GB1521614A - Apparatus for testing circuit elements - Google Patents
Apparatus for testing circuit elementsInfo
- Publication number
- GB1521614A GB1521614A GB716276A GB716276A GB1521614A GB 1521614 A GB1521614 A GB 1521614A GB 716276 A GB716276 A GB 716276A GB 716276 A GB716276 A GB 716276A GB 1521614 A GB1521614 A GB 1521614A
- Authority
- GB
- United Kingdom
- Prior art keywords
- substrate
- conductive
- input
- tracks
- contact areas
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
1521614 Electrical testing INTERNATIONAL COMPUTERS Ltd 17 Feb 1977 [24 Feb 1976] 07162/76 Heading H2E Apparatus for testing an integrated circuit element includes a substrate 1 carrying on an electrically insulating surface an array of contact areas 9 for contacting connections of the element being tested, each of at least some of the contact areas 9 being connected to a conductive input track 3andtoa conductive output track 8, which input track 3 is interrupted and bridged by a diode 6 closely adjacent the associated contact area 9. In one embodiment, one side of a substrate 1 is provided with conductive output tracks 8 terminating at one end in connectors 7 and at the opposite end in contact areas 9 which are adapted to contact the connection pins of an integrated circuit element positioned, when being tested, in an aperture 2. The contact areas 9 of the output tracks 8 are connected by through plated holes 13 to conductive input tracks 3 provided on the opposite side of the substrate 1. The input tracks 3 are provided at one end with connectors 4 and near the opposite end with interruptions 5 which are spurned by diode chips 6. The substrate 1 is also provided with an internal conductive earth plate 11 having a connector 12. The input and output tracks 3, 8 may be provided on the same side of the substrate 1. A multilayered construction may be provided.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB716276A GB1521614A (en) | 1977-02-17 | 1977-02-17 | Apparatus for testing circuit elements |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB716276A GB1521614A (en) | 1977-02-17 | 1977-02-17 | Apparatus for testing circuit elements |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1521614A true GB1521614A (en) | 1978-08-16 |
Family
ID=9827809
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB716276A Expired GB1521614A (en) | 1977-02-17 | 1977-02-17 | Apparatus for testing circuit elements |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB1521614A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2130383A (en) * | 1982-09-14 | 1984-05-31 | Risho Kogyo Kk | Test board for semiconductor packages |
GB2176063A (en) * | 1985-05-22 | 1986-12-10 | Michael Frederick Horgan | A probe card |
US4731577A (en) * | 1987-03-05 | 1988-03-15 | Logan John K | Coaxial probe card |
US4749362A (en) * | 1980-11-24 | 1988-06-07 | The Johns Hopkins University | Short-circuit-proof connector clip for a multiterminal circuit |
US4870356A (en) * | 1987-09-30 | 1989-09-26 | Digital Equipment Corporation | Multi-component test fixture |
-
1977
- 1977-02-17 GB GB716276A patent/GB1521614A/en not_active Expired
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4749362A (en) * | 1980-11-24 | 1988-06-07 | The Johns Hopkins University | Short-circuit-proof connector clip for a multiterminal circuit |
GB2130383A (en) * | 1982-09-14 | 1984-05-31 | Risho Kogyo Kk | Test board for semiconductor packages |
GB2176063A (en) * | 1985-05-22 | 1986-12-10 | Michael Frederick Horgan | A probe card |
US4731577A (en) * | 1987-03-05 | 1988-03-15 | Logan John K | Coaxial probe card |
US4870356A (en) * | 1987-09-30 | 1989-09-26 | Digital Equipment Corporation | Multi-component test fixture |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4837507A (en) | High frequency in-circuit test fixture | |
KR850005031A (en) | Electrical connector with flexible circuit with impedance control | |
US4716500A (en) | Probe cable assembly | |
GB1399006A (en) | Circuit boards | |
ES478107A1 (en) | Electrical connector for use in mounting an electronic device on a substrate. | |
CA1130876A (en) | High-frequency etched circuit board connection method | |
KR920702188A (en) | Function unit | |
MY107698A (en) | High packing density module board and electronic device having such module board | |
US5199887A (en) | Surface mounting connector | |
EP0001897A3 (en) | Electrical connector including an elastomeric connecting element | |
EP0298219A3 (en) | Method and apparatus for testing unpackaged integrated circuits in a hybrid circuit environment | |
GB1521614A (en) | Apparatus for testing circuit elements | |
EP0213046A3 (en) | Electronic card connecting circuit | |
KR100272715B1 (en) | Probe unit and inspection head | |
HK20179A (en) | Substrate connector | |
KR930023825A (en) | Probe for In-Circuit Emulators with Flexible Printed Circuit Boards | |
JPS60142590A (en) | Device for continuously inspecting printing circuit | |
JPS5732661A (en) | Module of semiconductor element having high density | |
MY115876A (en) | Electronic component connector | |
WO2000004585A3 (en) | Chip carrier device and method for the production of a chip carrier device with an electrical test | |
JPS5487070A (en) | Simultaneous multi-contact probe | |
WO1982001803A1 (en) | Multiple terminal two conductor layer burn-in tape | |
ATE48038T1 (en) | TEST ADAPTER. | |
CH609526GA3 (en) | ||
EP0333446A3 (en) | Connecting structure for connecting conductors in an electronic apparatus |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PS | Patent sealed | ||
PCNP | Patent ceased through non-payment of renewal fee |