GB2100447B - Marking apparatus - Google Patents
Marking apparatusInfo
- Publication number
- GB2100447B GB2100447B GB8211532A GB8211532A GB2100447B GB 2100447 B GB2100447 B GB 2100447B GB 8211532 A GB8211532 A GB 8211532A GB 8211532 A GB8211532 A GB 8211532A GB 2100447 B GB2100447 B GB 2100447B
- Authority
- GB
- United Kingdom
- Prior art keywords
- marking apparatus
- marking
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/316—Testing of analog circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1981058182U JPS57170551U (en) | 1981-04-22 | 1981-04-22 |
Publications (2)
Publication Number | Publication Date |
---|---|
GB2100447A GB2100447A (en) | 1982-12-22 |
GB2100447B true GB2100447B (en) | 1985-09-25 |
Family
ID=13076862
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB8211532A Expired GB2100447B (en) | 1981-04-22 | 1982-04-21 | Marking apparatus |
Country Status (3)
Country | Link |
---|---|
US (1) | US4568879A (en) |
JP (1) | JPS57170551U (en) |
GB (1) | GB2100447B (en) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59140442U (en) * | 1983-03-11 | 1984-09-19 | 富士通株式会社 | Marking equipment for semiconductor devices |
JPS61100942A (en) * | 1984-10-22 | 1986-05-19 | Canon Inc | Discrimination of substandard chip |
EP0419725A1 (en) * | 1989-09-29 | 1991-04-03 | Hugo Dr. Moschüring | Measuring spot for microwave components |
US5089774A (en) * | 1989-12-26 | 1992-02-18 | Sharp Kabushiki Kaisha | Apparatus and a method for checking a semiconductor |
US5420522A (en) * | 1991-12-04 | 1995-05-30 | Texas Instruments Incorporated | Method and system for fault testing integrated circuits using a light source |
US5416428A (en) * | 1993-02-09 | 1995-05-16 | Everett Charles Technologies, Inc. | Marker probe |
IT1273339B (en) * | 1994-02-24 | 1997-07-08 | Circuit Line Spa | MARKING SYSTEM FOR PRINTED CIRCUITS |
US5640100A (en) * | 1994-10-22 | 1997-06-17 | Tokyo Electron Limited | Probe apparatus having probe card exchanging mechanism |
US6122562A (en) * | 1997-05-05 | 2000-09-19 | Applied Materials, Inc. | Method and apparatus for selectively marking a semiconductor wafer |
KR100256052B1 (en) * | 1997-07-29 | 2000-06-01 | 윤종용 | Inker testing apparatus and method therefor |
US6051845A (en) * | 1998-03-25 | 2000-04-18 | Applied Materials, Inc. | Method and apparatus for selectively marking a semiconductor wafer |
JP2002190504A (en) * | 2000-12-22 | 2002-07-05 | Umc Japan | Mark formation method, device thereof and analyzer |
US6642708B1 (en) * | 2001-02-14 | 2003-11-04 | Mark Jay Dragan | Marker system for test fixture |
US6702489B2 (en) * | 2002-07-03 | 2004-03-09 | Taiwan Semiconductor Manufacturing Co., Ltd | Inking apparatus with multi-positioning capability |
US7022976B1 (en) * | 2003-04-02 | 2006-04-04 | Advanced Micro Devices, Inc. | Dynamically adjustable probe tips |
US7243038B2 (en) * | 2004-03-04 | 2007-07-10 | Dowtech, Inc. | Method and apparatus for testing circuit boards |
JP2016057187A (en) * | 2014-09-10 | 2016-04-21 | 株式会社東芝 | Analyzer |
DE102019129972A1 (en) * | 2019-11-06 | 2021-05-06 | Ingun Prüfmittelbau Gmbh | Marking device for marking circuit cards tested with a test device |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3345567A (en) * | 1964-02-26 | 1967-10-03 | Kulicke And Soffa Mfg Company | Multipoint probe apparatus for electrically testing multiple surface points within small zones |
US3437929A (en) * | 1965-08-05 | 1969-04-08 | Electroglas Inc | Automatically indexed probe assembly for testing semiconductor wafers and the like |
US3641972A (en) * | 1970-09-29 | 1972-02-15 | Collins Radio Co | Probe assembly |
-
1981
- 1981-04-22 JP JP1981058182U patent/JPS57170551U/ja active Pending
-
1982
- 1982-04-19 US US06/369,979 patent/US4568879A/en not_active Expired - Fee Related
- 1982-04-21 GB GB8211532A patent/GB2100447B/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
US4568879A (en) | 1986-02-04 |
GB2100447A (en) | 1982-12-22 |
JPS57170551U (en) | 1982-10-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 19960421 |