GB2109545B - Surface profile interferometer - Google Patents
Surface profile interferometerInfo
- Publication number
- GB2109545B GB2109545B GB08229353A GB8229353A GB2109545B GB 2109545 B GB2109545 B GB 2109545B GB 08229353 A GB08229353 A GB 08229353A GB 8229353 A GB8229353 A GB 8229353A GB 2109545 B GB2109545 B GB 2109545B
- Authority
- GB
- United Kingdom
- Prior art keywords
- surface profile
- interferometer
- profile interferometer
- profile
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0608—Height gauges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/2441—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using interferometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB08229353A GB2109545B (en) | 1981-10-30 | 1982-10-14 | Surface profile interferometer |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB8132745 | 1981-10-30 | ||
GB08229353A GB2109545B (en) | 1981-10-30 | 1982-10-14 | Surface profile interferometer |
Publications (2)
Publication Number | Publication Date |
---|---|
GB2109545A GB2109545A (en) | 1983-06-02 |
GB2109545B true GB2109545B (en) | 1985-07-24 |
Family
ID=26281126
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB08229353A Expired GB2109545B (en) | 1981-10-30 | 1982-10-14 | Surface profile interferometer |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB2109545B (en) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5975108A (en) * | 1982-10-22 | 1984-04-27 | Hitachi Ltd | Method and device for optical measurement of fine cap |
US4848908A (en) * | 1983-10-24 | 1989-07-18 | Lockheed Missiles & Space Company, Inc. | Optical heterodyne roughness measurement system |
EP0162973A1 (en) * | 1984-05-30 | 1985-12-04 | Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO | Distance measuring device |
US4639139A (en) * | 1985-09-27 | 1987-01-27 | Wyko Corporation | Optical profiler using improved phase shifting interferometry |
DE3574280D1 (en) * | 1985-12-23 | 1989-12-21 | Ibm Deutschland | Method and arrangement for optically determining surface profiles |
US5042949A (en) * | 1989-03-17 | 1991-08-27 | Greenberg Jeffrey S | Optical profiler for films and substrates |
US5017012A (en) * | 1989-08-04 | 1991-05-21 | Chapman Instruments, Inc. | Viewing system for surface profiler |
JP3351527B2 (en) * | 1991-11-08 | 2002-11-25 | ブリテイッシュ・テクノロジー・グループ・リミテッド | Measuring device |
GB2356931B (en) * | 1999-12-03 | 2003-05-28 | Aea Technology Plc | Optical ultrasonic measurement |
SG98388A1 (en) * | 2000-05-13 | 2003-09-19 | Univ Nanyang | Testing of aspheric surfaces with a magneto-optic active compensator |
-
1982
- 1982-10-14 GB GB08229353A patent/GB2109545B/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
GB2109545A (en) | 1983-06-02 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
732 | Registration of transactions, instruments or events in the register (sect. 32/1977) | ||
732 | Registration of transactions, instruments or events in the register (sect. 32/1977) | ||
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 19961014 |