GB1461866A - Measurement of optical properties of surfaces - Google Patents

Measurement of optical properties of surfaces

Info

Publication number
GB1461866A
GB1461866A GB4146874A GB4146874A GB1461866A GB 1461866 A GB1461866 A GB 1461866A GB 4146874 A GB4146874 A GB 4146874A GB 4146874 A GB4146874 A GB 4146874A GB 1461866 A GB1461866 A GB 1461866A
Authority
GB
United Kingdom
Prior art keywords
retro
reflected
radiation
sept
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB4146874A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ross A R L
Original Assignee
Ross A R L
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ross A R L filed Critical Ross A R L
Priority to GB4146874A priority Critical patent/GB1461866A/en
Publication of GB1461866A publication Critical patent/GB1461866A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/57—Measuring gloss

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optical Elements Other Than Lenses (AREA)

Abstract

1461866 Reflectometers A R L ROSS 18 Sept 1975 [24 Sept 1974] 41468/74 Heading G2J Surface roughness is measured by an optical system in which light from source e is reflected from a first test surface S on to a second test surface S (in Fig. 2, the two surfaces are identical) e.g. by the use of a retro-reflecting sheet R. The arrangement is such that translation and/or rotation of the surfaces S has substantially no effect on the positional and/or angular distribution of reflected radiation in the regions where it is measured. Roughness may be assessed according to:- (1) The spread of reflected radiation about the specular direction, (2) The variation in reflectivity with wavelength, or (3) the depolarisation of the radiation. In Fig. 3 (not shown) the retro-reflecting sheet R of Fig. 2 is replaced by a cube-corner reflector and in Fig. 4 (not shown) by an array of cubecorners. In Fig. 5 (not shown) the two test surfaces form a corner reflector. In Fig. 6 (not shown) a polarizer and an analyzer are added to the system of Fig. 2 while in Fig. 7 (not shown) an optical modulator is used to separate the retro-reflected signal from that due to diffusely reflected radiation.
GB4146874A 1974-09-24 1974-09-24 Measurement of optical properties of surfaces Expired GB1461866A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB4146874A GB1461866A (en) 1974-09-24 1974-09-24 Measurement of optical properties of surfaces

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB4146874A GB1461866A (en) 1974-09-24 1974-09-24 Measurement of optical properties of surfaces

Publications (1)

Publication Number Publication Date
GB1461866A true GB1461866A (en) 1977-01-19

Family

ID=10419826

Family Applications (1)

Application Number Title Priority Date Filing Date
GB4146874A Expired GB1461866A (en) 1974-09-24 1974-09-24 Measurement of optical properties of surfaces

Country Status (1)

Country Link
GB (1) GB1461866A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0152894A2 (en) * 1984-02-20 1985-08-28 Siemens Aktiengesellschaft Device for optically detecting local inhomogeneities in the structure of tested objects
DE3427838A1 (en) * 1984-07-27 1986-02-06 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch ROUGHNESS PROBE
DE3733041A1 (en) * 1987-09-30 1989-04-13 Siemens Ag TEST DEVICE FOR DETECTING SPATIAL IRREGULARITIES IN THE SURFACE STRUCTURE OF AN OBJECT
US5168322A (en) * 1991-08-19 1992-12-01 Diffracto Ltd. Surface inspection using retro-reflective light field
US5206700A (en) * 1985-03-14 1993-04-27 Diffracto, Ltd. Methods and apparatus for retroreflective surface inspection and distortion measurement
WO2004010094A1 (en) * 2002-07-19 2004-01-29 Luxtron Corporation Emissivity corrected radiation pyrometer integral with a reflectometer and roughness sensor for remote measuring of true surface temperatures

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0152894A2 (en) * 1984-02-20 1985-08-28 Siemens Aktiengesellschaft Device for optically detecting local inhomogeneities in the structure of tested objects
EP0152894A3 (en) * 1984-02-20 1987-05-06 Siemens Aktiengesellschaft Berlin Und Munchen Device for optically detecting local inhomogeneities in the structure of tested objects
DE3427838A1 (en) * 1984-07-27 1986-02-06 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch ROUGHNESS PROBE
US5206700A (en) * 1985-03-14 1993-04-27 Diffracto, Ltd. Methods and apparatus for retroreflective surface inspection and distortion measurement
DE3733041A1 (en) * 1987-09-30 1989-04-13 Siemens Ag TEST DEVICE FOR DETECTING SPATIAL IRREGULARITIES IN THE SURFACE STRUCTURE OF AN OBJECT
US5168322A (en) * 1991-08-19 1992-12-01 Diffracto Ltd. Surface inspection using retro-reflective light field
WO2004010094A1 (en) * 2002-07-19 2004-01-29 Luxtron Corporation Emissivity corrected radiation pyrometer integral with a reflectometer and roughness sensor for remote measuring of true surface temperatures

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Legal Events

Date Code Title Description
PS Patent sealed
PCNP Patent ceased through non-payment of renewal fee