GB1480289A - Measuring the sharpness of images - Google Patents

Measuring the sharpness of images

Info

Publication number
GB1480289A
GB1480289A GB4167574A GB4167574A GB1480289A GB 1480289 A GB1480289 A GB 1480289A GB 4167574 A GB4167574 A GB 4167574A GB 4167574 A GB4167574 A GB 4167574A GB 1480289 A GB1480289 A GB 1480289A
Authority
GB
United Kingdom
Prior art keywords
image
film
sharpness
strain wave
modulation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB4167574A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Research Corp
Original Assignee
Research Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Research Corp filed Critical Research Corp
Publication of GB1480289A publication Critical patent/GB1480289A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/28Systems for automatic generation of focusing signals
    • G02B7/36Systems for automatic generation of focusing signals using image sharpness techniques, e.g. image processing techniques for generating autofocus signals
    • G02B7/365Systems for automatic generation of focusing signals using image sharpness techniques, e.g. image processing techniques for generating autofocus signals by analysis of the spatial frequency components of the image
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/40Optical focusing aids

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Focusing (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Automatic Focus Adjustment (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

1480289 Photo-electric measurement of image sharpness RESEARCH CORP 25 Sept 1974 [17 Jan 1974] 41675/74 Heading G1A [Also in Division G2] To detect the sharpness of an image it is projected on to a transducer comprising a medium whose electrical properties vary with the incident image and also with a strain wave in the medium, and the modulation of the electrical properties at the strain wave frequency is observed. The basic transducer is described in Specification 1445119 (see Division H3-5). In Fig. 1 the medium is a CdS film 22 on a quartz substrate 20; a generator 26 establishes a strain wave 28 on the substrate, the wavelength being greater than the desired sharpness resolution but less than the size of the image projected from source 44. The wave frequency is for example 3-8 MHz. Contacts 24a, 24b allow the film resistance to be monitored by applying a constant bias voltage to it from supply 32. The D.C. current measured at 34 corresponds to a conventional measure of image intensity, while the modulation at the strain wave frequency measured at 42 is a function of image sharpness. In variations of this basic arrangement the film electrodes may be inter-digitated or curved, and the film may be thicker at its central region than elsewhere Figs. 8, 9 (not shown); these latter two arrangements allow the sharpness of images of low intensity or of low contrast to be detected. Two dimensional measurements can be made by using two generators whose waves intersect at the film, or by using two films angled with respect to one another, Figs. 7, 13 (not shown). It is also possible to replace the film with a tunnel barrier formed by a thin oxide layer between two aluminium films on a glass substrate, Fig. 10 (not shown); the film may also be replaced by a degenerate semi-conductor or a metal, or a photoemissive cathode and a collector plate. In all these arrangements the detected modulation is a maximum when the image is at its sharpest, Figs. 5, 6 (not shown). This can be used to automatically focus a slide projector, either by projecting the image on to a screen behind which is a focusing system and a Fig. 1 detector, Figs. 3, 4 (not shown), or by having a beamsplitter in the projector such that the image on the screen is reflected back into the projector and thence via the splitter to a Fig. 1 detector, Fig. 12 (not shown). The modulation can also be used to focus an SLR camera as in Fig. 11, where the SLR mirror directs the image on to the viewing screen 72 which carries a CdS film 22 and receives a strain wave from 26; a meter 34 acts as a conventional exposure meter while the tuned detector output can be displayed at 81 for manual focusing or can drive a lens setting motor 84.
GB4167574A 1974-01-17 1974-09-25 Measuring the sharpness of images Expired GB1480289A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US43410274A 1974-01-17 1974-01-17

Publications (1)

Publication Number Publication Date
GB1480289A true GB1480289A (en) 1977-07-20

Family

ID=23722844

Family Applications (1)

Application Number Title Priority Date Filing Date
GB4167574A Expired GB1480289A (en) 1974-01-17 1974-09-25 Measuring the sharpness of images

Country Status (5)

Country Link
JP (1) JPS50104644A (en)
AT (1) AT370887B (en)
CA (1) CA1021183A (en)
DE (1) DE2447914C3 (en)
GB (1) GB1480289A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112762993A (en) * 2020-12-29 2021-05-07 深圳市韦德勋光电科技有限公司 Detection device for raw material of LCD logic board substrate and use method

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5629215A (en) * 1979-08-15 1981-03-24 Konishiroku Photo Ind Co Ltd Focus detector

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3689772A (en) * 1971-08-18 1972-09-05 Litton Systems Inc Photodetector light pattern detector

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112762993A (en) * 2020-12-29 2021-05-07 深圳市韦德勋光电科技有限公司 Detection device for raw material of LCD logic board substrate and use method
CN112762993B (en) * 2020-12-29 2021-10-08 深圳市韦德勋光电科技有限公司 Detection device for raw material of LCD logic board substrate and use method

Also Published As

Publication number Publication date
DE2447914A1 (en) 1975-07-31
DE2447914B2 (en) 1979-07-12
CA1021183A (en) 1977-11-22
JPS50104644A (en) 1975-08-18
AT370887B (en) 1983-05-10
DE2447914C3 (en) 1980-03-20
ATA821374A (en) 1982-05-15

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Legal Events

Date Code Title Description
PS Patent sealed
PCNP Patent ceased through non-payment of renewal fee