GB1246101A - Integrated circuit testing - Google Patents

Integrated circuit testing

Info

Publication number
GB1246101A
GB1246101A GB5087868A GB5087868A GB1246101A GB 1246101 A GB1246101 A GB 1246101A GB 5087868 A GB5087868 A GB 5087868A GB 5087868 A GB5087868 A GB 5087868A GB 1246101 A GB1246101 A GB 1246101A
Authority
GB
United Kingdom
Prior art keywords
connector
component
clips
projections
contacts
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB5087868A
Inventor
Ronald Henry Trickey
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ELECTROSIL Ltd
Original Assignee
ELECTROSIL Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ELECTROSIL Ltd filed Critical ELECTROSIL Ltd
Priority to GB5087868A priority Critical patent/GB1246101A/en
Publication of GB1246101A publication Critical patent/GB1246101A/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/62—Means for facilitating engagement or disengagement of coupling parts or for holding them in engagement
    • H01R13/627—Snap or like fastening
    • H01R13/6275—Latching arms not integral with the housing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0425—Test clips, e.g. for IC's
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

1,246,101. Two-part couplings. ELECTROSIL Ltd. 23 Oct., 1969 [25 Oct., 1968], No. 50878/68. Heading H2E. [Also in Division G1] A connector for testing dual-in-line integrated circuit components which are attached to a circuit board (3, Figs. 1 and 2, not shown) by their terminals (2) has a moulded plastics body 4 with a channel to receive a body (1) of a component and two opposed rows of resilient contacts 12 which are separated and insulated by projections 14 of the body 4. Moulded clips 5 are pivotally connected to the body 4 so that their upper ends may be squeezed together causing deflection of blades 7 and allowing the connector to be clipped over the component and to be retained by projections 9 on the clips 5 when the latter are released. The opening of the clips is limited by their abutment surfaces 8 to ensure correct alignment with the component, this being further ensured by the projections 14 fitting between the component terminals (2). The connector may also have end walls which assist in its location, and the connector and component may be pressed apart by an angled arrangement of the contacts 12 or by a resilient or spring-loaded pad (20, Fig. 5, not shown) within the connector channel. Test leads to the contacts 12 may be anchored to a plastics peg (Fig. 8, not shown) on the connector by a heatshrunk sleeve. A number of connectors may be attached to a circuit board which is clippable to a board carrying a corresponding number of integrated circuit components, in which case the clips 5 may be omitted. In an alternative embodiment, the connector comprises two longitudinally pivoted body parts (15, 16, Figs. 9 and 10, not shown) which are resiliently biased to clip on to the component body (1) and have retaining projections (19) between adjacent contacts 12.
GB5087868A 1968-10-25 1968-10-25 Integrated circuit testing Expired GB1246101A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB5087868A GB1246101A (en) 1968-10-25 1968-10-25 Integrated circuit testing

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB5087868A GB1246101A (en) 1968-10-25 1968-10-25 Integrated circuit testing

Publications (1)

Publication Number Publication Date
GB1246101A true GB1246101A (en) 1971-09-15

Family

ID=10457754

Family Applications (1)

Application Number Title Priority Date Filing Date
GB5087868A Expired GB1246101A (en) 1968-10-25 1968-10-25 Integrated circuit testing

Country Status (1)

Country Link
GB (1) GB1246101A (en)

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4116518A (en) * 1977-08-31 1978-09-26 Ncr Corporation Clip for paralleling packaged integrated circuit chips
FR2419595A1 (en) * 1978-03-06 1979-10-05 Tektronix Inc LOW PROFILE TEST CLAMP ADAPTER FOR ELECTRONIC CIRCUITS
US4190311A (en) * 1978-03-06 1980-02-26 Tektronix, Inc. Low-profile test clip adapter
EP0116266A1 (en) * 1982-12-29 1984-08-22 Telefonaktiebolaget L M Ericsson Holder for connecting electrical conductors to contact surfaces on electronic components
US4547028A (en) * 1983-10-05 1985-10-15 A P Products Incorporated Low profile test clip
EP0158432A1 (en) * 1984-03-19 1985-10-16 Itt Industries, Inc. Chip carrier test adapter
FR2572537A1 (en) * 1984-10-30 1986-05-02 Socapex INTEGRATED CIRCUIT TEST PLIERS
US4639058A (en) * 1984-08-22 1987-01-27 Minnesota Mining & Manufacturing Co. Low profile test clip and handle therefor
US4816751A (en) * 1986-07-16 1989-03-28 Dakku Kabushiki-Kaisha Apparatus for inspecting the operation of integrated circuit device
US4822295A (en) * 1987-12-17 1989-04-18 Ncr Corporation Small outline SMT test connector
US20160126669A1 (en) * 2014-11-04 2016-05-05 Hong Fu Jin Precision Industry (Wuhan) Co., Ltd. Clip for bios chip
CN109524813A (en) * 2017-09-20 2019-03-26 泰科电子(上海)有限公司 Connector and circuit board assemblies
CN115015601A (en) * 2022-08-08 2022-09-06 山东元捷电子科技有限公司 Measuring device for resistor production

Cited By (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4116518A (en) * 1977-08-31 1978-09-26 Ncr Corporation Clip for paralleling packaged integrated circuit chips
FR2419595A1 (en) * 1978-03-06 1979-10-05 Tektronix Inc LOW PROFILE TEST CLAMP ADAPTER FOR ELECTRONIC CIRCUITS
US4190311A (en) * 1978-03-06 1980-02-26 Tektronix, Inc. Low-profile test clip adapter
EP0116266A1 (en) * 1982-12-29 1984-08-22 Telefonaktiebolaget L M Ericsson Holder for connecting electrical conductors to contact surfaces on electronic components
EP0116266B1 (en) * 1982-12-29 1987-08-26 Telefonaktiebolaget L M Ericsson Holder for connecting electrical conductors to contact surfaces on electronic components
US4547028A (en) * 1983-10-05 1985-10-15 A P Products Incorporated Low profile test clip
EP0158432A1 (en) * 1984-03-19 1985-10-16 Itt Industries, Inc. Chip carrier test adapter
US4639058A (en) * 1984-08-22 1987-01-27 Minnesota Mining & Manufacturing Co. Low profile test clip and handle therefor
EP0181806A1 (en) * 1984-10-30 1986-05-21 Socapex Integrated circuit test clip
US4683425A (en) * 1984-10-30 1987-07-28 Socapex Integrated circuit test clip
FR2572537A1 (en) * 1984-10-30 1986-05-02 Socapex INTEGRATED CIRCUIT TEST PLIERS
US4816751A (en) * 1986-07-16 1989-03-28 Dakku Kabushiki-Kaisha Apparatus for inspecting the operation of integrated circuit device
US4822295A (en) * 1987-12-17 1989-04-18 Ncr Corporation Small outline SMT test connector
US20160126669A1 (en) * 2014-11-04 2016-05-05 Hong Fu Jin Precision Industry (Wuhan) Co., Ltd. Clip for bios chip
CN109524813A (en) * 2017-09-20 2019-03-26 泰科电子(上海)有限公司 Connector and circuit board assemblies
CN115015601A (en) * 2022-08-08 2022-09-06 山东元捷电子科技有限公司 Measuring device for resistor production
CN115015601B (en) * 2022-08-08 2022-10-21 山东元捷电子科技有限公司 Measuring device for resistor production

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