB2184877A (en) * 1985-12-04 1987-07-01 Tdk Corp Method for detecting and correcting failure in mounting of electronic parts on substrate and apparatus therefor
EP0236738A2 (en) * 1986-02-05 1987-09-16 OMRON Corporation Input method for reference printed circuit board assembly data to an image processing printed circuit board assembly automatic inspection apparatus

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2106280A (en) * 1981-09-22 1983-04-07 Polygraph Leipzig Method of and apparatus for measuring and correcting registration on a printed sheet
US4644172A (en) * 1984-02-22 1987-02-17 Kla Instruments Corporation Electronic control of an automatic wafer inspection system
EP0195161A2 (en) * 1985-03-14 1986-09-24 Nikon Corporation Apparatus for automatically inspecting objects and identifying or recognizing known and unknown portions thereof, including defects and the like and method
GB2184877A (en) * 1985-12-04 1987-07-01 Tdk Corp Method for detecting and correcting failure in mounting of electronic parts on substrate and apparatus therefor
EP0236738A2 (en) * 1986-02-05 1987-09-16 OMRON Corporation Input method for reference printed circuit board assembly data to an image processing printed circuit board assembly automatic inspection apparatus

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4215948A1 (en) * 1992-05-14 1993-11-18 Fraunhofer Ges Forschung Measuring quality of crystalline products, esp. sugar - by measuring head above prod. conveyor directs light beam onto prods., reflected light is sensed by probe and numerical quality value fed to computer
DE4309939A1 (en) * 1993-03-26 1994-09-29 Guenter Dr Ing Dau Method and device for fully automatic analysis of the materials to be mixed in solids mixers
DE4343058A1 (en) * 1993-12-19 1995-06-22 Robert Prof Dr Ing Massen Multiple sensor camera for quality control
WO2000031519A1 (en) * 1998-11-25 2000-06-02 Koninklijke Philips Electronics N.V. Method of manufacturing a cathode ray tube, in which a display screen is inspected

Also Published As

Publication number Publication date
GB8904588D0 (en) 1989-04-12

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WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)