GB2080957A - Method of suppressing spurious voltages and of measuring fault resistance - Google Patents
Method of suppressing spurious voltages and of measuring fault resistance Download PDFInfo
- Publication number
- GB2080957A GB2080957A GB8111561A GB8111561A GB2080957A GB 2080957 A GB2080957 A GB 2080957A GB 8111561 A GB8111561 A GB 8111561A GB 8111561 A GB8111561 A GB 8111561A GB 2080957 A GB2080957 A GB 2080957A
- Authority
- GB
- United Kingdom
- Prior art keywords
- voltage
- measuring
- resistance
- measurement
- fault resistance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/08—Locating faults in cables, transmission lines, or networks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R17/00—Measuring arrangements involving comparison with a reference value, e.g. bridge
- G01R17/10—AC or DC measuring bridges
- G01R17/105—AC or DC measuring bridges for measuring impedance or resistance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/16—Measuring impedance of element or network through which a current is passing from another source, e.g. cable, power line
- G01R27/18—Measuring resistance to earth, i.e. line to ground
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Locating Faults (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
A method of suppressing spurious voltages and a method of indicating the fault resistance RF when carrying out measurements with d.c. Murray bridge circuits on cables a,b with a stabilized measuring voltage source involves stabilizing the measuring voltage source Um with a low internal resistance for d.c. voltage but with a high internal impedance for a.c. voltages e.g. by providing a transistor T and an operational amplifier V connected as shown. A voltage which depends on the measuring current and therefore on the fault resistance is measured by meter I to give the value of the fault resistance. The method can be used particularly with telecommunications cables, and substantially reduces the effects of spurious voltages which can give rise to differential voltages between the cores. <IMAGE>
Description
SPECIFICATION
Method of suppressing spurious voltages in measurements with d.c. Murray bridge circuits on cables, and of measuring fault resistance when measuring fault location
The invention relates to a method of suppressing spurious voltages in measurements with d.c. Murray bridge circuits on cables with a stabilized measuring voltage source. The method may also include measuring fault resistance when measuring fault location.
High spurious voltages at frequencies of 50 Hz and 163 Hz frequently occur in the cores of installed cables as a result of inductive coupling of external voltages. These are mainly common mode voltages. Identical cores of the same cable carry identical voltages with respect to a particular measuring point and if both cores are equally loaded there is no potential difference between them. When insulation faults are located, the cores used for the measurement are usually asymmetrically loaded by the measuring circuit so that voltages of several volts can appear between the cores used for measurement. When a fault is located by means of a known Murray measuring bridge, the said voltage appears between the two cores under measurement at the input of the nul indicator and frequently faisifies the measured results.
According to one aspect of the invention there is provided a method of suppressing spurious voltage in a measurement on a cable with a d.c.
Murray bridgeRcircuit having a stabilized measuring voltage source, wherein the measuring voltage source is stabilized with a low internal resistance for d.c. voltage but with a high internal impedance for a.c. voltage.
According to another aspect of the invention there is provided an apparatus for performing a
measurement on a cable, comprising a d.c. Murray
bridge circuit including a stabilized measuring voltage source having a relatively low internal impedance for direct voltage and a relatively high internal impedance for alternating voltage.
It is thus possible-to substantially reduce the effect of spurious voltages when faults are located
and to substantially prevent the appearance of
push-pull or differential voltages between 'measuring cores.
Preferably, the stabilization of the measuring
source is performed by means of a series transistor and operational amplifier in polarity
opposition, and the amplifier being provided with
frequency dependent feedback by means of a RC
network between the output of the transistor and
the inverting input of the amplifier so that
stabilization of d.c. voltage is fully effective but is
cancelled for a.c. voltages above a limiting
frequency defined by the RC network.
It is thus possible to further perfect location of
the fault by measurement of the absolute value of
the fault resistance.
Preferably, measurement of a voltage which
depends on the measuring current and is therefore approximately inversely dependent on fault resistance is used as measured value of the fault resistance.
Preferably, the measuring voltage for the fault resistance is tapped off between the base and the emitter of the series transistor. The fault resistance can thus be displayed with a logarithmic scale, i.e. over a relatively wide measuring range.
The invention will be further described, by way of example, with reference to the accompanying drawing, which is a circuit diagram of a preferred embodiment.
The single illustration shows in diagrammatic form a circuit for performing a method of suppressing spurious voltages when measuring fault resistance. The top part of the drawing shows a faulty cable with a fault-free core b having a core resistance Rb and a faulty core a. The resistance of the faulty core a as far as the fault location is designated by Rx and the resistance of the core a from the fault location to the distal cable end is designated by Ry. The two cores a and b are connected to each other at the distal end of the cable. The resistance of the fault location with respect to earth is designated by RF. A Murray measuring bridge with a balancing potentiometer
P and a nul indicator N is shown at the terminals of the cores a and b which are to be measured.A measuring voltage is supplied by a measuring voltage source Um which is shown as a battery in the exemplified embodiment. The measuring voltage source Um can be extended by an additional voltage source Uz, as shown in the example, for measuring longer cable lengths with higher core resistances or for measuring large fault resistances RF. The negative terminal of the measuring voltage source Um is connected via a voltage stabilizing circuit to the wiper of the balancing potentiometer P and the positive terminal is connected to earth E and therefore to the earthy end of the fault resistance RF.The path of the measuring current from the positive terminal of the measuring voltage source via earth
E, the fault resistance RF, via the measuring circuit, the wiper of the potentiometer P to the collector C of a series transistor T, the emitter E thereof, a limiting resistor R2, an operational amplifier V and to the negative terminal of the voltage source is designated by thicker lines outside the measuring circuit. A feedback voltage is tapped off from the collector C of the transistor
T and is applied via the RC network, comprising the resistor R1 and the capacitor Cl, to the inverting input of the amplifier V.
It can be seen, that two voltages of identical magnitude, induced on to the cable cores a and b are loaded with different resistances when the balancing potentiometer T is directly connected through the bridge circuit to the measuring voltage source Um so that substantial voltage differences of several volts can appear at the nul indicator N. These voltages can substantially falsify the measured results and in many cases render measurement completely impossible. The illustrated stabilizing circuit comprising the transistor T and the amplifier V simulates in accordance with its purpose a low internal resistance of the voltage source Um for d.c. but represents an impedance which is very high compared with all resistances in the measuring circuit for a.c. above a limiting frequency defined by the RC network R1, C1.The pair of cores to be measured is therefore symmetrically terminated and any conversion of the common mode voltage on the cores into a push-pull or differential voltage and therefore falsification of the measured result is substantially avoided.
Another uncertainty in measurement is due to the fact that the magnitude of the fault resistance
EF can alter during measurement. It is therefore
advantageous to observe the value of the vault
resistance while the location of the fault is determined. Due to the case of a constant
measuring voltage, the measuring current in the
circuit illustrated in the drawing is inversely
proportional to the fault resistance RF. A voltage,
tapped off the limiting resistor R2, couid therefore
be used as a measure of the fault resistance.
However, since the value of the fault resistance
can alter over several powers of ten while the fault
is being located, such observation wouid be
possible without difficulty only if the fault
resistance is logarithmically displayed. It is well
known that the voltage between the base B and
the emitter E of a transistorT in base connection is
inversely proportional to the logarithm of the current flowing between the collector C and the emitter E. If the base-emitter voltage of the transistor in the illustrated circuit is measured by the indicating instrument I, the display, given a suitable scale calibration, will indicate the fault
resistance RF on a logarithmic scale which is
particularly suitable for measurement. In practice,
the base-emitter voltage of the transistor T will be
indicated via an impedance converter and a
measuring amplifier. If an additionai transistor, not
shown in the illustration, but identical to the
transistor T, is used for impedance conversion and
is thermally coupled to the transistor T so that it
assumes the same temperature, it will be possible
to compensate for the dependence of the
displayed value on the temperature of the transistor T. Special commercial arrangements containing two identical transistors in one casing are particularly suitable to this end.
An illustration of circuit details for the abovedescribed condftioning of the measuring voltage was omitted, since this Is probably known.
Claims (7)
1. A method of suppressing spurious voltage in a measurement on a cable with X d.c. Murray bridge circuit having a stabilized measuring voltage source, wherein the measuring voltage source is stabilized with a low internal resistance for d.c. voltage but with a high internal tfnpedance for a.c. voltage.
2. A method as claimed in claim 1, in which stabilization of the measuring source is performed by means of a series transistor and operational amplifier in polarity opposition, and the amplifier being provided with frequency'dependent feedback by means of a RC network between the output of the transistor and the inverting input of the amplifier so that stabilization of d.c. voltage is fully effective but is cancelled for a.c. voltages above a limiting frequency defined by the RC network.
3. A method as claimed in claim 2, in which measurement of a voltage which depends on the measuring current and is therefore approximately inversely dependent on fault resistance is used as measured value of the fault resistance.
4. A method as claimed in claim 3, in which the measuring voltage for the vault resistance is tapped off between the base and the emitter of the series transistor.
5. A method of suppressing spurious voltage in a measurement on a cable substantially as hereinbefore described with reference to the accompanying drawing.
6. An apparatus for performing a measurement on a cable, comprising a d.c. Murray bridge circuit including a stabilized measuring. voltage source having a relatively low intemal'-irnpedance for direct voltage and a relatively high internal impedance for alternating voltage.
7. An apparatus substantially as hereinbefore described with reference to and as illustrated in the accompanying drawing.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19803027800 DE3027800C2 (en) | 1980-07-23 | 1980-07-23 | Circuit arrangement to avoid interference voltages during measurements with DC Murray bridge circuits on cables |
Publications (2)
Publication Number | Publication Date |
---|---|
GB2080957A true GB2080957A (en) | 1982-02-10 |
GB2080957B GB2080957B (en) | 1984-04-11 |
Family
ID=6107850
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB8111561A Expired GB2080957B (en) | 1980-07-23 | 1981-04-13 | Method of suppressing spurious voltages and of measuring fault resistance |
Country Status (3)
Country | Link |
---|---|
DE (1) | DE3027800C2 (en) |
FR (1) | FR2487525B1 (en) |
GB (1) | GB2080957B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0179920A1 (en) * | 1984-04-18 | 1986-05-07 | Sony Corporation | Apparatus for recording data signals |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10041670B4 (en) * | 2000-08-10 | 2005-12-29 | Deutsche Telekom Ag | Locating loop for determining the fault location of a faulty cable |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1252072A (en) * | 1969-01-28 | 1971-11-03 |
-
1980
- 1980-07-23 DE DE19803027800 patent/DE3027800C2/en not_active Expired
-
1981
- 1981-03-26 FR FR8106113A patent/FR2487525B1/en not_active Expired
- 1981-04-13 GB GB8111561A patent/GB2080957B/en not_active Expired
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0179920A1 (en) * | 1984-04-18 | 1986-05-07 | Sony Corporation | Apparatus for recording data signals |
EP0179920A4 (en) * | 1984-04-18 | 1988-06-13 | Sony Corp | Apparatus for recording data signals. |
Also Published As
Publication number | Publication date |
---|---|
GB2080957B (en) | 1984-04-11 |
DE3027800C2 (en) | 1983-03-24 |
FR2487525A1 (en) | 1982-01-29 |
DE3027800A1 (en) | 1982-02-18 |
FR2487525B1 (en) | 1985-09-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 19950413 |