GB2031163B - Method of testing - Google Patents

Method of testing

Info

Publication number
GB2031163B
GB2031163B GB7839318A GB7839318A GB2031163B GB 2031163 B GB2031163 B GB 2031163B GB 7839318 A GB7839318 A GB 7839318A GB 7839318 A GB7839318 A GB 7839318A GB 2031163 B GB2031163 B GB 2031163B
Authority
GB
United Kingdom
Prior art keywords
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB7839318A
Other versions
GB2031163A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
MIN RADIOTEKH INST
MOSKOV VYSSHEE TEKH UCHILIS IM
Original Assignee
MIN RADIOTEKH INST
MOSKOV VYSSHEE TEKH UCHILIS IM
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by MIN RADIOTEKH INST, MOSKOV VYSSHEE TEKH UCHILIS IM filed Critical MIN RADIOTEKH INST
Priority to GB7839318A priority Critical patent/GB2031163B/en
Publication of GB2031163A publication Critical patent/GB2031163A/en
Application granted granted Critical
Publication of GB2031163B publication Critical patent/GB2031163B/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • G05B23/0205Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0256Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults injecting test signals and analyzing monitored process response, e.g. injecting the test signal while interrupting the normal operation of the monitored system; superimposing the test signal onto a control signal during normal operation of the monitored system

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Tests Of Electronic Circuits (AREA)
GB7839318A 1978-10-04 1978-10-04 Method of testing Expired GB2031163B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB7839318A GB2031163B (en) 1978-10-04 1978-10-04 Method of testing

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB7839318A GB2031163B (en) 1978-10-04 1978-10-04 Method of testing

Publications (2)

Publication Number Publication Date
GB2031163A GB2031163A (en) 1980-04-16
GB2031163B true GB2031163B (en) 1983-01-12

Family

ID=10500122

Family Applications (1)

Application Number Title Priority Date Filing Date
GB7839318A Expired GB2031163B (en) 1978-10-04 1978-10-04 Method of testing

Country Status (1)

Country Link
GB (1) GB2031163B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114076883B (en) * 2021-11-10 2023-09-05 北京中电华大电子设计有限责任公司 Burn-in circuit, chip burn-in test method and chip

Also Published As

Publication number Publication date
GB2031163A (en) 1980-04-16

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee