GB2066590B - Test pin - Google Patents

Test pin

Info

Publication number
GB2066590B
GB2066590B GB8035306A GB8035306A GB2066590B GB 2066590 B GB2066590 B GB 2066590B GB 8035306 A GB8035306 A GB 8035306A GB 8035306 A GB8035306 A GB 8035306A GB 2066590 B GB2066590 B GB 2066590B
Authority
GB
United Kingdom
Prior art keywords
test pin
pin
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB8035306A
Other versions
GB2066590A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Publication of GB2066590A publication Critical patent/GB2066590A/en
Application granted granted Critical
Publication of GB2066590B publication Critical patent/GB2066590B/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Springs (AREA)
GB8035306A 1979-12-26 1980-11-03 Test pin Expired GB2066590B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10702779A 1979-12-26 1979-12-26

Publications (2)

Publication Number Publication Date
GB2066590A GB2066590A (en) 1981-07-08
GB2066590B true GB2066590B (en) 1984-02-15

Family

ID=22314479

Family Applications (1)

Application Number Title Priority Date Filing Date
GB8035306A Expired GB2066590B (en) 1979-12-26 1980-11-03 Test pin

Country Status (5)

Country Link
JP (1) JPS5953507B2 (en)
CA (1) CA1162243A (en)
DE (1) DE3038937A1 (en)
FR (1) FR2472773B1 (en)
GB (1) GB2066590B (en)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3225907A1 (en) * 1982-07-10 1984-01-12 Feinmetall Gmbh, 7033 Herrenberg Elastic contact module for measuring and testing purposes
DE3410093A1 (en) * 1984-03-20 1985-10-03 Feinmetall Gmbh, 7033 Herrenberg Spring contact pin and a method for its production
DE3424210A1 (en) * 1984-06-30 1986-01-09 Feinmetall Gmbh, 7033 Herrenberg Contact element for a test adaptor
JPS6179273U (en) * 1984-10-29 1986-05-27
GB2166913A (en) * 1984-11-13 1986-05-14 Tektronix Inc Impedance matched test probe
DE3441480A1 (en) * 1984-11-13 1986-05-15 MANIA Elektronik Automatisation Entwicklung und Gerätebau GmbH, 6384 Schmitten CONTACT PEN
US4740746A (en) * 1984-11-13 1988-04-26 Tektronix, Inc. Controlled impedance microcircuit probe
DE3500227A1 (en) * 1985-01-05 1986-07-10 Riba-Prüftechnik GmbH, 7801 Schallstadt Probe needle
US4884024A (en) * 1985-11-19 1989-11-28 Teradyne, Inc. Test pin assembly for circuit board tester
EP0292590A1 (en) * 1987-05-26 1988-11-30 Feinmetall Gesellschaft mit beschrÀ¤nkter Haftung Contact device for testing equipment
DE3832410C2 (en) * 1987-10-09 1994-07-28 Feinmetall Gmbh Contact device
DE3920850A1 (en) * 1989-06-24 1991-01-10 Feinmetall Gmbh SPRING CONTACT PIN
JPH0782028B2 (en) * 1990-07-30 1995-09-06 日本発条株式会社 Conductive contact
US5189364A (en) * 1990-07-30 1993-02-23 Nhk Spring Co., Ltd. Contact probe
JPH0531656U (en) * 1991-10-14 1993-04-27 フランスベツド株式会社 Bed device
US5254939A (en) * 1992-03-20 1993-10-19 Xandex, Inc. Probe card system
US5528158A (en) * 1994-04-11 1996-06-18 Xandex, Inc. Probe card changer system and method
DE19511565A1 (en) * 1995-03-29 1996-10-02 Atg Test Systems Gmbh Test adapter
US5801544A (en) * 1997-01-16 1998-09-01 Delaware Capital Formation, Inc. Spring probe and method for biasing
US5781023A (en) * 1997-01-31 1998-07-14 Delware Capital Formation, Inc. Hollow plunger test probe
DE19811795C1 (en) * 1998-03-18 1999-09-02 Atg Test Systems Gmbh Needle for test adapter for populated or unpopulated circuit boards
US6288531B1 (en) * 1999-02-03 2001-09-11 Ando Electric Co., Ltd. Probe for electro-optic sampling oscilloscope
US7154286B1 (en) * 2005-06-30 2006-12-26 Interconnect Devices, Inc. Dual tapered spring probe
JP5486760B2 (en) * 2006-07-04 2014-05-07 株式会社エンプラス Contact pin and socket for electrical parts
DE102012101929B4 (en) * 2012-03-07 2015-02-19 Federnfabrik Dietz Gmbh Spring sleeve, spring pin and method and apparatus for producing a spring sleeve and a spring pin
JP6201138B2 (en) 2013-07-18 2017-09-27 株式会社トキワ Cosmetic container
US9568388B2 (en) * 2014-08-05 2017-02-14 Sensata Technologies, Inc. Small form factor pressure sensor
CN107290099B (en) 2016-04-11 2021-06-08 森萨塔科技公司 Pressure sensor, plug for a pressure sensor and method for producing a plug
EP3236226B1 (en) 2016-04-20 2019-07-24 Sensata Technologies, Inc. Method of manufacturing a pressure sensor
US10545064B2 (en) 2017-05-04 2020-01-28 Sensata Technologies, Inc. Integrated pressure and temperature sensor
US10323998B2 (en) 2017-06-30 2019-06-18 Sensata Technologies, Inc. Fluid pressure sensor
US10724907B2 (en) 2017-07-12 2020-07-28 Sensata Technologies, Inc. Pressure sensor element with glass barrier material configured for increased capacitive response
US10557770B2 (en) 2017-09-14 2020-02-11 Sensata Technologies, Inc. Pressure sensor with improved strain gauge

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3435168A (en) * 1968-03-28 1969-03-25 Pylon Co Inc Electrical contact
DE1765461B2 (en) * 1968-05-22 1976-12-16 Bossert, Anneliese, 7530 Pforzheim SPRING CONTACT
CH589947A5 (en) * 1974-02-13 1977-07-29 Ingun Ag Test pin for printed circuit boards - with spring loaded shank in barrel and test end with conical hollow for boards test point
US4050762A (en) * 1976-11-10 1977-09-27 Everett/Charles, Inc. Telescoping spring probe having separate wiper contact member
US4105970A (en) * 1976-12-27 1978-08-08 Teradyne, Inc. Test pin

Also Published As

Publication number Publication date
FR2472773B1 (en) 1985-07-19
CA1162243A (en) 1984-02-14
GB2066590A (en) 1981-07-08
JPS5953507B2 (en) 1984-12-25
DE3038937A1 (en) 1981-07-02
JPS5694272A (en) 1981-07-30
FR2472773A1 (en) 1981-07-03

Similar Documents

Publication Publication Date Title
GB2066590B (en) Test pin
JPS5465085A (en) Pin tester
JPS5383075A (en) Testing pin
JPS5687874A (en) Test device
GB2060881B (en) Automatic tympanometric testing means
JPS55124041A (en) Tire tester
JPS55156843A (en) Analyzer
JPS5674667A (en) Test circuit
AU5961980A (en) Well testing
GB2041035B (en) Well testing
JPS5647654A (en) Tester
JPS5621060A (en) Nonndestructive inspector
JPS5596130A (en) Ultrasoniccwave probe
JPS5696221A (en) Probe
JPS55104151A (en) Testing circuit
ZA803473B (en) Diagnostic test
HU179089B (en) Pin like interconnecting piece
JPS5631518A (en) Pin shaped combining member
JPS566266A (en) Measuring correcteddvalue
GB2060358B (en) Pin connector
JPS5675617A (en) Tester for threeedimensional objects
GB8317800D0 (en) Pin
JPS55122539A (en) Xxray inspecting device
GB2039373B (en) Measuring forces
JPS55110939A (en) Hole probing apparatus

Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee