GB1444098A - Electron microscopes - Google Patents

Electron microscopes

Info

Publication number
GB1444098A
GB1444098A GB2986173A GB2986173A GB1444098A GB 1444098 A GB1444098 A GB 1444098A GB 2986173 A GB2986173 A GB 2986173A GB 2986173 A GB2986173 A GB 2986173A GB 1444098 A GB1444098 A GB 1444098A
Authority
GB
United Kingdom
Prior art keywords
lens
electrode
anode
image
potential
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB2986173A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Publication of GB1444098A publication Critical patent/GB1444098A/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • H01J37/06Electron sources; Electron guns
    • H01J37/073Electron guns using field emission, photo emission, or secondary emission electron sources

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Sources, Ion Sources (AREA)

Abstract

1444098 Electron microscopes SIEMENS AG 10 July 1973 [10 Julv 1972] 29861/73 Heading H1D An electron microscope comprises an auxiliary lens to produce a first image 9 of the cathode source at a fixed point between first anode 2 and a further lens provided to provide an image 12 of the first image, the further lens comprising acceleration electrode 3 in combination with further electrode 5 whose potential varies linearly proportionally with any variation in the acceleration voltage, the further lens thus acting to maintain the second image substantially unaffected by D.C. voltage supply variations, and in which the auxiliary lens is a single electrostatic lens with a centre electrode 4 maintained at a potential which varies linearly proportionally with any variation in the first anode voltage, separate voltage sources 6 and 7 being used for the acceleration electrode 3 and first anode 2. The proportional variations are obtained by potentiometers 8 and 10. The auxiliary lens may be a magnetic lens whose excitation current varies proportionally to the square root of any anode voltage variations (Fig. 2, not shown) which may use comparator (20) between source (17) and computer source (19) with resistor (18). Electrode 5 potential may be 0À5 V B in which case electrodes 2 and 5 form a lens, although virtually without effect for a cross over at the lens centre particularly when electrode 5 potential equals that of anode 2. Electrode potentials are specified. Cathode 1 as a field emission cathode may be cold, or also heated.
GB2986173A 1972-07-10 1973-07-10 Electron microscopes Expired GB1444098A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2234381A DE2234381C3 (en) 1972-07-10 1972-07-10 Electron beam lighting system

Publications (1)

Publication Number Publication Date
GB1444098A true GB1444098A (en) 1976-07-28

Family

ID=5850513

Family Applications (1)

Application Number Title Priority Date Filing Date
GB2986173A Expired GB1444098A (en) 1972-07-10 1973-07-10 Electron microscopes

Country Status (5)

Country Link
US (1) US3862419A (en)
JP (1) JPS5429075B2 (en)
DE (1) DE2234381C3 (en)
GB (1) GB1444098A (en)
NL (1) NL7309348A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2215907A (en) * 1987-07-14 1989-09-27 Jeol Ltd Charged particle apparatus

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3204897A1 (en) * 1982-02-12 1983-08-25 Siemens AG, 1000 Berlin und 8000 München BODY RADIATOR GENERATING SYSTEM AND METHOD FOR ITS OPERATION
US4426583A (en) * 1982-05-10 1984-01-17 International Business Machines Corporation Electron beam potential switching apparatus
FR2527383A1 (en) * 1982-05-24 1983-11-25 Univ Reims Champagne Ardenne ELECTRON GUN WITH FIELD EMISSION CATHODE AND MAGNETIC LENS
JPH0619960B2 (en) * 1986-12-27 1994-03-16 日本電子株式会社 Electron beam apparatus having thermal field emission electron source
JP3998556B2 (en) * 2002-10-17 2007-10-31 株式会社東研 High resolution X-ray microscope
US7218703B2 (en) * 2003-11-21 2007-05-15 Tohken Co., Ltd. X-ray microscopic inspection apparatus

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3678333A (en) * 1970-06-15 1972-07-18 American Optical Corp Field emission electron gun utilizing means for protecting the field emission tip from high voltage discharges
JPS494972A (en) * 1972-04-26 1974-01-17

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2215907A (en) * 1987-07-14 1989-09-27 Jeol Ltd Charged particle apparatus
GB2215907B (en) * 1987-07-14 1992-04-15 Jeol Ltd Apparatus using a charged-particle beam

Also Published As

Publication number Publication date
DE2234381B2 (en) 1975-02-27
JPS5429075B2 (en) 1979-09-20
JPS4946670A (en) 1974-05-04
NL7309348A (en) 1974-01-14
US3862419A (en) 1975-01-21
DE2234381A1 (en) 1974-01-31
DE2234381C3 (en) 1975-10-16

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PCNP Patent ceased through non-payment of renewal fee