GB1328838A - Vapour reaction apparatus - Google Patents

Vapour reaction apparatus

Info

Publication number
GB1328838A
GB1328838A GB6072670A GB6072670A GB1328838A GB 1328838 A GB1328838 A GB 1328838A GB 6072670 A GB6072670 A GB 6072670A GB 6072670 A GB6072670 A GB 6072670A GB 1328838 A GB1328838 A GB 1328838A
Authority
GB
United Kingdom
Prior art keywords
chamber
baffle
gas
whole
reaction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB6072670A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of GB1328838A publication Critical patent/GB1328838A/en
Expired legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B25/00Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
    • C30B25/02Epitaxial-layer growth
    • C30B25/08Reaction chambers; Selection of materials therefor
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/458Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
    • C23C16/4582Rigid and flat substrates, e.g. plates or discs
    • C23C16/4587Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially vertically
    • C23C16/4588Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially vertically the substrate being rotated
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B25/00Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
    • C30B25/02Epitaxial-layer growth
    • C30B25/14Feed and outlet means for the gases; Modifying the flow of the reactive gases

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Mechanical Engineering (AREA)
  • Chemical Vapour Deposition (AREA)

Abstract

1328838 Depositing by reaction from vapour; apparatus INTERNATIONAL BUSINESS MACHINES CORP 22 Dec 1970 [2 Jan 1970] 60726/70 Heading C7F [Also in Division C1] A vapour reaction apparatus includes a tubular reaction chamber, a gas inlet distribution baffle extended across substantially the whole cross-sectional area of one end of the chamber and providing sufficient resistance to gaseous phase material to develop a substantially uniform back pressure and to deliver a substantially uniform flow of gas with a planar velocity front over substantially the whole crosssection of the chamber, and a gas exit pressure baffle extending across substantially the whole area of the other end of the chamber to provide uniform gas resistance thereover. The apparatus may be used for the reduction of silicon tetrafluoride by hydrogen. In the Figure is shown a vapour deposition reactor 10 comprising an opaque quartz cylinder 12 capped at both ends by hollow plates 14 and 16 made of stainless steel through which cooling water may be circulated and defining a reaction chamber 18. The reaction chamber may be 9 inches in diameter and 18 inches high. Tie rods 20, with the aid of O-rings 22 and 24 enable the chamber 18 to be made air-tight. The lower plates 16 and O-ring 24 are attached to a hydraulic cylinder which opens and closes the reactor. In the chamber 18 is a substrate holder, graphite susceptor 28, mounted on a fusedquartz rod 26, having mounted around its circumference and substantially parallel to the longitudinal axis of the chamber defined by rod 26 a plurality of substrates 30 upon which the deposition is desired. The susceptor may be mounted on the rod 26 by a star plate. Supported by the top plate 14 and extending the whole of the cross-section of the chamber there is provided a gaseous phase inlet means including a distribution baffle 38, which forms with the plate 14 a first plenum 36. Gaseous materials 32 are introduced through tube 34 to 36 and are evenly delivered over the whole of the crosssectional area of the reaction chamber 18. The gas distribution baffle 38 may be a perforated plate or a sintered material having a gas resistance sufficient to develop uniform back pressure to maintain even gas distribution over the entire surface area of the baffle. A heat shield 40 may be mounted on the reaction chamber outside the baffle 38 to reflect the radiation from the heat receptor 28. 40 is a thin plate of stainless steel or molybdenum. Gaseous materials having passed through the heat shield 40 enter chamber 18 having a planar velocity front. After passing over the susceptor 28 reactant gases leave the bottom of the chamber through an exit pressure baffle 42 also of sintered or porous material. Preferably, the porosity of baffle 42 is greater than that of baffle 38. Exhaust gases pass through the second plenum 48 and exhaust tubes 50 to the atmosphere or to a reclamation process. To heat the substrate an RF source is preferred although a resistance heater may be used.
GB6072670A 1970-01-02 1970-12-22 Vapour reaction apparatus Expired GB1328838A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US34470A 1970-01-02 1970-01-02

Publications (1)

Publication Number Publication Date
GB1328838A true GB1328838A (en) 1973-09-05

Family

ID=21691104

Family Applications (1)

Application Number Title Priority Date Filing Date
GB6072670A Expired GB1328838A (en) 1970-01-02 1970-12-22 Vapour reaction apparatus

Country Status (7)

Country Link
US (1) US3603284A (en)
JP (1) JPS4822902B1 (en)
CA (1) CA922502A (en)
CH (1) CH516342A (en)
DE (1) DE2049229A1 (en)
FR (1) FR2075031A5 (en)
GB (1) GB1328838A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4501766A (en) * 1982-02-03 1985-02-26 Tokyo Shibaura Denki Kabushiki Kaisha Film depositing apparatus and a film depositing method
GB2194966A (en) * 1986-08-20 1988-03-23 Gen Electric Plc Deposition of films

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US3865072A (en) * 1973-10-18 1975-02-11 Hls Ind Apparatus for chemically depositing epitaxial layers on semiconductor substrates
JPS5517018Y2 (en) * 1974-03-20 1980-04-21
DE2943634C2 (en) * 1979-10-29 1983-09-29 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt Epitaxial reactor
US4322592A (en) * 1980-08-22 1982-03-30 Rca Corporation Susceptor for heating semiconductor substrates
US4365588A (en) * 1981-03-13 1982-12-28 Rca Corporation Fixture for VPE reactor
US4496828A (en) * 1983-07-08 1985-01-29 Ultra Carbon Corporation Susceptor assembly
US4615294A (en) * 1984-07-31 1986-10-07 Hughes Aircraft Company Barrel reactor and method for photochemical vapor deposition
US4597986A (en) * 1984-07-31 1986-07-01 Hughes Aircraft Company Method for photochemical vapor deposition
US4638762A (en) * 1985-08-30 1987-01-27 At&T Technologies, Inc. Chemical vapor deposition method and apparatus
JPS63186875A (en) * 1987-01-29 1988-08-02 Tadahiro Omi Surface reaction film forming device
DE3707672A1 (en) * 1987-03-10 1988-09-22 Sitesa Sa EPITAXY SYSTEM
US5002011A (en) * 1987-04-14 1991-03-26 Kabushiki Kaisha Toshiba Vapor deposition apparatus
US4997677A (en) * 1987-08-31 1991-03-05 Massachusetts Institute Of Technology Vapor phase reactor for making multilayer structures
KR890008922A (en) * 1987-11-21 1989-07-13 후세 노보루 Heat treatment device
DE3816788A1 (en) * 1988-05-17 1989-11-23 Siemens Ag Epitaxy apparatus
US5821175A (en) * 1988-07-08 1998-10-13 Cauldron Limited Partnership Removal of surface contaminants by irradiation using various methods to achieve desired inert gas flow over treated surface
WO1990010092A1 (en) * 1989-02-24 1990-09-07 Massachusetts Institute Of Technology A modified stagnation flow apparatus for chemical vapor deposition providing excellent control of the deposition
JP2888253B2 (en) * 1989-07-20 1999-05-10 富士通株式会社 Chemical vapor deposition and apparatus for its implementation
FR2670507B1 (en) * 1990-12-18 1993-12-31 Propulsion Ste Europeenne CHEMICAL STEAM INFILTRATION PROCESS.
US5268034A (en) * 1991-06-25 1993-12-07 Lsi Logic Corporation Fluid dispersion head for CVD appratus
US5286519A (en) * 1991-06-25 1994-02-15 Lsi Logic Corporation Fluid dispersion head
US5494522A (en) * 1993-03-17 1996-02-27 Tokyo Electron Limited Plasma process system and method
US5522933A (en) * 1994-05-19 1996-06-04 Geller; Anthony S. Particle-free microchip processing
KR100294057B1 (en) * 1995-08-22 2001-09-17 모리시타 요이찌 Semiconductor device comprising a silicon structure layer, method and method of manufacturing the layer and solar cell using the layer
US6194030B1 (en) 1999-03-18 2001-02-27 International Business Machines Corporation Chemical vapor deposition velocity control apparatus
IT1312150B1 (en) * 1999-03-25 2002-04-09 Lpe Spa IMPROVED REACTION CHAMBER FOR EPITAXIAL REACTOR
TW460942B (en) * 1999-08-31 2001-10-21 Mitsubishi Material Silicon CVD device, purging method, method for determining maintenance time for a semiconductor making device, moisture content monitoring device, and semiconductor making device with such moisture content monitoring device
US6475284B1 (en) * 1999-09-20 2002-11-05 Moore Epitaxial, Inc. Gas dispersion head
US6331212B1 (en) * 2000-04-17 2001-12-18 Avansys, Llc Methods and apparatus for thermally processing wafers
US6660126B2 (en) * 2001-03-02 2003-12-09 Applied Materials, Inc. Lid assembly for a processing system to facilitate sequential deposition techniques
KR100515052B1 (en) * 2002-07-18 2005-09-14 삼성전자주식회사 semiconductor manufacturing apparatus for depositing a material on semiconductor substrate
US8328939B2 (en) * 2004-05-12 2012-12-11 Applied Materials, Inc. Diffuser plate with slit valve compensation
US7794667B2 (en) * 2005-10-19 2010-09-14 Moore Epitaxial, Inc. Gas ring and method of processing substrates
US9101898B2 (en) 2006-03-29 2015-08-11 Robert M. Zubrin Portable gas generating device
US9441295B2 (en) * 2010-05-14 2016-09-13 Solarcity Corporation Multi-channel gas-delivery system
US9240513B2 (en) 2010-05-14 2016-01-19 Solarcity Corporation Dynamic support system for quartz process chamber
JP2012195565A (en) * 2011-02-28 2012-10-11 Hitachi Kokusai Electric Inc Substrate processing apparatus, substrate processing method, and manufacturing method of semiconductor device
CN103628039A (en) * 2012-08-28 2014-03-12 北京北方微电子基地设备工艺研究中心有限责任公司 MOCVD reaction chamber and MOCVD apparatus
CN103898473A (en) * 2012-12-27 2014-07-02 北京北方微电子基地设备工艺研究中心有限责任公司 Process reaction chamber and process equipment
CN104233225B (en) * 2013-06-17 2017-03-22 北京北方微电子基地设备工艺研究中心有限责任公司 Reaction chamber and semiconductor treating equipment with same
EP3061845B1 (en) * 2015-02-03 2018-12-12 LG Electronics Inc. Metal organic chemical vapor deposition apparatus for solar cell
MX359183B (en) 2015-02-17 2018-09-17 Solarcity Corp Method and system for improving solar cell manufacturing yield.
US9972740B2 (en) 2015-06-07 2018-05-15 Tesla, Inc. Chemical vapor deposition tool and process for fabrication of photovoltaic structures
CN108140550B (en) * 2015-10-08 2022-10-14 应用材料公司 Showerhead with reduced backside plasma ignition
US9748434B1 (en) 2016-05-24 2017-08-29 Tesla, Inc. Systems, method and apparatus for curing conductive paste
US9954136B2 (en) 2016-08-03 2018-04-24 Tesla, Inc. Cassette optimized for an inline annealing system
US10115856B2 (en) 2016-10-31 2018-10-30 Tesla, Inc. System and method for curing conductive paste using induction heating

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US2378476A (en) * 1943-02-11 1945-06-19 American Optical Corp Coating apparatus
US2489127A (en) * 1947-06-14 1949-11-22 Rca Corp High capacitance target
BE515457A (en) * 1951-11-10
GB760328A (en) * 1953-06-10 1956-10-31 Erie Resistor Ltd Improvements in and relating to a process and apparatus for the production of thin deposits upon a support by decomposition of a gaseous material
NL265823A (en) * 1960-06-13
NL6700080A (en) * 1966-01-03 1967-07-04
US3397094A (en) * 1965-03-25 1968-08-13 James E. Webb Method of changing the conductivity of vapor deposited gallium arsenide by the introduction of water into the vapor deposition atmosphere
US3424629A (en) * 1965-12-13 1969-01-28 Ibm High capacity epitaxial apparatus and method
US3517643A (en) * 1968-11-25 1970-06-30 Sylvania Electric Prod Vapor deposition apparatus including diffuser means

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4501766A (en) * 1982-02-03 1985-02-26 Tokyo Shibaura Denki Kabushiki Kaisha Film depositing apparatus and a film depositing method
GB2194966A (en) * 1986-08-20 1988-03-23 Gen Electric Plc Deposition of films

Also Published As

Publication number Publication date
JPS4822902B1 (en) 1973-07-10
CA922502A (en) 1973-03-13
FR2075031A5 (en) 1971-10-08
US3603284A (en) 1971-09-07
CH516342A (en) 1971-12-15
DE2049229A1 (en) 1971-07-08

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PCNP Patent ceased through non-payment of renewal fee