GB1565218A - Electrical continuity and voltagetesting device - Google Patents
Electrical continuity and voltagetesting device Download PDFInfo
- Publication number
- GB1565218A GB1565218A GB53751/76A GB5375176A GB1565218A GB 1565218 A GB1565218 A GB 1565218A GB 53751/76 A GB53751/76 A GB 53751/76A GB 5375176 A GB5375176 A GB 5375176A GB 1565218 A GB1565218 A GB 1565218A
- Authority
- GB
- United Kingdom
- Prior art keywords
- probe
- voltage
- transistor
- circuit
- testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06788—Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/145—Indicating the presence of current or voltage
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/54—Testing for continuity
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Measurement Of Current Or Voltage (AREA)
Description
(54) ELECTRICAL CONTINUITY AND VOLTAGE
TESTING DEVICE
(71) We, MONO-PROBE COR
PORATION, a corporation organised and existing under the laws of the State of
California, United States of America, of 4205 Maycrest Avenue, Los Angeles,
California 90032, United States of America, do hereby declare the invention for which we pray that a patent may be granted to us, and the method by which it is to be performed, to be particularly described in and by the following statement:- This invention relates generally to circuit testing devices, and more particularly concerns apparatus to test for voltages and electrical continuity. The invention enables the use of two tester probes to change from continuity testing to voltage testing, no switching devices being required and with the further advantage that no damage or injury can occur to the device or the user. In addition, the presence of 120, 220 and 440 volts can be determined using a single probe, with sound or light indicators being activated, the use of a neutral or ground not being required. A sound indicator is usable to indicate continuity.
Electrical contractors and electricians must frequently determine whether or not voltage is present at a terminal, lead or line, as for example 120, 240 or 480 volts. If the outlet or terminal being tested is difficult to reach, the running of a separate ground line to accomplish the test becomes very difficult. Such workmen also frequently need to know if there is electrical continuity between two terminals: for example, if such continuity is lacking as between neutral and ground terminals at a receptacle, there is the possibility of break in the neutral wire.
It is an object of the present invention to provide a circuit testing device suitable for such uses.
The present invention is a circuit testing device, comprising a casing, two probes, one of which projects from the casing, a voltage testing circuit operatively connected with said one probe, and electrical continuity testing circuitry connected between said two probes said voltage testing circuit including a voltage indicator, a transistor amplifier connected with the indicator to energise same in response to different voltages applied to said one probe, the indicator being connected in the emittercollector circuit of the transistor amplifier, said one probe being operatively coupled via a rectifier network to the base electrode of said transistor amplifier and a D.C. voltage source directly connected with the emittercollector circuit of said transistor amplifier.
Embodiments of the present invention will now be described, by way of example, with reference to the accompanying drawings, in which: Fig. 1 is a perspective drawing of a testing device embodying the invention; and
Figs. 2 and 3 are circuit diagrams of testing devices embodying the invention.
Referring first to Fig. 1, the portable, insulative housing 10 is elongated, to be hand-carried. Probe 11 which projects from the housing end wall 10a is relatively rigid.
A second probe 12 is connected with the housing via flexible cable 12a and its handle 1 2b may be clip supported at 13 by the housing. The housing also carries a battery saving push-button switch 14, a buzzer or speaker 15, a voltage meter 100 and three lights 101, 102 and 103 to indicate different voltage levels as indicated.
In Fig. 2, the probe 11 is connected with a voltage level testing circuit generally indicated at 210; also, electrical continuity testing circuitry 211 is connected between the two probes 11 and 12.
Circuitry 211 includes a sounder 212 which comprises a coil 213 and speaker 214. Zener diode 215 is connected across the coil to establish a fixed voltage thereacross.
Battery 218 has its negative terminal connected in series with both the Zener and the coil, via terminal 216, and the battery positive terminal is connected with probe 12 via lead 219. Probe 11 is connected with the terminal 217 via diode 325, resistor 221 and diode bridge 222. The latter has a junction 223 connected with probe 11, negative junction 224 connected with the negative side of battery 227, junction 225 connected with resistor 221, and positive junction 226.
Circuitry 210 includes multiple voltage level indicators, such as lamps or lights 231-233, together with means operatively connected with the indicators to selectively energize them in response to different predetermined voltage levels applied to probe 11. Thus, lights 231-233 are successively illuminated when 120, 240 and 480 volts are applied to that probe. Selective energization means for the lights includes three amplifiers 234--236, as for example the illustrated semiconductor device which have emitter, base and collector electrodes, as shown. The collectors are directly connected with the lamps, and the opposite side terminals of the lamps are connected with the positive terminal of battery 227.
The lamp emitters are connected with the negative terminal of the same battery.
The selective energization means also includes three Zener diodes 241-243, each connected in series between probe 11 (via bridge junctions 223 and 226) and a common 244 to which the negative terminal of battery 227 is also connected.
Resistors 245-247 are also connected with the Zener. The amplifier base terminals are connected with the Zeners, as shown, via resistors 248-250, to voltage control the bases.
While no specific return path for current from the circuitry 210 has been made, the circuit as illustrated functions as described, and it is presumed that this is so because of inherent leakage or capacitive effects through the users body.
Also shown in Fig. 2 is a voltage indicating sounder 251, that includes coil 252 and speaker 253, and an energizing battery 254. A controller, such as semiconductor device or amplifier 255, effects battery energization of the sounder in response to voltage application to probe 11; thus, a rectifier bridge 256 has a first junction 257 connected with probe 11; second and third junctions 258 and 259 respectively connected with the base and emitter electrodes of the device 255; and a fourth junction 260 connected with a common 261 at the switch 262, as via resistor 263.
The collector terminal of device 255 is connected with the coil 252, the latter also connected with the battery via lead 264, switch button 265, and lead 266. The battery negative terminal is connected to the emitter terminal of device 255. When the push-button 265 is depressed so that the user's finger contacts the common 261, body capacitance of the user is connected via junction 260 and 258 with the base of device 255, switching it to CONDUCT mode, whereby the sounder will be energised if probe 11 has voltage applied to it. A lamp 270 across the coil 252 will also light up.
In Fig. 3, the probe Il is connected with a voltage level testing circuit generally indicated at 310; also electrical continuity testing circuitry 311 is connected between probes 11 and 12.
Circuitry 311 includes elements 312-315, 317-319, 321 and 425 corresponding to elements 212-215, 217-219, 221 and 325 in Fig. 2. Probe 11 is directly connected with resistor 321, via fuse 322, and a meter 423 is connected across resistor 321 to indicate the presence of current through same.
Circuitry 310 includes multiple voltage level indicators, such as three lamps or lights 331-333, together with means operatively connected with the indicators to selectively energise them in response to different predetermined voltage levels applied to probe 11. For example, lights 331-333 are successively illuminated when 120, 240 and 480 volts are applied to that probe. Again, the users body presumably provides the return path for the current.
Selective energization means for the lights includes three amplifiers, each including primary and secondary transistors, each of the latter having base, emitter and collector electrodes, as shown. Thus, the amplifier for light 331 includes the primary and secondary transistors 344 and 334; the amplifier for light 332 includes the primary and secondary transistors 345 and 335: and the amplifier for light 333 includes primary and secondary transistors 346 and 336. Each primary transistor is connected in controlling relation with its associated secondary transistor, as via the emitter to base connections 360-362; DC voltage means such as the 9-volt batteries 36" 366 are respectively connected in series with the emitter-collector indicator circuits of the transistor in each of the three amplifiers, and resistances 35(w352 are respectively connected between the emitters of the transistors 344--346 and the negative terminals of the batteries. The values of the resistors vary to enable succ.essive turn-on of the lights as the voltage on probe 11 is raised to the values discussed.
The one probe 11 is electrically connected with the base electrode of each of the transistors 344--346, as for example via the respective diode bridges 322, 372 and 382, as shown. The bridges are alike; each bridge has a first junction (see 323 for bridge 322) connected with the probe 11, as via resistor 370; the bridges have second junctions (see 326 for bridge 322) respectively connected with the base electrodes of the primary transistors; and the bridges have third junctions (see 324 for bridge 322) respectively connected with the battery negative terminals.
In the simpler device of Fig. 3, the brightness of the indicator lights is substantially enhanced over that of Fig. 2.
The transistors may each be identified by the designations 2N6426, and the resistors 350, 351 and 352 may have the values 900 ohms, 3,000 ohms and 11,000 ohms, respectively. These values are representative, only, and others may be used.
WHAT WE CLAIM IS:
1. A circuit testing device, comprising a casing, two probes, one of which projects from the casing, a voltage testing circuit operatively connected with said one probe, and electrical continuity testing circuitry connected between said two probes, said voltage testing circuit incuding a voltage indicator, a transistor amplifier connected with the indicator to energise same in response to different voltages applied to said one probe, the indicator being connected in the emitter-collector circuit of the transistor amplifier, said one probe being operatively coupled via a rectifier network to the base electrode of said transistor amplifier, and a D.C. voltage source directly connected with the emittercollector circuit of said transistor amplifier.
2. A device as claimed in claim 1, wherein said electrical continuity testing circuitry includes a sounder.
3. A device as claimed in claim 2, wherein the sounder includes a coil and said electrical continuity testing circuitry includes a zener diode connected across said coil, and a battery connected in series with said diode and coil.
4. A device as claime din claim 3 wherein the electrical continuity testing circuitry includes a meter connected in series with said coil and zener diode.
5. A device as claimed in claim 2, wherein said electrical continuity testing includes a diode bridge connected in series between said one probe and said sounder, in said continuity testing circuitry, said bridge also constituting said rectifier network in the voltage testing circuit.
6. A device as claimed in claim 1, wherein said indicator means includes multiple voltage level indicators.
7. A device as claimed in claim 6, wherein there are three of said indicators, and said transistor amplifier means includes three amplifiers respectively connected with said indicators to selectively energise same in response to 120, 240 and 480 volts respectively applied to said one probe.
8. A device as claimed in claim 7, wherein said voltage level testing circuit includes a gas discharge lamp and electrical resistance connected in series between said one probe and a common, and three photocells located to be illuminated by radiation from said lamp, said photocells being respectively connected with the three amplifiers.
9. A device as claimed in claim 7, wherein said voltage level testing circuit includes three zener diodes each connected in series between said one probe and a common, said amplifiers respectively connected with the three zener diodes to be responsive to different voltage levels established by said zener diodes.
10. A device as claimed in claim 9, wherein said voltage level testing circuit includes a sounder and a battery, and a controller connected with said battery and sounder and energisable in response to voltage application to said one probe to effect battery energisation of said sounder Il. A device as claimed in claim 10, including a switch connected in series between said battery and sounder.
12. A device as claimed in claim 10, wherein the controller comprises a semiconductor having base, emitter and collector terminals, and said voltage level testing circuit includes a rectifier bridge having a first junction connected with said one probe, second and third junctions connected with said base and emitter terminals, and a fourth junction connected with a common at the switch, the collector terminal connected with the sounder
13. A device as claimed in claim 7, wherein each of said amplifiers includes primary and secondary transistors each having base, emitter and collector electrodes, the primary transistor connected in controlling relation with the secondary transistor, each indicator connected in the emitter-collector circuit of the secondary transistor, the one probe electrically connected with the base electrode of each primary transistor, D.C. voltage means connected in series with the emittercollector circuit of each transistor, and a resistor connected between the emitter and said D.C. voltage means.
14. A device as claimed in claim 13, wherein the voltage level testing circuit includes three diode bridges each having a first junction connected with said one probe, the bridges having second junctions respectively connected with the base electrodes of the primary transistors, and the bridges having third junctions respectively connected with the D.C.
voltage means.
15. A circuit testing device, comprising a casing, two probes, one of which projects from the casing, a voltage level testing circuit operatively connected with said one probe, and electrical continuity testing circuitry connected between said two probes, said voltage level testing circuit
**WARNING** end of DESC field may overlap start of CLMS **.
Claims (16)
1. A circuit testing device, comprising a casing, two probes, one of which projects from the casing, a voltage testing circuit operatively connected with said one probe, and electrical continuity testing circuitry connected between said two probes, said voltage testing circuit incuding a voltage indicator, a transistor amplifier connected with the indicator to energise same in response to different voltages applied to said one probe, the indicator being connected in the emitter-collector circuit of the transistor amplifier, said one probe being operatively coupled via a rectifier network to the base electrode of said transistor amplifier, and a D.C. voltage source directly connected with the emittercollector circuit of said transistor amplifier.
2. A device as claimed in claim 1, wherein said electrical continuity testing circuitry includes a sounder.
3. A device as claimed in claim 2, wherein the sounder includes a coil and said electrical continuity testing circuitry includes a zener diode connected across said coil, and a battery connected in series with said diode and coil.
4. A device as claime din claim 3 wherein the electrical continuity testing circuitry includes a meter connected in series with said coil and zener diode.
5. A device as claimed in claim 2, wherein said electrical continuity testing includes a diode bridge connected in series between said one probe and said sounder, in said continuity testing circuitry, said bridge also constituting said rectifier network in the voltage testing circuit.
6. A device as claimed in claim 1, wherein said indicator means includes multiple voltage level indicators.
7. A device as claimed in claim 6, wherein there are three of said indicators, and said transistor amplifier means includes three amplifiers respectively connected with said indicators to selectively energise same in response to 120, 240 and 480 volts respectively applied to said one probe.
8. A device as claimed in claim 7, wherein said voltage level testing circuit includes a gas discharge lamp and electrical resistance connected in series between said one probe and a common, and three photocells located to be illuminated by radiation from said lamp, said photocells being respectively connected with the three amplifiers.
9. A device as claimed in claim 7, wherein said voltage level testing circuit includes three zener diodes each connected in series between said one probe and a common, said amplifiers respectively connected with the three zener diodes to be responsive to different voltage levels established by said zener diodes.
10. A device as claimed in claim 9, wherein said voltage level testing circuit includes a sounder and a battery, and a controller connected with said battery and sounder and energisable in response to voltage application to said one probe to effect battery energisation of said sounder
Il. A device as claimed in claim 10, including a switch connected in series between said battery and sounder.
12. A device as claimed in claim 10, wherein the controller comprises a semiconductor having base, emitter and collector terminals, and said voltage level testing circuit includes a rectifier bridge having a first junction connected with said one probe, second and third junctions connected with said base and emitter terminals, and a fourth junction connected with a common at the switch, the collector terminal connected with the sounder
13. A device as claimed in claim 7, wherein each of said amplifiers includes primary and secondary transistors each having base, emitter and collector electrodes, the primary transistor connected in controlling relation with the secondary transistor, each indicator connected in the emitter-collector circuit of the secondary transistor, the one probe electrically connected with the base electrode of each primary transistor, D.C. voltage means connected in series with the emittercollector circuit of each transistor, and a resistor connected between the emitter and said D.C. voltage means.
14. A device as claimed in claim 13, wherein the voltage level testing circuit includes three diode bridges each having a first junction connected with said one probe, the bridges having second junctions respectively connected with the base electrodes of the primary transistors, and the bridges having third junctions respectively connected with the D.C.
voltage means.
15. A circuit testing device, comprising a casing, two probes, one of which projects from the casing, a voltage level testing circuit operatively connected with said one probe, and electrical continuity testing circuitry connected between said two probes, said voltage level testing circuit
including a voltage level indicator, an amplifier connected with the indicator to energise same in response to different voltages applied to said one probe, the amplifier including primary and secondary transistor, the primary transistor being connected in controlling relation with the secondary transistor, the indicator being connected in the emitter-collector circuit of the secondary transistor, a diode bridge having a first junction connected with the one probe and a second junction connected with the base electrode of the primary transistor, and a D.C. voltage connected with a junction of said bridge and also connected with the emitter-collector circuits of said primary and secondary transistors.
16. A circuit testing device substantially as hereinbefore described with reference to, and as shown in, the accompanying drawings.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US05/645,386 US4015201A (en) | 1974-10-31 | 1975-12-30 | Electrical continuity and voltage testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB1565218A true GB1565218A (en) | 1980-04-16 |
Family
ID=24588818
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB53751/76A Expired GB1565218A (en) | 1975-12-30 | 1976-12-23 | Electrical continuity and voltagetesting device |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JPS5283264A (en) |
| DE (1) | DE2659363A1 (en) |
| GB (1) | GB1565218A (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3027398A1 (en) * | 1980-07-19 | 1982-02-18 | Dipl.Ing. Ulrich Knick Elektronische Meßgeräte GmbH & Co, 1000 Berlin | Electrical indicator deriving power from measurement current - using evaluation circuit consuming less than quiescent current |
| GB2215065A (en) * | 1988-02-09 | 1989-09-13 | Edwyn Paul Dark | Tapping-out meter unit |
| GB2217026A (en) * | 1988-01-20 | 1989-10-18 | Trolex Limited | Voltage sensor |
| EP2581750A1 (en) * | 2011-10-12 | 2013-04-17 | Fluke Corporation | Voltage tester having alternatively attachable or separable probes |
| EP2581749A1 (en) * | 2011-10-12 | 2013-04-17 | Fluke Corporation | Voltage tester having alternatively attachable or separable probes |
| US9121870B2 (en) | 2010-10-18 | 2015-09-01 | Milwaukee Electric Tool Corporation | Clamp meter with detachable clamp and clamp storage area |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE4119894C2 (en) * | 1991-06-17 | 1994-09-22 | Hubertus Schauerte | Tension meter |
| DE4302292A1 (en) * | 1993-01-28 | 1994-08-04 | Benning Elektrotechnik | Test device for the optional display of an electrical voltage or the passage of current through an electrical conductor |
-
1976
- 1976-12-23 GB GB53751/76A patent/GB1565218A/en not_active Expired
- 1976-12-28 JP JP16076376A patent/JPS5283264A/en active Pending
- 1976-12-29 DE DE19762659363 patent/DE2659363A1/en not_active Withdrawn
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3027398A1 (en) * | 1980-07-19 | 1982-02-18 | Dipl.Ing. Ulrich Knick Elektronische Meßgeräte GmbH & Co, 1000 Berlin | Electrical indicator deriving power from measurement current - using evaluation circuit consuming less than quiescent current |
| GB2217026A (en) * | 1988-01-20 | 1989-10-18 | Trolex Limited | Voltage sensor |
| GB2215065A (en) * | 1988-02-09 | 1989-09-13 | Edwyn Paul Dark | Tapping-out meter unit |
| US9121870B2 (en) | 2010-10-18 | 2015-09-01 | Milwaukee Electric Tool Corporation | Clamp meter with detachable clamp and clamp storage area |
| EP2581750A1 (en) * | 2011-10-12 | 2013-04-17 | Fluke Corporation | Voltage tester having alternatively attachable or separable probes |
| EP2581749A1 (en) * | 2011-10-12 | 2013-04-17 | Fluke Corporation | Voltage tester having alternatively attachable or separable probes |
| US9030220B2 (en) | 2011-10-12 | 2015-05-12 | Fluke Corporation | Voltage tester having alternatively attachable or separable probes |
| US9423417B2 (en) | 2011-10-12 | 2016-08-23 | Fluke Corporation | Voltage tester having alternatively attachable or separable probes |
Also Published As
| Publication number | Publication date |
|---|---|
| DE2659363A1 (en) | 1977-07-14 |
| JPS5283264A (en) | 1977-07-12 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PS | Patent sealed | ||
| PCNP | Patent ceased through non-payment of renewal fee |